| Patents for H01L 27 - Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate (229,248) |
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| 07/04/2002 | WO2002052571A1 Ferroelectric memory device and method for operating memory cell comprising ferroelectric capacitor |
| 07/04/2002 | WO2002052335A2 Variable focal length micro lens array field curvature corrector |
| 07/04/2002 | WO2002052290A1 Asynchronous reset circuit testing |
| 07/04/2002 | WO2002052288A2 Weighted random pattern test using pre-stored weights |
| 07/04/2002 | WO2002031879A3 Select transistor architecture for a virtual ground non-volatile memory cell array |
| 07/04/2002 | WO2002027947A3 Improvements in or relating to electronic systems |
| 07/04/2002 | WO2002001644A3 Power mosfet and methods of forming and operating the same |
| 07/04/2002 | WO2001099153A3 A negative differential resistance device and method of operating same |
| 07/04/2002 | US20020087942 Apparatus for layout designing of semiconductor device, method of layout designing, and semiconductor device |
| 07/04/2002 | US20020087941 Semiconductor device having embedded array |
| 07/04/2002 | US20020087929 Test circuit for logical integrated circuit and method for testing same |
| 07/04/2002 | US20020087927 Method for testing integrated circuits |
| 07/04/2002 | US20020087661 One click web records |
| 07/04/2002 | US20020086585 Insulation device of an electric element |
| 07/04/2002 | US20020086542 Fabrication of semiconductor devices |
| 07/04/2002 | US20020086532 Method for processing a monocrystalline Si-semiconductor wafer |
| 07/04/2002 | US20020086516 Sub-minimum wiring structure |
| 07/04/2002 | US20020086509 Method for fabricating a contact pad of semiconductor device |
| 07/04/2002 | US20020086507 Method of forming a metal gate in a semiconductor device |
| 07/04/2002 | US20020086504 Method of manufacturing semiconductor devices |
| 07/04/2002 | US20020086493 Manufacturing method of semiconductor device having DRAM capacitors |
| 07/04/2002 | US20020086491 Semiconductor device having a metal gate with a work function compatible with a semiconductor device |
| 07/04/2002 | US20020086489 Use of sidewall spacer in PNP layout to minimize silicided area of emitter |
| 07/04/2002 | US20020086488 Method of manufacturing a semiconductor device comprising a bipolar transistor and a capacitor |
| 07/04/2002 | US20020086486 Method of manufacturing semiconductor device and the semiconductor device |
| 07/04/2002 | US20020086482 Method and structure for an improved floating gate memory cell |
| 07/04/2002 | US20020086481 Method of fabricating deep trench capacitor |
| 07/04/2002 | US20020086480 Method of manufacturing a capacitor in a semiconductor device |
| 07/04/2002 | US20020086476 Depositing a silicon oxide layer having a low dielectric constant, a high oxide content, and sufficient carbon content to provide barrier properties |
| 07/04/2002 | US20020086470 Method for crystallizing amorphous silicon and fabricating thin film transistor using crystallized silicon |
| 07/04/2002 | US20020086469 Method for fabricating polysilicon thin film transistor |
| 07/04/2002 | US20020086467 Substrate-blased silicon diode for electrostatic discharge protection and fabrication method |
| 07/04/2002 | US20020086466 Integrated circuit with conductive lines disposed within isolation regions |
| 07/04/2002 | US20020086465 Sub-lithographics opening for back contact or back gate |
| 07/04/2002 | US20020086463 Means for forming SOI |
| 07/04/2002 | US20020086461 Radiation hardened semiconductor memory |
| 07/04/2002 | US20020086458 Precision micromirror positioning |
| 07/04/2002 | US20020086457 Systems and methods for fabricating an electro-optical device used for image sensing |
| 07/04/2002 | US20020086448 Method for manufacturing a semiconductor device |
| 07/04/2002 | US20020086447 Method for fabricating capacitor |
| 07/04/2002 | US20020086445 Method for fabricating a dual metal gate for a semiconductor device |
| 07/04/2002 | US20020086232 Disposing active primer between receptor substrate and a thermal transfer donor; disposing transfer assist layer on active primer; selectively thermally transferring portion of transfer layer from donor to receptor |
| 07/04/2002 | US20020086222 Photomask and manufacturing method of an electronic device therewith |
| 07/04/2002 | US20020085445 Semiconductor memory device enabling reduction of test time period |
| 07/04/2002 | US20020085442 Semiconductor integrated circuit device |
| 07/04/2002 | US20020085434 Structure and process for 6F2 trench capacitor DRAM cell with vertical MOSFET and 3F bitline pitch |
| 07/04/2002 | US20020085428 Arrangement of bitline boosting capacitor in semiconductor memory device |
| 07/04/2002 | US20020085412 Passivated magneto-resistive bit structure |
| 07/04/2002 | US20020085411 Method for preventing unwanted programming in an MRAM configuration |
| 07/04/2002 | US20020085409 Static random access memory cell and method |
| 07/04/2002 | US20020085329 Electrostatic discharge protection circuit |
| 07/04/2002 | US20020085328 RC controlled ESD circuits for mixed-voltage interface |
