Patents for G01R 27 - Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom (22,286) |
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11/24/2004 | CN2658753Y Grounding electrode device used for measuring resistance to ground |
11/24/2004 | CN1177218C Inspection method of piezoelectric ceramic device |
11/24/2004 | CN1176633C Resin lid for bioelectrical impedance measurer |
11/23/2004 | US6823276 System and method for determining measurement errors of a testing device |
11/23/2004 | US6822473 Determination of permeability of layer material within interconnect |
11/23/2004 | US6822438 Apparatus for measuring parasitic capacitance and inductance of I/O leads on electrical component using a network analyzer |
11/18/2004 | WO2004100513A1 Method and arrangement for loop test of a disturbed line |
11/18/2004 | WO2004100512A1 Method and arrangement for signal loop test |
11/18/2004 | WO2004100363A2 Magnetic field response sensor for conductive media |
11/18/2004 | WO2004099711A1 Method and arrangement for estimation of line properties |
11/18/2004 | WO2003090353A3 Improved method and apparatus for tracking a resonant frequency |
11/18/2004 | US20040227527 Method and relative test structure for measuring the coupling capacitance between two interconnect lines |
11/18/2004 | US20040227526 Thickness detecting sensor |
11/18/2004 | US20040227524 Method and system for measuring thickness of thin films with automatic stabilization of measurement accuracy |
11/17/2004 | EP1077367B1 Capacitive force gauge |
11/17/2004 | CN1547036A Ferroelectric thin film material dielectric performance multi-frequency automatic testing method and device |
11/16/2004 | US6819194 Tunable voltage-controlled temperature-compensated crystal oscillator |
11/16/2004 | US6819124 Detection of electromigration in integrated circuits |
11/16/2004 | US6819122 Method for measuring a gap between a proximity probe and a conductive target material |
11/11/2004 | US20040222804 Electrical component and method of manufacturing the same |
11/11/2004 | US20040222802 Capacitive fingerprint sensor against ESD damage and contamination interference and a method for manufacturing the same |
11/11/2004 | US20040222800 Enhanced isolation level between sampling channels in a vector network analyzer |
11/11/2004 | DE202004010286U1 Measuring device for characterizing planar high-frequency substrate materials handles relative permittivities and dielectric losses |
11/11/2004 | DE19606526B4 Verfahren zur Bestimmung des Widerstandswertes einer Widerstandsanordnung A method for determining the resistance value of a resistor arrangement |
11/11/2004 | DE10064183B4 Verfahren zum Untersuchen eines piezoelektrischen Keramikelements A method of inspecting a piezoelectric ceramic element |
11/10/2004 | EP1475642A1 Method and arrangement for measuring the coupling capacitance between two interconnect lines |
11/10/2004 | EP1474697A1 Capacitance sensors with asynchronous ring oscillator circuit and capacitance |
11/10/2004 | EP1474669A1 Method for determining the electrical resistance of an electrical supply lead to sensor elements, and a sensor arrangement |
11/10/2004 | CN1545620A Regularization model for electrical resistance mapping |
11/10/2004 | CN1544959A Resistance tomography data acquisition system based on bipolar pulse current drive |
11/10/2004 | CN1175267C Capacity type humidity sensor and garbage processing method thereof |
11/09/2004 | US6816797 System and method for measuring fuel cell voltage and high frequency resistance |
11/09/2004 | US6816796 Resistance measuring circuit |
11/09/2004 | US6816714 Antenna interface unit |
11/09/2004 | US6815976 Apparatus and method for inspecting array substrate |
11/09/2004 | US6815964 Test board de-embedding method to improve RF measurements accuracy on an automatic testing equipment for IC wafers |
11/09/2004 | US6815959 Systems and methods for measuring properties of conductive layers |
11/09/2004 | US6815958 Method and apparatus for measuring thickness of thin films with improved accuracy |
11/09/2004 | US6815657 Reading apparatus |
11/04/2004 | US20040220759 Leakage current or resistance measurement method, and monitoring apparatus and monitoring system of the same |
11/04/2004 | US20040217766 Apparatus and methods for measuring resistance of conductive layers |
11/04/2004 | DE4304060B4 Schaltungsanordnung zur Auswertung von Meßreaktanzen Circuit arrangement for evaluating Meßreaktanzen |
11/04/2004 | DE202004013305U1 Kalibrierstandard Calibration |
11/04/2004 | DE10061106B4 Verfahren und Vorrichtung zur Überprüfung elektrischer Materialeigenschaften Method and apparatus for checking electrical material properties |
11/03/2004 | EP1473572A1 Apparatus and methods for measuring the resistance of conductive layers |
11/03/2004 | EP1259831A4 Control system simulation, testing, and operator training |
11/03/2004 | CN2653520Y Microwave ceramic medium pole resonant method detection clamp |
11/03/2004 | CN1543305A Method for correcting measurement error and electronic component characteristic measurement apparatus |
11/03/2004 | CN1542458A Method for testing internal capacitance of integrated circuit using bridge circuit |
