G01B 11 - Measuring arrangements characterised by the use of optical means

Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
12/2006
12/06/2006	CN2844844Y Digital glasses stress inspector
12/06/2006	CN1875258A Method for quality assurance of long timber
12/06/2006	CN1875246A Angle detection device and scan-type actuator using the same
12/06/2006	CN1875244A Azimuthal scanning of a structure formed on a semiconductor wafer
12/06/2006	CN1873374A System and method of guiding real-time inspection using 3d scanners
12/06/2006	CN1873372A Image measuring system and methods of generating and executing non-stop image measuring program
12/06/2006	CN1873371A Ur irradiation device
12/06/2006	CN1873370A X-ray inspection system having on-axis and off-axis sensors
12/06/2006	CN1873369A Test device and test method for optical information storage media
12/06/2006	CN1873295A Light source set in use for inspecting printing circuit board
12/06/2006	CN1288632C Inspection device and inspection method
12/06/2006	CN1288506C Method for manufacturing photoetching equipment and device
12/06/2006	CN1288421C Distance detecting apparatus, air bag system controlling apparatus, and method of detecting distance
12/06/2006	CN1288418C Measurement of hot container wall thickness
12/06/2006	CN1288417C Method for determining relative position of optical detection assembly and scanning platform
12/05/2006	US7146279 Measuring device
12/05/2006	US7146034 Tape manufacturing system
12/05/2006	US7145667 Semiconductor device manufacturing method, semiconductor device manufacturing apparatus, semiconductor device manufacturing system, and cleaning method for semiconductor device manufacturing apparatus
12/05/2006	US7145666 Position detecting method and apparatus
12/05/2006	US7145665 Light source apparatus, its manufacturing method and apparatus, reflector focal position-locating method and apparatus, focal position-locating light source, discharge lamp emission position-locating method and apparatus, and discharge lamp-reflector positioning method and apparatus
12/05/2006	US7145664 Global shape definition method for scatterometry
12/05/2006	US7145662 Method for measuring thickness of an optical disc
12/05/2006	US7145661 Efficient optical coherence tomography (OCT) system and method for rapid imaging in three dimensions
12/05/2006	US7145659 Light interference measurement method using computer-generated hologram, and interferometer using this method
12/05/2006	US7145648 Multiple beam path surveying instrument
12/05/2006	US7145647 Measurement of spatial coordinates
12/05/2006	US7145163 Apparatus for detecting light-transmissive sheet-like body
12/05/2006	US7145162 Wire loop height measurement apparatus and method
12/05/2006	US7145161 Detecting location of edge of media sheet
12/05/2006	US7145143 Tunable sensor
12/05/2006	US7145126 Optical position encoder device using incoherent light source
12/05/2006	US7143523 Securing device for transporting and mounting a measuring arrangement
12/05/2006	US7143520 Alignment structure
11/2006
11/30/2006	WO2006127952A2 Method and apparatus for full phase interferometry
11/30/2006	WO2006127886A2 Systems and methods for implementing an interaction between a laser shaped as a line beam and a film deposited on a substrate
11/30/2006	WO2006127626A2 Diffraction method for measuring thickness of a workpart
11/30/2006	WO2006126952A2 A tree harvester
11/30/2006	WO2006126593A1 Part positioning device
11/30/2006	WO2006009728A3 A system for automatically locating and manipulating positions on an object
11/30/2006	WO2005004052A3 Method and apparatus for automatic registration and visualization of occluded targets using ladar data
11/30/2006	US20060269848 photomasks; photoresists; lithography; quartz (transparent) substrate with film formed thereon
11/30/2006	US20060268286 Apparatus and method for measuring displacement, surface profile and inner radius
11/30/2006	US20060268285 Method for calibrating a camera-laser-unit in respect to a calibration-object
11/30/2006	US20060268284 Method and apparatus for surface roughness measurement
11/30/2006	US20060268283 Optical method and device for texture quantification of photovoltaic cells
11/30/2006	US20060268282 Adaptive nulls for testing off-axis segments of aspherics
11/30/2006	US20060268281 Rotation and translation measurement
11/30/2006	US20060268275 Lighting unit and optical reader having the same
11/30/2006	US20060268261 Laser distance-measuring device
11/30/2006	US20060268257 Endoscope apparatus, method of operating the endoscope apparatus, and program to be executed to implement the method
11/30/2006	US20060266927 Multiple wavelength quadrant detection
11/30/2006	DE19802036B4 Verfahren und Vorrichtung zur mechanischen Justage von Teilungsträgern Method and device for mechanical adjustment of division carriers
11/30/2006	DE19509420B4 Absolutkodierer Absolute encoder
11/30/2006	DE112004002478T5 Messung optischer Eigenschaften von strahlungsempfindlichen Materialien Measuring optical properties of radiation sensitive materials
