Patents
Patents for H01L 27 - Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate (229,248)
05/2003
05/29/2003US20030098483 Vertical internally-connected trench cell (V-ICTC) and formation method for semiconductor memory devices
05/29/2003US20030098482 Reduction of damage in semiconductor container capacitors
05/29/2003US20030098481 Capacitor array structure for semiconductor devices
05/29/2003US20030098479 Novel MOS transistor structure and method of fabrication
05/29/2003US20030098476 Synapse element with learning function and semiconductor integrated circuit device including the synapse element
05/29/2003US20030098475 Photodiode of end face incident type
05/29/2003US20030098473 Semiconductor device and method for fabricating the same
05/29/2003US20030098466 Capacitor element, method for manufacturing the same, semiconductor device and method for manufacturing the same
05/29/2003US20030098461 Utilizing atomic layer deposition for programmable device
05/29/2003US20030098458 Semiconductor device and its manufacturing method
05/29/2003US20030098454 Semiconductor device having a solid-state image sensor
05/29/2003US20030098444 High molecular weight compound, material emitting light by applying an electric field, solvent; higher response speed than liquid-crystal display
05/29/2003US20030098427 Solid sensor
05/29/2003US20030098406 Solid-state image sensing device
05/29/2003CA2409237A1 Process for the manufacture of an electronic component containing an inductive micro-component
05/29/2003CA2409232A1 Process for the manufacture of an electronic component containing an inductive micro-component
05/28/2003EP1315230A1 High-frequency line and high-frequency circuit
05/28/2003EP1315215A2 Floating gate field effect transistor
05/28/2003EP1315214A2 Semiconductor memory having storage cells storing multiple bits and a method of driving the same
05/28/2003EP1315211A1 A method for manufacturing charge coupled image sensors
05/28/2003EP1315210A1 Multi-threshold mis integrated circuit device and circuit design method thereof
05/28/2003EP1315209A2 Organic EL display device and method of manufacturing the same
05/28/2003EP1315208A2 Light emitting device and manufacturing method thereof
05/28/2003EP1315204A2 A dual gate oxide process with reduced thermal redistribution of thin-gate channel implant profiles due to thick-gate oxyde
05/28/2003EP1315203A2 Semiconductor device with different bonding configurations
05/28/2003EP1315200A1 CMOS semiconductor devices with selectable gate thickness and methods for manufacturing such devices
05/28/2003EP1315170A2 Multibit memory device
05/28/2003EP1315043A1 Resist pattern thickening material, resist pattern and forming process thereof, and semiconductor device and manufacturing process thereof
05/28/2003EP1314206A1 A spin filter and a memory using such a spin filter
05/28/2003EP1314202A1 Polarimetric optical detector
05/28/2003EP1314195A2 Method of manufacturing a trench-gate semiconductor device and corresponding device
05/28/2003EP1314190A2 Semiconductor device having passive elements and method of making same
05/28/2003EP1314189A2 Doped elongated semiconductors, their growth and applications
05/28/2003EP1314165A1 Memory cell arrangement and method for the production thereof
05/28/2003EP1314152A1 Circuit selection of magnetic memory cells and related cell structures
05/28/2003EP1222662B1 Polyvalent, magnetoresistive write/read memory and method for writing and reading a memory of this type
05/28/2003EP0904636B1 Power device with a short-circuit detector
05/28/2003EP0813751B1 Series capacitor charge pump
05/28/2003EP0701737B1 Method of forming a plurality of transistors in a substrate.
