Patents for G01Q 90 - Scanning-probe techniques or apparatus not otherwise provided for (906)
09/2005
09/09/2005WO2005062029A3 A tape manufacturing system
09/06/2005US6940681 Optical to magnetic alignment in magnetic tape system
08/2005
08/23/2005US6931917 System for sensing a sample
08/16/2005US6928863 Apparatus and method for isolating and measuring movement in a metrology apparatus
08/11/2005US20050176154 Using flow through separation mixture to characterize a population of linear macromolecules and long chain branched macromolecules of interest; size exclusion chromatography
08/10/2005CN1653620A Method of fabricating probe for SPM having FET channel structure utilizing self-aligned fabrication
08/09/2005US6926927 Applying a thin chalcogen film to an acute tip of a glass fiber; holding acute tip in physical contact with a metal, whereby a metal chalcogenide nano-particle or nano-particles are generated by diffusional reaction
08/09/2005US6925860 Leveling a measured height profile
08/03/2005CN1213059C Rapid dehydration of proteins
07/2005
07/26/2005US6921896 Automatic backscatter gauge
07/19/2005US6920088 Assembly for writing and/or erasing high density data on a media
07/07/2005WO2005062029A2 A tape manufacturing system
07/07/2005US20050145021 Method and apparatus for manipulating a sample
06/2005
06/30/2005WO2005003911A3 Optical metrology of structures formed on semiconductor wafers using machine learning systems
06/30/2005WO2002009836A3 Methods for solid phase nanoextraction and desorption
06/28/2005US6912193 Record condition extraction system and method of dielectric recording medium, and information recording apparatus
06/16/2005US20050126913 Systems and methods for making and using nanoelectrodes
06/09/2005US20050123186 Tape manufacturing system
06/09/2005US20050121605 Accelerated weathering apparatus
06/09/2005US20050120781 Scanning probe microscope
05/2005
05/17/2005US6892432 Nanotube cartridge and a method for manufacturing the same
04/2005
04/20/2005EP1189926B1 Rapid dehydration of proteins
04/19/2005US6882745 Method and apparatus for translating detected wafer defect coordinates to reticle coordinates using CAD data
04/05/2005US6875274 Carbon nanotube-nanocrystal heterostructures and methods of making the same
03/2005
03/29/2005US6873747 Method for measurement of pitch in metrology and imaging systems
03/29/2005US6872936 Accelerated weathering apparatus
03/22/2005US6869480 Method for the production of nanometer scale step height reference specimens
03/08/2005US6864481 Probe for scanning probe microscope
03/08/2005US6862921 Method and apparatus for manipulating a sample
02/2005
02/24/2005US20050041283 Molecular manipulator, a method of making the same, and a method of moving a nanostructure
02/23/2005CN1583545A Molecular manipulator, a method of making the same, and a method of moving a nanostructure
02/22/2005US6858423 Optical Amplification of molecular interactions using liquid crystals
02/16/2005EP1506393A1 Molecular topological frationation of macromolecules
02/10/2005US20050030995 GaN laser element
02/08/2005US6853824 Electrophotographic endless belt comprising meandering-preventive member, and process cartridge and electrophotographic apparatus having such an endless belt
02/08/2005US6852285 Measuring variations in conformation
02/03/2005US20050025032 Near-field optical probe for reproducing information on a recording medium using near-field light
02/03/2005US20050022726 Carbon nanotube-nanocrystal heterostructures and methods of making the same
02/02/2005EP1502306A1 Method of fabricating probe for spm having fet channel structure utilizing self-aligned fabrication
01/2005
01/27/2005US20050019997 Laser annealing method and laser annealing device
01/25/2005US6847907 Defect detection and repair of micro-electro-mechanical systems (MEMS) devices
01/13/2005WO2005003911A2 Optical metrology of structures formed on semiconductor wafers using machine learning systems
01/13/2005US20050005688 Dual stage instrument for scanning a specimen
12/2004
12/30/2004US20040267397 Optical metrology of structures formed on semiconductor wafer using machine learning systems
12/28/2004US6835925 Signal detector and probe microscope using the same
12/23/2004US20040256552 Cantilever array, method of manufacturing the array, and scanning probe microscope, sliding device of guide and rotating mechanism, sensor, homodyne laser interferometer, and laser doppler interferometer with specimen light excitation function, using the array, and cantilever
12/21/2004US6834158 Pinhole defect repair by resist flow
12/14/2004US6831887 Recording medium having information reproducible using near-field light
12/09/2004US20040246879 Recording/reproducing head and method of producing the same
12/02/2004US20040243320 Visual inspection and verification system
11/2004
11/18/2004US20040227076 Scanning probe microscope
11/16/2004US6819588 Memory element, method for structuring a surface, and storage device
10/2004
10/28/2004WO2004092712A1 Molecule detecting method, molecule counting method, molecule localization detecting method, molecule detection device used for them
