Patents
Patents for H01L 27 - Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate (229,248)
07/1998
07/16/1998DE19732237A1 Multilayer wafer having several SOI regions
07/15/1998EP0853427A2 Imaging devices, systems and methods
07/15/1998EP0853345A1 METHOD FOR FORMING CdTe FILM AND SOLAR BATTERY USING THE FILM
07/15/1998EP0853343A2 Semiconductor memory device having novel layout pattern
07/15/1998EP0853336A2 Method forming preferred orientation-controlled platinum films using nitrogen
07/15/1998EP0853254A2 Liquid crystal display
07/15/1998EP0853237A1 Sensors using detector arrays
07/15/1998EP0852817A1 Surface light-emitting element and self-scanning type light-emitting device
07/15/1998EP0852813A2 Integrated circuit device with embedded flash memory and method for manufacturing same
07/15/1998EP0852812A1 Semiconductor memory circuitry
07/15/1998EP0852806A1 Apparatus and method for making laminated electrical and electronic devices
07/15/1998CN1187906A Electrically erasable ROM cell array and method of producing same
07/15/1998CN1187695A Photoelectric conversion apparatus and method of driving same
07/15/1998CN1187694A Semiconductor memory and its making method
07/15/1998CN1187693A Structure of silicon on insulation layer of dynamic RAM and making method thereof
07/15/1998CN1187691A Semiconductor integrated circuit and its making method
07/15/1998CN1187687A Silicon on insulator substrate with improved insulation patterns
07/14/1998US5781494 Voltage pumping circuit for semiconductor memory device
07/14/1998US5781491 Memory device having divided cell array blocks to which different voltage levels are applied
07/14/1998US5781482 Semiconductor memory device
07/14/1998US5781468 Semiconductor memory device comprising two kinds of memory cells operating in different access speeds and methods of operating and manufacturing the same
07/14/1998US5781467 Decoding method for ROM matrix having a silicon controlled rectifier structure
07/14/1998US5781404 Electrode interface for high-dielectric-constant materials
07/14/1998US5781392 Balanced overvoltage protector for a dual-wire system
07/14/1998US5781391 IC having built-in over voltage protecting circuit
07/14/1998US5781389 Transistor protection circuit
07/14/1998US5781388 Non-breakdown triggered electrostatic discharge protection circuit for an integrated circuit and method therefor
07/14/1998US5781255 Active matrix display device using aluminum alloy in scanning signal line or video signal line
07/14/1998US5781234 Charge-coupled image sensor operable to simultaneously transfer pixels from adjacent image acquisition and image storage areas at different pixel transfer rates
07/14/1998US5781233 MOS FET camera chip and methods of manufacture and operation thereof
07/14/1998US5781071 Transformers and amplifiers
07/14/1998US5781050 Open drain output driver having digital slew rate control
07/14/1998US5781005 For detecting the presence of passing ferromagnetic articles
07/14/1998US5780930 Method for direct attachment of an on-chip bypass capacitor in an integrated circuit
07/14/1998US5780922 An aluminum oxide passivation layer, germanium channel region covering passivation layer, gate oxide of aluminum over channel, a controlling layer in contact with passivation layer to control excess arsenic migration to passivation
07/14/1998US5780920 Method of forming a resistor and integrated circuitry having a resistor construction
07/14/1998US5780919 Electrically programmable interconnect structure having a PECVD amorphous silicon element
07/14/1998US5780914 Contact image sensor whose sensory elements have identical output levels
07/14/1998US5780911 Thin film transistor and method for fabricating the same
07/14/1998US5780910 Semiconductor integrated circuit device
07/14/1998US5780909 Semiconductor memory device with a two-layer top gate
07/14/1998US5780907 Semiconductor device having triple wells
07/14/1998US5780906 Static memory cell and method of manufacturing a static memory cell
07/14/1998US5780905 Asymmetrical, bidirectional triggering ESD structure
07/14/1998US5780901 Semiconductor device with side wall conductor film
07/14/1998US5780899 For use in an integrated circuit
07/14/1998US5780898 Semiconductor device with a vertical field effect transistor and method of manufacturing the same
07/14/1998US5780897 ESD protection clamp for mixed voltage I/O stages using NMOS transistors
07/14/1998US5780895 Forward overvoltage protection circuit for a vertical semiconductor component
07/14/1998US5780894 Nonvolatile semiconductor memory device having stacked-gate type transistor
07/14/1998US5780893 Non-volatile semiconductor memory device including memory transistor with a composite gate structure
07/14/1998US5780892 Flash E2 PROM cell structure with poly floating and control gates
