Patents
Patents for G01N 23 - Investigating or analysing materials by the use of wave or particle radiation not covered by group  or , e.g. x-rays, neutrons (32,258)
09/2009
09/16/2009CN201311401Y Car radiation imaging detection system
09/16/2009CN101532971A Method and application for quickly screening long-grain rice flour and composition thereof
09/16/2009CN101532970A Crystal orientation and micromechanics performance measurement method of each composition crystal grain in polycrystal
09/16/2009CN101532969A System and method for phase-contrast imaging by use of X-ray gratings
09/16/2009CN101532968A Vehicle check system for green channel
09/16/2009CN101532967A Device for detecting ash content at coal bypass on line and method thereof
09/16/2009CN101532927A Method for preparing test piece to scan oil liquid solid pollution degree detected by electron microscope
09/16/2009CN100541505C Radiation photographing image reading apparatus
09/16/2009CN100541188C Radioactive ray flaw detection device and method of flaw detection
09/16/2009CN100541187C Container checking system with CT tomoscanning function
09/15/2009US7590220 X-ray inspection and detection system and method
09/15/2009US7590215 Coherent-scatter computer tomograph
09/15/2009US7589322 Sample measuring device
09/15/2009CA2313729C Ionization chamber with electron source
09/11/2009WO2009111454A1 Xrf system having multiple excitation energy bands in highly aligned package
09/11/2009WO2009111139A1 Methods for assessing the miscibility of compositions
09/11/2009WO2009111059A2 Suitcase compartmentalized for security inspection and system
09/11/2009WO2009110320A1 X-ray examination device
09/11/2009WO2009089111A3 A heterogeneous capture-gated neutron detector
09/11/2009WO2009068763A4 Method, device and system for measuring nanoscale deformations
09/11/2009WO2008107108A8 X-ray analysis instrument
09/11/2009CA2753990A1 Xrf system having multiple excitation energy bands in highly aligned package
09/10/2009US20090228216 Methods, a processor, and a system for improving an accuracy of identification of a substance
09/10/2009US20090225958 Methods and Devices for Quantitative Analysis of X-Ray Images
09/10/2009US20090225946 Method and Device for Judging Polarity of Single Crystal Sample
09/10/2009US20090225945 High spatial resolution x-ray and gamma ray imaging system using diffraction crystals
09/10/2009US20090225944 X-ray inspection and detection system and method
09/10/2009US20090225943 Systems for improving a spatial resolution of an image
09/10/2009US20090225941 X-ray imaging apparatus
09/10/2009US20090225940 Radiation imaging device and radiation imaging method
09/10/2009US20090225939 System for image inspection of movable object and dodging method
09/10/2009US20090225938 Anti-scatter-grid for a radiation detector
09/10/2009US20090225931 Combined X-Ray CT/Neutron Material Identification System
09/10/2009US20090225326 Charged particle beam apparatus and displacement detecting circuit
09/10/2009US20090224749 Method for measuring electric potential on sample, and charged particle beam system
09/10/2009US20090224188 Radiation image detecting apparatus
09/10/2009US20090224170 Scanning electron microscope
09/10/2009US20090224166 Radiation image device
09/10/2009US20090224165 Radiation imaging device
09/10/2009US20090224152 Method and apparatus for measuring dimension using electron microscope
09/10/2009US20090224151 Detector and inspecting apparatus
09/09/2009EP2098891A2 Methods, a processor, and a system for improving an accuracy of identification of a substance
09/09/2009CN201307095Y Centering mechanism of X-ray tyre detector
09/09/2009CN101526488A Method for analyzing components of iron ore by using X-ray fluorescence spectrum
09/09/2009CN101526487A A method, a processor and a system for improving an accuracy of identification of a substance
09/09/2009CN101526486A Anti-electromagnetic radiation textile simulating and testing instrument
09/09/2009CN100538349C Nano level high resolution stress measuring method
09/08/2009US7587700 Process monitoring system and method for processing a large number of sub-micron measurement targets
09/08/2009US7587026 Systems and methods for determining a packing fraction of a substance
09/08/2009US7587025 X-ray analysis apparatus and X-ray analysis method
09/08/2009US7587024 Particle beam irradiation system
09/08/2009US7587023 Method and apparatus for achieving optimal radiation dose in coronary CT angiography using standard deviation of CT number
09/08/2009US7587021 Computer tomography apparatus
