Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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03/08/2011 | US7904768 Probing system for integrated circuit devices |
03/08/2011 | US7904766 Statistical yield of a system-on-a-chip |
03/08/2011 | US7904342 Specifying products over a network |
03/08/2011 | US7904286 Method and apparatus for scheduling test vectors in a multiple core integrated circuit |
03/08/2011 | US7904074 Remote configuration and control of local devices via a broadband access gateway |
03/08/2011 | US7904025 Method and system for terminating PPP session in dormant state of mobile communication terminal |
03/08/2011 | US7903657 Method for classifying applications and detecting network abnormality by statistical information of packets and apparatus therefor |
03/08/2011 | US7903643 Method and apparatus for determining bandwidth for services over an Internet Protocol network |
03/08/2011 | US7903595 Apparatus and method for transmitting and receiving a reverse channel in a mobile communication system for packet data |
03/08/2011 | US7903582 Apparatus and method for channel estimation in wireless communication system |
03/08/2011 | US7903580 System and method for generating an alert signal indicating that an additional sector-carrier should be installed in a wireless coverage area, or that a sector-carrier in the wireless coverage area should be optimized |
03/08/2011 | US7903570 System and method for specifying measurement request start time |
03/08/2011 | US7903568 Systems and methods for providing recording as a network service |
03/08/2011 | US7903558 Method and system for monitoring a network link in network systems |
03/08/2011 | US7903557 Multipathing using multiple endpoint addresses for load balancing in a network |
03/08/2011 | US7903556 Method of controlling data transfers between nodes in a computer system |
03/08/2011 | US7903553 Method, apparatus, edge router and system for providing QoS guarantee |
03/08/2011 | US7903548 BFD rate-limiting and automatic session activation |
03/08/2011 | US7903543 Method, apparatus and program storage device for providing mutual failover and load-balancing between interfaces in a network |
03/08/2011 | US7903542 Path changeover method and device |
03/08/2011 | US7902856 Semiconductor integrated circuit |
03/08/2011 | US7902854 Body capacitance electric field powered device for high voltage lines |
03/08/2011 | US7902853 Semiconductor device, semiconductor device testing method, and probe card |
03/08/2011 | US7902852 High density test structure array to support addressable high accuracy 4-terminal measurements |
03/08/2011 | US7902851 Hermeticity testing |
03/08/2011 | US7902850 Versatile materials probe |
03/08/2011 | US7902849 Apparatus and method for test structure inspection |
03/08/2011 | US7902848 Reversible test probe and test probe tip |
03/08/2011 | US7902847 Semiconductor device and test method thereof |
03/08/2011 | US7902846 Electronics tester with a signal distribution board and a wafer chuck having different coefficients of thermal expansion |
03/08/2011 | US7902845 Inspection method and inspection apparatus |
03/08/2011 | US7902834 Upgradable test set |
03/08/2011 | US7902833 Malfunction detecting circuit and malfunction detecting method for detecting malfunction of current-sensing resistor, and power converting system applying the malfunction detecting circuit |
03/08/2011 | US7902832 Antenna cable break detector for construction machine wireless communication apparatus and construction machine wireless communication apparatus |
03/08/2011 | US7902829 Battery management system and driving method thereof |
03/08/2011 | US7902814 Microscope enclosure system |
03/08/2011 | US7902548 Planar voltage contrast test structure |
03/08/2011 | US7901983 Bump-on-lead flip chip interconnection |
03/08/2011 | US7901958 Fabrication method of semiconductor integrated circuit device |
03/08/2011 | US7901957 Disguising test pads in a semiconductor package |
03/08/2011 | US7901131 Apparatus state determination method and system |
03/08/2011 | US7900373 Method for conditioning semiconductor wafers and/or hybrids |
03/08/2011 | CA2366542C Monitoring leakage currents from high-voltage devices |
03/03/2011 | WO2011025096A1 De-embedding device and method |
03/03/2011 | WO2011024532A1 Charge control device for vehicle, and electric vehicle provided with same |
03/03/2011 | WO2011024477A1 Battery module, battery system and electrically driven vehicle |
03/03/2011 | WO2011024394A1 Test device and test method for modulated signal to be tested |
03/03/2011 | WO2011024344A1 Contact block |
03/03/2011 | WO2011024295A1 Interface apparatus and semiconductor testing apparatus |
03/03/2011 | WO2011023847A1 Method for integrated circuit design verification in a verification environment |
03/03/2011 | WO2011023312A1 Method for measuring a semiconductor structure, which is a solar cell or a precursor of a solar cell |
03/03/2011 | WO2011023296A1 Monitoring system for power transformers and monitoring method |
03/03/2011 | WO2011023137A1 Open phase detection system and method for three-phase motor |
