Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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09/19/1991 | WO1991011695A3 Measurement of deformation |
09/19/1991 | DE4008282A1 Web shrinkage of strength measurement - uses equidistant parallel and lateral marks for measurement after process station to show distortion |
09/19/1991 | DE4007957A1 Measuring vol., esp. inside of mouth dentures - by evaluating light reflected from interior surfaces, including translucent teeth |
09/18/1991 | EP0446691A2 Optical device |
09/18/1991 | EP0446549A2 Procedure to measure the dimensions of a spacer |
09/18/1991 | EP0379486B1 Detection system for a radiation profile line |
09/18/1991 | CN1013993B Laser elongation measuring unit for steel sheets |
09/17/1991 | US5049757 Method for scanning a plurality of optical measuring reflectors and an apparatus for performing the method |
09/17/1991 | US5049750 Apparatus and system for inspecting wall thickness of synthetic resin containers |
09/17/1991 | US5049735 Apparatus for detecting light receiving position |
09/17/1991 | US5048968 Alignment mark detecting optical system |
09/17/1991 | US5048967 Detection optical system for detecting a pattern on an object |
09/17/1991 | US5048966 Apparatus and system for linewidth measurements |
09/17/1991 | US5048960 Microspectroscope |
09/17/1991 | US5048954 Laser-based wheel alignment system |
09/17/1991 | US5048953 Optical collimating, laser ray target position indicating and laser ray absorbing device of a laser system |
09/17/1991 | US5048341 Container wall measuring apparatus and method |
09/14/1991 | WO1991013586A1 Process and device for measuring the dimensions of a space, in particular a buccal cavity |
09/14/1991 | CA2078115A1 Process and device for measuring the dimensions of a space, in particular a buccal cavity |
09/12/1991 | DE4007363A1 Measuring thickness of layer of carrier material - using two contactlessly working sensors to measure distances of layer and carrier surfaces from each other |
09/12/1991 | DE4006835A1 Calibrating two=dimensional test bodies eliminating systematic errors - measuring in two or three positions depending on test body shape elements |
09/11/1991 | EP0445945A1 Touch probe |
09/11/1991 | EP0445697A2 Component evaluation system |
09/11/1991 | EP0445618A2 Device and procedure to measure without contact the surface-contour of an object |
09/11/1991 | EP0319533A4 Determining a dimension of an article |
09/11/1991 | CN2084604U Precision detector for surveyor's rod grating |
09/10/1991 | US5048093 Defect counting method and apparatus |
09/10/1991 | US5047848 Elastomeric gage for borescope |
09/10/1991 | US5047651 Arrangement for measuring a deviation from its line of a movable web of foil |
09/10/1991 | US5047629 Position and motion detector with magnetic coupling and optical detection |
09/10/1991 | US5046851 Position sensing method and apparatus |
09/10/1991 | US5046849 Device having an exchangeable substrate sleeve for measuring layer thickness |
09/10/1991 | US5046843 Method and apparatus for measuring the three-dimensional orientation of a body in space |
09/08/1991 | CA2036687A1 Component evaluation system |
09/05/1991 | WO1991013318A1 Method and apparatus for measuring the angle of work |
09/05/1991 | WO1991013316A1 Contact probes |
09/05/1991 | DE4039366A1 Ascertaining and controlling distribution of wetting medium - applying optical brightener in soln. to agent for offset plate in printing machine |
09/05/1991 | DE4006343A1 Evaluating strip patterns for optical measuring process - modulating by carrier frequency and imaging on sensor for evaluating by phase shift algorithm |
09/05/1991 | CA2342969A1 A device and method for measuring angles of a workpiece |
09/04/1991 | EP0444697A2 Atomic probe microscope and cantilever unit for use in the microscope |
09/04/1991 | EP0308466A4 Distance measuring device |
09/04/1991 | CN2084189U Displacement measuring apparatus by photoelectric scanning |
09/04/1991 | CN1013749B Apparatus for detecting a shape of a grove |
09/03/1991 | US5046113 Method of and apparatus for detecting pattern defects by means of a plurality of inspecting units each operating in accordance with a respective inspecting principle |
09/03/1991 | US5046111 Methods and apparatus for optically determining the acceptability of products |
09/03/1991 | US5046032 Calibration bar |
09/03/1991 | US5045710 Coplanarity inspection machine |
09/03/1991 | US5045678 Method of and arrangement for determining the position of the optical axis of an optical waveguide |
