Patents for H01L 27 - Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate (229,248) |
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08/01/2001 | EP1120790A1 Magnetic memory with structures that prevent disruptions to magnetization in sense layers |
08/01/2001 | EP1120673A1 Passive alignment of optoelectronic components to optical waveguides using flip-chip bonding technology |
08/01/2001 | EP1119965A1 Method and device for the exposure-dependent noise correction in image sensors which can be addressed in lines and columns |
08/01/2001 | EP1119914A1 An integrated circuit provided with a fail-safe mode |
08/01/2001 | EP1119908A1 Electronic circuit for imitating a capacitor with variable capacitance |
08/01/2001 | EP1119878A1 Encapsulation of a device |
08/01/2001 | EP1119876A2 Switching transistor with reduced switching losses |
08/01/2001 | EP1119875A1 Semiconductor device with a non-volatile memory |
08/01/2001 | EP1119860A2 Magnetoresistive memory having improved interference immunity |
08/01/2001 | EP1119290A1 Tiered detector assembly |
08/01/2001 | CN1306678A Edge-emitting light-emitting device having improved external luminous efficiency and self-scanning light-emitting device array comprising same |
08/01/2001 | CN1306307A Module with film circuit |
08/01/2001 | CN1306304A Method for mfg. capacitor of semiconductor device |
08/01/2001 | CN1306299A Semiconductor structure with crystallzed alkaline-earth metal silicon-nitrogen compound/oxide and silicon interface |
08/01/2001 | CN1069112C Method for forming ferrioelectric thin film and appts. therefor |
07/31/2001 | US6269466 Method of constructing an integrated circuit utilizing multiple layers of interconnect |
07/31/2001 | US6269328 Testing integrated circuit device |
07/31/2001 | US6269280 Semiconductor device and method of fabricating the same |
07/31/2001 | US6269047 Semiconductor memory device |
07/31/2001 | US6269027 Non-volatile storage latch |
07/31/2001 | US6269018 Magnetic random access memory using current through MTJ write mechanism |
07/31/2001 | US6269017 Multi level mask ROM with single current path |
07/31/2001 | US6268993 Electrostatic discharge protection clamp for high-voltage power supply or I/O with nominal-voltage reference |
07/31/2001 | US6268992 Displacement current trigger SCR |
07/31/2001 | US6268990 Semiconductor protection device and power converting system |
07/31/2001 | US6268842 Thin film transistor circuit and semiconductor display device using the same |
07/31/2001 | US6268779 Integrated oscillators and tuning circuits |
07/31/2001 | US6268764 Bandgap voltage comparator used as a low voltage detection circuit |
07/31/2001 | US6268761 Booster circuit |
07/31/2001 | US6268757 Semiconductor device having capacitor that reduce fluctuation of power supply |
07/31/2001 | US6268658 Semiconductor integrated circuit device for connecting semiconductor region and electrical wiring metal via titanium silicide layer and method of fabrication thereof |
07/31/2001 | US6268640 Forming steep lateral doping distribution at source/drain junctions |
07/31/2001 | US6268639 Electrostatic-discharge protection circuit |
07/31/2001 | US6268638 Metal wire fuse structure with cavity |
07/31/2001 | US6268636 Operation and biasing for single device equivalent to CMOS |
07/31/2001 | US6268633 Electronic structure comprising high and low voltage transistors, and a corresponding fabrication method |
07/31/2001 | US6268632 Field effect transistor and power amplifier including the same |
07/31/2001 | US6268630 Silicon-on-insulator field effect transistor with improved body ties for rad-hard applications |
07/31/2001 | US6268628 Depletion type MOS semiconductor device and MOS power IC |
07/31/2001 | US6268627 Semiconductor device having impurity regions with varying impurity concentrations |
07/31/2001 | US6268626 DMOS field effect transistor with improved electrical characteristics and method for manufacturing the same |
07/31/2001 | US6268625 Trench-type thin film transistor |
07/31/2001 | US6268623 Apparatus and method for margin testing single polysilicon EEPROM cells |
07/31/2001 | US6268622 Non-volatile memory device and fabrication method thereof |
07/31/2001 | US6268621 Vertical channel field effect transistor |
07/31/2001 | US6268620 Method of forming capacitors on integrated circuit |
07/31/2001 | US6268619 Integrated circuits |
07/31/2001 | US6268558 Solar battery module |
07/31/2001 | US6268295 Method of manufacturing semiconductor device |
07/31/2001 | US6268286 Method of fabricating MOSFET with lateral resistor with ballasting |
07/31/2001 | US6268280 Semiconductor device using dual damascene technology and method for manufacturing the same |
07/31/2001 | US6268278 Semiconductor device and manufacturing process thereof |
07/31/2001 | US6268260 Methods of forming memory cell capacitor plates in memory cell capacitor structures |
07/31/2001 | US6268258 Method for fabricating capacitor in semiconductor device |
