Patents for G01Q 90 - Scanning-probe techniques or apparatus not otherwise provided for (906) |
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01/29/2004 | WO2004010075A1 Method for the production of nanometer scale step height reference specimens |
01/14/2004 | EP1381042A2 Recording / reproducing head and method of producing the same |
01/07/2004 | CN1466707A Pinhole defect repair by resist blow |
01/01/2004 | US20040001371 Information storage and retrieval device using macromolecules as storage media |
12/25/2003 | US20030237064 Characterization and verification for integrated circuit designs |
12/11/2003 | WO2003038033A3 Protein and peptide nanoarrays |
12/11/2003 | US20030229881 Adjustment of masks for integrated circuit fabrication |
12/11/2003 | US20030229880 Test masks for lithographic and etch processes |
12/11/2003 | US20030229868 Electronic design for integrated circuits based process related variations |
12/11/2003 | US20030229412 Electronic design for integrated circuits based on process related variations |
12/11/2003 | US20030229410 Integrated circuit metrology |
12/04/2003 | US20030223316 Information recording and reproducing head, information recording and reproducing apparatus, and information recording method |
12/02/2003 | US6655196 Scanning probe microscope |
11/27/2003 | WO2003098208A1 Molecular topological frationation of macromolecules |
11/20/2003 | WO2003096429A1 Method of fabricating probe for spm having fet channel structure utilizing self-aligned fabrication |
11/13/2003 | US20030209060 Apparatus and method for isolating and measuring movement in metrology apparatus |
11/06/2003 | US20030206749 Electrophotographic endless belt, process cartridge, and electrophotographic apparatus |
11/05/2003 | CN1453662A Electronic photographic ring band, processing box and electronic photographic apparatus |
10/30/2003 | WO2003090262A1 Apparatus and method for semiconductor wafer test yield enhancement |
10/29/2003 | EP1357445A2 Electrophotographic endless belt, process cartridge, and electrophotographic apparatus |
10/23/2003 | US20030197456 Devices containing a carbon nanotube |
10/16/2003 | WO2003006952A3 Method and apparatus for manipulating a sample |
10/08/2003 | EP1350471A1 Ultrasonic transesophageal probe for the imaging and diagnosis of multiple scan planes |
10/08/2003 | CN1123884C Magnetic disk device with lower probability of read error caused by surface scratch of magnetic disk |
10/07/2003 | US6630666 Positron trap beam source for positron microbeam production |
10/02/2003 | WO2002073624A3 Memory element, method for structuring a surface, and storage device |
09/30/2003 | US6628053 Carbon nanotube device, manufacturing method of carbon nanotube device, and electron emitting device |
09/30/2003 | US6627908 Radiation source assembly and connector press used in producing such assemblies |
09/30/2003 | US6627885 Method of focused ion beam pattern transfer using a smart dynamic template |
09/12/2003 | WO2003075424A1 GaN LASER ELEMENT |
09/10/2003 | CN1441420A Recording condition extracting system and method for dielectric recording medium and information record equipment |
09/09/2003 | US6617599 Apparatus and method for automated indexing of a nuclear gauge |
09/04/2003 | US20030165109 Recording medium having information reproducible using near-field light |
09/02/2003 | US6612160 Apparatus and method for isolating and measuring movement in metrology apparatus |
08/20/2003 | EP1336849A2 Analytical method and device for precise analysis with a simple sensor |
08/06/2003 | EP1333436A2 Record condition extraction system and method for a dielectric recording medium, and information recording apparatus |
07/31/2003 | US20030142614 Record condition extraction system and method of dielectric recording medium, and information recording apparatus |
07/31/2003 | US20030142456 Nanoscale grasping device, method for fabricating the same, and method for operating the same |
07/31/2003 | US20030141464 Apparatus and method for automated indexing of a nuclear gauge |
07/24/2003 | US20030139839 Method of sorting a group of integrated circuit devices for those devices requiring special testing |
07/24/2003 | US20030139066 Laser annealing method and laser annealing device |
07/17/2003 | US20030133324 Memory element, method for structuring a surface, and storage device |
07/16/2003 | EP1326589A2 Nanoparticles |
07/03/2003 | US20030126581 User interface for a network-based mask defect printability analysis system |
07/03/2003 | US20030122072 Probe for scanning probe microscope |
07/01/2003 | US6587426 Recording medium having information reproducible using near-field light |
06/24/2003 | US6583412 Scanning tunneling charge transfer microscope |
06/19/2003 | US20030110803 Method of manufacturing glass substrate for magnetic disks, and glass substrate for magnetic disks |
