Patents
Sitemap › G01 - Measuring; Testing › G01B - Measuring length, thickness or similar linear dimensions; Measuring angles; Measuring areas; Measuring irregularities of surfaces or contours › G01B 11 - Measuring arrangements characterised by the use of optical means
Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
12/1990
12/12/1990EP0402191A1 Method and device to measure line-width using optical scanning
12/12/1990EP0401909A1 Method of and device for determining the position of a surface
12/12/1990EP0401654A2 Device for coupling and/or uncoupling of light beams with an integrated optical element
12/12/1990EP0401600A2 Device for monitoring and/or measuring parameters of running test materials in form of thread or wire and method for operating the device
12/12/1990EP0401351A1 Optical measurement device and method.
12/12/1990EP0401269A1 Device for optically scanning the surface of an object under severe atmosphere conditions in order to identify fluctuating superelevations on this plane.
12/12/1990EP0203073B1 Fiber optic seam tracking apparatus
12/12/1990CN2067397U Holographic x-ray goniometer
12/11/1990US4977330 In-line photoresist thickness monitor
12/11/1990US4976545 For analyzing a surface structure
12/11/1990US4976544 Method of inspecting the ends of stacked cigarettes
12/11/1990US4976538 Detection and display device
12/05/1990EP0400912A2 Optical fiber coating control
12/05/1990EP0400881A2 A technique for object orientation detection using a feed-forward neural network
12/05/1990EP0400777A2 Method of inspecting die for forming honeycomb structure
12/05/1990EP0400408A2 Method for aligning two fibre ends and apparatus for its implementation
12/05/1990EP0400231A1 Reprographic machines
12/05/1990EP0086200B1 Optical determination of surface profiles
12/05/1990CN1047569A Self-scanning photorectifier array single-frequency laser interference length-measuring instrument
12/04/1990US4975570 Rotary encoder using multiple diffracted beams having co-incident paths
12/04/1990US4975141 Laser ablation for plasma etching endpoint detection
12/03/1990WO1990015302A1 A digital linear measuring device
11/1990
11/29/1990DE3916813A1 Alignment apparatus with single mode fibre optic stabiliser
11/28/1990EP0399925A1 Working device for the bearings of a crankshaft of a thermal engine
11/28/1990EP0399562A2 Pattern area ratio measuring apparatus
11/28/1990EP0399138A2 Method for three-dimensional examination of printed circuits
11/28/1990EP0399008A1 A monitoring device for at least one current pick-up of a transport truck of a rail-borne conveyor.
11/28/1990EP0398963A1 Control means and method for optical inspection system
11/28/1990CN2066570U Standard measuring instrument for optic space angle
11/28/1990CN1047385A Method and apparatus for adaptive measurement of linearity
11/27/1990USRE33460 Endface assessment
11/27/1990US4974164 Digital measuring and proportioning instrument
11/27/1990US4974077 Apparatus for detecting edge position of elongated article
11/27/1990US4973343 Optical fiber coating control apparatus
11/27/1990US4973164 Method and apparatus for the optical detection of the roughness profile of a material surface
11/27/1990US4973000 Method and apparatus for determining the contact position in a refiner
11/27/1990US4972597 Three-dimensional displacement gage
11/22/1990EP0398781A2 Method and apparatus for low angle, high resolution surface inspection
11/22/1990EP0398563A2 Fiber optic triangulation gage
11/22/1990EP0398352A2 An automatic engraving system
11/22/1990EP0398105A2 Tunnel furnace
11/22/1990EP0398073A2 Measuring apparatus
11/22/1990EP0397962A1 Topography measuring apparatus
11/22/1990DE4014808A1 Maschinensichtsystem Machine vision system
11/20/1990US4972092 Apparatus for determining the effective surface roughness of polished optical samples by measuring the integral scattered radiation
11/20/1990US4972090 Method and apparatus for measuring and inspecting articles of manufacture for configuration
11/20/1990US4972073 Light wave conductor-bending sensor with sliding rails for monitoring bridge structures or the like
11/20/1990US4972072 System for detecting a film layer on an object
