H01L 27 - Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate

Patents for H01L 27 - Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate (229,248)
12/2001
12/20/2001	US20010052610 Reduced topography DRAM cell fabricated using a modified logic process and method for operating same
12/20/2001	US20010052609 Multilayer electrode for a ferroelectric capacitor
12/20/2001	US20010052608 Multilayer electrode for a ferroelectric capacitor
12/20/2001	US20010052607 Nonvolatile semiconductor memory
12/20/2001	US20010052605 Lock in pinned photodiode photodetector
12/20/2001	US20010052604 Image sensor with photo diodes
12/20/2001	US20010052599 Semiconductor memory device including plurality of global data lines in parallel arrangement with low parasitic capacitance, and fabrication method thereof
12/20/2001	US20010052598 Display device and semiconductor device having laser annealed semiconductor elements
12/20/2001	US20010052597 Light-emitting matrix array display devices with light sensing elements
12/20/2001	US20010052574 MOS-based image sensor and method of forming black-level signal therefor
12/20/2001	DE10128577A1 Semiconductor pressure sensor for e.g., as intake pressure sensor in vehicle engine intake, has semiconductor substrate, diaphragm portion, strain gauge, circuit portion, and local oxidation of silicon film
12/20/2001	DE10064200A1 Nichtflüchtige Halbleiterspeichervorrichtung und integrierte Halbleiterschaltung A non-volatile semiconductor memory device and a semiconductor integrated circuit
12/20/2001	DE10064199A1 Halbleitervorrichtung Semiconductor device
12/20/2001	DE10063623A1 Semiconductor memory has select drive circuit which selectively drives dummy word line transistor, while operating in test mode
12/20/2001	DE10062232A1 Halbleitervorrichtung und Verfahren zu deren Herstellung Semiconductor device and process for their preparation
12/20/2001	DE10036140C1 Non-destructive read-out of MRAM memory cells involves normalizing actual cell resistance, comparing normalized and normal resistance values, detecting content from the result
12/20/2001	DE10028424A1 DRAM-Speicherzelle für DRAM-Speichervorrichtung und deren Herstellungsverfahren DRAM memory cell for DRAM memory device and its manufacturing method
12/20/2001	DE10026740A1 Semiconducting switch element with integral Schottky diode has first connection electrode electrically connected to first connection zone and to Schottky barrier in second connection zone
12/20/2001	DE10025363A1 Bildsensorelement und Bildsensor Image sensor element and image sensor
12/19/2001	EP1164643A2 Diode having breakdown voltage adjustable to arbitrary value without increase of parasitic capacitance and process for fabrication thereof
12/19/2001	EP1164642A2 Semiconductor memory
12/19/2001	EP1164641A2 Light emitting module and method of driving the same, and optical sensor
12/19/2001	EP1164640A1 Semiconductor device and manufacture thereof
12/19/2001	EP1164634A2 Method of manufacturing a field effect transistor
12/19/2001	EP1164633A2 Method for etching an electrode in a semiconductor device
12/19/2001	EP1164631A2 Process for forming openings in a layer
12/19/2001	EP1164595A1 Semiconductor device
12/19/2001	EP1164565A1 Constant-current device, display device, and method for driving the same
12/19/2001	EP1164381A2 Integrated circuit with a test fucntion and test arrangement for testing an integrated circuit
12/19/2001	EP1163699A1 Virtual-ground, split-gate flash memory cell arrangements
12/19/2001	EP1163698A1 Iridium oxide diffusion barrier between local interconnect layer and thin film of layered superlattice material
12/19/2001	EP1163676A1 Storage cell array and method for the production thereof
12/19/2001	EP1119290A4 Tiered detector assembly
12/19/2001	EP0931341B1 Process for producing barrier-free semiconductor storage assemblies
12/19/2001	EP0842540B1 Flat panel detector for radiation imaging and pixel for use therein
12/19/2001	EP0782768B1 Integrated circuit structure with an active microwave element and at least one passive element
12/19/2001	EP0737363B1 Method of manufacturing a semiconductor device for microwave
12/19/2001	CN1327617A Light-receiving element array and light-receiving element array chip
12/19/2001	CN1327616A Integrated circuit power and ground route
12/19/2001	CN1327615A 8 bit per cell non-volatile semiconductor memory structure utilizing trench technology and dielectric floating gate
12/19/2001	CN1327552A Rapid on chip voltage generator for low power integrated circuit
12/19/2001	CN1327535A Infrared bolometer and method for the manufacture thereof
12/19/2001	CN1327534A Infrared bolometer
12/19/2001	CN1327533A Bolometer with a zinc oxide bolometer element
12/19/2001	CN1327532A Photodetector array and optical branching filter using the array
12/19/2001	CN1327360A Electroluminescent element and its producing method
12/19/2001	CN1327272A High speed semiconductor photooptic detector
12/19/2001	CN1327270A Self luminous device and electric equipment using self luminous device
12/19/2001	CN1327269A Solid photographic device and its producing method
12/19/2001	CN1327267A Forming anti-fuse structure in silicone on insulator and method thereof
