| Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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| 01/09/2007 | CA2455066C Method of and apparatus for the inspection of vehicle wheel alignment |
| 01/09/2007 | CA2368320C Instrument for measuring physical property of sample |
| 01/09/2007 | CA2318626C Calibration and compensation of robot-based gauging system |
| 01/04/2007 | WO2007001653A2 Reticle alignment technique |
| 01/04/2007 | WO2007001327A2 Apparatus and methods for scanning conoscopic holography measurements |
| 01/04/2007 | WO2007000909A1 Method for forming master data for inspecting protruding and recessed figure |
| 01/04/2007 | WO2007000891A1 Laser rangefinder |
| 01/04/2007 | WO2007000890A1 Image position measuring apparatus and exposure apparatus |
| 01/04/2007 | WO2007000730A1 Mapping a surface profile |
| 01/04/2007 | WO2007000165A1 Online recording of wavelength absorption spectra in meat |
| 01/04/2007 | WO2007000045A1 Method and apparatus for detecting overlapped substrates |
| 01/04/2007 | WO2007000010A1 A system and method for measuring and mapping a surface relative to a reference |
| 01/04/2007 | WO2005079194A3 Optical beam translation device and method utilizing a pivoting optical fiber |
| 01/04/2007 | US20070005295 Method of inspecting the profile of the connection zone between the cylindrical portion and the taper of a roller for a turbomachine roller bearing |
| 01/04/2007 | US20070005293 Method and apparatus for calibration of camera system, and method of manufacturing camera system |
| 01/04/2007 | US20070003945 Method for manufacturing a biosensor element and for testing the same |
| 01/04/2007 | US20070002337 Modeling and measuring structures with spatially varying properties in optical metrology |
| 01/04/2007 | US20070002336 Metrology apparatus, lithographic apparatus, process apparatus, metrology method and device manufacturing method |
| 01/04/2007 | US20070002335 Laser index device on tool shaft of machine |
| 01/04/2007 | US20070002334 Method and system for measuring the curvature of an optical surface |
| 01/04/2007 | US20070002333 Interferometric apparatus for measuring moving object and optical interferometry method for measuring moving object |
| 01/04/2007 | US20070002332 System and methods for wavefront measurement |
| 01/04/2007 | US20070002331 In line thickness measurement |
| 01/04/2007 | US20070002330 Apparatus and methods for reducing non-cyclic non-linear errors in interferometry |
| 01/04/2007 | US20070002327 Fourier domain optical coherence tomography employing a swept multi-wavelength laser and a multi-channel receiver |
| 01/04/2007 | US20070002323 Mark position detection apparatus |
| 01/04/2007 | US20070002322 Image inspection method |
| 01/04/2007 | US20070002304 Stereoscopic Targeting, Tracking and Navigation Device, System and Method |
| 01/04/2007 | DE202006017076U1 Vorrichtung zur Inspektion einer Rohrleitung Apparatus for inspecting a pipeline |
| 01/04/2007 | DE19780107B4 Vorrichtung zum Erkennen biologischer Signale An apparatus for detecting biological signals |
| 01/04/2007 | DE10351142B4 Vorrichtungen und Verfahren zur Messung von thermisch induzierten Oberflächendeformationen Devices and methods for the measurement of thermally induced deformations surface |
| 01/04/2007 | DE10308042B4 Verfahren zur Bestimmung des Verlaufs einer beliebig geformten Linie im Raum A method for determining the course of an arbitrarily shaped line in space |
| 01/04/2007 | DE102006024179A1 Angle encoder has laser source split into three beams and focussed on reflecting coding disc with quarter wave deep impressed pattern on marking rings |
| 01/04/2007 | DE102005031216A1 Electronic component surface shape recording procedure uses white light interferometer with in pixel processing using incoherent demodulation |
| 01/04/2007 | DE102005029917A1 Positionsmesseinrichtung The position measuring device |
| 01/04/2007 | DE102005029553A1 Positionsmesseinrichtung und Verfahren zur Kontrolle von Abtastsignalen der Positionsmesseinrichtung The position measuring device and method for controlling scanning signals the position measuring device |
| 01/04/2007 | DE102004051842B4 Bemassung eines ausgedehnten Defekts Dimensioning of an extended defect |
| 01/04/2007 | DE10023172C5 Verfahren und Vorrichtung zur Messung der Unrundheit von länglichen Werkstücken Method and apparatus for measuring the runout of elongate workpieces |
| 01/04/2007 | CA2613526A1 A system and method for measuring and mapping a surface relative to a reference |
| 01/03/2007 | EP1739493A1 Metrology apparatus for lithography |
| 01/03/2007 | EP1739410A1 Systems and methods for determining the location and angular orientation of a hole with an obstructed opening residing on a surface of an article |
| 01/03/2007 | EP1739409A1 Thermal imaging and laser scanning systems and methods for determining the location and angular orientation of a hole with an obstructed opening residing on a surface of an article |
| 01/03/2007 | EP1739388A1 Method for manufacturing a biosensor element and for testing the same |
| 01/03/2007 | EP1738636A2 Straw chopper for combine with adjustable knife bank |
