Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
07/2009
07/02/2009CA2709433A1 Monitoring system for the acquisition of the layer thickness of dust in ventilation ducts
07/01/2009EP2074495A1 Laser controller
07/01/2009EP2074377A1 Method and system for acquiring a 3-d image of a scene
07/01/2009EP2073751A1 Method and arrangement for the optical measurement of surface profiles of objects
07/01/2009CN201266079Y 植物叶片面积测量仪 Plant leaf area meter
07/01/2009CN201266078Y Optical fiber grating strain sensor
07/01/2009CN201266077Y Dynamic solid mechanics experiment system based on digital speckle correlation technique
07/01/2009CN201266076Y Large size part measuring apparatus based on machine vision
07/01/2009CN101469976A Light wave interferometer apparatus
07/01/2009CN101469975A Optical detecting instrument and method thereof
07/01/2009CN101469974A Metal pipe detection apparatus
07/01/2009CN101469973A Measuring method
07/01/2009CN101469972A Long-focus depth super-resolution secondary confocal measuring apparatus
07/01/2009CN101469971A Method and apparatus for detecting contact head abrasive loss of vacuum circuit breaker
07/01/2009CN101469970A Method for measuring true position of conjunction member and conjunction member thereof
07/01/2009CN101469969A Multidimensional measuring apparatus and method, track drafting method
07/01/2009CN100507520C Orientation analysis meter
07/01/2009CN100507443C System and method of guiding real-time inspection using 3d scanners
07/01/2009CN100507442C Surface shape measuring apparatus and surface shape measuring method
07/01/2009CN100507441C Non-contact 3-D shape testing method and its device
07/01/2009CN100507440C System for measuring hard disk magnetic head flight height and common-path dual-frequency laser interference measuring method
06/2009
06/30/2009US7554678 Device and method for measuring the thickness of a transparent sample
06/30/2009US7554677 Optical measuring device for measuring micro displacement or micro vibration of object
06/30/2009US7554676 Positional measurement system and lens for positional measurement
06/30/2009US7554671 Absolute position measurement apparatus
06/30/2009US7554669 Spectral domain phase microscopy (SDPM) dual mode imaging systems and related methods and computer program products
06/30/2009US7554668 Light source for swept source optical coherence tomography based on cascaded distributed feedback lasers with engineered band gaps
06/30/2009US7554079 Signal conditioning for an optical encoder
06/30/2009US7554077 Encoder
06/25/2009WO2009079334A2 Analyzing surface structure using scanning interferometry
06/25/2009WO2009079111A1 Optical comparator using light-emitting diode light sources
06/25/2009WO2009078617A2 Surface shape measuring system and surface shape measuring method using the same
06/25/2009WO2009078616A2 Three-dimensional shape measuring apparatus
06/25/2009WO2009078443A1 Exposure apparatus, exposure method and device manufacturing method
06/25/2009WO2009078154A1 Moving body system, pattern forming device, exposure apparatus, measuring instrument, and device manufacturing method
06/25/2009WO2009077539A2 Method for processing a three-dimensional image of the surface of a tyre so that it can be used to inspect the said surface
06/25/2009WO2009077534A1 Device for evaluating the surface of a tyre
06/25/2009US20090161123 Method and system for measuring patterned structures
06/25/2009US20090161122 Targeted Artifacts and Methods for Evaluating 3-D Coordinate System Measurement Accuracy of Optical 3-D Measuring Systems using Such Targeted Artifacts
06/25/2009US20090161121 Position-measuring device and method for determining absolute position
06/25/2009US20090161120 Hand position detecting device and method
06/25/2009US20090161119 Mixing apparatus and distance measuring apparatus using same
06/25/2009US20090161117 Inclined exposure lithography system
06/25/2009US20090161116 Laser measurement device and laser measurement method
06/25/2009US20090161106 Wafer lens aligning method and wafer lens manufactured by the same
06/25/2009US20090161093 Systems and Methods for Lithographic Illuminator Beam Deviation Measurement and Calibration Using Grating Sensors
06/25/2009US20090161090 Systems and Methods for Measuring the Shape and Location of an object
06/25/2009US20090161088 Beam Characterization Monitor for Sensing Pointing or Angle of an Optical Beam
06/25/2009US20090161086 Movable body system, pattern formation apparatus, exposure apparatus and measurement device, and device manufacturing method
06/25/2009US20090161082 Exposure apparatus and exposure method
06/25/2009US20090160628 Guidance System and Method
06/25/2009US20090158603 Leveling device