03/03/2011 | US20110055651 High-speed serial transfer device test method, program, and device |
03/03/2011 | US20110055650 Hold Transition Fault Model and Test Generation Method |
03/03/2011 | US20110055649 Testing security of mapping functions |
03/03/2011 | US20110055648 System and a method for testing connectivity between a first device and a second device |
03/03/2011 | US20110054816 Method of estimating the non-measurable characteristics of an electrochemical system |
03/03/2011 | US20110054815 Professional diagnosis method of battery performance analysis |
03/03/2011 | US20110050675 Image Display Device and Testing Method of the Same |
03/03/2011 | US20110050277 System for controlling at least one actuator of the cowlings of a turbojet engine thrust reverser |
03/03/2011 | US20110050276 Method and program for operating test apparatus |
03/03/2011 | US20110050275 Semiconductor wafer having test modules including pin matrix selectable test devices |
03/03/2011 | US20110050274 Maintaining A Wafer/Wafer Translator Pair In An Attached State Free Of A Gasket Disposed Therebetween |
03/03/2011 | US20110050273 Fast testable wafer and wafer test method |
03/03/2011 | US20110050272 Method and circuit for testing integrated circuit |
03/03/2011 | US20110050271 Test apparatus of semiconductor integrated circuit and method using the same |
03/03/2011 | US20110050270 Circuit, system, and method for degradation detection |
03/03/2011 | US20110050269 Method for evaluating semiconductor device |
03/03/2011 | US20110050268 Parking Structure Memory-Module Tester that Moves Test Motherboards Along a Highway for Remote Loading/Unloading |
03/03/2011 | US20110050267 Electromagnetic shield for testing integrated circuits |
03/03/2011 | US20110050266 Probe card |
03/03/2011 | US20110050265 Method and apparatus for multilayer support substrate |
03/03/2011 | US20110050264 Substrate inspection apparatus |
03/03/2011 | US20110050262 Active non-contact probe card |
03/03/2011 | US20110050261 Test probe |
03/03/2011 | US20110050245 Radio device and fault position specifying method |
03/03/2011 | US20110050244 Method and apparatus for testing aircraft electrical systems |
03/03/2011 | US20110050239 Apparatus and method for making battery value index |
03/03/2011 | US20110050207 High voltage measurement device using poled fibers |
03/03/2011 | US20110050202 electric sensor web, system and a method for its manufacture |
03/03/2011 | US20110049709 Method of manufacturing a semiconductor device |
03/03/2011 | US20110049699 Method of semiconductor device protection, package of semiconductor device |
03/03/2011 | DE112009000739T5 Empfänger zum Rückgewinnen und Neutakten elektromagnetisch gekoppelter Daten A receiver for recovering and retiming electromagnetically coupled data |
03/03/2011 | DE10349600B4 Verfahren zur Überprüfung von Leitungsfehlern in einem Bussystem und Bussystem Proceedings for review of line faults in a bus system and bus system |
03/03/2011 | DE102010027966A1 Verfahren und Systeme zum Diagnostizieren von Statorwicklungen in einem Elektromotor Methods and systems of diagnosing stator windings in an electric motor |
03/03/2011 | DE102009045068A1 Semiconductor arrangement has semiconductor device supported on carrier with connecting surface, where contact area is arranged on carrier |
03/03/2011 | DE102009039399A1 Verfahren zur Vermessung einer Halbleiterstruktur, welche eine Solarzelle oder eine Vorstufe einer Solarzelle ist A method of measuring a semiconductor structure, which is a solar cell or a precursor of a solar cell |
03/03/2011 | DE102009037968A1 Verfahren und Vorrichtung zur Identifizierung eines Elektrofahrzeugs gegenüber einer Abrechnungszentrale A method and apparatus for identifying an electric vehicle to a billing center |
03/03/2011 | DE102009028911A1 Method for battery testing, particularly in vehicles, involves evaluating terminal voltage by load acting during limited time interval, where terminal voltage is measured and intermediately stored |
03/02/2011 | EP2290733A1 Battery system and electric vehicle including the same |
03/02/2011 | EP2290388A2 Battery condition determination |
03/02/2011 | EP2290387A2 Apparatus and method for establishing battery value index |
03/02/2011 | EP2290386A1 Method and apparatus for evaluation of electric performance of a FDSOI transistor |
03/02/2011 | EP2290385A1 Monitoring system for power transformers and monitoring method |
03/02/2011 | EP2290384A2 Circuit breaker locator |
03/02/2011 | EP2290383A1 Capacitor's remaining lifetime diagnosing device, and electric power compensating device having the remaining lifetime diagnosing device |
03/02/2011 | EP2290378A2 An elastic unit as a separate elastic member to be mounted at an elastic unit receiving section of an align fixture |
03/02/2011 | EP2290377A2 Two abutting sections of an align fixture together floatingly engaging an electronic component |
03/02/2011 | EP2290376A2 An elastic unit for clamping an electronic component and extending below an electronic component receiving volume of an align fixture |