Patents
Sitemap › H01 - Basic electric elements › H01L - Semiconductor devices; Electric solid state devices not otherwise provided for › H01L 27 - Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
Patents for H01L 27 - Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate (229,248)
03/2003
03/18/2003US6534363 High voltage oxidation method for highly reliable flash memory devices
03/18/2003US6534362 Method for fabricating a memory cell configuration
03/18/2003US6534361 Method of manufacturing a semiconductor device including metal contact and capacitor
03/18/2003US6534358 Method of fabricating semiconductor device having ferroelectric capacitor
03/18/2003US6534356 Method of reducing dark current for an image sensor device via use of a polysilicon pad
03/18/2003US6534355 Method of manufacturing a flash memory having a select transistor
03/18/2003US6534354 Method of manufacturing MOS transistor with fluorine implantation at a low energy
03/18/2003US6534349 Method of manufacturing a semiconductor device having a two-layered electrode structure
03/18/2003US6534340 Cover cap for semiconductor wafer devices
03/18/2003US6534335 Optimized low leakage diodes, including photodiodes
03/18/2003US6534333 Method of manufacturing an image sensor
03/18/2003US6534326 Method of minimizing leakage current and improving breakdown voltage of polycrystalline memory thin films
03/18/2003US6533948 Method of manufacturing semiconductor device having ferro-dielectric material film
03/18/2003US6533906 Method of manufacturing an oxide epitaxially strained lattice film
03/18/2003US6533631 Metal bumps function as spacers upon vapor-deposition of the organic layer, to prevent contact of a vapor deposition mask with an already formed film surface; allows image panel to be connected to the adjacent one without a gap between
03/18/2003CA2208762C Flat panel imaging system
03/13/2003WO2003022017A2 Systems and methods for detecting ionizing radiation with an imaging system comprising a scintillator
03/13/2003WO2003022012A1 Light emitting element, and display unit and illuminating device using the light emitting element
03/13/2003WO2003022010A1 Method for manufacturing organic el device and organic el device
03/13/2003WO2003021784A1 Programmable gate array based on configurable metal interconnect vias
03/13/2003WO2003021737A1 An arrangement for esd protection of an integrated circuit
03/13/2003WO2003021693A2 Elevated pore phase-change memory
03/13/2003WO2003021689A1 Antiparallel magnetoresistive memory cells
03/13/2003WO2003021687A2 Irfpa roic with dual tdm reset integrators and sub-frame averaging functions per unit cell
03/13/2003WO2003021683A1 Semiconductor device and its manufacturing method
03/13/2003WO2003021682A1 Radiation image detector
03/13/2003WO2003021681A1 Laser mark printing method of soi wafer, soi wafer and method for fabricating the same
03/13/2003WO2003021677A2 Iii-nitride laser activated semiconductor switch and associated methods of fabrication and operation
03/13/2003WO2003021676A2 Connecting the emitter contacts of a semiconductor device
03/13/2003WO2003021666A1 Nonvolatile storage device and semiconductor integrated circuit
03/13/2003WO2003021661A2 Process for making a mim capacitor
03/13/2003WO2003021615A1 Thin film capacity element-use composition, high-permittivity insulation film, thin film capacity element and thin film multilayer capacitor
03/13/2003WO2003021613A2 Electromechanical memory array using nanotube ribbons and method for making same
03/13/2003WO2003021601A1 Non-volatile memory device
03/13/2003WO2003021579A1 Magnetic material structures, devices and methods
03/13/2003WO2003021340A2 Optoelectronic displays
03/13/2003WO2003021294A1 Method and apparatus for identifying and correcting line artifacts in a solid state x-ray detector
03/13/2003WO2003020998A2 Integrated circuit device and fabrication using metal-doped chalcogenide materials
03/13/2003WO2003020846A1 Color-changing material composition and color-changing membranes made by using the same
03/13/2003WO2003012891A8 Electrode compositions
03/13/2003WO2003001601A3 Spacer etch mask for sonos memory
03/13/2003WO2002103797A3 High-voltage integrated cmos circuit
03/13/2003WO2002099482A3 Oscillating reference signal generator
03/13/2003WO2002097899A3 Integrated tunable capacitor
03/13/2003WO2002089177A3 A contact structure of a wiring line and method manufacturing the same, and thin film transistor array substrate including the contact structure and method manufacturing the same
03/13/2003WO2002082461A3 Readout of array-based analog data in semiconductor-based devices
03/13/2003WO2002078084A3 Method for producing ferroelectric memory cells
03/13/2003WO2002073667A3 Formation of a frontside contact on silicon-on-insulator substrate
03/13/2003WO2002069375A3 Trench condenser and method for production thereof
03/13/2003WO2002057180A3 Soi/glass process for forming thin silicon micromachined structures
03/13/2003WO2002054467A3 Semiconductor structure including a monocrystalline conducting layer
