Patents for G01Q 90 - Scanning-probe techniques or apparatus not otherwise provided for (906) |
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11/14/1990 | EP0397116A2 Information detecting apparatus |
11/06/1990 | US4968888 Pulsed field sample neutralization |
10/31/1990 | EP0394995A2 Information record/reproducing apparatus and information recording medium |
10/09/1990 | US4962516 Method and apparatus for state analysis |
10/02/1990 | US4961003 Scanning electron beam apparatus |
09/25/1990 | US4959544 Energy analyzer |
09/04/1990 | US4954711 Low-voltage source for narrow electron/ion beams |
07/24/1990 | US4943721 Method of obtaining accurate compositional information of multi-layer compositions |
05/30/1990 | EP0370276A1 Device for detecting charged secondary particles |
05/15/1990 | US4926054 Objective lens for focusing charged particles in an electron microscope |
05/09/1990 | EP0366851A1 Low-voltage source for narrow electron/ion beams |
05/03/1990 | CA2001908A1 Procedure and means for measuring paper formation |
04/24/1990 | US4920265 System for determining the basis weight of cord reinforced tire fabric |
04/17/1990 | US4918313 Device for counting particles of ionizing radiation and its application to implementing a method of measuring the rate of leakage between the primary and secondary circuits of a steam generator |
04/04/1990 | EP0361932A2 Scanning tunnel-current-detecting device and method |
03/27/1990 | US4912405 Magnetic lens and electron beam deflection system |
02/28/1990 | EP0355657A1 Method of depositing a tungsten film |
02/13/1990 | US4900932 Cathodoluminescence detector utilizing a hollow tube for directing light radiation from the sample to the detector |
01/30/1990 | US4897549 Method of measuring pore diameters by positronium decay |
01/23/1990 | US4896045 Electron beam head and patterning apparatus including detection of secondary or reflected electrons |
01/02/1990 | US4891523 Circuit for image displacement in a particle beam apparatus independently of magnification |
12/27/1989 | EP0347739A2 Scanning tunneling microscope and surface topographic observation method |
12/05/1989 | US4885464 Apply film containing isotopes |
11/21/1989 | US4882486 Electron detection with energy discrimination |
11/07/1989 | US4879473 Electron-beam exposure apparatus |
09/27/1989 | EP0334677A1 Information recording device and information recording and reproducing process |
09/20/1989 | EP0333018A2 Objective lens for focusing charged particles |
09/19/1989 | US4868394 Charged particle detector |
09/05/1989 | US4863226 Confocal laser scanning microscope |
08/08/1989 | US4855596 Photo ion spectrometer |
07/25/1989 | US4851768 Characteristic test apparatus for electronic device and method for using the same |
07/11/1989 | US4847502 Dual cathode system for electron beam instruments |
07/11/1989 | CA1257408A1 System for determining the basis weight of cord reinforced tire fabric |
06/27/1989 | US4843330 Electron beam contactless testing system with grid bias switching |
06/13/1989 | US4839520 Production of pulsed electron beams |
05/16/1989 | US4831266 Detector objective for particle beam apparatus |
05/10/1989 | EP0314947A1 Circuit allowing the magnification independant image shifting |
04/11/1989 | US4820927 Electron beam source employing a photo-emitter cathode |
04/04/1989 | US4818871 Process for the detection of superimposed sheets, apparatus for performing the process and application to bank notes |
04/04/1989 | US4817495 Defense system for discriminating between objects in space |
03/29/1989 | EP0308953A1 Charged particle detector |
03/15/1989 | EP0306790A2 Cathodoluminescence detector |
03/07/1989 | US4810880 Direct imaging monochromatic electron microscope |
01/31/1989 | CA1249467A1 Light waveguide with a submicron aperture, method for manufacturing the waveguide and application of the waveguide in an optical memory |
12/07/1988 | EP0293924A2 Direct imaging monochromatic electron microscope |
11/15/1988 | CA1244970A1 Detector for helicopter blade crack indicator |
11/02/1988 | EP0289277A2 An electron beam head |
09/28/1988 | EP0284136A1 Confocal laser scanning microscope |
08/30/1988 | US4768155 Supersonic flaw detecting system |
08/16/1988 | US4764673 Electric electron energy analyzer |
