Patents
Sitemap › G01 - Measuring; Testing › G01B - Measuring length, thickness or similar linear dimensions; Measuring angles; Measuring areas; Measuring irregularities of surfaces or contours › G01B 11 - Measuring arrangements characterised by the use of optical means
Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
12/1989
12/27/1989CA1264083A1 Spatial characteristic determination
12/26/1989US4889519 Coordinate measuring machine
12/26/1989US4889425 Laser alignment system
12/21/1989DE3820241A1 Device for measuring diameters
12/20/1989EP0347215A2 Proximity sensor
12/20/1989EP0346819A2 Method and apparatus for the contactless measuring and optionally machining of surfaces
12/20/1989CN2049760U Raster signal fine analyser
12/19/1989US4888491 Device for measuring angular deviation of flat plate
12/19/1989US4887905 Assembly and method for monitoring the alignment of a workpiece
12/19/1989US4887903 Apparatus for reading height of measurement column
12/19/1989US4887899 Apparatus and method for electronic analysis of test objects
12/14/1989WO1989012224A1 Interferometric imaging system
12/13/1989EP0346288A1 Method and apparatus for the contactless verification of the dimensions of a tool
12/13/1989EP0346015A2 Optical system for detecting three-dimensional shape
12/13/1989EP0345984A2 Non-contact optical gauge
12/13/1989EP0345773A2 Microspectroscope
12/13/1989EP0345414A1 Photoelectric angle-measuring system
12/13/1989CN1037963A Method and apparatus for non-contact spatial measurement
12/12/1989US4887155 Method and arrangement for measuring and/or monitoring properties of yarns or ropes
12/12/1989US4887087 Method of displaying detected information about a rotating mass
12/12/1989US4886362 Appratus for measuring the profile of an aspherical surface
12/12/1989US4886353 Measuring device employing laser interferometry
12/07/1989DE3915836A1 Method and device for determining the diameter of cigarettes
12/07/1989DE3819058A1 Method for quasi-simultaneous measurement of changes in length and/or width and/or thickness on elongated material samples, and device for carrying out the method
12/06/1989EP0345093A2 Rotation detecting apparatus
12/06/1989EP0344934A1 Digital inclinometer
12/06/1989EP0344322A1 Method of monitoring the state of an extended shell
12/05/1989US4885709 Method and apparatus for sensing or determining one or more properties or the identity of a sample
12/05/1989US4884890 Method for normalizing the detection signals of magnified images of fluorescing materials
12/05/1989US4884889 Calibration system for coordinate measuring machine
12/05/1989US4884888 Method and device for contactless optical measurement of distance changes
12/05/1989US4884887 Method for positioning a crystal ingot
12/05/1989US4884697 Surface profiling interferometer
12/05/1989US4884434 Wear sensor
12/05/1989CA1263755A1 Swept aperture flying spot profiler
12/05/1989CA1263754A1 Method and system for determining surface profile information
12/05/1989CA1263747A1 Optical scanning unit with a translational- position and angular-position detection system
11/1989
11/30/1989WO1989011709A1 A scanning intrusion detection device
11/30/1989WO1989011630A1 Process and device for measuring surfaces
11/30/1989WO1989011629A1 Compact portable diffraction moire interferometer
11/30/1989DE3818044A1 Precision measurement device for large displacements
11/30/1989DE3817561A1 Device for producing a projected object grating
11/30/1989DE3817269A1 Optical displacement sensor (position pick up)
11/29/1989EP0343665A2 Variable optical axis type bottle inspecting apparatus
11/29/1989EP0343366A1 Camera
11/29/1989EP0343297A2 Optical type displacement measuring apparatus
11/28/1989US4883952 Optical birefringment parameter measuring sensor
11/23/1989EP0342979A2 Optical sensor system
11/23/1989EP0342337A2 Device for the contactless recording of surface deviations of a specimen caused by ultrasound waves
11/23/1989EP0342289A2 Method and apparatus for measuring a three-dimensional curved surface shape
11/23/1989EP0342267A1 Coordinate-measuring apparatus
11/23/1989DE3816322A1 Method and device for the contactless measurement of the external dimensions of bodies
11/22/1989CN2048180U Angle corrector of probe of axle's temperature with infrared ray