12/19/2001	CN1327262A Method for producing semiconductor device
12/19/2001	CN1327261A Method for producing fuly self alignment film field effect transistor by improved technology window
12/19/2001	CN1327238A Equipmental readant method of resistance cross point storage unit array
12/19/2001	CN1076517C Production of semiconductor unit
12/19/2001	CN1076438C Electric EGR valve of rotary diesel engine
12/18/2001	USRE37477 Integrated circuit protected against electrostatic discharges, with variable protection threshold
12/18/2001	US6332016 Photoelectric conversion device, manufacturing method thereof, and x-ray imaging system including the device
12/18/2001	US6331962 Semiconductor device including voltage down converter allowing tuning in short period of time and reduction of chip area
12/18/2001	US6331947 Non-volatile MOS RAM cell with capacitor-isolated nodes that are radiation accessible for rendering a non-permanent programmed information in the cell a non-volatile one
12/18/2001	US6331943 MTJ MRAM series-parallel architecture
12/18/2001	US6331873 High-precision blooming control structure formation for an image sensor
12/18/2001	US6331797 Voltage translator circuit
12/18/2001	US6331796 Semiconductor integrated circuit device having transistor logic and load circuits
12/18/2001	US6331790 Customizable and programmable cell array
12/18/2001	US6331726 SOI voltage dependent negative-saturation-resistance resistor ballasting element for ESD protection of receivers and driver circuitry
12/18/2001	US6331725 Integrated circuitry
12/18/2001	US6331724 Single transistor E2prom memory device with controlled erasing
12/18/2001	US6331723 Active matrix display device having at least two transistors having LDD region in one pixel
12/18/2001	US6331722 Hybrid circuit and electronic device using same
12/18/2001	US6331720 Electrically conductive structure
12/18/2001	US6331719 Semiconductor device for reducing effects of noise on an internal circuit
12/18/2001	US6331718 Thin film circuit with improved carrier mobility
12/18/2001	US6331705 Room temperature solid state gamma or X-ray detectors
12/18/2001	US6331670 Solar cell module having an overvoltage preventive element and sunlight power generation system using the solar cell module
12/18/2001	US6331471 Method for improving peeling issues during fabrication of integrated circuits
12/18/2001	US6331466 Insulated gate semiconductor device and manufacturing method thereof
12/18/2001	US6331462 Manufacturing method of a semiconductor device for desired circuit patterns
12/18/2001	US6331461 Semiconductor processing methods of forming devices on a substrate, forming device arrays on a substrate, forming conductive lines on a substrate, and forming capacitor arrays on a substrate, and integrated circuitry
12/18/2001	US6331460 Method of fabricating a mom capacitor having a metal silicide barrier
12/18/2001	US6331459 Use of dummy poly spacers and divot fill techniques for DT-aligned processing after STI formation for advanced deep trench capacitor DRAM
12/18/2001	US6331458 Active region implant methodology using indium to enhance short channel performance of a surface channel PMOS device
12/18/2001	US6331455 Power rectifier device and method of fabricating power rectifier devices
12/18/2001	US6331443 Method for manufacturing a liquid crystal display
12/18/2001	US6331379 Photo-lithography process using multiple anti-reflective coatings
12/18/2001	CA2249977C Image sensor chip and image sensor
12/13/2001	WO2001095395A1 Protection device against electrostatic discharges
12/13/2001	WO2001095383A1 Method for making an electronic component with self-aligned drain and gate, in damascene architecture
12/13/2001	WO2001095378A2 Methods for forming and integrated circuit structures containing ruthenium and tungsten containing layers
12/13/2001	WO2001095377A2 Methods for forming and integrated circuit structures containing enhanced-surface-area conductive layers
12/13/2001	WO2001095376A2 Methods for forming rough ruthenium-containing layers and structures/methods using same
12/13/2001	WO2001095369A2 Halo-free non-rectifying contact on chip with halo source/drain diffusion
12/13/2001	WO2001095298A1 Display and personal digital assistant with display
12/13/2001	WO2001051243A3 Laser system and method for processing a memory link with a burst of laser pulses having ultrashort pulsewidths
12/13/2001	US20010052096 Low power scan flipflop
12/13/2001	US20010051444 Method for manufacturing aluminum oxide film for use in semiconductor device
12/13/2001	US20010051418 Method of manufacturing semiconductor device having memory cell transistors
12/13/2001	US20010051414 Semiconductor integrated circuit and method for manufacturing the same
12/13/2001	US20010051411 Manufacturing method of semiconductor device
12/13/2001	US20010051410 Semiconductor device having reduced field oxide recess and method of fabrication
12/13/2001	US20010051409 Processing methods of forming integrated circuitry memory devices, methods of forming DRAM arrays, and related semiconductor masks

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