07/20/1988 | EP0274622A1 Detector assembly with detector objective for corpuscular ray instruments |
07/05/1988 | US4755677 For determining the quanity |
06/07/1988 | US4749858 Nuclear measuring gauge with automatic detection of source depth |
05/24/1988 | US4746795 Method of and apparatus for analyzing fluid flows within hollow bodies |
05/11/1988 | EP0266535A1 Electron beam contactless testing system with grid bias switching |
04/06/1988 | EP0262855A2 Production of pulsed electron beams |
03/16/1988 | EP0259907A1 Electron detection with energy discrimination |
02/24/1988 | EP0256902A2 Ionization particle counter |
02/23/1988 | US4727251 Detector for helicopter blade crack indicator |
12/09/1987 | EP0248710A1 Detection process for superimposed sheets, device for carrying it out, and application to bank notes |
11/03/1987 | US4704528 Device for the separation of airborne particles into classes by grain size |
11/03/1987 | US4704527 Device for the separation of airborne particles into grain size classes |
09/08/1987 | US4692616 Basis weight gauge standardizing method and system |
09/02/1987 | EP0234821A2 Detector for cracks in hollow blades |
08/04/1987 | US4684206 Light waveguide with a submicron aperture, method for manufacturing the waveguide and application of the waveguide in an optical memory |
07/21/1987 | US4682034 Blast wave densitometer system |
07/15/1987 | EP0228502A1 Electron beam test apparatus for electronic device and method for using the same |
07/08/1987 | EP0228147A2 A system for determining the basis weight of cord reinforced tyre fabric |
07/07/1987 | US4678915 System and process for measuring and correcting the values of a parameter of a sheet material |
06/16/1987 | US4673988 Electronic mosaic imaging process |
04/07/1987 | US4656357 Apparatus for measuring coating thickness |
02/03/1987 | US4641030 Apparatus and method for directly measuring the density of a thin layer |
01/27/1987 | CA1217278A1 Basis weight gauge standardizing method and system |
10/29/1986 | EP0199573A2 Electronic mosaic imaging process |
10/08/1986 | EP0196804A1 Method and apparatus for testing integrated electronic device |
07/30/1986 | EP0189137A2 Ultrasonic flaw detecting system |
06/10/1986 | CA1205925A1 Gauge for measuring a sheet of material |
05/20/1986 | US4590373 Device for measurement of content of loose mixtures components |
02/04/1986 | US4569069 Drainage profile tester for papermaking |
12/31/1985 | US4562352 Analyzing apparatus capable of analyzing a surface at a high resolution |
10/30/1985 | EP0159648A1 A device for the separation of airborne particles into grain size classes |
10/30/1985 | EP0159647A1 An improved device for the separation of airborne particles into classes by grain size |
06/11/1985 | CA1188824A1 Apparatus for irradiating a continuously flowing stream of fluid |
01/08/1985 | US4492866 Method for predicting the performance of cathode materials |
11/06/1984 | US4481616 Scanning capacitance microscope |
08/21/1984 | US4467198 Radiation shielding arrangement for coating thickness measurement device |
08/07/1984 | US4464330 Apparatus for irradiating a continuously flowing stream of fluid |
07/31/1984 | US4463263 Positron-annihilation-radiation transmission gauge |
07/04/1984 | EP0112402A1 Light waveguide with a submicron aperture, method for manufacturing the waveguide and application of the waveguide in an optical memory |
05/29/1984 | US4451732 Apparatus for measuring thickness of coating on continuously moving material |
03/13/1984 | US4437012 Device for bringing about coincidence between the axis of a measuring probe and a normal to the surface of a part to be controlled |
03/13/1984 | US4437000 Aperture piece and method for calibrating backscatter thickness measuring instruments for measuring concave workpieces |
02/28/1984 | US4434366 Apparatus for measuring coating thickness |
01/24/1984 | US4427892 Detection and determination of species by fluorescence measurements |
01/03/1984 | US4424445 Portable coating thickness measuring device |
01/03/1984 | US4424443 Apparatus for measuring the density of cigarette rods or the like |
11/23/1983 | EP0094669A1 Gauge for measuring a sheet of material |
06/21/1983 | US4389136 Method of determining density |
02/15/1983 | US4374090 Chemical bias agent detection |
04/13/1982 | US4324136 Beta gauge mechanism |