10/19/2004CA2188848C Analytical method and device for precise analysis with a simple sensor
10/06/2004CN1170149C Radiation source assembly and connector pressing bed for manufacturing the same
09/2004
09/29/2004EP1461605A2 Protein and peptide nanoarrays
09/23/2004US20040185740 Method for rapid screening of emission-mix using a combinatorial chemistry approach
09/23/2004US20040185586 Preparation of sample chip, method of observing wall surface thereof and system therefor
09/16/2004US20040181148 Optical scanning observation apparatus
09/07/2004US6788993 Sorting a group of integrated circuit devices for those devices requiring special testing
09/02/2004US20040172152 Sorting a group of integrated circuit devices for those devices requiring special testing
08/2004
08/19/2004US20040161332 Positioning and motion control by electrons, Ions, and neutrals in electric fields
08/10/2004US6772620 Method of generating calibration data for relative height measurement
08/05/2004US20040149922 Accelerated weathering apparatus
07/2004
07/29/2004US20040147031 having a coating layer on the surface with nanoparticles present, enabling the functional beads to emit light specific to the nanoparticles by applying a voltage to the functional beads in flow path; flow cytometry
07/29/2004US20040145824 Flying height measurement method and system
07/28/2004EP1441227A2 Functional beads, method for reading the same and bead-reading apparatus
07/28/2004EP1441215A1 Optical scanning type observation device
07/22/2004WO2004061439A1 Translating detected wafer defect coordinates
07/15/2004US20040134264 Apparatus and method for isolating and measuring movement in a metrology apparatus
07/07/2004CN1156689C Improved thin layer nuclear density gauge
06/2004
06/29/2004US6757645 Visual inspection and verification system
06/24/2004US20040121496 Method and apparatus for translating detected wafer defect coordinates to reticle coordinates using CAD data
06/24/2004US20040118193 System for sensing a sample
06/17/2004US20040116034 Method of manufacturing an electronic device containing a carbon nanotube
06/15/2004US6749776 Making ceramic materials for fluorescent lamps
06/02/2004EP0552375B1 Method of forming a semiconductor film with a chemical vapor deposition apparatus
05/2004
05/20/2004US20040093935 Scanning probe microscope and operation method
05/13/2004US20040091815 Information recording medium and information recording device
05/13/2004US20040090903 Dielectric recording apparatus, dielectric reproducing apparatus, and dielectric recording / reproducing apparatus
05/06/2004US20040086808 To record and reproduce information in a highly precise manner; efficiency
05/06/2004US20040085862 Near-field optical probe and optical near-field generator
04/2004
04/29/2004US20040079882 Automatic backscatter gauge
04/29/2004US20040079142 Apparatus and method for isolating and measuring movement in metrology apparatus
04/29/2004DE10296461T5 Vorrichtung und Verfahren zum Isolieren und Messen einer Bewegung in einer messtechnischen Vorrichtung Apparatus and method for isolating and measuring a movement in a metrological device
04/21/2004EP1411341A1 Cantilever array, method of manufacturing the array, and scanning probe microscope, sliding device of guide and rotating mechanism, sensor, homodyne laser interferometer, and laser doppler interferometer with specimen light excitation function, using the array, and cantilever
04/20/2004US6724552 Magnetic disk apparatus with lower probability of occurrence of read errors due to scratch or the like on magnetic disk surface
04/13/2004US6720728 Devices containing a carbon nanotube
04/13/2004US6720562 Accelerated weathering apparatus
04/06/2004US6715345 Coaxial probe with cantilever and scanning micro-wave microscope including the same
04/06/2004US6715318 Glass substrate for information recording media and manufacturing method thereof
03/2004
03/18/2004US20040052729 Immobilization carbohydrates; calibration; diagnosis; antiinflammatory agents, bactericides
03/17/2004EP1398780A2 Dielectric recording apparatus, dielectric reproducing apparatus, and dielectric recording / reproducing apparatus
03/09/2004US6703615 Light receiving and emitting probe and light receiving and emitting probe apparatus
03/04/2004DE10296462T5 Vorrichtung und Verfahren zum Isolieren und Messen einer Bewegung in einer Messtechnischen Vorrichtung Apparatus and method for isolating and measuring a movement in a measuring device of Technology
03/03/2004CN1140767C Probe scanning device for probe microscope
03/02/2004US6700852 Information recording medium with recording film with cobalt oxide crystalline particles, and information recording device including the same
02/2004
02/24/2004US6697322 Recording medium, optical recording device utilizing recording medium, and method of manufacturing recording medium
02/12/2004US20040029297 Directed assembly of nanometer-scale molecular devices
02/03/2004US6685639 High intensity focused ultrasound system for scanning and curing tumor
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