H01L 27 - Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate

Patents for H01L 27 - Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate (229,248)
11/2001
11/20/2001	US6319860 Process for manufacturing semiconductor integrated circuit device including treatment of gas used in the process
11/20/2001	US6319849 Semiconductor device and a process for forming a protective insulating layer thereof
11/20/2001	US6319839 Approach to form an inter-polysilicon oxide (IPO) layer for charge coupled devices
11/20/2001	US6319806 Integrated circuit wiring and fabricating method thereof
11/20/2001	US6319805 Semiconductor device having metal silicide film and manufacturing method thereof
11/20/2001	US6319800 Static memory cell
11/20/2001	US6319793 Circuit isolation utilizing MeV implantation
11/20/2001	US6319790 Process for fabricating semiconductor device with multiple cylindrical capacitor
11/20/2001	US6319787 Method for forming a high surface area trench capacitor
11/20/2001	US6319781 Method of fabricating self-aligned multilevel mask ROM
11/20/2001	US6319777 Trench semiconductor device manufacture with a thicker upper insulating layer
11/20/2001	US6319774 Method for forming a memory cell
11/20/2001	US6319773 Construction and application for non-volatile, reprogrammable switches
11/20/2001	US6319772 Method for making low-leakage DRAM structures using selective silicon epitaxial growth (SEG) on an insulating layer
11/20/2001	US6319770 Method for fabricating a bottom electrode of a dynamic random access memory capacitor
11/20/2001	US6319769 Capacitor in a semiconductor device and a fabricating method thereof
11/20/2001	US6319768 Method for fabricating capacitor in dram cell
11/20/2001	US6319766 Method of tantalum nitride deposition by tantalum oxide densification
11/20/2001	US6319765 Method for fabricating a memory device with a high dielectric capacitor
11/20/2001	US6319763 Manufacturing method for semiconductor device
11/20/2001	US6319761 Method of fabricating a thin film transistor
11/20/2001	US6319747 Process for producing a thin-film solar module and separating means for use in this process
11/20/2001	US6319746 Optical semiconductor device and method for fabricating the same
11/20/2001	US6319738 Two-dimensionally arrayed quantum device fabrication method
11/20/2001	US6319731 Method for manufacturing a non-volatile memory device
11/20/2001	US6319542 Forming a thin-film microelectronic capacitor on an integrated circuit by forming an buffer layer, a lanthanum doped barium strontium titanate layer, a barium strontium titanate dielectric layer and an upper electrode
11/20/2001	US6319427 Fast luminescent silicon
11/20/2001	US6319196 Imaging element assembly unit for endoscope
11/20/2001	US6318901 Socket and a system for optoelectronic interconnection and a method of fabricating such socket and system
11/20/2001	US6318267 Integrated circuit configuration and ignition unit
11/15/2001	WO2001086946A1 Imaging device, and its drive control method
11/15/2001	WO2001086728A1 Anode voltage sensor of a vertical power component and use for protecting against short circuits
11/15/2001	WO2001086724A1 Polarimetric optical detector
11/15/2001	WO2001086723A1 Multiwavelength optical microsensor, digital spectrophotometer and polychromator
11/15/2001	WO2001086706A1 Method for substrate noise distribution
11/15/2001	WO2001086699A2 Low temperature grown optical detector
11/15/2001	WO2001086694A2 An optoelectronic display device
11/15/2001	WO2001059821A8 A process for forming a semiconductor structure
11/15/2001	WO2001059820A8 Semiconductor structure
11/15/2001	US20010041460 Method of depositing dielectric
11/15/2001	US20010041438 Semiconductor device and method of manufacturing the same
11/15/2001	US20010041434 Method of manufacturing non-volatile semiconductor memory device storing charge in gate insulating layer therein
11/15/2001	US20010041431 Semiconductor device with transparent link area for silicide applications and fabrication thereof
11/15/2001	US20010041418 Circuit isolation utilizing mev implantation
11/15/2001	US20010041413 Method of manufacturing electronic component having capacitor element and resistor element, method of manufacturing semiconductor device, and semiconductor device
11/15/2001	US20010041412 Method of manufacturing a semiconductor device
11/15/2001	US20010041411 Semiconductor device having improved parasitic capacitance and mechanical strength
11/15/2001	US20010041410 Method for production and formation of semiconductor light emitting diodes
11/15/2001	US20010041405 Semiconductor memory device and method of manufacturing the same
11/15/2001	US20010041404 Semiconductor memory device and method of fabricating the same
