Patents
Patents for G01R 27 - Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom (22,286)
04/2004
04/29/2004US20040080328 Methods and structures for electronic probing arrays
04/29/2004US20040080323 Signal pre-processing for estimating attributes of a transmission line
04/28/2004EP1413947A1 Electronic measurement apparatus having a function to display a function menu over a plurality of pages in a list and function menu display method
04/28/2004EP1413893A1 Measuring of low impedances
04/28/2004EP1413891A1 System and method of measuring low impedances
04/28/2004EP1412975A1 Testing vias and contacts in integrated circuit fabrication
04/28/2004CN1492227A Novel capacitive pool structure
04/28/2004CN1147727C Capacitive chromatographic imaging capacitance measuring system
04/27/2004US6728647 Determination of capacitances of individual resources in programmable logic devices
04/27/2004US6727786 Band switchable filter
04/27/2004US6727688 Method for measuring a gap between a proximity probe and a conductive target material
04/27/2004US6727687 Method for measuring a gap between a proximity probe and a conductive target material
04/22/2004US20040078156 System and method of measuring low impedances
04/22/2004US20040075451 System and method of measuring low impedances
04/22/2004US20040075441 Device for electromagnetic characterisation of a tested structure
04/22/2004US20040075036 Test plate for ceramic surface mount devices and other electronic components
04/22/2004DE10246700A1 Meßvorrichtung, insbesondere vektorieller Netzwerkanalysator, mit getrennten Oszillatoren Measuring device, in particular vectorial network analyzer, with separate oscillators
04/21/2004EP1411361A1 Signal pre-processing for estimating attributes of a transmission line
04/21/2004CN2612952Y Measuring and switch connecting device of internal resistance of storage battery
04/21/2004CN1490629A Correcting method, quality checking method for electronic component and characteristic measuring system
04/20/2004US6724198 Inductive sensory apparatus
04/15/2004WO2003023423A3 Dielectric constant measuring apparatus and dielectric constant measuring method
04/15/2004US20040073395 Frequency domain reflectometry system for baselining and mapping of wires and cables
04/15/2004US20040070409 Adaptive reference voltage method and system
04/15/2004US20040070402 Substrate impedance measurement
04/14/2004EP1408327A2 Apertured probes for localized measurements of a material's complex permittivity and fabrication method
04/14/2004EP1000363A4 Spreading resistance profiling system
04/14/2004CN2611912Y Microhm-class resistance measurer
04/14/2004CN2611896Y High pureness water conductometer
04/14/2004CN1488948A Circuit load property and its voltage-current phase difference measuring method and apparatus
04/14/2004CN1145805C Circuit and method for detecting standing wave
04/13/2004US6720777 Bridged capacitor sensor measurement circuit
04/08/2004WO2004030034A2 Test mode control circuit for reconfiguring a device pin of an integrated circuit chip
04/08/2004WO2004029638A1 Method and device for characterizing ferroelectric materials
04/08/2004WO2004029574A1 Distortion waveform control device, distortion regulating member, distorton waveform control method of distortion waveform control device, and distortion waveform control program
04/08/2004US20040066182 Measuring device, in particular vectorial network analyzer, with separate oscillators
04/08/2004DE19530238B4 Verfahren zur Überprüfung einer Sicherheitseinrichtung und Gerät zur Durchführung des Verfahrens Method for checking a safety device and the device for performing the method
04/07/2004EP1406292A2 Plasma treatment equipment and impedance measurement tool
04/07/2004EP1405382A1 Electric circuit providing selectable short circuit for instrumentation applications
04/07/2004CN2610343Y Construction acceptance testing device for communication cable
04/07/2004CN2610340Y 电解电容器分选机 Electrolytic capacitor sorter
04/07/2004CN2610330Y Movable electrode device for measuring resistance quantity
04/06/2004US6718276 Method and apparatus for characterizing frequency response on an error performance analyzer
04/06/2004US6717423 Substrate impedance measurement
04/01/2004WO2004028003A2 A system and method for monitoring harmonic content of an rf signal
04/01/2004US20040064284 Test method of memory IC function on device board with dynamic competing cycle
04/01/2004US20040061509 Moving object detection apparatus
04/01/2004DE19731750B4 Verfahren zum Stabilisieren einer Rückführungsschleife einer Impedanzmeßeinrichtung A method for stabilizing a feedback loop of an impedance measuring
04/01/2004DE10338072A1 Verfahren und Vorrichtung zum Kalibrieren eines Meßvorrichtungswegs und zum Messen einer Testvorrichtung in dem kalibrierten Meßvorrichtungsweg Method and apparatus for calibrating a Meßvorrichtungswegs and for measuring a test device in the calibrated Meßvorrichtungsweg
04/01/2004DE10244348A1 Frequency synthesizer for locking tunable oscillator to reference oscillator with small frequency offset, e.g. for heterodyne measuring system, has two frequency dividers arranged between oscillators
