| Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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| 09/10/2009 | US20090226785 Stainless Steel, Titanium, or Titanium Alloy Solid Polymer Fuel Cell Separator and Its Method of Produciton and Method of Evaluation of Warp and Twist of Separator |
| 09/10/2009 | US20090226078 Method and apparatus for aligning a substrate and for inspecting a pattern on a substrate |
| 09/10/2009 | US20090225333 System aspects for a probe system that utilizes structured-light |
| 09/10/2009 | US20090225332 Portable electronic measuring device and method |
| 09/10/2009 | US20090225331 Method of Providing Alignment Marks, Device Manufacturing Method and Lithographic Apparatus |
| 09/10/2009 | US20090225330 Optoelectronic distance sensor |
| 09/10/2009 | US20090225329 Phase-Shift Analysis System and Method |
| 09/10/2009 | US20090225328 Wavefront aberration measuring apparatus, wavefront aberration measuring method, exposure apparatus, and device manufacturing method |
| 09/10/2009 | US20090225327 Position measurement apparatus, position measurement method, and exposure apparatus |
| 09/10/2009 | US20090225304 Electronic component mounting apparatus, height detection method for electronic component, and optical-axis adjustment method for component height detection unit |
| 09/10/2009 | US20090225294 Reticle for projection exposure apparatus and exposure method using the same |
| 09/10/2009 | US20090223634 Method and means for assembly of high precision ultra- high speed crystal scanning heads |
| 09/10/2009 | DE19716809B4 Verfahren und Gerät zur Messung des Streulichts von Sichtscheiben, insbesondere Fahrzeugscheiben, auch im eingebauten Zustand, mit Oberflächenverschleiß auf der Außenseite der Scheibe Method and apparatus for measuring the scattered light of viewing windows, in particular vehicle windows, in the installed condition, surface wear on the outer side of the disk |
| 09/10/2009 | DE102009009893A1 Scanner Scanner |
| 09/10/2009 | DE102008020584B3 Object's upper surface area testing method, involves determining phases of wave fronts with wavelengths, and detecting synthetic wave front, which corresponds to different reciprocal value of wavelengths of phases |
| 09/10/2009 | DE102008013308A1 Tool measuring machine has clamping position for tool, which fixes axle for tool, carrier, two arms, and multiple optical elements, where optical elements carry optical measuring device |
| 09/10/2009 | DE102008013164A1 Material measure for optical position measuring unit, which operates with light of central wavelength, comprises substrate with two areas, which code position information, which is selected with light of wavelength |
| 09/10/2009 | DE102008012461A1 Hole's inner surface optical scanning device for fluid-dynamic bearing, has cone mirror comprising reflector, and guiding measuring light radiation to inner surface, where reflector has measuring surfaces for reflecting measuring radiation |
| 09/10/2009 | DE102008011993A1 Synchronisierte Bildgebung mittels optischer Verfahren und Rasterkraftmikroskopie Synchronized imaging using optical methods and atomic force microscopy |
| 09/10/2009 | DE102008011534A1 Method for operating coordinate measuring device, involves defining operating area of coordinate measuring device, which depends on position of movable element |
| 09/10/2009 | DE102008002780A1 Mask structure position determining method for use during semiconductor manufacturing, involves indicating structure on detector, and calculating position of structure from image of structure on detector |
| 09/10/2009 | DE102008002779A1 Method for determining traversing range in z-coordinate direction for determination of positions of structures on substrate, involves measuring location of z-position of substrate with focus-device at three positions on substrate |
| 09/10/2009 | DE102008002778A1 Edge position determining method for structure on semiconductor substrate, involves assigning values to position of part depending on relative change of distance of measuring lens to structure, such that one value is determined for position |
| 09/09/2009 | EP2098490A1 Method for finishing surface of preliminary polished glass substrate |