11/03/2004 | CN1542457A Method for testing internal capacitance of integrated circuit using CR circuit |
11/03/2004 | CN1174512C Membrane electrode assembly with integral sensor and method for operating fuel battery |
11/03/2004 | CN1174244C Square capacitance chromatographic imaging sensor |
11/02/2004 | US6813589 Method and apparatus for determining system response characteristics |
11/02/2004 | US6813578 Process for measuring CMOS device performance from hot carrier luminescence |
11/02/2004 | US6812716 Method and apparatus for testing an electrical component |
11/02/2004 | US6812715 Circuit and method for detecting load impedance |
11/02/2004 | US6812714 Apparatus for collecting signal measurement data at signal ports of an RF and microwave device-under-test, under different impedance load conditions |
11/02/2004 | US6812692 Inspection terminal for inspecting electronic chip component, and inspection method and inspection apparatus using the same |
10/28/2004 | US20040212377 Method for measuring resistivity of semiconductor wafer |
10/28/2004 | US20040212374 Current-to-voltage converting apparatus and impedance measuring apparatus |
10/28/2004 | DE10348027A1 Testsonde mit variabler Impedanz Test probe with variable impedance |
10/28/2004 | DE10316901A1 Kontrollsystem und Kontrollverfahren zum Überprüfen der Funktion von LCD-Anzeigen Control system and control method for checking the function of LCD displays |
10/28/2004 | DE10308029B3 Electrical component resistance value determination method e.g. for current measuring shunt resistance, using measuring bridge containing reference resistance in series with component and known resistances |
10/28/2004 | DE10256064B4 Verfahren und Vorrichtung zur Bestimmung des Wassergehalts und der Leitfähigkeit in Böden und Schüttgütern Method and apparatus for determining the water content and the conductivity in soils and solids |
10/28/2004 | DE102004012277A1 Sensorvorrichtung Sensor device |
10/27/2004 | EP1471360A2 Capacitance detection electrode and method of manufacturing the same |
10/27/2004 | EP1386173B1 Capacitance measuring circuit |
10/27/2004 | CN2651763Y Bipolar pulse current excited resistor chromatographic image data collecting system |
10/27/2004 | CN1541444A Electronic device and method of testing and of mfg. |
10/27/2004 | CN1540463A Computer controller in drinking water device capable of testing conductivity of water |
10/27/2004 | CN1173168C Stray field probe |
10/26/2004 | US6809533 Quantitative imaging of dielectric permittivity and tunability |
10/26/2004 | US6809531 Digital potentiometer device |
10/26/2004 | US6809527 Method of measuring a characteristic of a capacitive type of sensor, a sensor characteristic measuring apparatus, a capacitive type of sensor apparatus, and an ic chip for measuring a sensor characteristic |
10/26/2004 | US6809524 Testing of conducting paths using a high speed I/O test package |
10/26/2004 | US6809507 Implantable sensor electrodes and electronic circuitry |
10/26/2004 | US6808590 Method and apparatus of arrayed sensors for metrological control |
10/21/2004 | WO2004090852A1 Control system and control method for checking the function of liquid crystal displays |
10/21/2004 | US20040207426 Active prematching tuner system |
10/21/2004 | US20040207412 Capacitance measurement circuit |
10/21/2004 | US20040206455 Method and apparatus of arrayed, clustered or coupled eddy current sensor configuration for measuring conductive film properties |
10/21/2004 | DE102004015528A1 Unterbrechungserfassungsschaltung für eine Sensorvorrichtung Interruption detecting circuit for a sensor device |
10/21/2004 | CA2521737A1 Control system and control method for checking the function of liquid crystal displays |
10/20/2004 | EP1469416A2 Electrostatic capacitance detection device |
10/20/2004 | CN2650140Y Electronic integrating mega-ohm meter |
10/20/2004 | CN1538184A Method of fast measuring direct current resistance of power transformer using excitation vibration |
10/20/2004 | CN1538143A Electrosatatic capacity detector |
10/20/2004 | CN1537770A Vehicle testing method for rail circuit leckage resistamce and its testing equipment |
10/14/2004 | US20040204877 Apparatus for and method of calculating electromagnetic field intensity, and computer program product |
10/14/2004 | US20040201386 Methods for determining inductance and resistance of an inductor |
10/14/2004 | US20040201385 Method and apparatus for measuring dry density and water content of soil |
10/14/2004 | US20040201383 Balanced device characterization including test system calibration |
10/14/2004 | US20040201378 Electrical property evaluation apparatus |
10/13/2004 | EP1244921B1 Time domain reflectometer display method |
10/13/2004 | CN1537343A Tuning multiplexer |
10/12/2004 | US6804810 Resistance and capacitance estimation |
10/12/2004 | US6803859 Method and apparatus for active isolation in inductive loop detectors |
10/12/2004 | US6803794 Differential capacitance sense amplifier |
10/12/2004 | US6803776 Current-comparator-based four-terminal resistance bridge for power frequencies |
10/12/2004 | US6803773 Method and circuit for detecting a change in inductance |