G01B 11 - Measuring arrangements characterised by the use of optical means

Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
11/2006
11/16/2006	DE102006017833A1 Erscheinungsprüfungsvorrichtung und Erscheinungsprüfungsverfahren Appearance inspection apparatus and appearance inspection method
11/16/2006	DE102006005874A1 Contactless cylinder measurement unit has lamps generating lines on surface and orthogonal shadows for multiple line triangulation
11/16/2006	DE102005035700A1 Measuring equipment determines relative position of positioning table, movable in coordinate directions, which incorporates laser light operated interferometric measuring devices
11/16/2006	DE102005023302A1 Semiconductor wafer sample reflecting surface curvature measurement unit has birefringent element splitting lamp beam into two
11/16/2006	DE102005022819A1 Verfahren zur Bestimmung der absoluten Dicke von nicht transparenten und transparenten Proben mittels konfokaler Messtechnik A method for determining the absolute thickness of transparent and non-transparent specimen by confocal measurement technology
11/16/2006	DE102005022095A1 Verfahren und Vorrichtung zur Bestimmung einer lateralen Relativbewegung zwischen einem Bearbeitungskopf und einem Werkstück Method and apparatus for determination of a lateral relative movement between a machining head and a workpiece
11/16/2006	DE102005021783A1 Micro interferometer for micro roughness measurements on lithographic system optics has reference mirror generally curved to match object under test
11/16/2006	DE102005021594A1 Adhesive bead detector, illuminates bead from both sides and determines height and position of profile apex from transition region of different light
11/16/2006	DE102005021254A1 Sensor device for determining position of object, e.g for testing circuit board conveyor, has optical transmitters and receivers, with object casting position-dependent shadow on sensor surfaces
11/16/2006	DE102005000060A1 Handhabbares Flächenkoordinatenmessgerät Manageable surface coordinate measuring machine
11/16/2006	DE102004055561B4 Sensor und Verfahren zur berührungslosen Längenabschnittsmessung von Langprodukten und bahnartigen Gütern Sensor and method for contactless measurement length portion of long products and sheet-like materials
11/15/2006	EP1722191A1 Distance determination
11/15/2006	EP1721137A1 Method and apparatus for producing an image containing depth information
11/15/2006	EP1721121A1 Device and method for measuring the thickness of a transparent sample
11/15/2006	EP1721117A1 Sensing head for a coordinate measuring device
11/15/2006	EP1328195A4 Frameless radiosurgery treatment system and method
11/15/2006	EP1285222A4 Interferometric apparatus and method
11/15/2006	CN1864061A System and method of imaging the characteristics of an object
11/15/2006	CN1863611A Method of measuring misalignment of multi-stage rolling mill and measuring device therefor
11/15/2006	CN1862382A A sensor for use in a lithographic apparatus
11/15/2006	CN1862304A Decline measuring device for imaging element and its measuring method
11/15/2006	CN1862223A Repeat angle positioning method for rotary body
11/15/2006	CN1862222A Laser self-collimation zero reference error angle measuring method
11/15/2006	CN1862221A Calibrating method for laser self-collimation angle measuring system
11/15/2006	CN1862220A Interferometry measurement in disturbed environments
11/15/2006	CN1861317A Device and method for workpiece calibration
11/14/2006	US7136728 Computerized wheel alignment system with improved stability and serviceability
11/14/2006	US7136519 Specimen topography reconstruction
11/14/2006	US7136233 Device for the generation and projection of light marks
11/14/2006	US7136173 Method and apparatus for end-point detection
11/14/2006	US7136172 System and method for setting and compensating errors in AOI and POI of a beam of EM radiation
11/14/2006	US7136171 Method for the extraction of image features caused by structure light using template information
11/14/2006	US7136170 Method and device for determining the spatial co-ordinates of an object
11/14/2006	US7136169 Etalon testing system and process
11/14/2006	US7136168 Interferometric topological metrology with pre-established reference scale
11/14/2006	US7136166 Position sensor, method for detecting horizontal and vertical position, alignment apparatus including position sensor, and method for horizontal and vertical alignment
11/14/2006	US7136165 Substrate alignment apparatus and method, and exposure apparatus
11/14/2006	US7136164 Multiple beam ellipsometer
11/14/2006	US7135873 Digital time domain reflectometer system
11/14/2006	US7135858 System with distance sensor for measuring rotational speed of a body
11/14/2006	US7134688 Safety apparatus against automobile crash
11/14/2006	US7134465 Process and apparatus for identifying, tracking and handling lumber to be cut-in-two
11/14/2006	US7134343 Opto-acoustoelectric device and methods for analyzing mechanical vibration and sound
11/09/2006	WO2006118286A1 Space information detecting device, and space information detecting system using the device
11/09/2006	WO2006118134A1 Drawing apparatus and drawing method
11/09/2006	WO2006118057A1 Image display device
11/09/2006	WO2006118018A1 Flip chip mounting shift inspecting method and mounting apparatus
11/09/2006	WO2006117406A2 Identifying a gemstone
11/09/2006	WO2006116841A1 Method of on-line thickness measurement of applied coatings
11/09/2006	WO2006093752B1 Plurality of light sources for inspection apparatus and method
11/09/2006	WO2006091781B1 Apparatus and method for enhanced critical dimension scatterometry
