| Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
|---|
| 09/12/1990 | CN1009581B Compensation method for polarization type direct current component opitical fiber sensor |
| 09/11/1990 | US4956558 System for measuring film thickness |
| 09/11/1990 | US4955719 Interferometer with thin absorbing beam equalizing pellicle |
| 09/11/1990 | US4955718 Photoelectric measuring system with integrated optical circuit including and illuminating system |
| 09/11/1990 | US4955694 Process for producing HOE's for use in combination to produce a telecentric beam |
| 09/11/1990 | US4955228 Device for detecting rotation of steering wheel for automobiles |
| 09/07/1990 | WO1990010273A1 Process and arrangement for automatic optical classification of plants |
| 09/07/1990 | WO1990010220A1 Contour measurement using time-based triangulation methods |
| 09/07/1990 | WO1990010195A1 Device for interferometric measurement of surface structures |
| 09/07/1990 | WO1990010194A1 Computerized method of determining surface strain distributions in a deformed body |
| 09/07/1990 | WO1990010193A1 Arrangement and process for determining movements in structures |
| 09/07/1990 | WO1990010192A1 Process for measuring cutting edges |
| 09/07/1990 | WO1990010188A1 A method of measuring a vehicular frame |
| 09/06/1990 | DE4004807A1 Arrangement for locating focus point of parabolic reflector - samples reflector surface for dimensional accuracy |
| 09/05/1990 | EP0385825A1 System for the materialization of a point in a space, its applications and tooling equipment for said system |
| 09/05/1990 | EP0385474A2 Method of and apparatus for inspecting printed circuit boards |
| 09/05/1990 | EP0385272A2 Double-focus detector utilizing chromatic aberration |
| 09/05/1990 | EP0385262A2 Observation apparatus with reflecting object illumination appliance |
| 09/05/1990 | EP0385135A1 Position-sensitive photodetector |
| 09/05/1990 | EP0259350B1 Apparatus for sorting cutlery |
| 09/05/1990 | EP0227701A4 Optical determination of surface profiles |
| 09/05/1990 | EP0174961A4 Optical article dimension measuring system |
| 09/05/1990 | CN1045175A High-precision gradiometer for horizontal drilling |
| 09/05/1990 | CN1009487B Optical measuring system |
| 09/04/1990 | US4954891 Light guided illuminating/sectioning device for sheet inspection system |
| 09/04/1990 | US4954723 Disk surface inspection method and apparatus therefor |
| 09/04/1990 | US4954722 Scanning scattering microscope with hemispherical mirror and microfocused beam |
| 09/04/1990 | US4953982 Method and apparatus for endpoint detection in a semiconductor wafer etching system |
| 09/04/1990 | US4953974 Optical measurement of thin films |
| 08/30/1990 | DE3906215A1 Automatische klassifikation von pflaenzlingen Automatic classification of seedling |
| 08/30/1990 | DE3905949A1 Verfahren zum vermessen von schneidkanten A method of measure of the cutting edge |
| 08/29/1990 | EP0383832A1 Method for measuring diameters of wires, profiles or circular parts by diffraction of light rays and device for implementing such method. |
| 08/29/1990 | EP0155292B1 Light modulation sensor |
| 08/29/1990 | CN1044912A Method and apparatus for torch head to track weld line automatically |
| 08/28/1990 | US4952911 Scanning intrusion detection device |
| 08/28/1990 | US4952816 Focus detection system with zero crossing detection for use in optical measuring systems |
| 08/28/1990 | US4952149 Process and apparatus for taking a medical cast |
| 08/28/1990 | US4952061 Method and apparatus for sensing or determining one or more properties or the identity of a sample |
| 08/28/1990 | US4952056 Method of determining the autocollimation angle of a grating coupler |
| 08/28/1990 | CA1273224A1 Panel surface flaw inspection |
| 08/23/1990 | WO1990009627A1 Method of setting teaching data in a visual sensor system |
| 08/23/1990 | WO1990009562A1 Optical device and a method for alignment thereof on a machine |
| 08/23/1990 | WO1990009561A2 Laser range imaging system using projective geometry |
| 08/23/1990 | WO1990009560A1 Distance gauge |
| 08/23/1990 | WO1990009559A1 Position determination method and apparatus |
| 08/23/1990 | WO1990009558A1 Method and apparatus for measuring registration between layers of a semiconductor wafer |
| 08/22/1990 | EP0383244A1 Fiber optic scatterometer |
| 08/22/1990 | EP0382786A1 Device and method for monitoring alignment utilizing phase conjugation |
| 08/21/1990 | US4950898 Method of position monitoring and apparatus therefor |
| 08/21/1990 | CA1273077A1 Apparatus for monitoring thickness variations in a film web |
| 08/16/1990 | EP0382466A2 Methods and apparatus for optically determining the acceptability of products |
| 08/16/1990 | EP0382030A1 Measuring device to detect distances |
| 08/16/1990 | DE3904481A1 Optoelectronic measuring device |
