Patents
Patents for G01R 27 - Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom (22,286)
12/2003
12/31/2003WO2003074978A3 Stabilized conductivity sensing system
12/31/2003CN1464311A Process for determining quality of medium and small power triode by the resistance method
12/30/2003US6671645 Method for in-service RAM testing
12/30/2003US6670816 Test coupon for measuring a dielectric constant of a memory module board and method of use
12/24/2003CN2594800Y Electric current signal controller for inspector for kilowatt meters
12/24/2003CN2594799Y Equipotential coupling resistor measuring device with storage function
12/24/2003CN1463409A Reading appts.
12/18/2003WO2003105186A2 Integrated circuit and method for manufacturing same
12/18/2003US20030231025 System and method for measuring a capacitance of a conductor
12/18/2003US20030231024 Capacitive media resistivity, dialectic constant, and thickness sensor
12/17/2003CN2593206Y Motor winding welding and coil resistance measuring clamp
12/17/2003CN2593202Y Electromagnetic conductivity sensor
12/17/2003CN1462068A Semiconductor device and capacitance measuring method
12/17/2003CN1131437C Circuit for testing allowable current of capacitor
12/16/2003US6665628 Methods for embedding and de-embedding balanced networks
12/16/2003US6664782 Digital eddy current proximity system: apparatus and method
12/16/2003CA2100436C Methods and circuits for measuring the conductivity of solutions
12/11/2003WO2003102609A1 Direct, low frequency capacitance measurement for scanning capacitance microscopy
12/11/2003WO2003019184A9 Biometric quality control process
12/11/2003US20030227291 Capacitance measurement method
12/10/2003CN2591628Y Insulating property on-line detector for electrical equipment
12/09/2003US6661392 Resonant antennas
12/09/2003US6661242 Using a DUT pin at known voltage to determine channel path resistance in automated test equipment test channels
12/09/2003US6658938 Electret transducer
12/04/2003US20030222661 Capacitance-based position sensor with integrating demodulator
12/04/2003US20030222639 Determining a dynamic gaps between a proximity probe and a conductive target material
12/03/2003CN2589999Y Portable unipotential linking resistance measuring instrument
12/03/2003CN2589982Y Thermostat for measuring fuel resistant volume resistivity
12/03/2003CN1459629A Method of measuring solution electroconductivity
12/03/2003CN1129791C Method for measuring resistance of welded position of cathode in aluminium electrolyzer
12/02/2003US6657444 Capacitance-based position sensor with integrating demodulator
12/02/2003US6657439 Sheet resisitance meter
11/2003
11/27/2003WO2003098255A1 Method for calibrating and de-embedding, set of devices for de-embedding and vector network analyzer
11/27/2003US20030218473 Semiconductor device and capacitance measurement method
11/26/2003EP1364220A2 Electronic pressure sensitive transducer apparatus and method for manufacturing same
11/25/2003US6654700 Testing method of semiconductor integrated circuit and equipment thereof
11/25/2003US6653848 Method and apparatus for linear characterization of multi-terminal single-ended or balanced devices
11/25/2003US6653841 Device and method for carrying out a contactless measurement of the conductivity of a liquid situated in a flow channel
11/20/2003US20030216892 Method and apparatus for representing complex vector data
11/20/2003US20030215682 Method and apparatus for inspecting direct liquid fuel cell generator, and direct liquid fuel cell generator
11/20/2003US20030214283 Digital eddy current proximity system: apparatus and method
11/20/2003US20030214282 Method for measuring a gap between a proximity probe and a conductive target material
11/20/2003US20030214005 A-C:H ISFET device, manufacturing method, and testing methods and apparatus thereof
11/19/2003CN1128368C Network direct-to-ground capacitance and current measuring instrument
11/19/2003CN1128355C Method and device for measuring resistivity of carbon-contained refractory material
11/18/2003US6651014 Apparatus for automatically measuring the resistivity of semiconductor boules by using the method of four probes
11/18/2003US6650127 Apparatus for measuring conductivity
11/18/2003US6650123 Methods for determining characteristics of interface devices used with vector network analyzers
11/13/2003WO2003093840A1 Connector for measuring electric resistance, apparatus and method for measuring electric resistance of circuit board
11/13/2003US20030210039 Method for measuring a gap between a proximity probe and a conductive target material
11/13/2003US20030210038 Digital eddy current proximity system: apparatus and method
