Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
03/2011
03/08/2011US7904768 Probing system for integrated circuit devices
03/08/2011US7904766 Statistical yield of a system-on-a-chip
03/08/2011US7904342 Specifying products over a network
03/08/2011US7904286 Method and apparatus for scheduling test vectors in a multiple core integrated circuit
03/08/2011US7904074 Remote configuration and control of local devices via a broadband access gateway
03/08/2011US7904025 Method and system for terminating PPP session in dormant state of mobile communication terminal
03/08/2011US7903657 Method for classifying applications and detecting network abnormality by statistical information of packets and apparatus therefor
03/08/2011US7903643 Method and apparatus for determining bandwidth for services over an Internet Protocol network
03/08/2011US7903595 Apparatus and method for transmitting and receiving a reverse channel in a mobile communication system for packet data
03/08/2011US7903582 Apparatus and method for channel estimation in wireless communication system
03/08/2011US7903580 System and method for generating an alert signal indicating that an additional sector-carrier should be installed in a wireless coverage area, or that a sector-carrier in the wireless coverage area should be optimized
03/08/2011US7903570 System and method for specifying measurement request start time
03/08/2011US7903568 Systems and methods for providing recording as a network service
03/08/2011US7903558 Method and system for monitoring a network link in network systems
03/08/2011US7903557 Multipathing using multiple endpoint addresses for load balancing in a network
03/08/2011US7903556 Method of controlling data transfers between nodes in a computer system
03/08/2011US7903553 Method, apparatus, edge router and system for providing QoS guarantee
03/08/2011US7903548 BFD rate-limiting and automatic session activation
03/08/2011US7903543 Method, apparatus and program storage device for providing mutual failover and load-balancing between interfaces in a network
03/08/2011US7903542 Path changeover method and device
03/08/2011US7902856 Semiconductor integrated circuit
03/08/2011US7902854 Body capacitance electric field powered device for high voltage lines
03/08/2011US7902853 Semiconductor device, semiconductor device testing method, and probe card
03/08/2011US7902852 High density test structure array to support addressable high accuracy 4-terminal measurements
03/08/2011US7902851 Hermeticity testing
03/08/2011US7902850 Versatile materials probe
03/08/2011US7902849 Apparatus and method for test structure inspection
03/08/2011US7902848 Reversible test probe and test probe tip
03/08/2011US7902847 Semiconductor device and test method thereof
03/08/2011US7902846 Electronics tester with a signal distribution board and a wafer chuck having different coefficients of thermal expansion
03/08/2011US7902845 Inspection method and inspection apparatus
03/08/2011US7902834 Upgradable test set
03/08/2011US7902833 Malfunction detecting circuit and malfunction detecting method for detecting malfunction of current-sensing resistor, and power converting system applying the malfunction detecting circuit
03/08/2011US7902832 Antenna cable break detector for construction machine wireless communication apparatus and construction machine wireless communication apparatus
03/08/2011US7902829 Battery management system and driving method thereof
03/08/2011US7902814 Microscope enclosure system
03/08/2011US7902548 Planar voltage contrast test structure
03/08/2011US7901983 Bump-on-lead flip chip interconnection
03/08/2011US7901958 Fabrication method of semiconductor integrated circuit device
03/08/2011US7901957 Disguising test pads in a semiconductor package
03/08/2011US7901131 Apparatus state determination method and system
03/08/2011US7900373 Method for conditioning semiconductor wafers and/or hybrids
03/08/2011CA2366542C Monitoring leakage currents from high-voltage devices
03/03/2011WO2011025096A1 De-embedding device and method
03/03/2011WO2011024532A1 Charge control device for vehicle, and electric vehicle provided with same
03/03/2011WO2011024477A1 Battery module, battery system and electrically driven vehicle
03/03/2011WO2011024394A1 Test device and test method for modulated signal to be tested
03/03/2011WO2011024344A1 Contact block
03/03/2011WO2011024295A1 Interface apparatus and semiconductor testing apparatus
03/03/2011WO2011023847A1 Method for integrated circuit design verification in a verification environment
03/03/2011WO2011023312A1 Method for measuring a semiconductor structure, which is a solar cell or a precursor of a solar cell
03/03/2011WO2011023296A1 Monitoring system for power transformers and monitoring method
03/03/2011WO2011023137A1 Open phase detection system and method for three-phase motor
