Patents
Patents for G01B 9 - Instruments as specified in the subgroups and characterised by the use of optical measuring means (14,810)
09/2009
09/10/2009US20090225324 Apparatus for providing endoscopic high-speed optical coherence tomography
09/10/2009DE102008020584B3 Object's upper surface area testing method, involves determining phases of wave fronts with wavelengths, and detecting synthetic wave front, which corresponds to different reciprocal value of wavelengths of phases
09/09/2009EP2098490A1 Method for finishing surface of preliminary polished glass substrate
09/09/2009EP2097712A2 Interferometry testing of lenses, and systems and devices for same
09/09/2009EP2096990A1 An imaging system with two imaging modalities
09/09/2009CN201306998Y Second grade gauge block contact type laser interferometer
09/09/2009CN100538260C Micro-displacement high accuracy real-time interferometry instrument
09/09/2009CN100538259C Gas discharge MOPA laser spectral analysis module
09/09/2009CN100538258C Optical bandwidth meter for very narrow bandwidth laser emitted light
09/08/2009US7587049 Active stabilization of a one-way QKD system
09/08/2009US7586620 Methods and systems for interferometric analysis of surfaces and related applications
09/08/2009US7586072 Correlation operation method, correlation operation device, focus detection device and imaging device
09/03/2009WO2009106884A1 Multiple path interferometer and method
09/03/2009WO2009105904A1 Method and apparatus for evaluating an interferometric measurement variable
09/03/2009US20090221920 Low-coherence interferometry and optical coherence tomography for image-guided surgical treatment of solid tumors
09/03/2009US20090219546 Interferometric Gravity Sensor
09/03/2009US20090219544 Systems, methods and computer-accessible medium for providing spectral-domain optical coherence phase microscopy for cell and deep tissue imaging
09/03/2009US20090219543 Contra-propagative wave spectograph
09/03/2009US20090219542 Method for Evaluating A Measured Parameter
09/03/2009US20090219541 Lensless imaging with reduced aperture
09/03/2009US20090219499 Surface shape measuring apparatus, exposure apparatus, and device manufacturing method
09/03/2009US20090219494 Evaluation method, evaluation apparatus, and exposure apparatus
09/03/2009DE10202738B4 Phasenverschiebungsstreifenanalyseverfahren und eine dieses Verfahren verwendende Vorrichtung Phase shifting fringe analysis method and apparatus of this method using
09/03/2009DE102007036309B4 Optisches Abbildungssystem und Verfahren zum Ermitteln dreidimensionaler Amplituden- und/oder Phasenverteilungen An optical imaging system and method for determining three-dimensional amplitude and / or phase distributions
09/03/2009CA2713914A1 Method for evaluating a measured parameter
09/02/2009EP2095063A2 Carousel having liquid filled cells for optical testing of ophathalmic lenses
09/02/2009EP1853874B1 Interferometer for determining characteristics of an object surface
09/02/2009EP1658470B1 Optical measuring system for recording the geometrical data of surfaces
09/02/2009CN101520320A Aspheric aperture splicing measuring device based on spherical air-bearing shafts
09/02/2009CN101520306A Spatial carrier based interference confocal measuring device and method
09/02/2009CN101520305A Instantaneous phase-shifting secondary interference confocal measuring device and method
09/02/2009CN101520304A Phase-shifting secondary interference confocal soft-pinhole detection device and method
09/01/2009US7583710 Laser and environmental monitoring system
09/01/2009US7583390 Accelerometer comprising an optically resonant cavity
09/01/2009US7583385 Optical tomography system
09/01/2009US7583368 Method of enhancing measurement of stress in glass
08/2009
08/27/2009WO2009105188A1 Apparatus and method for measuring surface topography of an object
08/27/2009WO2009103172A1 Electro-optical distance-measuring unit
08/27/2009US20090213389 Wavefront aberration measuring method, mask, wavefront aberration measuring device, exposure apparatus, and device manufacturing method
08/27/2009US20090213388 Measurement method and measurement reticle
08/27/2009US20090213386 Apparatus and method for measuring surface topography of an object
08/27/2009US20090213385 Multi-Phase Interferometer
08/27/2009US20090213384 Sensor, multichannel sensor, sensing apparatus, and sensing method
08/27/2009US20090212201 Method of measuring relative movement in two dimensions of an object and an optical input device using a single self-mixing laser
08/27/2009DE102006029539B4 Verlustloses Kompressionsverfahren für Interferogramme Lossless compression methods for interferograms
08/27/2009CA2711541A1 Electro-optical distance-measuring unit
08/26/2009EP1658516A4 Improved bandwidth estimation