06/25/2009DE102008062756A1 Method for examination of cell in low pressure plate, involves determining measuring security for measuring points, which indicates probability for correctness of measurement of measuring point
06/25/2009DE102008053472A1 Objekt-Erfassungssystem Object detection system
06/25/2009DE102007062052A1 Schichtdickenmessung an transparenten Schichten Layer thickness measurement of transparent layers
06/25/2009DE102007061574A1 Verfahren zur Füllstandsmessung Method to measure the level
06/25/2009DE102007061573A1 Vorrichtung zur Ermittlung und/oder Überwachung zumindest eines Füllstands von zumindest einem Medium in einem Behälter gemäß einer Laufzeitmessmethode und/oder einer kapazitiven Messmethode Device for determining and / or monitoring a fill level of at least at least one medium in a container according to a run-time measuring method and / or a capacitive measuring method
06/25/2009DE102007061287A1 Positionsmesseinrichtung und Verfahren zur absoluten Positionsbestimmung The position measuring device and method for absolute position determination
06/25/2009DE102004038761B4 Kamera-basierte Objektprüfung mittels Shape-from-Shading Camera-based object inspection using shape-from-shading
06/24/2009EP2072947A1 Image processing device and image processing method
06/24/2009EP1573648B1 Image scanning device having a system for determining the distance to a target
06/24/2009EP1167918B1 Optical displacement sensor
06/24/2009CN201262546Y TBM tunnel clearance displacement monitoring system
06/24/2009CN101466999A End inclination angle measuring method, inspecting method and inspecting apparatus for objects having undulations, method for determining the position of illuminating means, irregularity inspecting ap
06/24/2009CN101466998A Method and apparatus for absolute-coordinate three-dimensional surface imaging
06/24/2009CN101466997A Undulation inspecting device, undulation inspecting method, control program of undulation inspecting device, and recording medium
06/24/2009CN101464144A Proportional compass apparatus used for underwater area measurement
06/24/2009CN101464143A Method and equipment for digitized detection of double-plain shaft parallelism of optical instrument
06/24/2009CN101464142A Detection apparatus and detection method for plain shaft precision of camera
06/24/2009CN101464141A Aspheric surface detecting instrument
06/24/2009CN101464140A Device for detecting the edges of a workpiece, and a laser beam processing machine
06/24/2009CN101464139A 1152nm wavelength helium neon laser nano-measuring tape
06/24/2009CN101464138A Displacement or acceleration sensor
06/24/2009CN101464137A Vehicle, vessel and bridge width detecting equipment and method
06/24/2009CN101464136A Detection method for aspheric surface optical element peak
06/24/2009CN101464135A Method for measuring moving object by optical ruler
06/24/2009CN101464134A Vision measuring method for three-dimensional pose of spacing target
06/24/2009CN101464133A Detection apparatus for circumferential clearance of elastic ring
06/24/2009CN101464132A Position confirming method and apparatus
06/24/2009CN101464131A Position measuring device and method for determining an absolute position
06/24/2009CN101464130A Detection apparatus for automatic pattern sheet perforating press
06/24/2009CN100504293C Device for detecting light axis parallelism of laser and visual light system
06/24/2009CN100504292C Method and device for determining rectilinearity of guide rails
06/24/2009CN100504291C Instruments for analyzing related assays based on attenuation of light by thin films
06/24/2009CN100504290C 3D non-contacting type coordinates equipment for measuring fabric or garment material
06/24/2009CN100504289C Device for detecting parallelism of two route parallel beams
06/24/2009CN100504288C Article geometrical size measuring device and method based on multi-source image fusion
06/24/2009CN100504287C Surface plasma resonance measurement mechanism and method thereof
06/23/2009US7551817 Probe and optical tomography system
06/23/2009US7551768 Image recognition apparatus and method for surface discrimination using reflected light
06/23/2009US7551767 Pattern inspection apparatus
06/23/2009US7551762 Method and system for automatic vision inspection and classification of microarray slides
06/23/2009US7551296 Method for determining the focal position of at least two edges of structures on a substrate
06/23/2009US7551295 Displacement sensor
06/23/2009US7551294 System and method for brewster angle straddle interferometry
06/23/2009US7551293 Method and apparatus for three-dimensional spectrally encoded imaging
06/23/2009US7551292 Interferometric Height Measurement
06/23/2009US7551291 Interferometric height measurement
06/23/2009US7551281 Position sensor
06/23/2009US7551268 System for monitoring sealing wear