07/31/2001 | US6268252 Method of forming self-aligned contact pads on electrically conductive lines |
07/31/2001 | US6268249 Semiconductor device and method of fabricating the same |
07/31/2001 | US6268248 Method of fabricating a source line in flash memory having STI structures |
07/31/2001 | US6268245 Method for forming a DRAM cell with a ragged polysilicon crown-shaped capacitor |
07/31/2001 | US6268244 Method of fabricating capacitors of a memory cell array |
07/31/2001 | US6268243 Method for fabricating dynamic random access memory cells |
07/31/2001 | US6268240 Static semiconductor memory device capable of enhancing access speed |
07/31/2001 | US6268234 Solid state imaging device |
07/31/2001 | US6268229 Emitting electrons |
07/31/2001 | US6267479 Semiconductor device, and method for manufacturing the same |
07/31/2001 | US6267294 Method of operating a charge coupled device in an accelerated mode, and in conjunction with an optical symbology imager |
07/28/2001 | CA2331992A1 High speed semiconductor photodetector |
07/26/2001 | WO2001054199A1 Semiconductor device and manufacture thereof |
07/26/2001 | WO2001054198A1 A video bus for high speed multi-resolution imagers and method thereof |
07/26/2001 | WO2001054194A1 Personalized hardware |
07/26/2001 | WO2001054189A1 Method of joining components |
07/26/2001 | WO2001054174A1 Silicon on insulator circuit structure with buried semiconductor interconnect structure and method for forming same |
07/26/2001 | WO2001054168A2 Semiconductor component and corresponding testing method |
07/26/2001 | WO2001053903A1 Bandgap voltage reference source |
07/26/2001 | WO2001053844A1 Hierarchical test circuit structure for chips with multiple circuit blocks |
07/26/2001 | WO2001053840A1 Circuit for voltage level detection |
07/26/2001 | WO2000060670A3 Integrated semiconductor device with one lateral power gate |
07/26/2001 | WO2000028664A3 Fully integrated tuner architecture |
07/26/2001 | US20010010092 Semiconductor integrated circuit with a reduced skew and layout method in design for semiconductor integrated circuit |
07/26/2001 | US20010009796 N-type silicon regions are implanting with a p+ type dopant through the first oxide, p-type silicon regions are implanted with an n+ type dopant through second oxide |
07/26/2001 | US20010009795 Simplified high Q inductor substrate |
07/26/2001 | US20010009789 Semiconductor device and manufacturing method thereof |
07/26/2001 | US20010009788 Layers of silicon carbide, silicon dioxide an insulating material, and a gate contact |
07/26/2001 | US20010009786 Contact is evenly formed and the area of the cell array region is reduced, thereby enabling cells to be packed on a chip with high density |
07/26/2001 | US20010009785 Forming n-type drain region in n-type silicon region, forming n-type source region in n-type silicon region, forming dielectric layer on n-type silicon region, forming a p-type polysilicon gate on dielectric layer |
07/26/2001 | US20010009784 Preparing substrate, isolating active region, depositing gate oxide, depositing first and second selective etchable layers over gate oxide layer, etching to undercut first etchable layer, implanting ions, etching, depositing oxide, metallizing |
07/26/2001 | US20010009783 Semiconductor device and fabrication method thereof |
07/26/2001 | US20010009691 Multicolor display device, comprising a transparent substrate, fluorescent dye deposited in a dye layer onto the substrate by ink jet printing, and a source of radiation for illuminating the dye; used in computer, television, screen |
07/26/2001 | US20010009689 Forming spacers having a height exceeding the thickness of thin film on the substrate, vapor depositing a deposit for patterning, the shadow mask having reinforcing lines formed across its apertures is kept in contact with spacers |
07/26/2001 | US20010009527 Semiconductor memory device |
07/26/2001 | US20010009524 Semiconductor device having a test circuit |
07/26/2001 | US20010009519 Dynamic ram and semiconductor device |
07/26/2001 | US20010009442 Solid image-pickup device and method of manufacturing the same |
07/26/2001 | US20010009383 Semiconductor integrated circuit and its fabrication method |
07/26/2001 | US20010009381 Semiconductor integrated circuit and method of designing the same |
07/26/2001 | US20010009351 Organic electroluminescence element and manufacturing method thereof |
07/26/2001 | US20010009350 Organic electroluminescent apparatus and method of fabricating the same |
07/26/2001 | US20010009300 Semiconductor element having external connection terminals, method of manufacturing the semiconductor element, and semiconductor device equipped with the semiconductor element |
07/26/2001 | US20010009292 Semiconductor device and method of manufacturing the same |
07/26/2001 | US20010009289 Flash memory device and fabrication method thereof |
07/26/2001 | US20010009288 Semiconductor device and method of fabricating the same |