| 09/09/2009 | EP2097715A1 Three-dimensional optical radar method and device which use three rgb beams modulated by laser diodes, in particular for metrological and fine arts applications |
| 09/09/2009 | EP2097714A2 Method for determining the clearance and/or mismatch of an opening for a vehicle without referencing the opening |
| 09/09/2009 | EP2097713A2 Apparatus and method for measuring characteristics of surface features |
| 09/09/2009 | EP2097261A2 Rotary printing press and method for adjusting a cylinder thereof |
| 09/09/2009 | EP1984770B1 Method and arrangement for a rapid and robust chromatic confocal 3d measurement technique |
| 09/09/2009 | EP1859228B1 Measuring arrangement and method for the optical monitoring of coating processes |
| 09/09/2009 | EP1306801B1 Part recognition data creation method and apparatus, electronic part mounting apparatus, and recorded medium |
| 09/09/2009 | EP1269156B1 An imaging apparatus and method |
| 09/09/2009 | EP1123562B1 Layer processing |
| 09/09/2009 | CN201307002Y Image scanner device |
| 09/09/2009 | CN201307001Y Window ash quantity detector |
| 09/09/2009 | CN201307000Y Film thickness measuring light path system |
| 09/09/2009 | CN201306999Y Detecting and recording instrument for aluminum plate hole |
| 09/09/2009 | CN101529200A 确定表面和厚度 Determine the surface and thickness |
| 09/09/2009 | CN101529199A Line width measuring method, image forming status detecting method, adjusting method, exposure method and device manufacturing method |
| 09/09/2009 | CN101529198A Trolley wire wear measuring device |
| 09/09/2009 | CN101526753A Parameter measuring method of worktable coordinate system |
| 09/09/2009 | CN101526749A Photolithographic system and method for measuring deviation between variable gap of photolithographic system and center of mask stage |
| 09/09/2009 | CN101526746A Vertical measuring system capable of adjusting zero-plane position |
| 09/09/2009 | CN101526453A Method for quantitatively measuring inhomogeneous deformation of nano-crystal material |
| 09/09/2009 | CN101526351A Rod type strata displacement monitor and system |
| 09/09/2009 | CN101526347A Portable electronic device and method for measuring object length |
| 09/09/2009 | CN101526346A Portable electronic device and method for measuring length of object by same |
| 09/09/2009 | CN101526342A Detecting device and method of unevenness of a glass substrate |
| 09/09/2009 | CN101526341A Differential confocal curvature radius measurement method and device |
| 09/09/2009 | CN101526340A Stripe color coding method for grating stripe images based on Gray code principle |
| 09/09/2009 | CN101526339A Temperature self-compensation fiber grating displacement sensor |
| 09/09/2009 | CN101526338A Field calibration method of structural parameter of line structure light vision sensing system |
| 09/09/2009 | CN101526337A Scanning system and method for three-dimensional images |
| 09/09/2009 | CN101526336A Calibration method of linear structured light three-dimensional visual sensor based on measuring blocks |
| 09/09/2009 | CN100538522C Lithographic apparatus and integrated circuit manufacturing method |
| 09/09/2009 | CN100538347C Automatic optical detection system of membrane type or belt type printed circuit board and processing method thereof |
| 09/09/2009 | CN100538262C Soil body image real time capturing method and system used for centrifugal machine model trial |
| 09/09/2009 | CN100538261C Unknown free-form surface self-adaptive measuring method based on exploration method and measuring head device |
| 09/08/2009 | US7587295 Image processing device and method therefor and program codes, storing medium |
| 09/08/2009 | US7587094 Phase measurement system |
| 09/08/2009 | US7586626 Measurement method, exposure method, exposure apparatus, and device fabrication method |
| 09/08/2009 | US7586625 Position verifying apparatus and method, position measuring apparatus and method, and computer program for position verification or position measurement |
| 09/08/2009 | US7586624 Apparatus and method for detecting error of transfer system |
| 09/08/2009 | US7586623 Optical metrology of single features |