08/26/2009EP0760932B2 Apparatus for detecting relative movement
08/25/2009US7580586 Enhanced recovery of low spatial frequency spectral information in a Fizeau Fourier transform spectrometer
08/25/2009US7580135 Chromatic compensation in Fizeau interferometer
08/25/2009US7580134 Method of measuring micro-structure, micro-structure measurement apparatus, and micro-structure analytical system
08/25/2009US7580132 Optical device for measuring a doppler frequency shift
08/25/2009US7580122 Image inspection method by polarized compensation for deformation of lens
08/25/2009CA2465311C Optical displacement sensor
08/20/2009WO2009103015A2 An interferometer employing a multi-waveguide optical loop path and fiber optic rotation rate sensor employing same
08/20/2009WO2009080998A3 High-resolution surface plasmon microscope with heterodyne interferometry in radial polarization mode
08/20/2009WO2009079334A3 Analyzing surface structure using scanning interferometry
08/20/2009US20090210971 Displacement Measurement Method and Apparatus Thereof, Stage Apparatus, and Probe Microscope
08/20/2009US20090207419 Large areas undistorted imaging apparatus for light speckles and method thereof
08/20/2009US20090207418 Absolute distance measurement method and system using optical frequency generator
08/20/2009US20090207417 High Intensity Fabry-Perot Sensor
08/20/2009US20090207416 Surface characteristic determining apparatus
08/20/2009US20090207415 Method of reading information from a holographic data storage medium and holographic data read out device
08/20/2009US20090207414 Apparatus and method for optical coherence tomography
08/20/2009US20090207403 Method of measuring front and back surfaces of target object
08/19/2009EP1830710A4 Device, system, and method for optical in-vivo analysis
08/19/2009CN101512286A Method and device for generating a synthetic wavelength
08/19/2009CN100529656C Method for measuring article profile using electronic speckle interferometry and carrier-frequency modulation
08/18/2009US7576870 Measurement apparatus, exposure apparatus, and device fabrication method
08/18/2009US7576867 Position sensitive detectors in wavelength monitoring
08/18/2009US7576866 Optical tomography system
08/18/2009US7576865 Optical coherent tomographic (OCT) imaging apparatus and method using a fiber bundle
08/18/2009US7576864 Interferometric measuring device for recording geometric data for surfaces
08/18/2009US7576840 Brillouin spectral measuring method and Brillouin spectral measuring apparatus
08/18/2009US7576308 Mosaic imager using wave front control
08/13/2009WO2009099530A2 System and method for assembly inspection
08/13/2009WO2009098516A2 Camera adapter based optical imaging apparatus
08/13/2009WO2009098126A1 Interferometer
08/13/2009US20090204110 Broadband or Mid-Infrared Fiber Light Sources
08/13/2009US20090201512 Compact achromatic optical interferometer of the three-wave lateral shearing type
08/13/2009US20090201509 Interferometer using vertical-cavity surface-emitting lasers
08/13/2009US20090199630 Fiber optic sensor system using white light interferometery
08/13/2009DE102008008559A1 Interferometer Interferometer
08/13/2009DE102006007573B4 Verfahren und Vorrichtung zur 3D-Geometrieerfassung von Objektoberflächen Method and apparatus for 3D geometry acquisition of object surfaces
08/12/2009EP2087308A2 Multiple beam source for a multi-beam interferometer and multi-beam interferometer
08/12/2009EP0581871B2 Apparatus for optical imaging and measurement
08/12/2009CN100526830C Wave front aberration measuring device
08/12/2009CN100526795C Image pickup apparatus equipped with a microscope and size measuring apparatus
08/11/2009US7574253 Signal processing using non-linear regression with a sinusoidal model
08/11/2009US7573581 Position-measuring device
08/11/2009US7573580 Optical position measuring system and method using a low coherence light source
08/11/2009US7573579 Coded aperture imaging photopolarimetry
08/11/2009US7573578 Micro-electromechanical system Fabry-Perot filter mirrors
08/11/2009US7573577 Spatial heterodyne wide-field Coherent Anti-Stokes Raman spectromicroscopy
08/11/2009US7573020 Optoelectronic probe system with all-optical coupling
08/06/2009WO2008151155A3 Polarization-sensitive spectral interferometry
08/06/2009US20090196477 Process, System And Software Arrangement For A Chromatic Dispersion Compensation Using Reflective Layers In Optical Coherence Tomography (OCT) Imaging
08/06/2009US20090195789 Biosensing Apparatus And Method Using Optical Interference
08/06/2009US20090195786 Device for inspecting semi-conductor wafers
08/05/2009EP2084490A1 Self-mixing optical coherence detector without an external beamsplitter
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