Patents for G01Q 90 - Scanning-probe techniques or apparatus not otherwise provided for (906)
02/2008
02/28/2008US20080048114 Scanning Type Probe Microscope
02/26/2008US7334460 Method and apparatus of manipulating a sample
01/2008
01/29/2008US7325206 Electronic design for integrated circuits based process related variations
01/24/2008US20080017809 Scanning Probe Microscope System
01/22/2008CA2363419C Improved thin layer nuclear density gauge
01/10/2008WO2003098208A8 Molecular topological frationation of macromolecules
12/2007
12/21/2007WO2007145012A1 Probe design support system, probe design support method and probe design support program
12/18/2007US7309863 Cantilever array, method for fabricating the same, scanning probe microscope, sliding apparatus of guiding and rotating mechanism, sensor, homodyne laser interferometer, laser doppler interferometer having optically exciting function for exciting sample, each using the same, and method for exciting cantilevers
11/2007
11/22/2007US20070267580 Drive stage for scanning probe apparatus, and scanning probe apparatus
10/2007
10/23/2007US7285792 Scratch repairing processing method and scanning probe microscope (SPM) used therefor
10/16/2007US7283453 Recording/reproducing head
10/11/2007US20070239308 Sorting a group of integrated circuit devices for those devices requiring special testing
10/09/2007US7278301 System for sensing a sample
10/09/2007US7278296 Scanning probe microscope
09/2007
09/27/2007US20070225851 Optical metrology model optimization for process control
09/18/2007US7271042 Laser annealing method and laser annealing device
09/06/2007US20070205707 Electronic device containing a carbon nanotube
09/05/2007EP1502306A4 Method of fabricating probe for spm having fet channel structure utilizing self-aligned fabrication
08/2007
08/29/2007EP1166095B1 Improved thin layer nuclear density gauge
08/21/2007US7259372 Processing method using probe of scanning probe microscope
07/2007
07/11/2007EP1806572A1 Measuring device with daisy type cantilever wheel
07/10/2007US7243316 Test masks for lithographic and etch processes
07/04/2007EP1804050A2 Cantilever array, method of manufacturing the array, and scanning probe microscope, sliding device of guide and rotating mechanism, sensor, homodyne laser interferometer, and laser doppler interferometer with specimen light excitation function, using the array, and cantilever
06/2007
06/14/2007US20070131249 Probe washing method of scanning probe microscope
06/05/2007US7227830 Dielectric recording apparatus, dielectric reproducing apparatus, and dielectric recording / reproducing apparatus
05/2007
05/22/2007US7221989 Optical metrology model optimization for process control
05/22/2007US7220962 Cantilever array and scanning probe microscope including a sliding, guiding, and rotating mechanism
05/16/2007CN1963451A Vibration-type cantilever holder and scanning probe microscope
05/10/2007US20070104079 Vibration-type cantilever holder and scanning probe microscope
04/2007
04/26/2007US20070093376 Tape manufacturing system
04/18/2007EP1775570A2 Cantilever array, method of manufacturing the array, and scanning probe microscope, sliding device of guide and rotating mechanism, sensor, homodyne laser interferometer, and laser Doppler interferometer with specimen light excitation function, using the array and cantilever
04/18/2007EP1775569A2 Cantilever array, method of manufacturing the array, and scanning probe microscope, sliding device of guide and rotating mechanism, sensor, homodyne laser interferometer, and laser Doppler interferometer with specimen light excitation function, using the array and cantilever
04/18/2007EP1775568A2 Cantilever array, method of manufacturing the array, and scanning probe microscope, sliding device of guide and rotating mechanism, sensor, homodyne laser interferometer, and laser Doppler interferometer with specimen light excitation function, using the array and cantilever
04/18/2007EP1775567A2 Cantilever array, method of manufacturing the array, and scanning probe microscope, sliding device of guide and rotating mechanism, sensor, homodyne laser interferometer, and laser Doppler interferometer with specimen light excitation function, using the array and cantilever
02/2007
02/06/2007US7174520 Characterization and verification for integrated circuit designs
01/2007
01/30/2007US7170054 Scanning probe microscopy cantilever holder and scanning probe microscope using the cantilever holder
01/25/2007US20070018096 Cantilever array, method for fabricating the same, scanning probe microscope, sliding apparatus of guiding and rotating mechanism, sensor, homodyne laser interferometer, laser doppler interferometer having optically exciting function for exciting sample, each using the same, and method for exciting cantilevers
01/02/2007US7158234 Optical scanning observation apparatus
12/2006
12/26/2006US7153697 Functional beads, method for reading the same and bead-reading apparatus
12/12/2006US7148619 Electronic device containing a carbon nanotube
12/07/2006US20060275703 Recording medium, near field optical head, optical recording device, and method of manufacturing thereof
12/05/2006US7146034 Tape manufacturing system
11/2006
11/09/2006US20060253943 Cantilever array, method for fabricating the same, scanning probe microscope, sliding apparatus of guiding and rotating mechanism, sensor, homodyne laser interferometer, laser doppler interferometer having optically exciting function for exciting sample, each using the same, and method for exciting cantilevers
