Patents for G01Q 90 - Scanning-probe techniques or apparatus not otherwise provided for (906)
11/2000
11/08/2000EP1050322A1 A high intensity focused ultrasound system for scanning and curing tumor
10/2000
10/24/2000US6137115 Film inspecting apparatus
10/11/2000EP0960344A4 Calibration method for radiation spectroscopy
09/2000
09/19/2000US6122563 Method of sorting a group of integrated circuit devices for those devices requiring special testing
09/19/2000US6122562 Method and apparatus for selectively marking a semiconductor wafer
09/12/2000US6118121 Probe scanning mechanism for a scanning probe microscope
09/08/2000WO2000052454A2 Improved thin layer nuclear density gauge
08/2000
08/22/2000US6106471 Procedure for an examination of objects by the means of ultrasound waves
08/08/2000US6100534 Microscopic area scanning apparatus
08/08/2000US6100523 Micro goniometer for scanning microscopy
08/01/2000US6097197 Scanning probe microscope
07/2000
07/04/2000US6083624 Graphite sheet with hole of regular geometric shape in top atomic layer; microstrips
06/2000
06/06/2000US6072764 Information processing apparatus having face regulating system
05/2000
05/31/2000CN1254920A Magnetic disk device with lower probability of read error caused by surface seratch of magnetic disk
05/18/2000WO2000028276A1 Line based characterization of a complex surface
04/2000
04/19/2000EP0994476A1 Magnetic disk apparatus with lower probability of occurrence of read errors due to scratch or the like on magnetic disk surface
04/18/2000US6052238 Near-field scanning optical microscope having a sub-wavelength aperture array for enhanced light transmission
04/18/2000US6051833 Probe scanning device
04/04/2000US6046061 Method of inspecting wafer water mark
03/2000
03/08/2000EP0640963B1 Recording and reproducing method and apparatus using a scanning probe
03/07/2000US6033921 Method for depositing a material of controlled, variable thickness across a surface for planarization of that surface
02/2000
02/15/2000US6026171 Apparatus and method for detection of liquids in computed tomography data
02/08/2000US6021665 Cantilever tracking type scanning probe microscope
02/02/2000EP0975828A1 Etching method
01/2000
01/25/2000US6017618 Substrate coated with polymer whereby polymer molecule chains have been mechanically oriented into an pattern of parallel stacks representing written information such as a bar code; atomic scale resolution, high speed, room temperature
01/25/2000US6016684 Certification of an atomic-level step-height standard and instrument calibration with such standards
01/11/2000CA2125537C Method and apparatus for thermal conductivity measurements
12/1999
12/09/1999WO1999063329A1 Optical amplification of molecular interactions using liquid crystals
12/09/1999CA2334238A1 Optical amplification of molecular interactions using liquid crystals
12/08/1999EP0962785A1 Method for examining objects with ultrasound
12/01/1999EP0960344A2 Calibration method for radiation spectroscopy
11/1999
11/30/1999US5994750 Microstructure and method of forming the same
11/30/1999US5994160 Forming oxide film on walls of mold; vapor deposition of diamond particles; removal substrate
11/23/1999US5990477 Apparatus for machining, recording, and reproducing, using scanning probe microscope
11/17/1999EP0957333A1 Correlation sample for scanning probe microscope and method of processing the correlation sample
11/02/1999US5978326 Information processing apparatus using an offset signal to control the position of a probe
11/02/1999US5978256 Non-volatile memory device using AFM and method for operating the device
10/1999
10/26/1999US5973316 Sub-wavelength aperture arrays with enhanced light transmission
10/14/1999WO1999052133A1 Depositing a material of controlled, variable thickness across a surface for planarization of that surface
10/13/1999EP0948741A1 Method and apparatus for high spatial resolution spectroscopic microscopy
10/12/1999US5965885 Probe scanning apparatus for probe microscope
10/05/1999US5963334 Apparatus and method for measuring color of a measurement object
09/1999
09/21/1999US5955654 Calibration standard for microroughness measuring instruments
09/21/1999CA2070359C Scanning probe microscope
09/16/1999WO1999046558A1 Atomic-level step-height standard certification method
09/14/1999US5953306 Micro needle probe apparatus having probes cantilevered over respective electronic circuits, moving medium memory device including same and method of making same
09/14/1999US5952658 Method and system for judging milling end point for use in charged particle beam milling system
09/07/1999US5948972 For sensing a sample
08/1999