07/14/1998US5780891 Nonvolatile floating gate memory with improved interploy dielectric
07/14/1998US5780890 Nonvolatile semiconductor memory device and a method of writing data in the same
07/14/1998US5780889 Non-volatile memory cell
07/14/1998US5780888 Semiconductor device with storage node
07/14/1998US5780884 Amplication type solid-state imaging device
07/14/1998US5780883 Gate array architecture for multiplexer based circuits
07/14/1998US5780882 Semiconductor integrated circuit device, process for fabricating the same, and apparatus for fabricating the same
07/14/1998US5780881 Gate array driven by source voltages and electronic equipment using the same
07/14/1998US5780875 Hybrid optical integration assembly using optical platform
07/14/1998US5780873 Semiconductor device capable of easily forming cavity and its manufacturing method
07/14/1998US5780872 Liquid crystal device, projection type color display device and driving circuit
07/14/1998US5780871 TFT structure including a photo-imageable insulating layer for use with LCDs and image sensors
07/14/1998US5780858 Electromagnetic radiation imaging device using dual gate thin film transistors
07/14/1998US5780840 Close contact type image sensor having integrally moded reflective surfaces
07/14/1998US5780375 Containing barium titanate, zinc barium borate frit and bismuth oxide
07/14/1998US5780354 Method of manufacturing semiconductor devices with semiconductor elements formed in a layer of semiconductor material glued on a support wafer
07/14/1998US5780352 Method of forming an isolation oxide for silicon-on-insulator technology
07/14/1998US5780351 Semiconductor device having capacitor and manufacturing method thereof
07/14/1998US5780344 Method for fabricating mask ROM semiconductor device with junction isolation
07/14/1998US5780341 Low voltage EEPROM/NVRAM transistors and making method
07/14/1998US5780338 Method for manufacturing crown-shaped capacitors for dynamic random access memory integrated circuits
07/14/1998US5780335 Method of forming a buried-sidewall-strap two transistor one capacitor trench cell
07/14/1998US5780334 Method of fabricating capacitor of semiconductor memory device
07/14/1998US5780333 Method of fabricating an analog semiconductor device having a salicide layer
07/14/1998US5780332 Method of manufacturing a semiconductor memory device with a trench capacitor
07/14/1998US5780329 Process for fabricating a moderate-depth diffused emitter bipolar transistor in a BICMOS device without using an additional mask
07/14/1998US5780328 Process for producing semiconductor integrated circuit
07/14/1998US5780327 Vertical double-gate field effect transistor
07/14/1998US5780326 Patterning and etching the blanket of insulating layer over doped substrate to define an opening, forming conductive silicon material plug within the opening, forming dielectric over plug, then semiconductor layer and doping it
07/14/1998US5780325 Methods of making isolations including doped edge layer, for semiconductor-on-insulator substrates
07/14/1998US5780321 Forming indium-gallium-aluminum-phosphide epilayer
07/14/1998US5780314 Depositing first high temperature superconductive layer on first region and a portion of second region of substrate, a dielectric layer covering it, then second low temperature superconductive layer on second regionsecond
07/14/1998US5780311 bonded wafer processing
07/14/1998US5780310 Method of fabricating a memory cell array area and a peripheral circuit area
07/14/1998US5780115 Methods for fabricating electrode structures including oxygen and nitrogen plasma treatments
07/14/1998US5779918 Method for manufacturing a photo-sensor
07/09/1998WO1998029908A1 Ferroelectric memory device and method for manufacturing the same
07/09/1998WO1998029907A2 Low voltage single supply cmos electrically erasable read-only memory
07/09/1998WO1998029904A1 Bump-bonded semiconductor imaging device
07/09/1998WO1998029881A1 Device comprising an integrated coil
07/09/1998DE19756929A1 Cell array and read-out amplifier structure for semiconductor memory
07/08/1998EP0852401A2 Semiconductor device and method of manufacturing the same
07/08/1998EP0852400A2 A bistable SCR-like switch for ESD protection of silicon-on-insulator integrated circuits
07/08/1998EP0852396A2 Memory cell that includes a vertical transistor and a trench capacitor
07/08/1998EP0852066A1 Process for generating the source regions of a flash-eeprom storage cell field
07/08/1998EP0852064A2 Method of producing very small structural widths on a semiconductor substrate
07/08/1998EP0800720A4 Substrate clamp for non-isolated integrated circuits
07/08/1998EP0579779B1 A single transistor non-volatile electrically alterable semiconductor memory device