Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
08/2006
08/24/2006DE19504714B4 Verfahren und Vorrichtung zur Überwachung einer Zustandsgröße eines Leistungsschalters A method and apparatus for monitoring a state quantity of a circuit breaker
08/24/2006DE10315086B4 Verfahren und Vorrichtung zum Ausrichten von Halbleiterwafern bei der Halbleiterherstellung Method and apparatus for aligning the semiconductor wafers in the semiconductor manufacturing
08/24/2006DE102005007283A1 Object distance measurement procedure uses lamp providing oscillating non repeating coded line pattern form array transducer base triangulation
08/24/2006DE102005007244A1 Absolute calibration free three dimensional mirror surface measurement sensor has lamp unit giving high depth of field laterally structured light pattern from microlens array
08/24/2006DE102005006069A1 Verfahren und Vorrichtung zum dreidimensionalen Scannen von Objekten Method and apparatus for three-dimensional scanning of objects
08/24/2006DE10120730B4 Verfahren und Vorrichtung zur Messung der Phasengrenze Method and apparatus for measuring the phase boundary
08/23/2006EP1692460A1 Scanning and measuring of surface features
08/23/2006EP1692459A1 Proximity detector
08/23/2006EP1692458A1 Measuring pyramid size on a textured surface
08/23/2006EP1399707B8 Method and device for determining the contour of a recess in a piece of material
08/23/2006EP1210564B1 Interferometric measuring device
08/23/2006CN2809624Y Simple tyre positioning detector
08/23/2006CN1823523A Projector apparatus, inclination angle obtaining method, and projection image correction method
08/23/2006CN1823256A Information presentation apparatus and information presentation system using the same
08/23/2006CN1821714A Detection system, informing system, actuation system and vehicle
08/23/2006CN1821712A Image recognition device of transparent body
08/23/2006CN1821711A Position sensitive photoelectric sensor and method of setting reference distance in the same
08/23/2006CN1271700C Alignment apparatus
08/23/2006CN1271697C Method for evaluating quality of semiconductor substrate
08/23/2006CN1271391C An improved displacement and torque sensor
08/23/2006CN1271387C Polarization bearing detection type two-dimensional light reception timing detecting device and surface shape measuring device using it
08/22/2006US7095901 Apparatus and method for adjusting focus position in iris recognition system
08/22/2006US7095886 Arrangement and method for producing photogrammetric image records
08/22/2006US7095763 Semiconductor wafer carrier mapping sensor
08/22/2006US7095511 Method and apparatus for high-speed thickness mapping of patterned thin films
08/22/2006US7095507 Method and apparatus using microscopic and interferometric based detection
08/22/2006US7095499 Method of measuring alignment of a substrate with respect to a reference alignment mark
08/22/2006US7095498 Spectroscopic ellipsometer
08/22/2006US7095494 Method and apparatus for measuring temporal response characteristics of digital mirror devices
08/22/2006US7095488 System for profiling objects on terrain forward and below an aircraft utilizing a cross-track laser altimeter
08/22/2006US7095483 Process independent alignment marks
08/22/2006US7093372 Machinist's accuracy testing tool
08/22/2006CA2340965C Method and apparatus for inspecting blow molded containers
08/22/2006CA2296785C Measurement of hot container wall thickness
08/22/2006CA2237204C Container sealing surface area inspection
08/17/2006WO2006086004A2 Measurement device
08/17/2006WO2006085618A1 Device and method for detecting defect at glass sheet end surface
08/17/2006WO2006085403A1 Real time terahertz tomography device and spectrum imaging device
08/17/2006WO2006001834A3 Passive optical sensor using carbon nanotubes
08/17/2006US20060184270 Calibration cassette pod for robot teaching and method of using
08/17/2006US20060182308 Scanning system with stereo camera set
08/17/2006US20060181715 Method and apparatus for measuring wafer thickness
08/17/2006US20060181714 Method for processing multiwavelength interferometric imaging data
08/17/2006US20060181713 Optical metrology of a structure formed on a semiconductor wafer using optical pulses
08/17/2006US20060181712 Highly-sensitive displacement-measuring optical device
08/17/2006US20060180761 Measurement system with separate optimized beam paths
08/17/2006DE19950559B4 Verfahren zum Bestimmen von geometrischen Strukturen auf oder in einem Substrat sowie von Materialparametern A method of determining geometrical structures on or in a substrate and from material parameters
08/17/2006DE19944516B4 Dreidimensionale Formerfassung mit Kamerabildern Three-dimensional shape acquisition with camera images
08/17/2006DE10336718B4 Vorrichtung zur optischen Vermessung der Konturen von Probenkörpern bei hohen Temperaturen in einem gasdicht verschlossenem Rohrofen Device for optical measurement of the contours of test specimens at high temperatures in a gas-tight sealed tube furnace
08/17/2006DE10319711B4 Verfahren zur hochgenauen dimensionalen Messung an Messobjekten Method for high precision dimensional measurement metrics