08/11/1999EP0935137A1 Scanning probe microscope
08/04/1999EP0933771A2 Recording medium and recording device
07/1999
07/29/1999WO1999037364A1 A high intensity focused ultrasound system for scanning and curing tumor
07/13/1999US5923637 For use in a scanning probe microscope or information recording apparatus
06/1999
06/15/1999US5912461 Probe scanning mechanism for a scanning probe microscope
05/1999
05/25/1999CA2118637C Information recording method and information recording apparatus
05/06/1999WO1999022226A1 Method and apparatus for high spatial resolution spectroscopic microscopy
05/06/1999WO1999014706A3 Visual inspection and verification system
05/06/1999EP0913665A1 Fine movement mechanism and scanning probe microscope
05/06/1999EP0913508A2 Carbon nanotube device, manufacturing method of carbon nanotube device, and electron emitting device
05/05/1999CN1215616A High-intensity focus supersonic tumor scanning therapy system
04/1999
04/14/1999EP0908719A1 Stage unit used for sample positioning and scanning probe microscope with such a stage unit
03/1999
03/25/1999WO1999014706A2 Visual inspection and verification system
03/09/1999US5880012 Method for making semiconductor nanometer-scale wire using an atomic force microscope
03/02/1999US5877497 Data acquisition and control apparatus for scanning probe systems
02/1999
02/18/1999WO1999008065A1 Calibration standard for microroughness measuring instruments
02/02/1999US5866321 Accuracy
02/02/1999US5865839 Artificial retina
01/1999
01/19/1999US5861754 Position detection device
12/1998
12/23/1998WO1998039628A3 Calibration method for radiation spectroscopy
12/22/1998US5851902 Semiconductor layer structure and recording medium for a large capacity memory
12/15/1998US5850038 Scanning probe microscope incorporating an optical microscope
12/08/1998US5847488 Apparatus having drive device using electromechanical transducer
12/08/1998US5846200 Ultrasonic diagnostic imaging system for analysis of left ventricular function
12/01/1998US5844803 Method of sorting a group of integrated circuit devices for those devices requiring special testing
11/1998
11/17/1998US5836996 Artificial retina
11/11/1998EP0877413A2 Method and apparatus for selectively marking a semiconductor wafer
11/10/1998US5833749 Compound semiconductor substrate and process of producing same
10/1998
10/22/1998WO1998046813A1 Etching method
10/22/1998DE19816914A1 Scanning microscope with stage observing=evaluating parameters of sample surface
10/21/1998EP0872733A1 Method for simultaneously assaying of biomolecular interactions by plasmon resonance and fluorescence detection
10/14/1998EP0871166A1 Apparatus for machining, recording, or reproducing, using scanning probe microscope
10/13/1998US5822285 Atomic force microscopy disk data storage system with nonradial tracking lines
10/10/1998CA2231224A1 Apparatus for machining, recording, and reproducing, using scanning probe microscope
10/07/1998EP0869489A2 Atomic force microscopy data storage systems
09/1998
09/22/1998US5812722 Optical fiber and method for manufacturing the same
09/22/1998US5812516 Information recording system
09/22/1998US5811796 Optical probe microscope having a fiber optic tip that receives both a dither motion and a scanning motion, for nondestructive metrology of large sample surfaces
09/22/1998US5811017 Cantilever for use in a scanning probe microscope and method of manufacturing the same
09/15/1998US5808977 Tracking method and recording means thereby
09/15/1998US5807758 Chemical and biological sensor using an ultra-sensitive force transducer
09/11/1998WO1998039628A2 Calibration method for radiation spectroscopy
09/08/1998US5805560 Recording/reproducing apparatus and recording/reproducing method using probe
09/08/1998US5805541 Information processing apparatus
08/1998
08/18/1998US5796706 Information recording apparatus
08/13/1998DE19804017A1 Probe scanner for raster probe microscope
08/11/1998US5793743 Reading a magnetic storage medium with a probe that detects tunneling current induced in a magnetic layer by a non-ionizing light beam
07/1998
07/22/1998EP0727085B1 Method and apparatus for retrieving digital data from a magnetic storage medium
06/1998
06/10/1998EP0846442A2 Ultrasonic diagnostic imaging system for analysis of left ventricular function
05/1998
05/26/1998US5757760 Information recording and/or reproducing apparatus and method for performing recording and/or reproduction of information by using probe
05/20/1998EP0843151A1 Probe scanning apparatus for probe microscope
05/20/1998CN1182216A Probe scanning apparatus for probe microscope
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