Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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05/27/2009 | EP2063219A1 Measurement of hot container wall thickness |
05/27/2009 | EP2062008A1 Method and apparatus for determining component parameters by means of thermography |
05/27/2009 | EP1831639A4 Overlapping common-path interferometers for two-sided measurement |
05/27/2009 | EP1602001B1 Optical device and inspection module |
05/27/2009 | CN201247051Y Receiving device for calibration laser emission of spinning axis proper alignment |
05/27/2009 | CN201247050Y Calibration instrument for proper alignment of spinning axis |
05/27/2009 | CN201247049Y Measuring apparatus for testing dynamic strain, vibration and acceleration |
05/27/2009 | CN201247048Y Thickness meter for optical film |
05/27/2009 | CN201247047Y Flexible transmission type built-in miniature multi-point displacement test system used for model experiment |
05/27/2009 | CN201247046Y Miniature built-in stretching type optical fiber spring combination type displacement gage used for model experiment |
05/27/2009 | CN201247045Y Measuring system for cantalever digging handpiece location posture |
05/27/2009 | CN101443654A Surface inspection apparatus |
05/27/2009 | CN101442018A Detection method for silicon wafer warpage degree |
05/27/2009 | CN101441180A Fast analysis method of tree annual ring composing ingredient |
05/27/2009 | CN101441076A Method and device for detecting barrier |
05/27/2009 | CN101441068A Device and method for measuring non-contact road surface roughness |
05/27/2009 | CN101441067A Portable vegetation coverage measuring instrument |
05/27/2009 | CN101441066A Phase de-packaging method of color fringe coding |
05/27/2009 | CN101441065A Tiny displacement deforming high precision and non-contact type measuring system and method |
05/27/2009 | CN101441064A Substrate for offset check of tin soldering position, check apparatus and check method |
05/27/2009 | CN101441063A Test device of integrated circuit height measurement |
05/27/2009 | CN101441062A Optical positioning device |
05/27/2009 | CN101441061A System and method for measuring shaft part |
05/27/2009 | CN100492409C Image processing system, 3-dimensional shape estimation system, object position posture estimation system, and image generation system |
05/27/2009 | CN100491968C Measuring installation for testing adhesion strength and operating life of diamond coated cutter |
05/27/2009 | CN100491924C Ultra-remote distributed fiber raman and brillouin photons sensor |
05/27/2009 | CN100491910C Measurer for sleeve offset |
05/27/2009 | CN100491909C Three-dimensional measuring apparatus |
05/27/2009 | CN100491908C Sensing and visualized method for space flexible sail plate structure form |
05/27/2009 | CN100491907C Three-dimensional shape measuring instrument |
05/27/2009 | CN100491906C Grating projection and recognition method |
05/27/2009 | CN100491905C Silicon ball surface oxidation layer appearance measuring mechanism |
05/27/2009 | CN100491904C Drinking bottle mouth vision positioning method |
05/27/2009 | CN100491903C Method for calibrating structural parameter of structure optical vision sensor |
05/27/2009 | CN100491902C Synthetic wave interference nano surface tri-dimensional on-line measuring system and method |
05/27/2009 | CN100491901C Synthetic wave interference nano surface tri-dimensional on-line measuring system and method |
05/27/2009 | CN100491900C Personnel space orientation automatic measuring method and system |
05/27/2009 | CN100491899C Quick and high-precision method for extracting center of structured light stripe |
05/27/2009 | CN100491898C Method and device for detecting direction of member having outer periphery formed in vertically asymmetrical shape |
05/26/2009 | US7539350 Image correction method |
05/26/2009 | US7539340 Apparatus and method for three-dimensional coordinate measurement |
05/26/2009 | US7539339 Part recognition data creation method and apparatus, electronic part mounting apparatus, and recorded medium |
05/26/2009 | US7539328 Surface position measuring method and apparatus |
05/26/2009 | US7538894 Coordinate input apparatus, control method thereof, and program |
05/26/2009 | US7538893 Method of microscopically examining a spatial finestructure |
05/26/2009 | US7538892 Method and apparatus for examining end faces of light guides |
05/26/2009 | US7538890 Wavefront-measuring interferometer apparatus, and light beam measurement apparatus and method thereof |
05/26/2009 | US7538889 Calibration feedback-control circuit for diffraction light devices |
05/26/2009 | US7538888 Method for estimating absolute distance of tracking laser interferometer and tracking laser interferometer |
05/26/2009 | US7538887 Temporal interferometric signal modeling with constant phase shift in white light interferometry |
05/26/2009 | US7538885 Optical characteristic measuring apparatus |
05/26/2009 | US7538867 Mura defect inspection mask, apparatus and method of inspecting the mura defect, and method of producing a photomask |
05/26/2009 | US7538312 Method for determining the position of a first moving component relatively to a second component and device for applying said method |
05/26/2009 | US7537797 Method for simultaneously coating and measuring parts |
