| Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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| 07/04/2006 | US7071566 Multi-substrate package assembly |
| 07/04/2006 | US7071460 Optical non-contact measuring probe |
| 07/04/2006 | US7069664 Portable coordinate measurement machine |
| 07/04/2006 | US7069660 Gradient calculating camera board |
| 07/04/2006 | CA2375457C Method and apparatus improving performance of aperture monitoring system |
| 06/30/2006 | CA2531895A1 Defining and checking conformance of an object shape to shape requirements |
| 06/30/2006 | CA2531863A1 Determining the position and angular orientation of food products |
| 06/29/2006 | WO2006068949A1 Thin film thickness measurement method and apparatus |
| 06/29/2006 | WO2006068906A1 Sensor and methods for measuring select components in sheetmaking systems |
| 06/29/2006 | WO2006068288A1 Method for measuring position of mask surface in height direction, exposure apparatus and exposure method |
| 06/29/2006 | WO2006068217A1 Three-dimensional shape measuring instrument |
| 06/29/2006 | WO2005062826A3 Method and apparatus for absolute metrology |
| 06/29/2006 | US20060143006 Speech recognition apparatus and speech recognition method |
| 06/29/2006 | US20060141374 Lithographic apparatus with multiple alignment arrangements and alignment measuring method |
| 06/29/2006 | US20060140484 Method and equipment for measuring feature points of wave signal |
| 06/29/2006 | US20060140470 Inspection device for mouth of container |
| 06/29/2006 | US20060139660 Lithographic apparatus, device manufacturing method and device manufactured thereby |
| 06/29/2006 | US20060139659 Modular fixture and sports lighting system |
| 06/29/2006 | US20060139658 Inspection method for warpage of rod and inspection apparatus therefor |
| 06/29/2006 | US20060139656 Overlapping common-path interferometers for two-sided measurement |
| 06/29/2006 | US20060139655 Method and system for on-line measurement of thickness and birefringence of thin plastic films |
| 06/29/2006 | US20060139643 Alignment method of using alignment marks on wafer edge |
| 06/29/2006 | US20060139642 Lithographic apparatus with two-dimensional alignment measurement arrangement and two-dimensional alignment measurement method |
| 06/29/2006 | US20060139641 Optical reader system and method for monitoring and correcting lateral and angular misalignments of label independent biosensors |
| 06/29/2006 | US20060139626 Optical inclination sensor |
| 06/29/2006 | US20060139619 Distance calculation device and calculation program |
| 06/29/2006 | US20060138410 Method for measuring information about a substrate, and a substrate for use in a lithographic apparatus |
| 06/29/2006 | DE202005002622U1 Optical position sensor has reference scale with zones of different reflectivity and sensor plate of different transmission to generate reference pulse |
| 06/29/2006 | DE19544253B4 Verfahren zur Dispersionskompensation bei Interferometern mit nicht symmetrisch zum Referenzstrahlengang ausgefühltem Objektstrahlengang Methods for dispersion compensation in interferometers with non symmetric to the complete product reference beam path object beam path |
| 06/29/2006 | DE102004061177A1 Construction unit calibrating device, has triangulation sensors arranged on measuring section under formation of position mismatch for determination of high and transverse profiles in section |
| 06/29/2006 | DE10131778B4 Optische Messvorrichtung Optical measuring device |
| 06/29/2006 | CA2591885A1 Thin film thickness measurement method and apparatus |
| 06/29/2006 | CA2591739A1 Sensor and methods for measuring select components in sheetmaking systems |
| 06/28/2006 | EP1674851A2 Near field analysis apparatus |
| 06/28/2006 | EP1674824A1 Apparatus and method for detecting lens thickness |
| 06/28/2006 | EP1674822A1 Device and method for non-contact scanning of contact lens mold geometry |
| 06/28/2006 | EP1674234A2 Method and apparatus for handling parts ejected from an injection molding machine |
| 06/28/2006 | EP1673588A1 Measuring device and measuring method for verifying the cut quality of a sheet |
| 06/28/2006 | EP1310763B1 Method and device for detecting crankshaft installation position, and program for detecting the installation position |
| 06/28/2006 | EP1106043B9 Procedure and system for inspecting a component with leads to determine its fitness for assembly |
| 06/28/2006 | CN2791599Y Digital correlation displacement measuring instrument for circular lighting |
| 06/28/2006 | CN2791598Y Micro abnormal-shape pipece automatic detecting device |
| 06/28/2006 | CN1795536A Position information measuring method and device, and exposure method and system |
| 06/28/2006 | CN1795365A Method and apparatus for testing fibers |
| 06/28/2006 | CN1795364A Pickup image processing device of electronic part mounting device and pickup image processing method |
| 06/28/2006 | CN1795363A Method for contactlessly and dynamically detecting the profile of a solid body |
| 06/28/2006 | CN1794440A Detection of silicon chip state in box and its center relocation method |
| 06/28/2006 | CN1794010A Position posture tracing system |