08/17/2006DE10230891B4 Photolithographisches System und photolithographes Verfahren zur Erfassung von Verunreinigungen aufder Oberfläche von Wafern Photolithography system and method for detecting photolithographes of impurities on the surface of wafers
08/17/2006DE102005007150A1 Vorrichtung und Verfahren zur Erkennung der Ausrichtung/Lage von Produkten, insbesondere von Fischen, auf einem Transportelement Apparatus and method for detecting the orientation / position of products, in particular fish, on a transport element
08/17/2006DE102005006247A1 Positionsmesseinrichtung The position measuring device
08/17/2006DE102005005896A1 Beleuchtungsvorrichtung Lighting device
08/17/2006DE102005005816A1 Vorrichtung zur Positionsbestimmung voneinander distanzierter Bereiche in transparenten und/oder diffusen Objekten Apparatus for determining the position of spaced areas in transparent and / or diffuse objects
08/17/2006DE102005005557A1 Vorrichtung zur Steuerung und/oder Regelung einer Landmaschine mittels einer Bilderfassungs- und -verarbeitungseinrichtung A device for controlling and / or regulating an agricultural machine by means of an image capture and processing means
08/17/2006DE10064037B4 Streifenanalyseverfahren unter Verwendung der Fouriertransformation Fringe analysis method using the Fourier transform
08/16/2006EP1691167A2 Laser alignment apparatus
08/16/2006EP1691166A1 Angle detection device and scan-type actuator using the same
08/16/2006EP1399710B1 Self-calibrating position determination system
08/16/2006EP1341223B1 Polishing progress monitoring device and polishing device
08/16/2006EP1027577B2 Computerized automotive service system
08/16/2006CN2807199Y Rotary scanning measurer
08/16/2006CN2807198Y Micro-displacement measurer based on semiconductor laser-electric charge coupling device
08/16/2006CN2807197Y Dynamic measurer for posture of object moving in space
08/16/2006CN1818546A Small-displacement measuring method in long-distance plane
08/16/2006CN1818545A Small-displacement measuring system in long-distance plane
08/16/2006CN1818544A Portable acoplane displacement measuring device
08/16/2006CN1818543A Image measuring apparatus and image measuring method
08/16/2006CN1818542A Inspection method and apparatus for mounted electronic components
08/16/2006CN1270161C Optical fiber strain three-dimensional simulation experimental bench
08/16/2006CN1270160C Method and device for real non-destructive determination of residual stresses in objects by optical holographic interferometry technique
08/15/2006US7092860 Hardware simulation systems and methods for vision inspection systems
08/15/2006US7092842 Multiple sensor system
08/15/2006US7092563 Three-dimensional information acquisition apparatus and three-dimensional information acquisition method
08/15/2006US7092562 Method for measuring a three-dimensional object, or assembly of objects
08/15/2006US7092110 Optimized model and parameter selection for optical metrology
08/15/2006US7092109 Position/orientation measurement method, and position/orientation measurement apparatus
08/15/2006US7092108 Method for determining a position and position measurement device for carrying out the method
08/15/2006US7092107 Method and apparatus for imaging three-dimensional structure
08/15/2006US7092106 System for determining the configuration of obscured structure by employing phase profilometry and method of use therefor
08/15/2006US7092105 Method and apparatus for measuring the three-dimensional surface shape of an object using color informations of light reflected by the object
08/15/2006US7092104 Speckle interferometer apparatus
08/15/2006US7092102 Measuring device for detecting the dimensions of test samples
08/15/2006US7092096 Optical scatterometry method of sidewall spacer analysis
08/15/2006US7092094 Coordinated polarization for shiny surface measurement
08/15/2006US7092093 Polarization bearing detection type two-dimensional light reception timing detecting device and surface form measuring device using the same
08/15/2006US7092015 Apparatus and method for stereo matching and method of calculating an infinite distance corresponding point
08/15/2006US7091978 Processing apparatus and photographing device
08/15/2006US7091475 Miniature 2-dimensional encoder readhead using fiber optic receiver channels
08/15/2006US7089776 Calibration certification for wheel alignment equipment
08/15/2006US7089678 Encoder with reference marks
08/15/2006US7089673 Optical angle sensor
08/15/2006US7089672 Optical angle and torque sensor
08/15/2006US7089656 Electric parts mounting apparatus
08/15/2006CA2250135C Method and apparatus for optical alignment of a measuring head in an x-y plane
08/10/2006WO2006083839A2 Specific density detector and optical multiplexer improvement
08/10/2006WO2006083335A2 Specific density detector with electro mechanical actuator and improved mirror
08/10/2006WO2006082932A1 Defective particle measuring apparatus and defective particle measuring method
08/10/2006WO2006082928A1 Position posture measuring method and device