11/22/1989CN1037392A Microcomputerized 4-coordinate measuring system of universal tool microscope
11/21/1989US4882497 Method and apparatus of measuring outer diameter and structure of optical fiber
11/16/1989WO1989011078A1 Digital measuring and proportioning instrument
11/15/1989EP0342127A2 Method for determining the optical quality of flat glass or products from flat glass
11/15/1989EP0342123A1 Method of positioning an object in respect to a plane, length measuring method and device for making use of it
11/15/1989EP0342016A2 Optical position measurement
11/15/1989EP0341849A2 Optical profile measuring apparatus
11/15/1989EP0341743A2 Alignment of mask and semiconductor wafer using linear fresnel zone plate
11/15/1989CN2047780U 光学位移传感器 Optical displacement sensor
11/14/1989US4880992 Non-contacting measuring system for precision characteristics, particularly of industrial robots
11/14/1989US4880991 Non-contact dimensional gage for turned parts
11/14/1989US4880972 Fiber-optic measuring apparatus using luminescent material
11/14/1989US4880309 Dark field target design system for alignment of semiconductor wafers
11/14/1989US4880307 Method of detecting the position of an object
11/14/1989US4880306 Method of checking collinearity
11/14/1989US4879815 Alignment apparatus
11/09/1989DE3814499A1 Testing and adjusting device for concentric-running, multiple-cutter tools
11/09/1989DE3814487A1 Method for carrying out contactless optical measurements
11/09/1989DE3814466A1 Verfahren und vorrichtung zum feststellen der relativen lage einer bezugsachse eines objekts bezueglich eines referenzstrahls, insbesondere eines laserstrahls Method and apparatus for detecting the location relative to a reference axis of an object relative to a reference beam, in particular a laser beam,
11/08/1989EP0340412A2 Semiconductor light beam position sensor, and image input device using this sensor
11/08/1989CN2047363U Universal light cutting measurement device
11/07/1989US4879670 Vehicle wheel alignment transducer, system and method
11/07/1989US4879664 Three-dimensional position sensor and three-dimensional position setting system
11/07/1989US4878755 Process and device for measuring the optical properties of thin layers
11/07/1989US4878754 Method of and apparatus for measuring irregularities of road surface
11/07/1989US4878736 Control means and method for optical inspection system
11/02/1989WO1989010535A1 Device for finding the relative position of the reference axis of an object relative to a reference beam, a laser beam in particular
11/02/1989WO1989010237A1 Apparatus for tracking the surface of a workpiece
11/02/1989EP0339985A2 Method for measuring film thickness
11/02/1989EP0339845A2 System for automated real-time control of film deposition
10/1989
10/31/1989US4878247 Method for the photogrammetrical pick up of an object with the aid of at least one opto-electric solid-state surface sensor
10/31/1989US4878114 Method and apparatus for assessing surface roughness
10/31/1989US4877970 Process for measuring contour configurations of articles defined by numerous cylindrical surface portions
10/31/1989US4877325 Machine component accuracy measuring system
10/31/1989CA1262567A1 System for automatically inspecting a flat workpiece for holes
10/25/1989EP0338851A2 Image processing system
10/25/1989EP0338446A2 Optical convex surface profiling and gauging apparatus and method therefor
10/25/1989EP0338079A1 Method and device for controlling the condition of a lengthy construction element
10/25/1989EP0338053A1 Focus detection system for use in optical measuring systems
10/25/1989CN1036633A 光学编码器 Optical encoders
10/24/1989US4876732 System for detecting rotational angle of objective pattern
10/24/1989US4876506 Apparatus and method for inspecting the profile of the inner wall of a tube employing a wall follower and an eddy current probe
10/24/1989US4875779 Lead inspection system for surface-mounted circuit packages
10/24/1989US4875777 Off-axis high accuracy structured light profiler
10/24/1989US4875776 Electro-optical inspection
10/19/1989WO1989009922A1 Method and sensor for opto-electronic angle measurements
10/19/1989DE3811551A1 Setting instrument for a machine tool
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