11/15/2001	US20010041402 Method for manufacturing semiconductor memory and method for manufacturing capacitor
11/15/2001	US20010041401 Open pattern inductor
11/15/2001	US20010041395 Planar substrate with patterned silicon-on- insulator region and self-aligned trench
11/15/2001	US20010041394 Photolithography system and a method for fabricating a thin film transistor array substrate using the same
11/15/2001	US20010041393 Process of forming a thick oxide field effect transistor
11/15/2001	US20010041379 Fabricating method of optical semiconductor device
11/15/2001	US20010041377 Method of manufacturing semiconductor device
11/15/2001	US20010041374 Low temperature chemical vapor deposition process for forming bismuth-containing ceramic thin films useful in ferroelectric memory devices
11/15/2001	US20010041373 Thin film ferroelectric capacitors having improved memory retention through the use of essentially smooth bottom electrode structures
11/15/2001	US20010041310 Semiconductor; masking substrate with photoresist; patterning; exposure; development
11/15/2001	US20010041270 Light-emitting device
11/15/2001	US20010040835 Semiconductor integrated circuit device
11/15/2001	US20010040834 Semiconductor integrated circuit device having a hierarchical power source configuration
11/15/2001	US20010040829 Semiconductor integrated circuit device capable of performing operational test for contained memory core at operating frequency higher than that of memory tester
11/15/2001	US20010040822 Nonvolatile semiconductor memory
11/15/2001	US20010040819 Magnetoresistive device and magnetic memory using the same
11/15/2001	US20010040817 SRAM having a reduced chip area
11/15/2001	US20010040816 Reduced leakage DRAM storage unit
11/15/2001	US20010040814 Semiconductor memory device
11/15/2001	US20010040778 Limiting magnetoresistive electrical interaction to a preferred portion of a magnetic region in magnetic devices
11/15/2001	US20010040649 Manufacturing method of a liquid crystal display
11/15/2001	US20010040645 Semiconductor device and manufacturing method thereof
11/15/2001	US20010040644 Bonded layer semiconductor device
11/15/2001	US20010040639 Image-pickup apparatus, fabrication method thereof, and camera system
11/15/2001	US20010040635 CMOS active pixel sensor type imaging system on a chip
11/15/2001	US20010040634 Photoelectric conversion device
11/15/2001	US20010040631 CMOS sensor array with a memory interface
11/15/2001	US20010040620 Optical write head, and method of assembling the same
11/15/2001	US20010040565 Electro luminescence display device and method of testing the same
11/15/2001	US20010040541 Semiconductor device having laser-annealed semiconductor device, display device and liquid crystal display device
11/15/2001	US20010040475 Integrated circuit
11/15/2001	US20010040465 Semiconductor device
11/15/2001	US20010040440 Motor driving circuit, a method for driving a motor, and a semiconductor integrated circuit device
11/15/2001	US20010040271 BEOL decoupling capacitor
11/15/2001	US20010040270 Inductance device formed on semiconductor substrate
11/15/2001	US20010040263 Microlens array and fabrication method thereof
11/15/2001	US20010040261 Integrated circuit wiring and fabricating method thereof
11/15/2001	US20010040260 High-resistance load sram
11/15/2001	US20010040259 Semiconductor device and method of manufacturing the same
11/15/2001	US20010040257 Semiconductor device and manufacturing method thereof
11/15/2001	US20010040254 Reference voltage supply circuit having reduced dispersion of an output voltage
11/15/2001	US20010040251 Semiconductor device and manufacturing method thereof
11/15/2001	US20010040249 Ferroelectric capacitor
11/15/2001	US20010040210 Solid-state image sensor with reduced smear and noise
11/15/2001	DE10053201A1 Aufschleuder-Glaszusammensetzung und Verfahren zur Herstellung einer Siliziumoxidschicht bei einem Halbleiterherstellungsprozeß unter Verwendung derselben Spin-on glass composition and method for producing a silicon oxide film in a semiconductor fabrication process using the same
11/15/2001	DE10021367A1 Detektor für Computertomographen Detector computed tomography
11/15/2001	DE10019697A1 Spin polarization of charge carrier systems in solid bodies comprises applying a inhomogeneous magnetic field produced by a structure in the region of a solid body or on the surface of a solid body
11/15/2001	CA2409583A1 Anode voltage sensor of a vertical power component and use for protecting against short circuits
11/15/2001	CA2308820A1 Wireless radio frequency technique design and method for testing of integrated circuits and wafers
11/14/2001	EP1154676A1 Display device

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