| 09/08/2009 | US7586622 Measuring thickness of a device layer using reflectance and transmission profiles of baseline devices |
| 09/08/2009 | US7586621 Displacement-measuring optical scale and optical encoder using same |
| 09/08/2009 | US7586620 Methods and systems for interferometric analysis of surfaces and related applications |
| 09/08/2009 | US7586609 Method for analyzing overlay errors |
| 09/08/2009 | US7586608 Wafer-level testing of optical and optoelectronic chips |
| 09/08/2009 | US7586606 Near-field polarized-light measurement apparatus |
| 09/08/2009 | US7586594 Method for inspecting defect and apparatus for inspecting defect |
| 09/08/2009 | US7586593 Inspection method and inspection apparatus |
| 09/08/2009 | US7585204 Substrate polishing apparatus |
| 09/03/2009 | WO2009107981A2 Apparatus and method for measuring a three-dimensional shape |
| 09/03/2009 | WO2009107839A1 Physical quantity measuring device of optical frequency range reflection measuring type, and temperature and strain simultaneous measuring method using the device |
| 09/03/2009 | WO2009107838A1 Physical quantity measuring device of optical frequency range reflection measuring type, and temperature and strain measuring method using the device |
| 09/03/2009 | WO2009107636A1 Blinking signal detection circuit, blinking signal detection method, object detection device, object detection method, and imaging system |
| 09/03/2009 | WO2009106820A1 Improved interferometric methods and apparatus for seismic exploration |
| 09/03/2009 | WO2009106602A1 Synchronized imaging by way of an optical method and atomic force microscopy |
| 09/03/2009 | WO2009106576A1 Method and means for monitoring a bragg grating fibre on a surface |
| 09/03/2009 | WO2009106375A1 Device for beam control and a method for beam control |
| 09/03/2009 | WO2009106253A1 Inspection method and apparatus, lithographic apparatus, lithographic processing cell and device manufacturing method |
| 09/03/2009 | US20090222238 Method and apparatus for layer thickness measurement |
| 09/03/2009 | US20090221874 Coded structure light |
| 09/03/2009 | US20090221103 Fabrication method of semiconductor integrated circuit device |
| 09/03/2009 | US20090219549 Three dimensional, position observation method and apparatus |
| 09/03/2009 | US20090219548 Making Method of Sample for Evaluation of Laser Irradiation Position and Making Apparatus Thereof and Evaluation Method of Stability of Laser Irradiation Position and Evaluation Apparatus Thereof |
| 09/03/2009 | US20090219547 Method and Device for Position Sensing in an Imaging System |
| 09/03/2009 | US20090219546 Interferometric Gravity Sensor |
| 09/03/2009 | US20090219533 Exposure method, exposure apparatus, and method of manufacturing device |
| 09/03/2009 | US20090219532 System and method for quality checking of anisotropic conductive film |
| 09/03/2009 | US20090219518 Optimizing use and performance of optical systems implemented with telecentric on-axis dark field illumination |
| 09/03/2009 | US20090219508 System and method for detecting local mechanical stress in integreated devices |
| 09/03/2009 | US20090219494 Evaluation method, evaluation apparatus, and exposure apparatus |
| 09/03/2009 | US20090217871 Thin film deposition apparatus and method of maintaining the same |
| 09/03/2009 | DE202009008906U1 Markierungselement, Probeneinheit mit Markierungselementen und Prüfvorrichtung mit Probeneinheit Marker, sample unit with marking elements and testing device with sample unit |
| 09/03/2009 | DE202009007199U1 Schneideinrichtung für durch Wärmeeinwirkung zu trennende Körper Cutter for to be separated by heat body |
| 09/03/2009 | DE10202738B4 Phasenverschiebungsstreifenanalyseverfahren und eine dieses Verfahren verwendende Vorrichtung Phase shifting fringe analysis method and apparatus of this method using |
| 09/03/2009 | DE102008020326B3 Stereoscopic three-dimensional-safety camera for monitoring spatial area in safety engineering, has evaluation unit designed to combine entire image from three dimensional images of image sensors of stereoscopy systems |
| 09/03/2009 | DE102007052302B4 Inspektionsvorrichtung mit Rollbeleuchtung Inspection device with Roll Lighting |