Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
12/2009
12/03/2009US20090296103 Fizeau lens having aspheric compensation
12/03/2009US20090296102 Coherence tomography device
12/03/2009US20090296101 Measurement method
12/03/2009US20090296100 Method for determining an optical property of an optical layer
12/03/2009US20090296099 Interferometric Layer Thickness Determination
12/03/2009US20090296058 Lithographic apparatus and device manufacturing method
12/03/2009US20090296057 Automated determination of height and tilt of a substrate surface within a lithography system
12/03/2009US20090295755 Retroreflector for use in touch screen applications and position sensing systems
12/03/2009US20090295580 Area Monitoring Sensor
12/03/2009DE102008057309B3 Determining misadjustment of powder supply nozzle, by which powder is guided as additives on workpiece, relative to laser beam, comprises constructing test structure on the workpiece in different directions by powder deposition welding
12/03/2009DE102008049837A1 Rotationsscanner sowie Verfahren zum Scannen eines Körpers und ein Verfahren zum Prüfen der Bedruckung eines Körpers Rotary scanner and method for scanning a body, and a method for testing the printing of a body
12/03/2009DE102008025870A1 Optische Positionsmesseinrichtung An optical encoder
12/03/2009DE102008024395A1 Verfahren zur Objekterfassung Method for object detection
12/03/2009DE102008023438A1 Verfahren zur Analyse von Gewebeschnitten A process for the analysis of tissue sections
12/03/2009DE102008023402A1 Microchip for producing digital representation of small object in space during production of dental crown, has LED with lens bundling radiations scanning object, where spatial position of observed point of surface of object is calculated
12/03/2009CA2721616A1 Intrusion warning system
12/02/2009EP2128701A1 Method of determining defects in a substrate and apparatus for exposing a substrate in a lithographic process
12/02/2009EP2128603A1 A method for determining an optical property of an optical layer
12/02/2009EP2128561A1 Interferometric distance measuring method with delayed chirp signal and such a device
12/02/2009EP2128560A1 Interferometric distance measuring method with spectrally separable double chirp and device
12/02/2009EP2127600A1 Surface extraction method, surface extractor and program
12/02/2009EP2127020A1 Baffled sun sensor antenna alignment monitors
12/02/2009EP2126712A2 Differential non-linear strain measurement using binary code symbol
12/02/2009EP2126552A1 Method and apparatus for illuminating material for automated inspection
12/02/2009EP2126511A1 Optical strain gauge
12/02/2009EP2126510A1 Method and apparatus for the contactless determination of the lateral misalignment relative to a straight direction
12/02/2009EP2125350A2 Device for manufacturing a rubber strip
12/02/2009EP1817123B1 Device and method for aligning the input apparatuses and the channels in a rolling stand
12/02/2009CN201355243Y Portable vegetation coverage measuring apparatus
12/02/2009CN201355242Y Measuring device for measuring garbage compression length
12/02/2009CN201355241Y Visual-based space target pose measuring device
12/02/2009CN201355234Y Special gauge for calibration of length measuring machine
12/02/2009CN201354440Y Three-dimensional restraining and measuring device for track with portable laser rangefinder
12/02/2009CN101595365A Prediction algorithm for scanning an object
12/02/2009CN101594995A Rotary printing press and method for adjusting a cylinder thereof
12/02/2009CN101593714A A needle tracking inspection device, a detecting device and a needle tracking inspection method
12/02/2009CN101593583A Optical fiber composite insulator and preparation method thereof
12/02/2009CN101592573A Tension-compression and fatigue loading testing machine based on laser confocal microscope
12/02/2009CN101592481A Laser internal control vertical section measuring method of high-rise building
12/02/2009CN101592480A Translational photoelectricity profilograph
12/02/2009CN101592479A Photoelectricity profilograph
12/02/2009CN101592478A Device and method for non-zero compensating mirror precise interference positioning and adjustment in non-spherical non-zero detection
12/02/2009CN101592477A Right-angled reflection type three-dimensional laser scanner and method for realizing three-dimensional imaging by using same
12/02/2009CN101592476A Method for measuring three-dimension shape
12/02/2009CN101592475A Fully distributed fiber Rayleigh and Raman scattering photon strain and temperature sensor
12/02/2009CN101592474A Method for evaluating cooperative transformation of asphalt pavement material and optical fiber grating sensor
12/02/2009CN101592473A Laser measuring instrument for track lifting and lining for railway works