| 07/04/2002 | US20020085139 Liquid crystal display device and fabricating method thereof |
| 07/04/2002 | US20020085105 CMOS active pixel sensor |
| 07/04/2002 | US20020085103 Solid state image pickup apparatus |
| 07/04/2002 | US20020085102 Solid-state image sensing apparatus with temperature correction and method of calibrating the same |
| 07/04/2002 | US20020084967 Image display apparatus and driving method thereof |
| 07/04/2002 | US20020084952 Flat panel color display with enhanced brightness and preferential viewing angles |
| 07/04/2002 | US20020084886 Method for fabricating a thin film resistor |
| 07/04/2002 | US20020084835 Semiconductor device with reduced leakage of current |
| 07/04/2002 | US20020084804 Semiconductor integrated circuit device having power reduction mechanism |
| 07/04/2002 | US20020084747 Light emitting device and production method thereof |
| 07/04/2002 | US20020084746 Contact between element to be driven and thin film transistor for supplying power to element to be driven |
| 07/04/2002 | US20020084536 Interconnected circuit board assembly and method of manufacture therefor |
| 07/04/2002 | US20020084525 Structure and method for planar lateral oxidation in passive devices |
| 07/04/2002 | US20020084512 Semiconductor wafer |
| 07/04/2002 | US20020084509 Spiral inductor semiconducting device with grounding strips and conducting vias |
| 07/04/2002 | US20020084500 Magnetic random access memory and method for manufacturing the same |
| 07/04/2002 | US20020084496 Semiconductor device having resistance elements, and process for fabricating the same |
| 07/04/2002 | US20020084493 Memory cell with transistors having relatively high threshold voltages in response to selective gate doping |
| 07/04/2002 | US20020084492 Complementary MOS semiconductor device and method of manufacturing the same |
| 07/04/2002 | US20020084491 Multi-finger type electrostatic discharge protection circuit |
| 07/04/2002 | US20020084490 ESD protection networks with NMOS-bound or PMOS-bound diode structures in a shallow-trench-isolation (STI) CMOS process |
| 07/04/2002 | US20020084488 Etch-stopped SOI back-gate contact |
| 07/04/2002 | US20020084487 Semiconductor device |
| 07/04/2002 | US20020084485 Dummy layer diode structures for ESD protection |
| 07/04/2002 | US20020084484 Semiconductor memory and method of manufacture thereof |
| 07/04/2002 | US20020084483 Method and structure for an improved floating gate memory cell |
| 07/04/2002 | US20020084477 Semiconductor integrated circuit device and the process of manufacturing the same |
| 07/04/2002 | US20020084475 Method of fabricating X-ray detecting device |
| 07/04/2002 | US20020084474 Back illuminated imager with enhanced UV to near IR sensitivity |
| 07/04/2002 | US20020084473 Method for forming contact hole and spacer of semiconductor device |
| 07/04/2002 | US20020084472 Thermal coupling of matched SOI device bodies |
| 07/04/2002 | US20020084471 Integrated circuit capacitors having a dielectric layer between a u-shaped lower electrode and a support layer and methods of fabricating the same |
| 07/04/2002 | US20020084469 Linear image sensor integrated circuit |
| 07/04/2002 | US20020084464 Light emitting device and method of manufacturing the same |
| 07/04/2002 | US20020084463 Low-power organic light emitting diode pixel circuit |
| 07/04/2002 | US20020084460 Thin film transistor matrix device and method for fabricating the same |
| 07/04/2002 | US20020084459 Thin film transistor substrate and fabricating method thereof |
| 07/04/2002 | US20020084457 Semiconductor device having embedded array |
| 07/04/2002 | US20020084454 Organic electro luminescence element having in plane electrode structure and method for fabricating the same |
| 07/04/2002 | US20020084419 X-ray detecting device and fabricating method thereof |
| 07/04/2002 | US20020084407 Systems and methods for fabricating an electro-optical device used for image sensing |
| 07/04/2002 | US20020084250 Method for forming a passivation on berry diffusion layer of a non-volatile memory |
| 07/04/2002 | DE10164606A1 Flip chip semiconductor device for integrated circuit has signal connection surfaces arranged outside energy lead connection surfaces |
| 07/04/2002 | DE10159762A1 Halbleiterspeicher Semiconductor memory |
| 07/04/2002 | DE10158706A1 Semiconductor device e.g. metal oxide semiconductor transistor, has gate electrode with polysilicon layer having reverse tapering portion to enlarge distance between gate electrode and contact plug |
| 07/04/2002 | DE10136246A1 Halbleitervorrichtung mit kapazitivem Element und Verfahren zu ihrer Herstellung A semiconductor device having a capacitive element and process for its preparation |
| 07/04/2002 | DE10131716A1 Verfahren zur Herstellung eines Kondensators für eine Halbleiterspeichervorrichtung durch eine zweistufige Thermalbehandlung A method of manufacturing a capacitor for a semiconductor memory device by a two stage thermal treatment |
| 07/04/2002 | DE10064478A1 Verfahren zur Prüfung einer integrierten Schaltung A method for testing an integrated circuit |