03/13/2003WO2002050908A3 Gate length control for semiconductor chip design
03/13/2003WO2002039501A3 Method for producing trench capacitors
03/13/2003WO2002013243A3 Devices with optical gain in silicon
03/13/2003US20030051221 Master slice type in which various logic circuits are formed by commonly carrying out product steps except a wiring step, and changing only the wiring step
03/13/2003US20030051198 Electronic circuit and method for testing
03/13/2003US20030051093 Nonvolatile semiconductor memory device
03/13/2003US20030051091 Latched sense amplifiers as high speed memory in a memory system
03/13/2003US20030049945 Interconnection structure and method for designing the same
03/13/2003US20030049940 Method for manufacturing field effect transistor
03/13/2003US20030049930 Method of fabricating a high-voltage transistor with a multi-layered extended drain structure
03/13/2003US20030049925 High-density inter-die interconnect structure
03/13/2003US20030049922 Rectangular contact used as a low voltage fuse element
03/13/2003US20030049919 Semiconductor device having smooth refractory metal silicide layers and process for fabrication thereof
03/13/2003US20030049912 Method of forming chalcogenide comprsing devices and method of forming a programmable memory cell of memory circuitry
03/13/2003US20030049910 Monotonic Dynamic-Static Pseudo-NMOS Logic Circuit
03/13/2003US20030049909 Manufacturing method of a semiconductor device having a polysilicon electrode
03/13/2003US20030049908 Method for fabricating a capacitor
03/13/2003US20030049907 Semiconductor device and manufacturing method therefor
03/13/2003US20030049905 Method of manufacturing semiconductor device
03/13/2003US20030049903 Semiconductor device and method of manufacturing the same
03/13/2003US20030049902 Semiconductor processing methods of forming devices on a substrate, forming device arrays on a substrate, forming conductive lines on a substrate, and forming capacitor arrays on a substrate, and integrated circuitry
03/13/2003US20030049896 Method for making an active pixel sensor
03/13/2003US20030049895 Semiconductor integrated electronic device and corresponding manufacturing method
03/13/2003US20030049560 Wherein active primer is disposed between thermal transfer donor sheet and receptor to assist selective thermal transfer; binder improves adhesion
03/13/2003US20030048686 Semiconductor memory device
03/13/2003US20030048679 Methods of forming contact holes using multiple insulating layers and integrated circuit devices having the same
03/13/2003US20030048676 Antiparallel magnetoresistive memory cells
03/13/2003US20030048674 Nonvolatile semiconductor memory device
03/13/2003US20030048673 Test mode decoder in a flash memory
03/13/2003US20030048667 High-speed data programmable nonvolatile semiconductor memory device
03/13/2003US20030048666 Graded composition metal oxide tunnel barrier interpoly insulators
03/13/2003US20030048661 Nonvolatile semiconductor memory
03/13/2003US20030048658 Magnetic element with an improved magnetoresistance ratio and fabricating method thereof
03/13/2003US20030048657 Four terminal memory cell, a two-transistor SRAM cell, a SRAM array, a computer system, a process for forming a SRAM cell, a process for turning a SRAM cell off, a process for writing a SRAM cell and a process for reading data from a SRAM cell
03/13/2003US20030048656 Four terminal memory cell, a two-transistor sram cell, a sram array, a computer system, a process for forming a sram cell, a process for turning a sram cell off, a process for writing a sram cell and a process for reading data from a sram cell
03/13/2003US20030048653 Semiconductor integrated circuit device and contactless electronic device
03/13/2003US20030048593 Capacitor and method for forming a capacitor
03/13/2003US20030048590 Circuit for esd protection
03/13/2003US20030048588 Output buffer and I/O protection circuit for CMOS technology
03/13/2003US20030048519 Microelectronic photonic structure and device and method of forming the same
03/13/2003US20030048395 Electric optical apparatus and manufacturing method of the same, projection display, and electronic instrument
03/13/2003US20030048378 Imaging device module package
03/13/2003US20030048371 Solid-state imaging apparatus for controlling a sweep transfer period in dependence upon the amount of unnecessary charges to be swept out
03/13/2003US20030048239 Self-illuminating imaging device
03/13/2003US20030048142 Controllable and testable oscillator apparatus for an integrated circuit
03/13/2003US20030048140 Electronic component containing capacitance diodes, the component in combination with a receiving unit, and circuit configuration containing the component
03/13/2003US20030048124 Integrated circuit and method of adjusting capacitance of a node of an integrated circuit
03/13/2003US20030048123 Integrated circuit and method of adjusting capacitance of a node of an integrated circuit
03/13/2003US20030048073 Light emitting device
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