05/28/2003CN1421047A Method and apparatus for measuring parameters of electronic device
05/28/2003CN1421046A Dual spacer process for non-volatile memory devices
05/28/2003CN1420716A Method for forming induction and through-hole in single chip circuit
05/28/2003CN1420688A Single chip integrating method and system for 3D Y/C comb filter and interlace-progression converter
05/28/2003CN1420637A Passive device and module of transceiver
05/28/2003CN1420631A Non-reciprocal CMOS circuit structure for maximum time difference production line system
05/28/2003CN1420568A Luminescent device
05/28/2003CN1420567A Nitride read-only memory structure and mfg. method threrof
05/28/2003CN1420566A Non-volatile semiconductor storage unit structure and mfg. method thereof
05/28/2003CN1420563A 半导体装置 Semiconductor device
05/28/2003CN1420562A Semiconductor device, robot, method for running lottery ticket and recording medium
05/28/2003CN1420561A Semiconductor IC and mfg. method thereof
05/28/2003CN1420560A Semiconductor device and mfg. method thereof
05/28/2003CN1420559A 半导体装置 Semiconductor device
05/28/2003CN1420552A Silicon nitride read-only memory structure and mfg. method thereof
05/28/2003CN1420550A Method for mfg. static random memory
05/28/2003CN1420549A Double bit location rapid storage structure and mfg. method thereof
05/28/2003CN1420548A Method for mfg. semiconductor IC device
05/28/2003CN1420547A Method for mfg. semiconductor IC device
05/28/2003CN1420546A Method for mfg. semiconductor IC device
05/28/2003CN1420543A Double MONOS unit mfg. method and module structure
05/28/2003CN1420536A Method for mfg. thin film transistor
05/28/2003CN1420530A Oxygen doped Si-C compound etching stop layer
05/28/2003CN1420379A Focussing method of scanning device
05/28/2003CN1420362A Cell voltage detecting circuit
05/28/2003CN1110100C Triple-trap flash memory cell and fabrication process thereof
05/28/2003CN1110099C Semiconductor IC device and method for mfg. same
05/28/2003CN1110098C High-speed high-voltage power IC device with resistance path
05/28/2003CN1110097C Clock skew minimization system and method for IC
05/28/2003CN1110096C LC element, semiconductor device, and mfg. method of LC element
05/28/2003CN1110085C Flash memory with separated grid and source injection and its mfg. method
05/28/2003CN1110075C Method of fabricating semiconductor device
05/28/2003CN1110073C Process for mfg. semiconductor integrated circuit
05/27/2003US6571379 Semiconductor integrated circuit and semiconductor integrated circuit wiring layout method
05/27/2003US6570812 Semiconductor memory device with improved setup time and hold time
05/27/2003US6570810 Contactless flash memory with buried diffusion bit/virtual ground lines
05/27/2003US6570795 Defective memory component of a memory device used to represent a data bit in a bit sequence
05/27/2003US6570792 Bus driving circuit and memory device having same
05/27/2003US6570790 Highly compact EPROM and flash EEPROM devices
05/27/2003US6570788 Semiconductor device and method of driving and method of producing the same
05/27/2003US6570786 NAND-type memory array and method of reading, programming and erasing using the same
05/27/2003US6570783 Asymmetric MRAM cell and bit design for improving bit yield
05/27/2003US6570781 Logic process DRAM
05/27/2003US6570618 Solid-state image sensing apparatus, method for driving the same and camera
05/27/2003US6570617 CMOS active pixel sensor type imaging system on a chip
05/27/2003US6570464 High frequency apparatus
05/27/2003US6570451 High-frequency power amplifier
05/27/2003US6570433 Laser fuseblow protection method for silicon on insulator (SOI) transistors
05/27/2003US6570324 Image display device with array of lens-lets
05/27/2003US6570323 Organic thin-film light-emitting device
05/27/2003US6570264 Semiconductor memory device
05/27/2003US6570253 Multi-layer film for a thin film structure and a capacitor using the same
05/27/2003US6570242 Bipolar transistor with high breakdown voltage collector
05/27/2003US6570240 Semiconductor device having a lateral bipolar transistor and method of manufacturing same
05/27/2003US6570239 Semiconductor device having resistive element
05/27/2003US6570237 Semiconductor device with a protective diode having a high breakdown voltage
05/27/2003US6570236 Semiconductor device
05/27/2003US6570235 Cells array of mask read only memory
05/27/2003US6570234 Radiation resistant integrated circuit design
05/27/2003US6570233 Processing a bit line contact and a storage node contact used mainly in each element of a dynamic random access memory; reducing the direct contact resistance; and reducing the junction leak while maintaining the punch through margin
05/27/2003US6570231 Semiconductor device with varying width electrode