03/03/2011US20110055651 High-speed serial transfer device test method, program, and device
03/03/2011US20110055650 Hold Transition Fault Model and Test Generation Method
03/03/2011US20110055649 Testing security of mapping functions
03/03/2011US20110055648 System and a method for testing connectivity between a first device and a second device
03/03/2011US20110054816 Method of estimating the non-measurable characteristics of an electrochemical system
03/03/2011US20110054815 Professional diagnosis method of battery performance analysis
03/03/2011US20110050675 Image Display Device and Testing Method of the Same
03/03/2011US20110050277 System for controlling at least one actuator of the cowlings of a turbojet engine thrust reverser
03/03/2011US20110050276 Method and program for operating test apparatus
03/03/2011US20110050275 Semiconductor wafer having test modules including pin matrix selectable test devices
03/03/2011US20110050274 Maintaining A Wafer/Wafer Translator Pair In An Attached State Free Of A Gasket Disposed Therebetween
03/03/2011US20110050273 Fast testable wafer and wafer test method
03/03/2011US20110050272 Method and circuit for testing integrated circuit
03/03/2011US20110050271 Test apparatus of semiconductor integrated circuit and method using the same
03/03/2011US20110050270 Circuit, system, and method for degradation detection
03/03/2011US20110050269 Method for evaluating semiconductor device
03/03/2011US20110050268 Parking Structure Memory-Module Tester that Moves Test Motherboards Along a Highway for Remote Loading/Unloading
03/03/2011US20110050267 Electromagnetic shield for testing integrated circuits
03/03/2011US20110050266 Probe card
03/03/2011US20110050265 Method and apparatus for multilayer support substrate
03/03/2011US20110050264 Substrate inspection apparatus
03/03/2011US20110050262 Active non-contact probe card
03/03/2011US20110050261 Test probe
03/03/2011US20110050245 Radio device and fault position specifying method
03/03/2011US20110050244 Method and apparatus for testing aircraft electrical systems
03/03/2011US20110050239 Apparatus and method for making battery value index
03/03/2011US20110050207 High voltage measurement device using poled fibers
03/03/2011US20110050202 electric sensor web, system and a method for its manufacture
03/03/2011US20110049709 Method of manufacturing a semiconductor device
03/03/2011US20110049699 Method of semiconductor device protection, package of semiconductor device
03/03/2011DE112009000739T5 Empfänger zum Rückgewinnen und Neutakten elektromagnetisch gekoppelter Daten A receiver for recovering and retiming electromagnetically coupled data
03/03/2011DE10349600B4 Verfahren zur Überprüfung von Leitungsfehlern in einem Bussystem und Bussystem Proceedings for review of line faults in a bus system and bus system
03/03/2011DE102010027966A1 Verfahren und Systeme zum Diagnostizieren von Statorwicklungen in einem Elektromotor Methods and systems of diagnosing stator windings in an electric motor
03/03/2011DE102009045068A1 Semiconductor arrangement has semiconductor device supported on carrier with connecting surface, where contact area is arranged on carrier
03/03/2011DE102009039399A1 Verfahren zur Vermessung einer Halbleiterstruktur, welche eine Solarzelle oder eine Vorstufe einer Solarzelle ist A method of measuring a semiconductor structure, which is a solar cell or a precursor of a solar cell
03/03/2011DE102009037968A1 Verfahren und Vorrichtung zur Identifizierung eines Elektrofahrzeugs gegenüber einer Abrechnungszentrale A method and apparatus for identifying an electric vehicle to a billing center
03/03/2011DE102009028911A1 Method for battery testing, particularly in vehicles, involves evaluating terminal voltage by load acting during limited time interval, where terminal voltage is measured and intermediately stored
03/02/2011EP2290733A1 Battery system and electric vehicle including the same
03/02/2011EP2290388A2 Battery condition determination
03/02/2011EP2290387A2 Apparatus and method for establishing battery value index
03/02/2011EP2290386A1 Method and apparatus for evaluation of electric performance of a FDSOI transistor
03/02/2011EP2290385A1 Monitoring system for power transformers and monitoring method
03/02/2011EP2290384A2 Circuit breaker locator
03/02/2011EP2290383A1 Capacitor's remaining lifetime diagnosing device, and electric power compensating device having the remaining lifetime diagnosing device
03/02/2011EP2290378A2 An elastic unit as a separate elastic member to be mounted at an elastic unit receiving section of an align fixture
03/02/2011EP2290377A2 Two abutting sections of an align fixture together floatingly engaging an electronic component
03/02/2011EP2290376A2 An elastic unit for clamping an electronic component and extending below an electronic component receiving volume of an align fixture