09/03/1991 | US5045668 Apparatus and method for automatically aligning a welding device for butt welding workpieces |
09/03/1991 | US5044751 Light source for an optical sensor and optical measuring device using same |
09/03/1991 | US5044750 Method for checking lithography critical dimensions |
09/03/1991 | US5044749 Fiber-optic bender beam interferometer rate sensor |
09/03/1991 | US5044746 Apparatus for measurement of wheel alignment data |
09/03/1991 | US5044205 Method for monitoring deformations with light waveguides |
08/29/1991 | DE4106042A1 Light absorption measuring system |
08/29/1991 | DE4105207A1 Workpiece holder for woodworking machine - has optical arrangement monitoring workpiece distance from slide surface and distance between workpiece surfaces |
08/29/1991 | DE4105192A1 Polarimetric testing of surface properties and transparent material - by evaluating difference between reflected s and p polarised components |
08/29/1991 | DE4003983C1 Automated monitoring of space=shape data for mfg. semiconductors - compares image signals for defined illumination angle range with master signals, to determine defects |
08/28/1991 | EP0443702A2 Measuring method for determining small light absorptions |
08/28/1991 | EP0443514A2 Apparatus for monitoring a bearing |
08/28/1991 | EP0443322A2 Method and apparatus for measuring the thickness of a coating |
08/28/1991 | EP0443289A2 Apparatus for inspecting printed circuit boards |
08/28/1991 | EP0443137A2 Method for three-dimensional lightoptical measuring of objects and device to execute the method |
08/27/1991 | US5043590 Method and apparatus for monitoring size encapsulation of yarn on a slasher |
08/27/1991 | US5043589 Semiconductor device inspection apparatus using a plurality of reflective elements |
08/27/1991 | US5043588 Pellet diameter measurement apparatus and method detecting non-orthogonally to the common axis of the pellets |
08/27/1991 | US5042949 Optical profiler for films and substrates |
08/27/1991 | US5042944 Automatic stress analyzer |
08/27/1991 | US5042943 Cleaved optical fibre |
08/27/1991 | US5042905 Electrically passive fiber optic position sensor |
08/27/1991 | US5042505 Electronic angular position and range of motion measuring device and method |
08/27/1991 | US5042341 Marking station for timber |
08/27/1991 | US5042310 Method for the determination of area of drawings and device for implementing the same |
08/27/1991 | CA1288163C Film thickness measuring method and device therefor |
08/24/1991 | CA2034162A1 Method and apparatus for measuring the thickness of a coating |
08/22/1991 | WO1991012490A1 Method and device for measuring the twist of a textile yarn |
08/22/1991 | WO1991012489A1 Process and device for automatic monitoring of space-shape data in the manufacture of semiconductor components |
08/22/1991 | WO1991012488A1 Method and device for measuring at least one transverse dimension of a textile yarn |
08/22/1991 | WO1991012482A1 Combined laser position detector, infrared emissivity target and tv emissivity target |
08/22/1991 | WO1991010887A3 Probes |
08/21/1991 | EP0442536A2 Atomic force sensor head for measuring the properties of a data store |
08/21/1991 | EP0442393A2 Three-dimensional contour measuring apparatus |
08/21/1991 | EP0442252A2 Device to assess the dimensions of a possibly moving object |
08/21/1991 | EP0442193A2 Projection of two orthogonal reference light planes |
08/21/1991 | EP0441972A1 Object recognition method by otpical cutting method |
08/20/1991 | US5042015 Measuring method and apparatus |
08/20/1991 | US5041988 Method and device for measuring a surface contour |
08/20/1991 | US5041736 Apparatus for monitoring a product in a hostile environment |
08/20/1991 | US5041726 Infrared holographic defect detector |
08/16/1991 | CA2010263A1 Method and apparatus for inspecting quality of manufactured articles |
08/14/1991 | EP0441578A2 Positional deviation detecting method |
08/14/1991 | EP0441153A2 Procedure and device for absolute interferometric testing of flat surfaces |
08/14/1991 | EP0440990A1 Optical collimating, laser ray target position indicating and laser ray absorbing device of a laser system |
08/14/1991 | EP0440766A1 Edge sensor. |
08/13/1991 | US5040154 Method of monitoring the state of extended shell |
08/13/1991 | US5039857 Scanner for sizing apparatus |
08/13/1991 | US5039223 Interferometer for measuring aspherical form with the utilization of computer generated hologram |
08/13/1991 | US5039217 Optical transceiver apparatus for detecting distance between two cars |
08/13/1991 | US5038618 Measurement of distortion |
08/13/1991 | CA1287487C Rocker arm sensor |