05/26/2009 | US7537796 Coating method which measures a part, applies a coating to the part based on such measurement and continuously measures the part during the coating process; enhances the productivity and production rates |
05/22/2009 | WO2009064670A2 Interferometer utilizing polarization scanning |
05/22/2009 | WO2009064597A2 Proximity sensors and methods for sensing proximity |
05/22/2009 | WO2009064247A1 Optical triangulation |
05/22/2009 | WO2009064103A1 The minute measuring instrument for high speed and large area and the method of thereof |
05/22/2009 | WO2009064102A1 Single-polarizer focused-beam ellipsometer |
05/22/2009 | WO2009064081A1 Linear-focused beam ellipsometer |
05/22/2009 | WO2009063863A1 Interference measuring device |
05/22/2009 | WO2009063088A2 Method for optical measurement of objects using a triangulation method |
05/22/2009 | WO2009063087A2 Method for optical measurement of the three dimensional geometry of objects |
05/22/2009 | WO2009062641A1 Measuring device, measuring head and measuring head holder |
05/22/2009 | WO2009062315A1 Material measurement system for obtaining coincident properties and related method |
05/22/2009 | WO2007061704A3 Overlay metrology using the near infra-red spectral range |
05/22/2009 | CA2705864A1 Material measurement system for obtaining coincident properties and related method |
05/22/2009 | CA2705754A1 Optical triangulation |
05/21/2009 | US20090132192 Measurement apparatus |
05/21/2009 | US20090130784 Method for determining the position of the edge bead removal line of a disk-like object |
05/21/2009 | US20090129545 Frameless radiosurgery treatment system and method |
05/21/2009 | US20090128833 Dual mode depth imaging |
05/21/2009 | US20090128832 Lithographic Method |
05/21/2009 | US20090128831 Optical element positioning apparatus |
05/21/2009 | US20090128828 Device for measuring the position of at least one structure on a substrate |
05/21/2009 | US20090128815 Remote control pointing technology with roll detection |
05/21/2009 | US20090128811 Full hemisphere bi-directional reflectance distribution function instrument |
05/21/2009 | US20090128801 Measurement of constitutive properties of a powder subject to compressive axial and radial loading, using optical sensing |
05/21/2009 | US20090128792 Lithographic apparatus and method |
05/21/2009 | US20090128788 System and method for making photomasks |
05/21/2009 | US20090127723 AIM-Compatible Targets for Use with Methods of Inspecting and Optionally Reworking Summed Photolithography Patterns Resulting from Plurally-Overlaid Patterning Steps During Mass Production of Semiconductor Devices |
05/20/2009 | EP2060931A1 Image generating method and apparatus |
05/20/2009 | EP2060876A2 Measurement apparatus |
05/20/2009 | EP2060869A1 Dynamic Compensation Of Profile Data Selection for a Chromatic Point Sensor |
05/20/2009 | EP2060383A1 Mehtod and device for measuring the resin amount by impregnating filaments in filament winding molding |
05/20/2009 | EP2059791A1 Photorefractive interferometer |
05/20/2009 | EP2059765A2 Optical device for monitoring a rotatable shaft with an orientated axis |
05/20/2009 | EP2059764A1 Distance measuring device |
05/20/2009 | EP1989508A4 Method and apparatus and computer program product for collecting digital image data from microscope media-based specimens |
05/20/2009 | DE19918100B4 Vorrichtung und Verfahren zur berührungslosen Gewichtsermittlung von lebenden Tieren, insbesondere von Schweinen in ihrer Haltungsumwelt, vorzugsweise in ihren Buchten Apparatus and method for contactless determination of weight of live animals, especially pigs in their housing environment, preferably in their bays |
05/20/2009 | DE112007001624T5 Handgehaltener Laserlichtdetektor mit Höhenkorrektur, unter Verwendung eines GPS-Empfängers zum Bereitstellen von zweidimensionalen Positionsdaten Hand-held laser detector with altitude correction, using a GPS receiver to provide two-dimensional position data |
05/20/2009 | DE102008042333A1 Gerät zur dreidimensionalen Messung, Bildaufnahmevorrichtung und Verfahren zum Einstellen einer derartigen Bildaufnahmevorrichtung An apparatus for three-dimensional measurement, image pickup device and method of adjusting such an image pick-up device |
05/20/2009 | DE102007055205A1 Verfahren zum Ermitteln eines Aufstellortes und zum Aufstellen einer Erfassungsvorrichtung eines Navigationssystems A method for determining a position and for establishing a detection device of a navigation system |
05/20/2009 | DE102007054915A1 Messvorrichtung, Messkopf und Messkopfhalter Measuring device, measuring head and probe holder |
05/20/2009 | DE102007054734A1 Object profile measurement combines the use of two long distance lenses as a Linnik interferometer with digital camera images |
05/20/2009 | DE102007000990A1 Vorrichtung und Verfahren zur positionsgenauen Halterung eines Substrats Apparatus and method for precise positioning of a substrate holder |
05/20/2009 | DE102006059416B4 Vorrichtung und Verfahren zur Steigerung der Messgenauigkeit digitaler 3D-Geometriemesssysteme Apparatus and method for increasing the accuracy of digital 3D geometry measurement systems |
05/20/2009 | DE102004024378B4 Verfahren zur robotergestützten Vermessung von Objekten A method for robot-assisted measurement of objects |
05/20/2009 | CN201242428Y Apparatus for measuring optical fiber length rapidly |