11/02/2006US20060247816 Optical metrology model optimization for process control
11/02/2006US20060243034 Method and apparatus of manipulating a sample
10/2006
10/19/2006US20060231757 Cantilever array, method for fabricating the same, scanning probe microscope, sliding apparatus of guiding and rotating mechanism, sensor, homodyne laser interferometer, laser doppler interferometer having optically exciting function for exciting sample, each using the same, and method for exciting cantilevers
10/19/2006US20060230819 System for Sensing a Sample
10/18/2006EP1243553B1 Method for preparing ultra fine particle of metal chalcogenide
10/12/2006WO2006106949A1 Scanning probe microscope, method of measuring sample surface shape, and probe device
10/05/2006US20060219916 Cantilever holder and scanning probe microscope
10/03/2006US7117063 Sorting a group of integrated circuit devices for those devices requiring special testing
10/03/2006US7115881 Positioning and motion control by electrons, ions, and neutrals in electric fields
09/2006
09/28/2006US20060216814 Molecule detecting method, molecule counting method, molecule localization detecting method, and molecule detecting device used for them
09/21/2006US20060207318 System for Sensing a Sample
09/20/2006CN1835128A Cantilever holder and scanning probe microscope
09/20/2006CN1276314C Electronic photographic ring band, processing box and electronic photographic apparatus
09/14/2006DE112004001001T5 Optische Messung von auf Halbleiterwafern gebildeten Strukturen unter Verwendung von Maschinenlernsystemen Optical measurement of formed on semiconductor wafers structures using machine learning systems
09/12/2006US7107571 Visual analysis and verification system using advanced tools
09/12/2006US7107117 Sorting a group of integrated circuit devices for those devices requiring special testing
09/06/2006EP0948741B1 Method and apparatus for high spatial resolution spectroscopic microscopy
09/05/2006US7100430 Dual stage instrument for scanning a specimen
08/2006
08/31/2006US20060192114 Processing probe, processing apparatus, and method of manufacturing the processing probe
07/2006
07/05/2006CN1799045A Optical metrology of structures formed on semiconductor wafers using machine learning systems
06/2006
06/21/2006EP1671625A1 Nanoparticles
06/20/2006US7065423 Optical metrology model optimization for process control
06/08/2006US20060120992 Rapid dehydration of proteins
05/2006
05/30/2006US7054234 Near-field high density magneto-optical recording head
05/09/2006US7040147 Method and apparatus for manipulating a sample
05/04/2006WO2006046625A1 Measuring device with daisy type cantilever wheel
05/04/2006WO2006046509A1 Cantilever sensor, sensor system and method of detecting analyte in specimen liquid
05/04/2006CA2585173A1 Measuring device with daisy type cantilever wheel
04/2006
04/11/2006US7026607 Scanning probe microscope
03/2006
03/23/2006WO2005120486A3 Novel use of cytotoxic drugs for treatment and prophylasxis of aging diseases by reversing the loss of elasticity of epithelial cells due to aging
03/22/2006EP1637867A1 Molecule detecting method, molecule counting method, molecule localization detecting method, molecule detection device used for them
03/21/2006US7014869 Rapid dehydration of proteins
03/08/2006EP1326589B1 Nanoparticles
03/07/2006US7008811 Method of fabricating probe for SPM having FET channel structure utilizing self-aligned fabrication
03/02/2006US20060043290 Scanning probe microscopy cantilever holder and scanning probe microscope using the cantilever holder
02/2006
02/21/2006US7003755 User interface for a networked-based mask defect printability analysis system
02/16/2006US20060033415 Electronic device containing a carbon nanotube
02/09/2006US20060030963 Sorting a group of integrated circuit devices for those devices requiring special testing
01/2006
01/25/2006CN1726389A Translating detected wafer defect coordinates
01/12/2006WO2006004064A1 Scanning probe microscope system
01/12/2006US20060009872 Optical metrology model optimization for process control
01/03/2006US6982174 Directed assembly of nanometer-scale molecular devices
12/2005
12/27/2005US6979244 Method of manufacturing an electronic device containing a carbon nanotube
12/22/2005WO2005120486A2 Novel use of cytotoxic drugs for treatment and prophylasxis of aging diseases by reversing the loss of elasticity of epithelial cells due to aging
12/15/2005US20050277696 Novel use of cytotoxic drugs for treatment and prophylasxis of aging diseases by reversing the loss of elasticity of epithelial cells due to aging
12/07/2005CN1230669C Scanning probe-needle microscope
12/01/2005US20050263700 Processing method using probe of scanning probe microscope
12/01/2005US20050262931 System for sensing a sample
10/2005
10/19/2005EP1586904A2 Functional beads, method for reading the same and bead-reading apparatus
09/2005
09/29/2005US20050214966 Method of fabricating probe for spm having fet channel structure utilizing self-aligned fabrication
09/27/2005US6950296 Nanoscale grasping device, method for fabricating the same, and method for operating the same
09/22/2005US20050205805 Scratch repairing processing method and scanning probe microscope (SPM) used therefor
09/21/2005EP1576358A1 Translating detected wafer defect coordinates
09/20/2005US6946652 Accelerated weathering apparatus
09/14/2005EP1574815A2 A dual stage instrument for scanning a specimen
09/13/2005US6944117 Information recording medium and information recording device
09/13/2005US6941798 Scanning probe microscope and operation method
1 2 3 4 5 6 7 8 9 10