11/09/2006	WO2006088698A3 Optical metrology of a structure formed on a semiconductor wafer using optical pulses
11/09/2006	WO2006002104A3 Small form factor pluggable module providing passive optical signal processing of wavelength division multiplexed signals
11/09/2006	US20060253943 Cantilever array, method for fabricating the same, scanning probe microscope, sliding apparatus of guiding and rotating mechanism, sensor, homodyne laser interferometer, laser doppler interferometer having optically exciting function for exciting sample, each using the same, and method for exciting cantilevers
11/09/2006	US20060252189 Method and apparatus for crystallizing semiconductor with laser beams
11/09/2006	US20060251319 Modelling of three dimensional shapes
11/09/2006	US20060250619 Method and system for interferometric height measurment
11/09/2006	US20060250618 Interferometer and method of calibrating the interferometer
11/09/2006	US20060250617 Lithographic apparatus, position quantity detection system and method
11/09/2006	US20060248967 Disk master producing method, disk master producing device, method for detecting difference in disk master travel distance, and device for detecting difference in disk master travel distance
11/09/2006	DE19818405B4 Verfahren zur Erfassung von Geometrieabweichungen wenigstens einer Achse eines Koordinatenmeßgerätes A method for detecting deviations in the geometry of at least one axis of a coordinate
11/09/2006	DE102006019623A1 Workpiece roundness measurement procedure uses rotatable optical probe splitting light beam to provide measurement and reference beam path length comparison
11/09/2006	DE102005032526A1 Sensor assembly for optically detecting edges of product, has row of locally defined, individually controlled point-type light sources located on one side of product and used in conjunction with at least one fiber-optic unit
11/09/2006	DE102005019367A1 Verfahren zur Vermessung eines solarthermischen Konzentrators Method for measuring a solar thermal concentrator
11/09/2006	DE10146499B4 Verfahren zur Optimierung der Abbildungseigenschaften von mindestens zwei optischen Elementen sowie Verfahren zur Optimierung der Abbildungseigenschaften von mindestens drei optischen Elementen Method for optimizing imaging properties of at least two of the optical elements as well as methods for optimizing imaging properties of at least three optical elements
11/09/2006	CA2605970A1 Method of on-line thickness measurement of applied coatings
11/08/2006	EP1719973A1 Three-dimensional shape measuring and analyzing device
11/08/2006	EP1719972A1 A method for measuring deformations in test specimens and a system for marking the test specimens
11/08/2006	EP1719971A1 Optical stacked structure inspecting method and optical stacked structure inspecting apparatus
11/08/2006	EP1719970A2 Method and apparatus for measuring wall thickness of a plastic container
11/08/2006	EP1719580A2 Laser projection systems and method
11/08/2006	EP1719001A1 Retroreflector covered by window
11/08/2006	EP1718957A1 Method and device for control by ombroscopy
11/08/2006	EP1718926A1 Device and method for determining spatial co-ordinates of an object
11/08/2006	EP1718925A1 Scanning head for a coordinate measuring device
11/08/2006	EP1335840B1 Height control system and sensor therefor
11/08/2006	EP1076226B1 Absolute value encoder
11/08/2006	CN2835994Y Tool for size identification
11/08/2006	CN1860361A Printed circuit board inspection system combining x-ray inspection and visual inspection
11/08/2006	CN1860346A Measuring device and measuring method for verifying the cut quality of a sheet
11/08/2006	CN1860345A Three-dimensional measuring instrument and three-dimensional measuring method
11/08/2006	CN1858554A Multispectral optical angle guage detecting calibrating instrument
11/08/2006	CN1858548A Method for measuring sedimentation size by optical fiber Bragg grating sensor
11/08/2006	CN1284072C Optical positioning system and method for computing this optical positioning system moving value
11/08/2006	CN1284063C Information processing method and information processing deivce
11/08/2006	CN1283979C Arrangement for detecting relative movements or relative positions of two objects, inductor using the arrangement, and keyboard containing the inductor
11/08/2006	CN1283978C Method and apparatus for angular measurement of plane angle
11/08/2006	CN1283977C Object detection device with operation monitoring function
11/07/2006	US7133574 Method for recognizing position of honeycomb structure
11/07/2006	US7133550 Pattern inspection method and apparatus
11/07/2006	US7133548 Method and apparatus for reticle inspection using aerial imaging
11/07/2006	US7133225 Method of manufacturing an optical system
11/07/2006	US7133140 Apparatus and measurement procedure for the fast, quantitative, non-contact topographic investigation of semiconductor wafers and other mirror like surfaces
11/07/2006	US7133137 Integrated scanning and ocular tomography system and method
11/07/2006	US7133132 Light-force sensor and method for measuring axial optical-trap forces from changes in light momentum along an optic axis
11/07/2006	US7132647 Optical encoder
11/07/2006	US7132640 Wave interrogated near field array system and method for detection of subwavelength scale anomalies
11/07/2006	US7131732 Projector apparatus, inclination angle obtaining method, and projection image correction method
11/02/2006	WO2006115292A1 Measuring apparatus, exposure apparatus and method, and device manufacturing method
11/02/2006	WO2006114955A1 Imaging position analyzing method

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