| Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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| 07/12/2006 | CN1800834A Method for extracting order value of coherent gradient sensing interference fringe |
| 07/12/2006 | CN1800818A Analysis test apparatus and method capable of observing substance form during chemical reaction process |
| 07/12/2006 | CN1800776A Laser thick measuring device with micron precision |
| 07/12/2006 | CN1800775A Exterior test equipment and transportation therefor |
| 07/12/2006 | CN1264003C Optical tactile sensor |
| 07/12/2006 | CN1263999C Cylindrical grating shaft interference encoder |
| 07/12/2006 | CN1263998C Three dimensional high precision multifunctional thermal deformation experimental apparatus |
| 07/12/2006 | CN1263997C Distortion measurement method and exposure equipment |
| 07/11/2006 | US7076394 Method and device for inspecting an object using a time delay integration sensor |
| 07/11/2006 | US7076094 Method and apparatus for detecting position of lead of electric component, and electric-component mounting method |
| 07/11/2006 | US7075663 Optical device and a method for aiming and visually indicating a reading area |
| 07/11/2006 | US7075662 Method for three-dimensional inspection using patterned light projection |
| 07/11/2006 | US7075661 Apparatus and method for obtaining three-dimensional positional data from a two-dimensional captured image |
| 07/11/2006 | US7075651 Image forming characteristics measuring method, image forming characteristics adjusting method, exposure method and apparatus, program and storage medium, and device manufacturing method |
| 07/11/2006 | US7075639 Method and mark for metrology of phase errors on phase shift masks |
| 07/11/2006 | US7075635 Vehicle measuring system |
| 07/11/2006 | US7075634 Surveying system |
| 07/11/2006 | US7075630 Combined high speed optical profilometer and ellipsometer |
| 07/11/2006 | US7075621 Alignment method |
| 07/11/2006 | US7075620 Lithographic apparatus, device manufacturing method, and device manufactured thereby |
| 07/11/2006 | US7075619 In-process correction of stage mirror deformations during a photolithography exposure cycle |
| 07/11/2006 | US7075097 Optical path array and angular filter for translation and orientation sensing |
| 07/11/2006 | US7075086 Measurement of metal polish quality |
| 07/11/2006 | US7075085 Method of measuring thickness of thin film using infrared thermal imaging system |
| 07/11/2006 | US7075054 Optical position detecting device and recording medium including a detection of dust on a light retro-reflector |
| 07/11/2006 | US7073422 Linkage device for linear positioning apparatus |
| 07/11/2006 | CA2403247C Method of automatically repairing cracks and apparatus for use in such method |
| 07/11/2006 | CA2368278C Apparatus for measuring physical properties of a sample |
| 07/11/2006 | CA2288746C Distributed sensing system |
| 07/06/2006 | WO2006071569A2 Overlapping common-path interferometers for two-sided measurement |
| 07/06/2006 | WO2006071322A1 Laser goniometer for measuring the angle of a surface |
| 07/06/2006 | WO2006070850A1 Method and apparatus for detecting reflective object |
| 07/06/2006 | WO2006070822A1 Work bending angle detecting device and work bending machine |
| 07/06/2006 | WO2006070161A1 Metrological characterization of microelectronic circuits |
| 07/06/2006 | WO2006070047A1 Provision of target specific information |
| 07/06/2006 | WO2006069748A1 Device for measurement of an object and method for use of said device |
| 07/06/2006 | WO2006069443A1 Surface roughness measurement methods and apparatus |
| 07/06/2006 | WO2005038396A8 Computer simulation model for determining damage to the human central nervous system |
| 07/06/2006 | US20060147128 Image processing device, method, and program |
| 07/06/2006 | US20060147104 Reticle inspecting apparatus and reticle inspecting method |
| 07/06/2006 | US20060146560 Structured light projector |
| 07/06/2006 | US20060146347 Scatterometry method with characteristic signatures matching |
| 07/06/2006 | US20060146346 Systems and methods for in-vivo optical imaging and measurement |
| 07/06/2006 | US20060146345 Methods and apparatus for measurement of a dimensional characteristic and methods of predictive modeling related thereto |
| 07/06/2006 | US20060146344 Method for determining optimum grating parameters for producing a diffraction grating for a vuv spectrometer |
| 07/06/2006 | US20060146343 Scatterometer and a method for observing a surface |
| 07/06/2006 | US20060146342 Phase shifting interferometric method, interferometer apparatus and method of manufacturing an optical element |
| 07/06/2006 | US20060146336 Interferometer arrangement and interferometric measuring method |
| 07/06/2006 | US20060146329 Device for aligning substrate with mask and method using the same |
| 07/06/2006 | US20060146314 Elastic-wave monitoring device and surface-acoustic-wave device |
| 07/06/2006 | US20060145101 Method for the contactless measurement of an object |
| 07/06/2006 | US20060145065 Position-to-number electro-optical converter |
| 07/06/2006 | US20060144147 Device and method for measuring thickness |
| 07/06/2006 | DE4204878B4 Anordnung zum Erfassen der Verschiebungsgröße einer Hologrammskala vom Reflexionstyp Means for detecting the displacement size of a reflection-type hologram scale |
| 07/06/2006 | DE202006005643U1 Vorrichtung zum dreidimensionalen Erfassen eines Raumbereichs An apparatus for three-dimensional detecting a region of space |
