Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
09/2009
09/03/2009DE102007036309B4 Optisches Abbildungssystem und Verfahren zum Ermitteln dreidimensionaler Amplituden- und/oder Phasenverteilungen An optical imaging system and method for determining three-dimensional amplitude and / or phase distributions
09/03/2009CA2717137A1 Improved interferometric methods and apparatus for seismic exploration
09/03/2009CA2696238A1 Physical quantity measuring apparatus utilizing optical frequency domain reflectometry, and method for simultaneous measurement of temperature and strain using the apparatus
09/02/2009EP2096403A1 Optical scanning probe with a variable aperture at the light projector
09/02/2009EP2095069A2 Optical computerized method for the 3d measurement of an object by fringe projection and use of a phase-shift method, corresponding system
09/02/2009EP2095068A1 Apparatus and method for increasing the measurement accuracy of digital 3d geometry measuring systems
09/02/2009EP2095067A2 Gauge to measure distortion in glass sheet
09/02/2009EP2095066A1 Method and system for measuring an object
09/02/2009EP1853874B1 Interferometer for determining characteristics of an object surface
09/02/2009EP1658470B1 Optical measuring system for recording the geometrical data of surfaces
09/02/2009EP1646912B1 High resolution, dynamic positioning mechanism
09/02/2009EP1644700A4 Methods and devices for charge management for three-dimensional and color sensing
09/02/2009EP1405120A4 Compact imaging head and high speed multi-head laser imaging assembly and method
09/02/2009CN201302447Y An automobile rear axle bending detection instrument
09/02/2009CN101523154A Apparatus and method for determining orientation parameters of an elongate object
09/02/2009CN101520895A Method for automatic switching of pixel displacement and actual displacement in scale image
09/02/2009CN101520844A Blood vessel authentication apparatus
09/02/2009CN101520609A Method, inspection system, computer program and reference substrate for detecting mask defects
09/02/2009CN101520608A Optical focus sensor, inspection apparatus and a lithographic apparatus
09/02/2009CN101520514A Target and three-dimensional-shape measurement device using the same
09/02/2009CN101520501A Probe card inclination adjusting method and inclination detecting method
09/02/2009CN101520413A A heterodyne interference elliptic-deviation measurement nonlinear error compensation method
09/02/2009CN101520389A Super-precision trans-scale in-situ nanometer indentation marking test system
09/02/2009CN101520387A Low-dimension material dynamic tensile loading measurement system
09/02/2009CN101520326A Non-contact type positioning device for lighting body capable of utilizing different color sequences
09/02/2009CN101520323A Extensive angle measuring method for inclination angle of plane moving mirror in Fourier spectrometer
09/02/2009CN101520322A Telecentric measurement device and method
09/02/2009CN101520321A Precision testing device
09/02/2009CN101520320A Aspheric aperture splicing measuring device based on spherical air-bearing shafts
09/02/2009CN101520319A Composite three-dimensional laser measurement system and measurement method
09/02/2009CN101520318A Method for measuring sheet metal deformation based on images
09/02/2009CN101520317A Rock deforming and cracking three-dimensional dynamic testing system based on fiber strain sensing
09/02/2009CN101520316A Pressure displacement measure and control device of electrothermal pressure kitchenware and pressure measure and control method thereof
09/02/2009CN101520315A Portable non-contact ranging rod
09/02/2009CN101520314A Sensing method and device for micro inner cavity and two-dimensional coordinate based on one-dimensional micro-focus collimation
09/02/2009CN101520313A Sensing method and device for micro inner cavity size and three-dimensional coordinate based on two-dimensional micro-focus collimation
09/02/2009CN101520312A Displacement detecting device and optical instrument having the same
09/02/2009CN101520311A Dimension measurement device for sample double sections
09/02/2009CN101520310A Positional measurement system
09/02/2009CN101520309A Imaging device
09/02/2009CN101520308A Sample multipoint measurement mechanism
09/02/2009CN101520307A Method for measuring tree-crown volume fractal dimension by applying three-dimensional laser image-scanning system
09/02/2009CN101520306A Spatial carrier based interference confocal measuring device and method
09/02/2009CN101520305A Instantaneous phase-shifting secondary interference confocal measuring device and method
09/02/2009CN101520304A Phase-shifting secondary interference confocal soft-pinhole detection device and method
09/02/2009CN100535592C Survey system
09/02/2009CN100535588C Projector for a system for three dimensional optical object measurement
09/02/2009CN100535587C Unevenness detection device and unevenness detection method
09/02/2009CN100535586C High precision six-axis laser measurement device and measurement method
09/01/2009US7583392 Surface profile measuring apparatus
09/01/2009US7583391 Three-dimensional measuring apparatus, three-dimensional measuring method, and three-dimensional measuring program
09/01/2009US7583389 Geometric measurement system and method of measuring a geometric characteristic of an object
09/01/2009US7583388 Position measurement system
09/01/2009US7583387 Seismic exploration
09/01/2009US7583386 Method and apparatus for optically analyzing a surface
