Patents
Patents for G01N 23 - Investigating or analysing materials by the use of wave or particle radiation not covered by group  or , e.g. x-rays, neutrons (32,258)
10/2009
10/06/2009US7599463 Remote sensing device to detect materials of varying atomic numbers
10/06/2009US7599054 Pattern inspection apparatus
10/06/2009US7598594 Wafer-scale microcolumn array using low temperature co-fired ceramic substrate
10/06/2009US7598492 Charged particle microscopy using super resolution
10/06/2009US7598491 Observing method and its apparatus using electron microscope
10/06/2009US7598490 SEM-type reviewing apparatus and a method for reviewing defects using the same
10/01/2009WO2009120817A2 Inelastic background correction for a pulsed-neutron instrument
10/01/2009WO2009120196A1 Method of and system for three-dimensional workstation for security and medical applications
10/01/2009WO2009117826A1 Determining characteristics of electric cables using terahertz radiation
10/01/2009US20090248322 Method and system for monitoring changes in a sample for a process or an environment
10/01/2009US20090248319 Mail parcel screening using multiple detection technologies
10/01/2009US20090245588 Method And Apparatus For Determining Particle Parameter And Processor Performance In A Coal And Mineral Processing System
10/01/2009US20090245464 X-ray radiographic apparatus and method
10/01/2009US20090245463 Automatic material discrimination by using computer tomography
10/01/2009US20090245462 Cargo Scanning System
10/01/2009US20090242766 Transmission electron microscope having electron spectroscope
10/01/2009US20090242765 Scanning electron microscope
10/01/2009US20090242764 Spin-torque probe microscope
10/01/2009US20090242763 Environmental Cell for a Particle-Optical Apparatus
10/01/2009US20090242762 Apparatus and Method for Inspecting Sample
10/01/2009US20090242761 Method and apparatus for charged particle beam inspection
10/01/2009US20090242760 Method and Apparatus for Measuring Dimension of Circuit Patterm Formed on Substrate by Using Scanning Electron Microscope
10/01/2009US20090242759 Slice and view with decoration
10/01/2009US20090242758 Multistage gas cascade amplifier
10/01/2009US20090242757 Charged particle beam apparatus and method adjusting axis of aperture
09/2009
09/30/2009EP2105727A1 Scanning electron microscope comprising a film for holding a sample and a dish for receiving sample material from a damaged film
09/30/2009EP2104849A1 Method for simulating the failure rate of an electronic equipment due to neutronic radiation
09/30/2009EP1915611B1 Computer tomography measuring device and method
09/30/2009CN101545876A Method for observing collagenous fibre of fresh and alive trepang with electron microscope
09/30/2009CN101545875A Method for analyzing scattered element content in chloride type oilfield water by utilizing X-ray fluorescence spectra
09/30/2009CN101545874A Environmental cell for a particle-optical apparatus
09/30/2009CN101545873A X-ray inspection in package
09/30/2009CN101545872A Low-dimensional nano material microstructure and device and method for electrical performance testing
09/30/2009CN101545871A Microstructure of nano wire and electrical performance testing device
09/30/2009CN100545644C A method of semi-automatic X-ray crystal plane index calibration and method of unit cell constant computation
09/30/2009CN100545643C Nuclear imaging analysis instrument for nuclear track detection
09/30/2009CN100545642C Radiographic inspection compensation method
09/30/2009CN100545641C Ray detecting device
09/29/2009US7596455 Crystallization of IGF-1
09/29/2009US7596275 Methods and systems for imaging and classifying targets as empty or non-empty
09/29/2009US7596207 Method of accounting for tumor motion in radiotherapy treatment
09/29/2009US7596206 Radiography device for recording dynamic processes and associated recording method
09/29/2009US7595490 Charged particle beam emitting device and method for operating a charged particle beam emitting device
09/29/2009US7595489 Method and apparatus for material identification
09/29/2009US7595488 Method and apparatus for specifying working position on a sample and method of working the sample
09/29/2009US7595482 Standard component for length measurement, method for producing the same, and electron beam metrology system using the same
09/29/2009US7594434 Downhole tool system and method for use of same
09/29/2009CA2322462C Method and system for creating three-dimensional images using tomosynthetic computed tomography
09/24/2009WO2009117033A2 Scanning analyzer for single molecule detection and methods of use
09/24/2009WO2009116930A1 Phase-contrast x-ray imaging
09/24/2009WO2009116634A1 Microstructure inspection method, microstructure inspection apparatus, and microstructure inspection program
09/24/2009WO2009115982A1 Computed tomography scanner apparatus and method for ct-based image acquisition based on spatially distributed x-ray microsources of the cone-beam type