| 06/28/2006 | CN1793876A Stereo leathe shrinking temperature defecting instrument |
| 06/28/2006 | CN1793843A Humidity distribution type sensing method and equipment based on optical fiber Bragg grating |
| 06/28/2006 | CN1793780A Measuring splice method and device of large three-dimensional body shape based on splicing target |
| 06/28/2006 | CN1793779A Transmission intensity modulation optical fiber sensor |
| 06/28/2006 | CN1793778A Displacement detector |
| 06/28/2006 | CN1261908C Method and system for detecting defects on a printed circuit board |
| 06/28/2006 | CN1261759C Dynamic-changeable detection method, dynamic changeable detection device and supersonic diagnosis device |
| 06/28/2006 | CN1261751C Inspecting method for end faces of brittle-material-made substrate and device therefor |
| 06/28/2006 | CN1261738C Array aiming adjusting device of fiber-optic collimating apparatus |
| 06/28/2006 | CN1261737C Measuring devices |
| 06/28/2006 | CN1261736C Line Profile asymmetry measurement using scatter-metering |
| 06/28/2006 | CN1261735C Position bar for measuring light guide plate nod and measuring method thereof |
| 06/28/2006 | CN1261734C Zoned split joint multiple He-Ne laser digital speckle interference measuring system |
| 06/27/2006 | USRE39145 Method and apparatus for in-situ monitoring of plasma etch and deposition processes using a pulsed broadband light source |
| 06/27/2006 | US7069182 Database interpolation method for optical measurement of diffractive microstructures |
| 06/27/2006 | US7069153 CD metrology method |
| 06/27/2006 | US7068426 Method of calibrating a stereomicroscope and a stereomicroscope capable of being calibrated |
| 06/27/2006 | US7068379 Compact optical contour digitizer |
| 06/27/2006 | US7068378 Apparatus and method for measuring amount of projection of abrasive grain on grinding tool |
| 06/27/2006 | US7068377 System and method for surface profiling a target object |
| 06/27/2006 | US7068376 Interferometry method and apparatus for producing lateral metrology images |
| 06/27/2006 | US7068371 Methods and apparatus for aligning a wafer in which multiple light beams are used to scan alignment marks |
| 06/27/2006 | US7068364 Pattern inspection apparatus |
| 06/27/2006 | US7068359 Contactless system for measuring centricity and diameter |
| 06/27/2006 | US7068317 Photoelectric conversion apparatus |
| 06/27/2006 | US7067826 Position detection method and apparatus |
| 06/27/2006 | US7067784 Programmable lens assemblies and optical systems incorporating them |
| 06/27/2006 | US7066611 Alignment with linear array of receptors |
| 06/27/2006 | US7066005 Noncontact sensitivity and compliance calibration method for cantilever-based insturments |
| 06/27/2006 | US7065889 Tool and a method for assessing an indicator mark position |
| 06/22/2006 | WO2006066255A2 System and method for inspecting a workpiece surface using surface structure spatial frequencies |
| 06/22/2006 | WO2006065437A2 Laser triangulation method for measurement of highly reflective solder balls |
| 06/22/2006 | WO2006064428A1 Method and apparatus for reducing probe wavelength in laser excited surface acoustic wave spectroscopy |
| 06/22/2006 | WO2006064181A1 Structural joint strain monitoring apparatus and system |
| 06/22/2006 | WO2006063543A1 Device for measuring parts by triangulation sensors and an evaluation unit for determining |
| 06/22/2006 | WO2006063496A1 A method of shoemaking for whole custom-made type |
| 06/22/2006 | WO2006045867A3 Mechanical-electronic system for the laser measurement of the thickness of moving sheets with perpendicularity correction |
| 06/22/2006 | WO2006007320A3 Vehicle air bag electrical system |
| 06/22/2006 | US20060136096 Navigational control system for a robotic device |
| 06/22/2006 | US20060133692 Angle de-skew device and method thereof |
| 06/22/2006 | US20060132808 Thin thickness measurement method and apparatus |
| 06/22/2006 | US20060132807 Periodic patterns and technique to control misalignment between two layers |
| 06/22/2006 | US20060132806 Parametric profiling using optical spectroscopic systems to adjust processing parameter |
| 06/22/2006 | US20060132805 Light beam switch system for locating the edge of a workpiece |
| 06/22/2006 | US20060132804 System and method to decrease probe size for improved laser ultrasound detection |
| 06/22/2006 | US20060132803 Method and apparatus for combining a targetless optical measurement function and optical projection of information |
| 06/22/2006 | US20060132802 Imaging system for three-dimensional reconstruction of surface profiles |
| 06/22/2006 | US20060132801 Laser triangulation method for measurement of highly reflective solder balls |
| 06/22/2006 | US20060132800 Image processing type of measuring device, lighting system for the same, lighting system control method, lighting system control program, and a recording medium with the lighting system control program recorded therein |
| 06/22/2006 | US20060132799 Digital holographic microscope |
| 06/22/2006 | US20060132798 Method and apparatus for determining endpoint of semiconductor element fabricating process |
| 06/22/2006 | US20060132797 Method and apparatus for measuring thickness of thin article |