09/01/2009US7583376 Method and device for examination of nonuniformity defects of patterns
09/01/2009US7583375 Self-compensating laser tracker
09/01/2009US7583374 Measurement method and measurement apparatus using tracking type laser interferometer
09/01/2009US7583372 Machine vision vehicle wheel alignment image processing methods
09/01/2009US7583367 Catheter surgery simulation
09/01/2009US7583359 Reduction of fit error due to non-uniform sample distribution
09/01/2009US7583271 Method and apparatus for data processing recognizing an object represented as two-dimensional image
09/01/2009US7582888 Reflection type optical sensor and method for detecting surface roughness
09/01/2009US7582855 High-speed measuring device and method based on a confocal microscopy principle
09/01/2009US7581331 Calibration device for nozzle and calibration method for nozzle
09/01/2009US7581313 Component mounting method and mounter
09/01/2009CA2363539C Automatic installation and procedure for measurement and acquisition of shapes
08/2009
08/27/2009WO2009105331A2 3d imaging of live cells with utraviolet radiation
08/27/2009WO2009105188A1 Apparatus and method for measuring surface topography of an object
08/27/2009WO2009104876A2 Optical inspection system, and an inspection method for inspecting objects in which the said system is used
08/27/2009WO2009104568A1 Single-axis drive aligner
08/27/2009WO2009103272A1 Measuring station for high-gloss surfaces
08/27/2009WO2009083161A3 Folded optical encoder and applications for same
08/27/2009WO2009068416A3 Controller and fully automatic bending system for bending machines
08/27/2009WO2008011872A8 Height measuring device
08/27/2009WO2006126593A8 Part positioning device
08/27/2009US20090216486 Method for measuring three-dimension shape
08/27/2009US20090216484 Method for the relative positioning of an object to be measured and of a motor vehicle to a measuring device, and measuring device and a device for measuring a chassis
08/27/2009US20090216444 System and method for determining the position of an underwater vehicle
08/27/2009US20090214760 Optical Monitoring System for Coating Processes
08/27/2009US20090213390 Displacement detecting device and optical instrument having the same
08/27/2009US20090213388 Measurement method and measurement reticle
08/27/2009US20090213387 Optical probe and optical tomographic image production apparatus using the probe
08/27/2009US20090213386 Apparatus and method for measuring surface topography of an object
08/27/2009US20090213378 Method for calculating out an optimum arrangement pitch between each two LED chip package units
08/27/2009US20090213375 Optical method for the characterization of laterally-patterned samples in integrated circuits
08/27/2009US20090213357 Exposure apparatus and device manufacturing method
08/27/2009US20090213072 Remote input device
08/27/2009US20090212447 Mark Structure for Coarse Wafer Alignment and Method for Manufacturing Such a Mark Structure
08/27/2009US20090211105 Process and device for determining the alignment of two rotatable machine parts, the alignment of two hollow cylindrical machine parts or for testing a component for straightness along a lengthwise side
08/27/2009DE202006020719U1 Positionsbestimmungssystem Positioning system
08/27/2009DE10349327B4 Positionsinformationsfehler-Detektor Position information error detector
08/27/2009DE102008011212A1 Device under test's layer thickness variations measuring method, involves evaluating intensity characteristics in sample as measure of deviation from preset layer thickness based on measured values recorded by recording device
08/27/2009DE102008010973A1 Corrosion resistance evaluating method for e.g. steel, involves removing corroded material from test body, and detecting recesses formed by removing corroded material in test body, and corroded surfaces
08/27/2009DE102008010916A1 Verfahren und Vorrichtung zur Ermittlung einer Ausrichtung von zwei drehbar gelagerten Maschinenteilen, einer Ausrichtung von zwei hohlzylinderförmigen Maschinenteilen oder zur Prüfung einer Komponente auf Geradheit entlang einer Längsseite Method and apparatus for determining an alignment of two rotatably mounted machine parts, an orientation of two hollow-cylindrical machine parts or for testing a component on straightness along one longitudinal side
08/27/2009DE102008010805A1 Calibration plate arranging device for motor vehicle, has holding device allowing vertical and horizontal adjustment and fixing calibration plate, and objective device for aligning calibration plate with respect to vehicle camera system
08/27/2009DE102008010284A1 XY-Tisch mit einer Messanordnung zur Positionsbestimmung XY-table with a measuring arrangement for determining the position
08/27/2009DE102008009681A1 Measuring object's three-dimensional surface determining method, involves determining three-dimensional surface of measuring object based on two images, which determine measuring object under observation direction
08/27/2009DE102008009680A1 Sensor device for three-dimensional measurement of e.g. flip chip, in manufacturing system, has camera unit to record object under observation direction, which together with illumination direction includes angle differ from zero
08/27/2009DE102008009280A1 Device for contactless measurement of wall thickness distribution of transparent material, has light source, image recording unit, processing unit, and rotating unit swiveling around vertical axis