06/18/2003 | EP1319199A2 Pinhole defect repair by resist flow |
06/10/2003 | US6578188 Method and apparatus for a network-based mask defect printability analysis system |
05/27/2003 | US6568290 Method of measuring dishing using relative height measurement |
05/21/2003 | EP1312105A1 Directed assembly of nanometer-scale molecular devices |
05/15/2003 | US20030089163 System for sensing a sample |
05/15/2003 | US20030089162 Dual stage instrument for scanning a specimen |
05/08/2003 | WO2003038410A1 Optical scanning type observation device |
05/08/2003 | WO2003038033A2 Protein and peptide nanoarrays |
04/22/2003 | US6552339 Micro goniometer for scanning probe microscopy |
04/10/2003 | US20030068446 Nanoarray substrate, dots on the substrate, the dots comprising a patterning compound with proteins on the substrate |
04/08/2003 | US6544889 Method for tungsten chemical vapor deposition on a semiconductor substrate |
04/01/2003 | US6540972 Patterning a surface atomic layer of a graphite sheet by forming circular holes at the growth points of a pattern in the surface layer, and radially enlarging them by heating |
03/26/2003 | CN1405546A Scanning probe-needle microscope |
03/11/2003 | US6530268 Apparatus and method for isolating and measuring movement in a metrology apparatus |
03/05/2003 | EP1288920A2 Optical alignment in magnetic tape system |
03/04/2003 | US6529793 Method of sorting a group of integrated circuit devices for those devices requiring special testing |
03/04/2003 | US6528359 Laser annealing method and laser annealing device |
02/20/2003 | US20030035238 Optical to magnetic alignment in magnetic tape system |
02/20/2003 | US20030034453 Coaxial probe and scanning micro-wave microscope including the same |
02/18/2003 | US6521890 Focused ion beam machining method and focused ion beam machining apparatus |
02/18/2003 | US6521466 Apparatus and method for semiconductor wafer test yield enhancement |
02/18/2003 | US6520005 System for sensing a sample |
02/04/2003 | US6515898 Memory element, method for structuring a surface, and storage device |
01/23/2003 | WO2003006952A2 Method and apparatus for manipulating a sample |
01/21/2003 | US6510120 Method for writing and/or erasing high density data on a media |
01/21/2003 | US6508979 Layered nanofabrication |
01/16/2003 | US20030010099 Scanning probe microscope |
01/14/2003 | US6507474 Using localized ionizer to reduce electrostatic charge from wafer and mask |
01/02/2003 | US20030003043 Applying a thin chalcogen film to an acute tip of a glass fiber; holding acute tip in physical contact with a metal, whereby a metal chalcogenide nano-particle or nano-particles are generated by diffusional reaction |
01/02/2003 | EP1271554A2 Scanning probe microscope |
12/31/2002 | US6501210 Positioning mechanism having elongate bending elements oriented perpendicular to the direction of movement |
12/27/2002 | WO2002103328A1 Cantilever array, method of manufacturing the array, and scanning probe microscope, sliding device of guide and rotating mechanism, sensor, homodyne laser interferometer, and laser doppler interferometer with specimen light excitation function, using the array, and cantilever |
12/24/2002 | US6498776 Near field light emitting element and optical head |
12/10/2002 | CA2326703C High intensity focused ultrasound system for scanning and treating tumors |
12/05/2002 | WO2002073125B1 Apparatus and method for isolating and measuring movement in a metrology apparatus |
12/05/2002 | US20020178802 Scanning probe microscope and method of processing signals in the same |
11/28/2002 | US20020174714 System for sensing a sample |
11/14/2002 | WO2002073126B1 Apparatus and method for isolating and measuring movement in metrology apparatus |
11/14/2002 | US20020168414 Rapid dehydration of proteins |
10/29/2002 | US6473384 Near field optical head having flexible structure |
10/29/2002 | US6470738 Rotating probe microscope |
10/24/2002 | WO2001058655A9 Layered nanofabrication |
10/17/2002 | US20020148954 Signal detector and probe microscope using the same |
10/09/2002 | EP1248097A1 Improved acceleration weathering apparatus |
10/03/2002 | US20020142453 Optical amplification of molecular interactions using liquid crystals |
10/03/2002 | US20020139928 Accelerated weathering apparatus |
10/02/2002 | CA2378819A1 Improved accelerated weathering apparatus |
09/25/2002 | EP1243553A1 Method for preparing ultra fine particle of metal chalcogenide |
09/24/2002 | US6456736 Automatic field sampling for CD measurement |
09/19/2002 | WO2002073624A2 Memory element, method for structuring a surface, and storage device |
09/19/2002 | WO2002073126A1 Apparatus and method for isolating and measuring movement in metrology apparatus |
09/19/2002 | WO2002073125A1 Apparatus and method for isolating and measuring movement in a metrology apparatus |