Patents
Patents for G01R 27 - Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom (22,286)
01/2005
01/06/2005US20050001635 Vehicle controller
01/06/2005US20050000653 Method and apparatus of arrayed sensors for metrological control
01/05/2005CN2669202Y Conductivity pulse measuring device
01/05/2005CN1560641A Device for measuring impulse current of non-linear metal oxide resistor disc
01/05/2005CN1560640A Indirect measuring method for electric network capacitance current
01/04/2005US6839657 Method of and an arrangement for characterizing non-linear behavior of RF and microwave devices in a near matched environment
01/04/2005US6839620 Detecting soot during real time operation in diesel engine lubricant
01/04/2005US6838885 Method of correcting measurement error and electronic component characteristic measurement apparatus
01/04/2005US6838869 Clocked based method and devices for measuring voltage-variable capacitances and other on-chip parameters
12/2004
12/30/2004US20040267476 Method and product for processing system test data
12/30/2004US20040265712 Detecting erosion in collector optics with plasma sources in extreme ultraviolet (euv) lithography systems
12/30/2004US20040263186 Capacitance type dynamic quantity sensor
12/30/2004US20040263185 Dielectric constant measuring apparatus, dielectric constant measuring method, and information recording/reproducing apparatus
12/30/2004DE102004020037A1 Vector network analyzer calibration for multiport measurement on semiconductor wafer, involves performing calibration measurement at multiple-fold one-port using known impedances and unknown reflective terminations, respectively
12/29/2004WO2004113936A1 Loss-compensating circuit
12/29/2004WO2004113935A2 Test fixture for impedance measurements
12/29/2004WO2004113930A1 Capacitive acceleration sensor arrangement
12/29/2004WO2004083812A3 Method and apparatus for detection of contaminants in a fluid
12/29/2004EP1490910A2 Determination apparatus and method of calibrating the apparatus
12/29/2004EP1135840A4 System and method for monitoring a vehicle battery
12/29/2004EP0882240B1 Microscopic imaging of properties of room-temperature objects
12/29/2004CN1558253A Method and apparatus for measuring complex impedance of cells and batteries
12/29/2004CN1182404C Method for determining very low capacitance and the use thereof
12/29/2004CN1182403C Piezoelectric ceramics transducer admittance circular graphic instruments
12/28/2004US6836743 Compensating for unequal load and source match in vector network analyzer calibration
12/28/2004US6836124 Capacitance monitoring systems
12/28/2004US6836123 Sensor for electro-active materials
12/23/2004WO2004111666A1 Method and apparatus for testing a medium
12/23/2004WO2004040324A3 A method of and apparatus for testing for integrated circuit contact defects
12/23/2004US20040257105 Testing vias and contacts in integrated circuit
12/23/2004US20040257094 Fluid quality test method based on impedance
12/23/2004US20040257093 Narrow-band amplifier and impedance-measuring apparatus
12/23/2004US20040257092 Method and a test setup for measuring large-signal S-parameters
12/23/2004US20040257065 System bench wireless mapping board
12/23/2004US20040257060 Measuring device and method for determining a characteristic curve of a high frequency unit
12/22/2004EP1488222A2 Stabilized conductivity sensing system
12/22/2004CN1181469C Ratio method for measurement of MR read head resistance
12/21/2004US6833820 Tunable monopole antenna
12/21/2004US6833722 Electronic circuit device with a short circuit switch using transistors and method of testing such a device
12/21/2004US6833719 Apparatus for evaluating electrical characteristics
12/16/2004WO2004109527A1 A network analyzing method and a network analyzing apparatus
12/16/2004WO2004072618A3 Improved microwave spectrometer
12/16/2004US20040254756 Internal bias measure with onboard ADC for electronic devices
12/16/2004US20040253921 Transducer package for process control
12/16/2004US20040251922 Methods and computer program products for full N-port vector network analyzer calibrations
12/16/2004US20040251920 Apparatus and methods for non-destructive inspection using microwave sensing
12/16/2004US20040251918 Patent application for a computer motional command interface
12/16/2004US20040251916 Methods and apparatus for measuring rotating machine clearances
12/16/2004DE20312254U1 Earthing device for a tool or implement, comprises a crocodile clip and earthing cable for connecting to the implement and a display attached to distal cable end that indicates when a correct earth has been established