| 08/15/1990 | CN1044708A Mutual calibration angle gauge and measuring method thereof |
| 08/14/1990 | US4949024 For tracing a model surface using an optical distance measuring probe |
| 08/14/1990 | US4948984 Optical scanning head with objective position measuring and mirrors |
| 08/14/1990 | US4948983 Alignment of mask and semiconductor wafer using linear fresnel zone plate |
| 08/14/1990 | US4948967 Method for detecting a position receiving a light beam |
| 08/14/1990 | US4948259 Method and apparatus for monitoring layer erosion in a dry-etching process |
| 08/14/1990 | US4948258 Structured illumination surface profiling and ranging systems and methods |
| 08/14/1990 | US4948253 Interferometric surface profiler for spherical surfaces |
| 08/14/1990 | US4948251 Optical heterodyne measuring apparatus |
| 08/14/1990 | US4948246 Leading-vehicle detection apparatus |
| 08/14/1990 | US4947692 Apparatus for detecting positional changes in relation to a vertical reference direction in buildings or in building subsoil |
| 08/14/1990 | US4947685 System for measuring the repeat length of a moving web |
| 08/09/1990 | WO1990008939A1 Method for calibrating a system for the tri-dimensional acquisition of shape and system for implementing such method |
| 08/09/1990 | DE3903000A1 Method for measuring the inside diameter and the form error (deviation from the true shape) of small bores, and device for carrying it out |
| 08/08/1990 | EP0381633A2 System to automatically compensate the transversal oscillation of the scanning plane in a laser scanner for profile measurement by means of a special device |
| 08/08/1990 | EP0380764A1 Measuring device with a lightwave guide-bending sensor for the supervision of bridge components or the like |
| 08/08/1990 | EP0210263B1 Device for optical determination of low-order errors in shape |
| 08/08/1990 | EP0201598B1 Laser position measurement and alignment |
| 08/07/1990 | US4947044 Method and apparatus for covertly viewing a target using infrared radiation |
| 08/07/1990 | US4947034 Apertureless near field optical microscope |
| 08/07/1990 | US4946281 Laser profiler for high precision surface dimensional grouping apparatus and method |
| 08/07/1990 | US4945593 Automatic determination of coordinates of the operating path of an adhesive-applying nozzle in an adhesive applicator for a shoe machine |
| 08/07/1990 | CA1272392A1 Roll-firmness measuring device |
| 08/02/1990 | DE3902801A1 Messeinrichtung, insbesondere zur einrichtung von schneidwerkzeugen fuer platten aus polykristallwerkstoffen, wie marmor oder dergleichen Measuring device, in particular for the device of cutting tools for plates from polykristallwerkstoffen, such as marble or the like |
| 08/01/1990 | EP0380412A2 Coating weight measuring and control apparatus and method |
| 08/01/1990 | EP0380408A1 Control of objects at a high rate |
| 08/01/1990 | EP0379650A1 Fibre optical sensor for small tensile or compression forces |
| 08/01/1990 | EP0379486A1 Detection system for a radiation profile line. |
| 07/31/1990 | US4945254 Method and apparatus for monitoring surface layer growth |
| 07/26/1990 | WO1990008215A1 Process and sewing machine for stitching two pieces of fabric together along the same length |
| 07/26/1990 | DE3843396C1 Method and device for observing moiré patterns of surfaces under investigation in conjunction with the application of the projection moiré method with phase shifts |
| 07/26/1990 | CA2008508A1 Control device for high speed objects |
| 07/25/1990 | EP0379425A1 System for determining the position of at least one target by means of triangulation |
| 07/25/1990 | EP0379226A2 Ranging apparatus |
| 07/25/1990 | EP0379097A2 Process for determining the position of the rim of an object, photo-electronic sensing device to trace the rim |
| 07/25/1990 | EP0379079A1 - Apparatus for surveying the surface of an object by projection of fringe patterns |
| 07/25/1990 | EP0378781A1 Method and device for the contactless measurement of the deformation and wear of railroad tracks; method for the measurement of the gauge on railroad tracks |
| 07/25/1990 | CN1044192A Technology of 3.39um waveband dual spectrum line synthesis wave and helium neon gas laser |
| 07/25/1990 | CN1008945B Linear type displacement measurement instrument |
| 07/24/1990 | US4943160 Interface angle estimation system |
| 07/24/1990 | US4943157 Fiber optic triangulation gage |
| 07/24/1990 | US4942814 Operation stand for measuring sheet size for sheet-fed press |
| 07/24/1990 | US4942671 Probe head mount for a deflectable probe or the like |
| 07/24/1990 | US4942668 Digital inclinometer |
| 07/24/1990 | US4942667 Apparatus for detecting defects |
| 07/19/1990 | DE3901088A1 Method and device for the detection of double parts |
| 07/18/1990 | EP0377716A1 A scanning intrusion detection device |