11/13/2003US20030210037 Method for measuring a gap between a proximity probe and a conductive target material
11/13/2003US20030210036 Device for digitally measuring electrical impedance
11/12/2003EP1361449A2 Time domain reflectometer display method
11/12/2003CN2586165Y Multiroute cable insulation measurer
11/12/2003CN1455869A Device to audibly express impedance difference
11/12/2003CN1455262A Resistance measuring circuit and detection, control and alarm apparatus comprising said circuit
11/11/2003US6647357 Method for correcting reciprocity error in two port network measurements
11/11/2003US6646454 Electronic apparatus and method for measuring length of a communication cable
11/11/2003US6646451 Time domain reflectometer display method
11/06/2003WO2003076956A3 Method for measuring the residual system directivity and/or the residual system port impedance match of a system-calibrated vector network analyser
11/06/2003WO2003071230A3 Bridged capacitor sensor measurement circuit
11/06/2003US20030206006 Method for measuring a gap between a proximity probe and a conductive target material
11/06/2003US20030206005 Apparatus for determining a gap between a proximity probe component and a conductive target material
11/06/2003US20030206004 Digital eddy current proximity system: apparatus and method
11/06/2003US20030206003 Method for measuring a gap between a proximity probe and a conductive target material
11/06/2003US20030206002 Method for measuring a gap between a proximity probe and a conductive target material
11/06/2003US20030206001 Method for measuring a position of a conductive target material
11/06/2003US20030206000 Method for measuring a gap between a proximity probe and a conductive target material
11/05/2003EP1357985A1 Inductive sensory apparatus
11/05/2003EP1078283B1 Capacitive measuring method
11/05/2003CN1453574A Complex microwave dielectric constant measuring method for ceramic with high dielectric constant and low loss
11/04/2003US6643597 Calibrating a test system using unknown standards
11/04/2003US6642818 Loop coupled microwave cavity
11/04/2003US6642723 Apparatus monitoring the deposition of a liquid-to-pasty medium on a substrate
11/04/2003US6642721 Method of measuring insulation resistance of capacitor and insulation resistance measuring apparatus of the same
11/04/2003CA2137577C Microdevice for measuring the electromagnetic characteristics of a medium and use of said microdevice
10/2003
10/30/2003WO2003090353A2 Improved method and apparatus for tracking a resonant frequency
10/30/2003US20030204349 Data-based control of integrated circuits
10/30/2003US20030204343 Electromagnetic field analysis method based on FDTD method, medium representation method in electromagnetic field analysis, simulation device, and storage medium
10/29/2003EP1357656A2 Test measurement and control apparatus for a ground plant with protection of the electric plant connected thereto
10/29/2003EP1357386A2 Device and method for electrical charge detection and electrical apparatus equipped with such a device
10/29/2003CN1451970A Method for identifying abnormal condition in power transformer
10/29/2003CN1125986C Dielectric consumption factor with floating unit and capacitance tester
10/28/2003US6639491 Tunable ferro-electric multiplexer
10/28/2003US6639410 Insulation resistance measuring apparatus for capacitive electronic parts
10/28/2003US6639393 Methods and apparatus for time-domain measurement with a high frequency circuit analyzer
10/28/2003US6639221 Annular illumination method for charged particle projection optics
10/23/2003WO2003087856A1 Network analyzer, network analyzing method, automatic corrector, correcting method, program, and recording medium
10/23/2003US20030200039 Method, apparatus, and article of manufacture for predicting electrical behavior of a multiport device having balanced device ports
10/22/2003CN2582005Y Safety starter for measuring impedance
10/22/2003CN1125347C Method for automatic measuring asynchronous machine rotor ohmic resistance
10/21/2003US6636816 Vector signal analysis method and apparatus therefor
10/21/2003US6636053 Capacitive pixel for fingerprint sensor
10/21/2003US6636050 Four-terminal measuring device that uses nanotube terminals
10/21/2003US6636046 Electrical resistivity probes
10/16/2003WO2003048791A3 High frequency circuit analyser
10/16/2003WO2000038958A8 Occupant sensor
10/16/2003DE29924441U1 Charge transfer capacitance measurement circuit for measuring capacitance to ground, switches one plate of sample capacitor to corresponding voltage line, while keeping other line open-circuited
10/15/2003EP1353367A2 Apparatus and method for determining doping concentration of a semiconductor wafer