Patents for G01Q 90 - Scanning-probe techniques or apparatus not otherwise provided for (906)
01/2004
01/29/2004WO2004010075A1 Method for the production of nanometer scale step height reference specimens
01/14/2004EP1381042A2 Recording / reproducing head and method of producing the same
01/07/2004CN1466707A Pinhole defect repair by resist blow
01/01/2004US20040001371 Information storage and retrieval device using macromolecules as storage media
12/2003
12/25/2003US20030237064 Characterization and verification for integrated circuit designs
12/11/2003WO2003038033A3 Protein and peptide nanoarrays
12/11/2003US20030229881 Adjustment of masks for integrated circuit fabrication
12/11/2003US20030229880 Test masks for lithographic and etch processes
12/11/2003US20030229868 Electronic design for integrated circuits based process related variations
12/11/2003US20030229412 Electronic design for integrated circuits based on process related variations
12/11/2003US20030229410 Integrated circuit metrology
12/04/2003US20030223316 Information recording and reproducing head, information recording and reproducing apparatus, and information recording method
12/02/2003US6655196 Scanning probe microscope
11/2003
11/27/2003WO2003098208A1 Molecular topological frationation of macromolecules
11/20/2003WO2003096429A1 Method of fabricating probe for spm having fet channel structure utilizing self-aligned fabrication
11/13/2003US20030209060 Apparatus and method for isolating and measuring movement in metrology apparatus
11/06/2003US20030206749 Electrophotographic endless belt, process cartridge, and electrophotographic apparatus
11/05/2003CN1453662A Electronic photographic ring band, processing box and electronic photographic apparatus
10/2003
10/30/2003WO2003090262A1 Apparatus and method for semiconductor wafer test yield enhancement
10/29/2003EP1357445A2 Electrophotographic endless belt, process cartridge, and electrophotographic apparatus
10/23/2003US20030197456 Devices containing a carbon nanotube
10/16/2003WO2003006952A3 Method and apparatus for manipulating a sample
10/08/2003EP1350471A1 Ultrasonic transesophageal probe for the imaging and diagnosis of multiple scan planes
10/08/2003CN1123884C Magnetic disk device with lower probability of read error caused by surface scratch of magnetic disk
10/07/2003US6630666 Positron trap beam source for positron microbeam production
10/02/2003WO2002073624A3 Memory element, method for structuring a surface, and storage device
09/2003
09/30/2003US6628053 Carbon nanotube device, manufacturing method of carbon nanotube device, and electron emitting device
09/30/2003US6627908 Radiation source assembly and connector press used in producing such assemblies
09/30/2003US6627885 Method of focused ion beam pattern transfer using a smart dynamic template
09/12/2003WO2003075424A1 GaN LASER ELEMENT
09/10/2003CN1441420A Recording condition extracting system and method for dielectric recording medium and information record equipment
09/09/2003US6617599 Apparatus and method for automated indexing of a nuclear gauge
09/04/2003US20030165109 Recording medium having information reproducible using near-field light
09/02/2003US6612160 Apparatus and method for isolating and measuring movement in metrology apparatus
08/2003
08/20/2003EP1336849A2 Analytical method and device for precise analysis with a simple sensor
08/06/2003EP1333436A2 Record condition extraction system and method for a dielectric recording medium, and information recording apparatus
07/2003
07/31/2003US20030142614 Record condition extraction system and method of dielectric recording medium, and information recording apparatus
07/31/2003US20030142456 Nanoscale grasping device, method for fabricating the same, and method for operating the same
07/31/2003US20030141464 Apparatus and method for automated indexing of a nuclear gauge
07/24/2003US20030139839 Method of sorting a group of integrated circuit devices for those devices requiring special testing
07/24/2003US20030139066 Laser annealing method and laser annealing device
07/17/2003US20030133324 Memory element, method for structuring a surface, and storage device
07/16/2003EP1326589A2 Nanoparticles
07/03/2003US20030126581 User interface for a network-based mask defect printability analysis system
07/03/2003US20030122072 Probe for scanning probe microscope
07/01/2003US6587426 Recording medium having information reproducible using near-field light
06/2003
06/24/2003US6583412 Scanning tunneling charge transfer microscope
06/19/2003US20030110803 Method of manufacturing glass substrate for magnetic disks, and glass substrate for magnetic disks
06/18/2003EP1319199A2 Pinhole defect repair by resist flow