11/20/1990US4971445 Fine surface profile measuring apparatus
11/20/1990US4971440 Projection of two orthogonal reference light planes
11/20/1990CA1276490C Scanning apparatus and method
11/19/1990CA2017141A1 Automatic engraving system
11/18/1990CA2016512A1 Fiber optical triangulation gage
11/16/1990WO1990014633A1 Optical robotic canopy polishing system
11/16/1990CA2033058A1 Optical robotic canopy polishing system
11/14/1990EP0397629A2 Rock working tool
11/14/1990EP0397530A2 Alignment apparatus
11/14/1990EP0397388A2 Method and apparatus for measuring thickness of thin films
11/14/1990EP0397289A2 Straightness interferometer system
11/14/1990CN1010427B Automatic stress gauge for glass
11/13/1990US4970402 Apparatus for sensing characteristics of a traveling yarn with yarn guiding means
11/13/1990US4970401 Non-contact triangulation probe system
11/13/1990US4969744 Optical angle-measuring device
11/13/1990US4969736 Integrated fiber optic coupled proximity sensor for robotic end effectors and tools
11/13/1990US4969551 Method of and apparatus for rolling rod-shaped articles
11/09/1990CA2014765A1 Rock working tool
11/07/1990EP0396010A2 Method and apparatus for monitoring growth and etch rates of materials
11/07/1990EP0395879A2 Metering apparatus and method for the measurement of a fixed length of continuous yarn or strand
11/07/1990EP0395831A1 Topography measuring apparatus
11/07/1990EP0395811A2 Optical probe
11/06/1990USRE33424 Apparatus and method for measuring the depth of fine engraved patterns
11/06/1990US4969108 Vision seam tracking method and apparatus for a manipulator
11/06/1990US4969106 Computerized method of determining surface strain distributions in a deformed body
11/06/1990US4969038 Method for scanning image information
11/06/1990US4969037 Arrangement for illuminating and detecting parts in an image processing system
11/06/1990US4968147 Laser target pipe insert apparatus
11/06/1990US4968146 Optical depth measuring device to be mounted on drilling power tool
11/06/1990US4968114 Method of manufacturing an optical transmitter or receiver device
11/06/1990CA1275802C Method of determining surface relief without making contact with the surface
11/06/1990CA1275801C Optical proximity imaging method and apparatus
11/01/1990WO1990013000A1 Projection/exposure device and projection/exposure method
11/01/1990WO1990012720A1 A plant for track-based detection of the wheel profile of train wheels
10/1990
10/31/1990EP0395374A1 Optical metrological scale
10/31/1990EP0394932A2 Photothermal inspection method, arrangement for its working out, and utilisation of the method
10/31/1990EP0394668A1 Apertureless near field optical microscopy
10/31/1990EP0394372A1 Measuring compass.
10/30/1990US4967093 Deformation measuring method and device using cross-correlation function between speckle patterns with reference data renewal
10/30/1990US4967092 Apparatus for optically checking the inner profile of a tube or bore
10/30/1990US4966030 Pin-on-disk type wear testing device
10/30/1990CA1275581C Method of producing a fiber-optical reflection sensor and sensor so produced
10/25/1990DE3913159A1 Measuring wave-shaped rail deformation - using vehicle with two sensors measuring height difference of two rail top points
10/25/1990DE3912968A1 Monitor for dia. of threads and wires - based on light reflected by object and converted to electrical signals
10/25/1990DE3912812A1 Error angle measurement - adjusting casing rotation and central axis to position light spot on detector surface
10/24/1990EP0393048A1 Length measuring device with perforated tape
10/24/1990CN2064499U Constant temp., slot for light-interferenced length-measuring meter
10/24/1990CN2064498U Instruments for measuring particle diameter by use of laser
10/24/1990CN2064216U Detecting instrument
10/23/1990US4965840 Method and apparatus for determining the distances between surface-patches of a three-dimensional spatial scene and a camera system
10/23/1990US4965734 Veneer lathe charging method for determining log spin axis
10/23/1990US4965665 3D imaging of a substrate using perpendicular scanning directions
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