12/02/2009CN101592472A Single-grating interferometer for time resolution
12/02/2009CN101592470A Page thickness detection device of combined saddle stitching machine
12/02/2009CN100565498C Minimum discontinuousness two-dimension phase unwrapping method based on phase discontinuousness area detection
12/02/2009CN100565275C Semiconductor array technology
12/02/2009CN100565196C Apparatus and method for detecting defect and apparatus and method for extracting wire area
12/02/2009CN100565194C Optical inspection for container lean
12/02/2009CN100565169C Simulation method and device for detecting lateral stability of directly laid pipes on sea floor
12/02/2009CN100565141C Method and apparatus for producing an image containing depth information
12/02/2009CN100565101C Method and device for measuring, determining and controlling flatness of a metal strip
12/02/2009CN100565100C Non-contact method and system for tyre analysis
12/02/2009CN100565099C Method and apparatus for increasing signal to noise ratio in a photoacoustic film thickness measurement system
12/02/2009CN100565098C Online type holographic moulding film duplicate length measuring device
12/02/2009CN100565097C Structural optical sensor structural parameter calibration method based on unchanged two-dimensional cross ratio
12/02/2009CN100565096C Full-automatic image measurer
12/02/2009CN100565095C Linear measurement apparatus
12/02/2009CN100565093C Controllable device initial angle position dynamic detection device
12/02/2009CN100564592C Apparatus and method of detecting the electroless deposition endpoint
12/02/2009CN100564137C Indicating system of the space length between the left and right vehicle wheel tyres
12/02/2009CN100563551C Patient visual instruction techniques for synchronizing breathing with a medical procedure
12/01/2009US7627449 Apparatus for measuring eccentricity of optical module
12/01/2009US7627438 Observer based Q-control imaging methods for atomic force microscopy
12/01/2009US7627197 Position measurement method, an apparatus, a computer program and a method for generating calibration information
12/01/2009US7626712 Methods and systems for characterizing semiconductor materials
12/01/2009US7626711 Method and system for measuring patterned structures
12/01/2009US7626710 Method and system for measuring patterned structures
12/01/2009US7626709 Device for examining the optical properties of surfaces
12/01/2009US7626708 Phase shifting grating-slit test for optical surface reconstruction
12/01/2009US7626707 Dual cavity displacement sensor
12/01/2009US7626706 Polarization interference microscope
12/01/2009US7626702 Overlay target and measurement method using reference and sub-grids
12/01/2009US7626701 Lithographic apparatus with multiple alignment arrangements and alignment measuring method
12/01/2009US7626689 Method and device for analysing the imaging behavior of an optical imaging element
12/01/2009US7626680 Exposure apparatus and device fabrication method using the same
12/01/2009US7626189 Characterization of fancy yarn
12/01/2009US7625335 Method and apparatus for three-dimensional optical scanning of interior surfaces
11/2009
11/26/2009WO2009143319A1 Stereoscopic measurement system and method
11/26/2009WO2009142974A2 Laser ultrasonic measurement system with movable beam delivery
11/26/2009WO2009142390A2 Apparatus for measurement of a surface profile
11/26/2009WO2009142121A1 Semiconductor device and fabrication method thereof
11/26/2009WO2009141838A1 Method for contactless measurement of surface shape objects, particularly for dental arch portions or teeth portions
11/26/2009WO2009141720A1 Method and apparatus for overlay compensation between subsequently patterned layers on workpiece
11/26/2009WO2009141606A1 Optical inspection probe
11/26/2009WO2009141337A1 Method and device for sintering an object while determining the geometric surface profile of the object
11/26/2009WO2009141333A1 Method for determining the measuring uncertainty of coordinates in geometric measurement
11/26/2009WO2009140946A1 Method for detecting objects
11/26/2009WO2009140778A1 Optical position detection
11/26/2009WO2009120623A3 Method and apparatus for detecting defects using structured light
11/26/2009US20090290168 Inspecting Method and Inspecting Apparatus for Substrate Surface
11/26/2009US20090290167 Optical Coherence Tomography Laser with Integrated Clock
11/26/2009US20090290158 Semiconductor wafer
11/26/2009US20090290146 Probing device and a system for obtaining geometrical data related to a cavity
11/26/2009US20090289042 Light beam scanning apparatus, laser machining apparatus, test method and laser machining method
11/26/2009DE102008025896A1 Verfahren zur Ermittlung der Messunsicherheit bei der Geometriemessung A method for determining the uncertainty in the measurement geometry