12/15/2004EP1486776A1 High-sensitivity measuring instrument
12/15/2004CN1180269C Contact dynamic contact resistance measurer and measuring method thereof
12/14/2004US6831469 Micropower apparatus for low impedance measurements
12/14/2004US6829950 Method and apparatus for pressure sensing
12/09/2004US20040249605 Network analyzing apparatus and test method
12/09/2004US20040249603 Transient response analysis program of capacitor, recording medium, method of analysis, and simulator
12/09/2004US20040249579 Method and apparatus for formulating and controlling chemical concentrations in a solution
12/09/2004US20040246079 Method and apparatus for measuring complex dielectric constant of dielectric
12/09/2004US20040246019 Inspection device and inspection method for active matrix panel, and manufacturing method for active matrix organic light emitting diode panel
12/09/2004US20040246007 Fast, high precision, interference tolerant impedance measurement apparatus
12/09/2004US20040246006 Techniques to test signal propagation media
12/09/2004US20040246005 Wire tracer receiver
12/09/2004US20040246004 Calibration method for carrying out multiport measurements on semiconductor wafers
12/09/2004US20040245998 Method and apparatus for tracing a line
12/09/2004US20040245996 Apparatus and method for monitoring and predicting failures in system interconnect
12/08/2004EP1483593A2 Method for measuring the residual system directivity and/or the residual system port impedance match of a system-calibrated vector network analyser
12/08/2004CN1553200A Integrated unitary standing-wave ratio measuring module design method
12/07/2004US6828808 Long-life conductivity sensor system and method for using same
12/07/2004US6828807 Biological cell test method and apparatus
12/07/2004US6828806 Electrostatic capacitance sensor, electrostatic capacitance sensor component, object mounting body and object mounting apparatus
12/07/2004US6828804 Method of measuring electrical capacitance
12/02/2004WO2004104603A1 Phase measurement device, method, program, and recording medium
12/02/2004US20040243326 Method and apparatus for measuring the transmission loss of a cable
12/02/2004US20040239346 Method of determining current-voltage characteristics of a device
12/02/2004US20040239345 Measurement of coatings on metal
12/02/2004US20040239343 Magnetic head smear detecting method and device
12/02/2004US20040239342 Electrostatic capacitance detecting device
12/02/2004US20040239340 Resistor value detection circuit
12/02/2004US20040239336 System and method for measuring characteriscs of materials with the use of a composite sensor
12/01/2004EP1482317A1 Earth resistance measurement instrument by neutral-to-earth loop and measurement procedure
12/01/2004CN1551991A Potential fixing device and potential fixing method
12/01/2004CN1551990A Circuit and apparatus for detection of capacitance and microphone device
12/01/2004CN1551989A Impedance measuring circuit and capacitance measuring circuit
12/01/2004CN1551988A Sensor capacity sensing apparatus and sensor capacity sensing method
12/01/2004CN1551987A Capacitance detection circuit, capacitance detection instrument and microphone device
12/01/2004CN1550786A Electrical component and method of manufacturing the same
12/01/2004CN1550783A Capacitor type mechanical mass sensor
12/01/2004CN1550749A Thickness detecting sensor
11/2004
11/30/2004US6826506 Method and apparatus for calibrating a multiport test system for measurement of a DUT
11/30/2004US6825818 Tunable matching circuit
11/30/2004US6825676 Apparatus for determining dynamic gaps between a proximity probe and a conductive target material
11/30/2004US6825671 Integrated electromigration length effect testing method and apparatus
11/30/2004US6825649 Non-contact voltage measurement method and device, and detection probe
11/30/2004US6825090 Fluid dielectric variable capacitor
11/25/2004US20040232919 Fault detection system and method
11/25/2004US20040232519 Electronic device and method of testing and of manufacturing
11/25/2004US20040231887 Apparatus and methods for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer
11/24/2004EP1480051A2 Device and method for the determination of the high current capacity of a battery
11/24/2004EP1480046A1 A method for determining the current-voltage characteristic of a snap-back device
11/24/2004EP1480003A1 Thickness detecting sensor
11/24/2004CN2658754Y Earth resistance measuring device