09/24/2009WO2009115966A1 Rotational x ray device for phase contrast imaging
09/24/2009WO2009115664A2 Crystalline structure of the cc2-lz domain of nemo
09/24/2009WO2009114992A1 Integrated system and integrated method for x-ray radiation imaging and radioactive matter monitoring
09/24/2009WO2009114928A1 Method and apparatus for assessing characteristics of liquids
09/24/2009WO2009079311A3 Apparatus and method for fluid phase fraction determination using x-rays optimized for wet gas
09/24/2009WO2009060319A3 Method and apparatus for deriving an iso-dense bias and controlling a fabrication process
09/24/2009US20090240137 Diagnostic Imaging Method
09/24/2009US20090238337 Concurrent reconstruction using multiple bed frames or continuous bed motion
09/24/2009US20090238336 Multiple Pass Cargo Inspection System
09/24/2009US20090238335 Suitcase compartmentalized for security inspection and system
09/24/2009US20090236523 Analysis apparatus and analysis method for semiconductor device
09/24/2009US20090236522 Optical zoom system for a light scanning electron microscope
09/24/2009US20090236521 Method and system for ultrafast photoelectron microscope
09/24/2009US20090236520 method and apparatus allowing simultaneous direct observation and electronic capture of scintillation images in an electron microscope
09/24/2009DE102008016411A1 X-ray computer tomography for patient, has detector for radiography of body section of patient for detection of recording dates of cross section images to be reconstructed for body section according to reconstruction algorithms
09/24/2009CA2713884A1 Crystalline structure of the cc2-lz domain of nemo
09/24/2009CA2709217A1 Scanning analyzer for single molecule detection and methods of use
09/23/2009EP2102638A1 Method and device for producing a tomosynthetic 3d x-ray image
09/23/2009EP2102637A2 Methods and apparatus for obtaining low-dose imaging
09/23/2009CN101539557A Integrating system for radioactive substance detection and X-ray radiation imaging
09/23/2009CN101539556A Integrating system and integrating method for radioactive substance detection and X-ray radiation imaging
09/23/2009CN101539534A X-ray analysis apparatus and x-ray analysis method
09/23/2009CN101539533A Automatic detecting device and method for battery internal defect
09/22/2009US7593506 Backscatter inspection portal
09/22/2009US7593504 X-ray inspection apparatus
09/22/2009US7593119 Generation of a library of periodic grating diffraction signals
09/22/2009US7592586 Mapping-projection-type electron beam apparatus for inspecting sample by using electrons reflected from the sample
09/22/2009US7592063 Quartz glass substrate and process for its production
09/22/2009US7591698 Vehicle lighting device manufacturing method for positioning and welding a cover to a housing
09/22/2009US7591587 Method for controlling X-ray diagnostic apparatus
09/17/2009WO2009114230A2 Reducing particle implantation
09/17/2009WO2009113713A1 X-ray imaging apparatus, x-ray imaging method and method of controlling x-ray imaging apparatus
09/17/2009WO2009113670A1 Method and device for visualizing distribution of local electric field
09/17/2009WO2009112713A1 Radar operation apparatus for detecting and locating discontinuities or foreign bodies in materials
09/17/2009US20090234251 Computer System and Method for Assessing Dynamic Bone Quality
09/17/2009US20090233371 Method of determining cyclic carbon content in sample and method of determining content of cyclic carbon material in sample
09/17/2009US20090232277 System and method for inspection of items of interest in objects
09/17/2009US20090232276 X-ray detection in packaging
09/17/2009US20090231134 Method and System for Certifying Operators of X-Ray Inspection Systems
09/17/2009US20090230984 Defective product inspection apparatus, probe positioning method and probe moving method
09/17/2009US20090230304 Scanning electron microscope
09/17/2009US20090230303 Defect analyzer
09/17/2009DE112007002487T5 Hochgeschwindigkeits-Vorverstärkerschaltung, Detektionselektronik und Strahlungsdetektionssysteme daraus High speed preamplifier circuit, detection electronics and radiation detection systems from
09/17/2009DE102007013569B4 Detektionssubstrat, Detektormodul und Detektor für ein Computertomographiegerät, sowie ein Computertomographiegerät Detection substrate detector module and detector for a CT scanner and a computed tomography scanner
09/17/2009CA2717918A1 Method for a highly sensitive detection and quantification of biomolecules using secondary ion mass spectrometry (sims) and related technologies
09/16/2009EP1618368B1 Control means for heat load in x-ray scanning apparatus
09/16/2009EP1328903B1 Method and apparatus for digital image defect correction and noise filtering
09/16/2009CN201311402Y Portable super-fast visual contraband detector structure