09/08/2009US7586093 Apparatus and method for inspecting a sample of a specimen by means of an electron beam
09/03/2009WO2009108628A2 Sample module with sample stream spaced from window, for x-ray analysis system
09/03/2009WO2009107575A1 Device for nondestructively examining composite structure and nondestructive examination method
09/03/2009WO2009107464A1 Nuclear material detection device, nuclear material inspection system, and clearance device
09/03/2009WO2009106304A1 X-ray computer tomograph and method for analyzing an object by means of x-ray computer tomography
09/03/2009US20090222753 Defect inspection tool and method of parameter tuning for defect inspection tool
09/03/2009US20090220047 Hybrid Bandgap Engineering For Super-Hetero-Epitaxial Semiconductor Materials, and Products Thereof
09/03/2009US20090220045 Portable X-Ray Fluorescence Instrument with Tapered Absorption Collar
09/03/2009US20090218529 Radiation image capturing system, radiation image capturing method, and program
09/03/2009US20090218512 Ultraviolet treatment device
09/03/2009US20090218491 Sample dimension inspecting/measuring method and sample dimension inspecting/measuring apparatus
09/03/2009US20090218490 Apparatus and method of semiconductor defect inspection
09/03/2009US20090218489 Systems and methods for material treatment and characterization employing positron annihilation
09/03/2009US20090218488 Beam positioning for beam processing
09/02/2009EP2096431A1 Portable X-ray fluorescence analyzer
09/02/2009EP2095157A1 A method for downhole, non -isotopic generation of neutrons and an apparatus for use when practising the method
09/02/2009EP2095098A1 Sample support structure and methods
09/02/2009EP2095097A2 Dual source xrf system
09/02/2009EP2095096A1 Energetic material detector
09/02/2009EP1644700A4 Methods and devices for charge management for three-dimensional and color sensing
09/02/2009EP1468276B1 X-ray diffraction method
09/02/2009EP1428006A4 Method and apparatus for scanned instrument calibration
09/02/2009EP1195177A4 Roentgen device for localization and radiation therapy of cancellation cancers
09/02/2009CN101520450A Manufacture method of zinc-iron alloy standard template
09/02/2009CN101520423A X-ray fluorescence analyzer
09/02/2009CN101520422A X-ray fluorescence analyzer
09/02/2009CN101520421A Modeling method of soil heavy metal content detection model and application thereof
09/01/2009US7584012 Automatic defect review and classification system
09/01/2009US7583830 Method for correcting image artifacts due to detector overexposure in computed tomography
09/01/2009US7583788 Measuring device for the shortwavelength x ray diffraction and a method thereof
09/01/2009US7583785 Detecting apparatus and method for detecting an object by means of a projection through the object by means of x-rays, and a contrast—and noise-optimized quantum counting detector
09/01/2009US7582868 Method of nano thin film thickness measurement by auger electron spectroscopy
09/01/2009US7582182 Method and apparatus for measuring electron density of plasma and plasma processing apparatus
08/2009
08/27/2009WO2009105331A2 3d imaging of live cells with utraviolet radiation
08/27/2009WO2009104560A1 X-ray imaging apparatus and x-ray source used therein
08/27/2009US20090216373 Mobile Device for Irradiation and Detection of Radiation
08/27/2009US20090213993 Methods and apparatus for the identification of molecular and crystalline materials by the doppler broadening of nuclear states bound in molecules, crystals and mixtures using nuclear resonance fluorescence
08/27/2009US20090213992 Vertical/horizontal small angle x-ray scattering apparatus and method for measuring small angle x-ray scattering
08/27/2009US20090213990 X-ray apparatus
08/27/2009US20090213989 System and method for xrd-based threat detection
08/27/2009US20090213988 Sample module with sample stream spaced from window, for x-ray analysis system
08/27/2009US20090213984 Computed Tomography Systems and Related Methods Involving Post-Target Collimation
08/27/2009US20090213368 Tunable spectroscopic enhancement via transformation of electroless plating into metal films with predictably adjustable optical features
08/27/2009US20090212242 Microscope System and VS Image Production and Program Thereof
08/27/2009US20090212215 Scanning electron microscope and method of measuring pattern dimension using the same
08/27/2009US20090212214 Sample inspection apparatus
08/27/2009US20090212213 Projection electron beam apparatus and defect inspection system using the apparatus