06/10/2003US6578188 Method and apparatus for a network-based mask defect printability analysis system
05/2003
05/27/2003US6568290 Method of measuring dishing using relative height measurement
05/21/2003EP1312105A1 Directed assembly of nanometer-scale molecular devices
05/15/2003US20030089163 System for sensing a sample
05/15/2003US20030089162 Dual stage instrument for scanning a specimen
05/08/2003WO2003038410A1 Optical scanning type observation device
05/08/2003WO2003038033A2 Protein and peptide nanoarrays
04/2003
04/22/2003US6552339 Micro goniometer for scanning probe microscopy
04/10/2003US20030068446 Nanoarray substrate, dots on the substrate, the dots comprising a patterning compound with proteins on the substrate
04/08/2003US6544889 Method for tungsten chemical vapor deposition on a semiconductor substrate
04/01/2003US6540972 Patterning a surface atomic layer of a graphite sheet by forming circular holes at the growth points of a pattern in the surface layer, and radially enlarging them by heating
03/2003
03/26/2003CN1405546A Scanning probe-needle microscope
03/11/2003US6530268 Apparatus and method for isolating and measuring movement in a metrology apparatus
03/05/2003EP1288920A2 Optical alignment in magnetic tape system
03/04/2003US6529793 Method of sorting a group of integrated circuit devices for those devices requiring special testing
03/04/2003US6528359 Laser annealing method and laser annealing device
02/2003
02/20/2003US20030035238 Optical to magnetic alignment in magnetic tape system
02/20/2003US20030034453 Coaxial probe and scanning micro-wave microscope including the same
02/18/2003US6521890 Focused ion beam machining method and focused ion beam machining apparatus
02/18/2003US6521466 Apparatus and method for semiconductor wafer test yield enhancement
02/18/2003US6520005 System for sensing a sample
02/04/2003US6515898 Memory element, method for structuring a surface, and storage device
01/2003
01/23/2003WO2003006952A2 Method and apparatus for manipulating a sample
01/21/2003US6510120 Method for writing and/or erasing high density data on a media
01/21/2003US6508979 Layered nanofabrication
01/16/2003US20030010099 Scanning probe microscope
01/14/2003US6507474 Using localized ionizer to reduce electrostatic charge from wafer and mask
01/02/2003US20030003043 Applying a thin chalcogen film to an acute tip of a glass fiber; holding acute tip in physical contact with a metal, whereby a metal chalcogenide nano-particle or nano-particles are generated by diffusional reaction
01/02/2003EP1271554A2 Scanning probe microscope
12/2002
12/31/2002US6501210 Positioning mechanism having elongate bending elements oriented perpendicular to the direction of movement
12/27/2002WO2002103328A1 Cantilever array, method of manufacturing the array, and scanning probe microscope, sliding device of guide and rotating mechanism, sensor, homodyne laser interferometer, and laser doppler interferometer with specimen light excitation function, using the array, and cantilever
12/24/2002US6498776 Near field light emitting element and optical head
12/10/2002CA2326703C High intensity focused ultrasound system for scanning and treating tumors
12/05/2002WO2002073125B1 Apparatus and method for isolating and measuring movement in a metrology apparatus
12/05/2002US20020178802 Scanning probe microscope and method of processing signals in the same
11/2002
11/28/2002US20020174714 System for sensing a sample
11/14/2002WO2002073126B1 Apparatus and method for isolating and measuring movement in metrology apparatus
11/14/2002US20020168414 Rapid dehydration of proteins
10/2002
10/29/2002US6473384 Near field optical head having flexible structure
10/29/2002US6470738 Rotating probe microscope
10/24/2002WO2001058655A9 Layered nanofabrication
10/17/2002US20020148954 Signal detector and probe microscope using the same
10/09/2002EP1248097A1 Improved acceleration weathering apparatus
10/03/2002US20020142453 Optical amplification of molecular interactions using liquid crystals
10/03/2002US20020139928 Accelerated weathering apparatus
10/02/2002CA2378819A1 Improved accelerated weathering apparatus
09/2002
09/25/2002EP1243553A1 Method for preparing ultra fine particle of metal chalcogenide
09/24/2002US6456736 Automatic field sampling for CD measurement
09/19/2002WO2002073624A2 Memory element, method for structuring a surface, and storage device
09/19/2002WO2002073126A1 Apparatus and method for isolating and measuring movement in metrology apparatus
09/19/2002WO2002073125A1 Apparatus and method for isolating and measuring movement in a metrology apparatus
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