11/30/2006	DE10303038B4 Positionsmesseinrichtung The position measuring device
11/30/2006	DE102005043912A1 Verfahren zum Bestimmen der 3D-Koordinaten der Oberfläche eines Objekts A method for determining the 3D coordinates of the surface of an object
11/30/2006	DE102005023737A1 Calculation method e.g. for multiple spectrums of total reflection, involves measuring reflection spectrum of object and comparing it with computed model spectrum
11/30/2006	DE102005023736A1 Structural parameter e.g. line width, determining method for use in semiconductor manufacturing, involves analyzing formula for spectrum in partial formula so that partial formulas are newly computed during computation of spectrum
11/30/2006	DE102005023735A1 Automatic surface quality measurement, especially for layered semiconductors, uses an intelligent combination of Fourier transformation, constant mesh and gradient processes
11/30/2006	DE102005023734A1 Determining layer thickness in multilayer system involves correcting measurement spectrum, transforming correction spectrum, determining fast Fourier transform spectrum peaks, determining mean dispersion per thickness, computing thickness
11/30/2006	DE102005023351A1 Vorrichtung und Verfahren zum Vermessen von Oberflächen Apparatus and method for measuring surfaces
11/30/2006	DE102005022876A1 Sub-micron positioner with optical determination of location comprises first and second modules moved relatively, with laser source, optical modulator and optical fiber connections
11/29/2006	EP1727087A1 Object posture estimation/correlation system, object posture estimation/correlation method, and program for the same
11/29/2006	EP1726914A2 System and method for determining a shape of a surface of an object and method of manufacturing an object having a surface of a predetermined shape
11/29/2006	EP1726913A1 Sensor and sensor system for optically detecting objects, insertion head, method for determining the height position of a component
11/29/2006	EP1725834A1 Measuring method and measuring unit for determining the spatial position of a wheel rim, and chassis measuring device
11/29/2006	EP1725833A2 Method and scanning arrangement for the contactless scanning of three-dimensional objects and device for holding the objects
11/29/2006	EP1725832A1 Interferometric measuring arrangement
11/29/2006	EP1725831A1 Device for measuring changes in the position of the edge of a body
11/29/2006	EP1725830A1 Single-pole optical wavelength selector
11/29/2006	EP1644698B1 Interferometric method for the measurement of plane separations with sub-nanometre accuracy
11/29/2006	CN2842369Y High-precision moveable electronic leather measuring machine
11/29/2006	CN1871665A Cantilever assembly
11/29/2006	CN1871506A Method and device for inspecting surface to be inspected
11/29/2006	CN1871495A Optical method and device for texture quantification of photovoltaic cells
11/29/2006	CN1871128A Apparatus for measuring the physical properties of a surface and a pattern generating apparatus
11/29/2006	CN1869586A Method of reference counting before cable tower segmental face machining
11/29/2006	CN1869585A Three-D track measuring marking-off method for segment of cable tower
11/29/2006	CN1869582A Design method and making process of fibre-optical grating sensitization strain transducer
11/29/2006	CN1869581A Method and apparatus for thermography
11/29/2006	CN1287331C Method and equipment for estimating light source and producing mutual luminosity effect in public supporting space
11/29/2006	CN1287329C Monitor device
11/29/2006	CN1287141C Method for detecting rolling products shape detect and relative device
11/29/2006	CN1287128C Photoelectric encoder
11/28/2006	US7142999 Method and device for correcting guiding errors in a coordinate measuring machine
11/28/2006	US7142708 Defect detection method and its apparatus
11/28/2006	US7142315 Slit confocal autofocus system
11/28/2006	US7142314 Wafer stage position calibration method and system
11/28/2006	US7142313 Interaxis angle correction method
11/28/2006	US7142312 Laser digitizer system for dental applications
11/28/2006	US7142311 Methods and systems for determining optical properties using low-coherence interference signals
11/28/2006	US7142310 Interferometric measuring device utilizing an active optical element
11/28/2006	US7142301 Method and apparatus for adjusting illumination angle
11/28/2006	US7142198 Method and apparatus for remote pointing
11/28/2006	US7141813 Surface position detection apparatus and method, and exposure apparatus and device manufacturing method using the exposure apparatus
11/28/2006	US7141772 Three-dimensional location measurement sensor
11/28/2006	US7141450 Flip-chip alignment method
11/28/2006	US7140544 Three dimensional vision device and method, and structured light bar-code patterns for use in the same
11/28/2006	US7140119 Measurement of form of spherical and near-spherical optical surfaces
11/28/2006	US7140118 Workpiece center and edge finder having visual light indicator

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