| 01/03/2007 | EP1738137A1 Instrument for measuring the thickness of a coating on bottles |
| 01/03/2007 | EP1738136A1 Measuring apparatus and method in a distribution system |
| 01/03/2007 | EP1738135A1 Method and device for hyperacute detection of an essentially rectilinear contrast edge and system for fine following and fixing of said contrast edge |
| 01/03/2007 | EP1737402A2 Calibrating laser beam position and shape using an image capture device |
| 01/03/2007 | EP1682936A4 Laser projection systems and method |
| 01/03/2007 | EP1476797A4 Method and system for visualizing surface errors |
| 01/03/2007 | EP1290485B1 Method for measuring surface topography in a quantitative and optical manner |
| 01/03/2007 | CN2854512Y High precision dust-proof calibrate instrument |
| 01/03/2007 | CN2854511Y Calibrate instrument capable of regulating radial |
| 01/03/2007 | CN2854510Y Portable hot-rolled steel rod on-line detector and its optical signal conduction device |
| 01/03/2007 | CN2854509Y Filter bar circulation measuring display control device |
| 01/03/2007 | CN2854496Y Laser calliper |
| 01/03/2007 | CN1890531A Noncontact three-dimensional measuring method and device |
| 01/03/2007 | CN1888820A Characteristic sampling method in photographic measurement |
| 01/03/2007 | CN1888819A Sub-picture element level outline extracting method in photographic measurement |
| 01/03/2007 | CN1888818A Sinusoidal fringe structural optical projector based on acousto-optic deflection device |
| 01/03/2007 | CN1888817A Body surface three-dimensional topographic information measuring device |
| 01/03/2007 | CN1888816A Extender high-light folding feedback displacement measuring system |
| 01/03/2007 | CN1888815A Projecting structural optical space position and shape multi-point fitting calibrating method |
| 01/03/2007 | CN1888814A Multi-viewpoint attitude estimating and self-calibrating method for three-dimensional active vision sensor |
| 01/03/2007 | CN1888813A Image obtaining apparatus |
| 01/03/2007 | CN1293618C Rotary etcher with thickness measuring system |
| 01/03/2007 | CN1293362C Moire projecting 3D surface shape measuring method and equipment |
| 01/03/2007 | CN1293361C Arrangement in a measuring system |
| 01/02/2007 | US7158915 Apparatus and method for displaying numeric values corresponding to the volume of segments of an irregularly shaped item |
| 01/02/2007 | US7158914 Precision surface measurement |
| 01/02/2007 | US7158690 Enhancing the resolution of measurement systems employing image capturing systems to measure lengths |
| 01/02/2007 | US7158665 Image processing device for stereo image processing |
| 01/02/2007 | US7158664 Image recognition apparatus |
| 01/02/2007 | US7158280 Methods and systems for improved boundary contrast |
| 01/02/2007 | US7158265 Method of calibrating an engraving machine |
| 01/02/2007 | US7158242 Method to determine the volume of small, spherical moving objects |
| 01/02/2007 | US7158241 Method for calibration and certifying laser projection beam accuracy |
| 01/02/2007 | US7158240 Measurement device and method |
| 01/02/2007 | US7158239 Optical method of examining reliefs on a structure |
| 01/02/2007 | US7158236 Heterodyne laser interferometer for measuring wafer stage translation |
| 01/02/2007 | US7158235 System and method for inspection using white light interferometry |
| 01/02/2007 | US7158234 Optical scanning observation apparatus |
| 01/02/2007 | US7158233 Alignment mark, alignment apparatus and method, exposure apparatus, and device manufacturing method |
| 01/02/2007 | US7158232 Substrate processing apparatus |
| 01/02/2007 | US7157726 Method and apparatus for measuring shape of sheet |
| 01/02/2007 | US7155835 Self-leveling laser alignment tool and method thereof which compensates for material stiffness of an included pendulum |
| 12/28/2006 | WO2006138220A1 Method and apparatus for determining the straightness of tubes and bars |
| 12/28/2006 | WO2006137448A1 Sample expansion/contraction amount measuring system and sample expansion/contraction amount measuring method |
| 12/28/2006 | WO2006137396A1 Exposing method and device |
| 12/28/2006 | WO2006137385A1 Film inspection apparatus and method |
| 12/28/2006 | WO2006136030A1 Method and apparatus for measuring a thickness of a thin film in motion |
| 12/28/2006 | WO2006135948A1 Method for analysing the surface properties of a material |
| 12/28/2006 | WO2006091840A9 Apparatus and method for enhanced critical dimension scatterometry |
| 12/28/2006 | WO2006023612A3 Sub-nanometer overlay, critical dimension, and lithography tool projection optic metrology systems based on measurement of exposure induced changes in photoresist on wafers |
| 12/28/2006 | WO2005065091A3 Method for calibrating the geometry of a multi-axis metrology system |
| 12/28/2006 | US20060293865 Method and apparatus for direct image pick-up of granular speck pattern generated by reflecting light of laser beam |
| 12/28/2006 | US20060291719 Image processing apparatus |
| 12/28/2006 | US20060291059 Gap monitor arrangement |
| 12/28/2006 | US20060290947 Optical metrology model optimization for repetitive structures |
| 12/28/2006 | US20060290946 System and method for measuring roundness |