| 07/06/2006 | DE202006005565U1 Force measurement arrangement, has helical spring effecting rotary movement around loading direction and including two coil springs or spiral springs mounted onto one another, where spring wires are connected by connecting unit |
| 07/06/2006 | DE202005003352U1 Three dimensional tool positioning and monitoring sensor has three cameras including stereo pair arranged around tool hole with lamp and pattern projector |
| 07/06/2006 | DE102005021476A1 Microparticle relative impact position determination procedure for biological and medical research substrate droplet loading uses stroboscopic observations from different directions |
| 07/06/2006 | DE102004063076A1 Measuring method for examining a structured surface, especially for testing the correct insertion of connecting pins in a PCB by use of white light interferometry |
| 07/06/2006 | DE102004062484A1 Vorrichtung zur Erkennung einer Kollision eines Kraftfahrzeuges Device for detecting a collision of a motor vehicle |
| 07/06/2006 | DE102004062461A1 Image supported surface reconstruction procedure uses combined shape from shading and polarisation property methods |
| 07/06/2006 | DE102004062412A1 Method for spatial measurement of fast moving object involves 3D measuring device with multiple passages whereby each passage covers other passages lying opposite so that they are spatially arranged against each other with respect to object |
| 07/06/2006 | DE102004061764A1 System for measurement of spatial positions and orientations has position measuring device combined with inertial sensor unit to a hybrid position measuring system |
| 07/06/2006 | DE102004061705A1 Measuring system`s temperature compensation method, involves determining measurement value at object, attached to object-retaining frame, and converting measurement value into its absolute value in reference coordinate system |
| 07/06/2006 | DE102004061338A1 Automatische Bauteilprüfung Automatic Component Testing |
| 07/06/2006 | CA2594010A1 Surface roughness measurement methods and apparatus |
| 07/05/2006 | EP1677098A1 Surface defect inspecting method and device |
| 07/05/2006 | EP1677093A2 Near-field film-thickness measurement apparatus |
| 07/05/2006 | EP1677071A1 Multiple axle alignment method and device for trucks |
| 07/05/2006 | EP1677070A1 Method and device for determining the deflection of a connecting element |
| 07/05/2006 | EP1677069A1 Three-dimensional measuring instrument and three-dimensional measuring method |
| 07/05/2006 | EP1676095A1 Computer simulation model for determining damage to the human central nervous system |
| 07/05/2006 | EP1434981B1 Apparatus for the fast, quantitative, non-contact topographic investigation of semiconductor wafers and other mirror like surfaces |
| 07/05/2006 | CN2792635Y Gap measuring mechanism of upper and lower aligning aligning device |
| 07/05/2006 | CN1799045A Optical metrology of structures formed on semiconductor wafers using machine learning systems |
| 07/05/2006 | CN1798958A Stereo optical module and stereo camera |
| 07/05/2006 | CN1798957A Stereo camera system and stereo optical module |
| 07/05/2006 | CN1798956A Method for measuring the sagging of a glass panel to be bent on a ring mould |
| 07/05/2006 | CN1796994A Method for sensing stability of acid tank and reaction tank |
| 07/05/2006 | CN1796933A Method and equipment for realizes structured light in high performance based on uniqueness in field |
| 07/05/2006 | CN1796932A Dimesize attitude measurement system in magnetic infrared ray |
| 07/05/2006 | CN1796930A Modeling method of laser auto collimating measurement for angle in 2D |
| 07/05/2006 | CN1796929A Optical fiber interference type device and method for measuring thickness |
| 07/05/2006 | CN1796928A Method and devices for measuring dynamic response error of position sensor |
| 07/05/2006 | CN1796927A Observation board for position and application of force in micro |
| 07/05/2006 | CN1262885C Parallel processing type optical range finder |
| 07/05/2006 | CN1262815C Collimation measuring device |
| 07/05/2006 | CN1262814C Laser three-dimensional color scanning digital method and digital equipment |
| 07/04/2006 | US7072505 Method of defining deviations of pixel positions |
| 07/04/2006 | US7072051 Laser diffraction process and apparatus for width measurement of elongated objects |
| 07/04/2006 | US7072050 Substrate film thickness measurement method, substrate film thickness measurement apparatus and substrate processing apparatus |
| 07/04/2006 | US7072049 Model optimization for structures with additional materials |
| 07/04/2006 | US7072046 Optical imaging system and optical imaging detection method |
| 07/04/2006 | US7072042 Apparatus for and method of measurement of aspheric surfaces using hologram and concave surface |
| 07/04/2006 | US7072040 Mask for inspecting an exposure apparatus, a method of inspecting an exposure apparatus, and an exposure apparatus |
| 07/04/2006 | US7072032 Automatic tracking apparatus for reflector |
| 07/04/2006 | US7072031 Alignment laser for use in cross-connects |
| 07/04/2006 | US7072027 Exposure apparatus, method of controlling same, and method of manufacturing devices |
| 07/04/2006 | US7072023 Position detection apparatus having a plurality of detection sections, and exposure apparatus |
| 07/04/2006 | US7071985 Optical device and method for selecting object of focus |