04/01/2004DE10243244A1 Antenna system reflection method measurement method in which in two measurement cycles a signal is transmitted to and reflected from the antenna with the measurements used in an equation to eliminate an interference contribution
03/2004
03/31/2004EP1404021A2 Method and circuit for reading a potentiometer
03/31/2004CN1486427A Device for determining the internal resistance of a linear oxygen probe
03/31/2004CN1144057C Device for measuring capacitance of electrical wires
03/30/2004US6714037 Methodology for an assessment of the degree of barrier permeability at via bottom during electromigration using dissimilar barrier thickness
03/30/2004US6714023 Method for high-accuracy non-contact capacitive displacement measurement of poorly connected targets
03/30/2004CA2100303C Circuit arrangement for evaluating the signal of a capacitive measuring sensor
03/25/2004WO2003052429A9 Method and apparatus for in-circuit impedance measurement
03/25/2004US20040059537 Test mode control circuit for reconfiguring a device pin of an integrated circuit chip
03/25/2004US20040057583 Dynamic impedance comparator
03/25/2004US20040056730 Tunable voltage controlled oscillator
03/25/2004US20040056674 Multi-point probe
03/25/2004US20040056643 Method of determining the output capacitance of a voltage supply device
03/24/2004EP1399876A1 Image acquisition apparatus
03/24/2004EP1399747A1 Method for charging a structure comprising an insulating body
03/24/2004EP1399746A1 Image sensor utilizing a low fpn high gain capacitive transimpedance amplifier
03/24/2004CN1484041A Detector for moving object
03/23/2004US6710507 Digital control loop to solve instability of electrostatic drives beyond ⅓ gap limit
03/23/2004US6710352 Charged particle measuring apparatus
03/23/2004US6709779 Cooling device for fuel cell system and control method thereof
03/18/2004WO2004023526A2 Apparatus and method for processing capacitor sensor signals using digital frequency shift measurement techniques with floating reference
03/18/2004US20040054490 Single port single connection VNA calibration apparatus
03/18/2004US20040051538 Method and system for calibrating a measurement device path and for measuring a device under test in the calibrated measurement device path
03/18/2004US20040051519 Method of and apparatus for controlling probe tip sanding in semiconductor device testing equipment
03/18/2004US20040051396 Electric circuit for a capacitive sensor element
03/18/2004DE60002518T2 Verfahren und Vorrichtung zum adaptiven Lernen von Testfehlern zur Verminderung der Gesamtzahl von Testmessungen erforderlich in Echtzeit Method and apparatus for adaptive learning of test failures to reduce the total number of test measurements required in real-time
03/18/2004DE19962764B4 Verfahren zum Abstimmen eines Filters mit mehreren gekoppelten Resonatoren A method for tuning a filter with a plurality of coupled resonators
03/18/2004DE10242932A1 Line-reflect-reflect (LRR) method for calibrating 4-measurement point vectoral network analyzers, where four calibration circuits comprising conduction elements of unknown length and unknown symmetrical obstacle networks are used
03/18/2004CA2495483A1 Apparatus and method for processing capacitor sensor signals using digital frequency shift measurement techniques with floating reference
03/17/2004EP1073910B1 Paper stock zeta potential measurement and control
03/17/2004CN1482468A Structure and method for testing contact resistance of detecting probe
03/17/2004CN1482452A High sensitivity liquid dielectric constant measuring probe
03/16/2004US6707312 Pseudo variable resistor for tester platform
03/16/2004US6707308 Measurements using tunnelling current between elongate conductors
03/16/2004US6707306 Measuring method for a capacitive measuring system
03/11/2004WO2004021249A1 Extracting semiconductor device model parameters
03/11/2004US20040046574 Capacitive micro pressure sensing member and fingerprint sensor using the same
03/11/2004US20040046569 Automatic jack tester
03/11/2004DE19946180B4 Schaltung zur Messung des Feuchtigkeitsgehaltes von flüssigen Erdölprodukten durch Untersuchung der Kapazität Circuit for measuring the moisture content of liquid petroleum products by investigating the capacity
03/10/2004EP1395840A1 Fault detection system and method
03/10/2004EP1373030A4 Occupant sensor
03/10/2004EP1140576A4 Occupant detection system
03/10/2004EP1140575A4 Occupant detection system
03/10/2004EP1140574A4 Occupant detection system
03/10/2004CN2606358Y Transmission type microwave signal sampling and measuring devices
03/10/2004CN1480736A Method for testing electronic component and its instrument
03/10/2004CN1141588C Capacitance detecting circuit and its application
03/09/2004US6703843 Device for digitally measuring electrical impedance
03/04/2004WO2004019501A2 Methods for transmitting a waveform having a controllable attenuation and propagation velocity
03/04/2004DE10240195A1 Determining capacitance of capacitor, by compensating for current caused by stray capacitance of measuring arrangement e.g. using second capacitor and inverting amplifier