Patents
Sitemap › H01 - Basic electric elements › H01L - Semiconductor devices; Electric solid state devices not otherwise provided for › H01L 27 - Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
Patents for H01L 27 - Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate (229,248)
03/2003
03/19/2003EP0939933B1 Light detection device
03/19/2003EP0746905B1 A power semiconductor switch
03/19/2003CN1404681A 一种图像传感器 An image sensor
03/19/2003CN1404628A Semiconductor device comprising an arrangement of an electrically programmable non-volatile memory element
03/19/2003CN1404625A Etching process
03/19/2003CN1404600A Active matrix display and active matrix organic electroluminescence display
03/19/2003CN1404345A Method for producing electroluminescent display board and vapour-deposition shade
03/19/2003CN1404344A Method for producing electroluminescent element and vapour-deposition shade
03/19/2003CN1404343A Organic EL display apparatus and processing method thereof
03/19/2003CN1404303A Image instrument module package
03/19/2003CN1404219A Making process and apparatus for high-frequency film bulk filter
03/19/2003CN1404159A SCR with base triggering effect
03/19/2003CN1404158A Making process of phase grating image sensor
03/19/2003CN1404157A Solid image detecting device
03/19/2003CN1404155A Non-volatile memory element and its manufacture
03/19/2003CN1404154A Semiconductor apparatus and producing method thereof
03/19/2003CN1404152A Nonvolatile semiconductor storage and its producing method and operating method
03/19/2003CN1404150A Semiconductor storage unit and semiconductor memory
03/19/2003CN1404149A Semiconductor device with electrostatic discharge protective circuit
03/19/2003CN1404142A Method for producing semiconductor substrate, semiconductor substrate, electrooptical apparatus and electronic equipment
03/19/2003CN1404138A Integrated radio-frequency circuit
03/19/2003CN1404133A Wiring design method
03/19/2003CN1404123A Semiconductor device and checkup apparatus thereof
03/19/2003CN1404066A Thin film magnetic storing device containing storage unit with magnetic tunel junction
03/19/2003CN1403854A Displaying apparatus and displaying method
03/19/2003CN1103500C Infield-aided metal ultramicro-particle/medium composite photoelectric emitting film
03/19/2003CN1103497C Bulk and strained silicon formed on insulator with local selective oxidation
03/19/2003CN1103328C Process for producing strontium-barium titanate film material
03/18/2003US6536030 Macroblock for use in layout design of semiconductor integrated circuit, storage medium for storing intellectual property including information on the macroblock, and layout design method using the macroblock
03/18/2003US6536028 Standard block architecture for integrated circuit design
03/18/2003US6536013 Memory embedded semiconductor integrated circuit and a method for designing the same
03/18/2003US6535535 Laser irradiation method, laser irradiation apparatus, and semiconductor device
03/18/2003US6535453 Semiconductor memory device
03/18/2003US6535451 Semiconductor memory
03/18/2003US6535435 Reference voltage generator permitting stable operation
03/18/2003US6535417 Semiconductor storage device
03/18/2003US6535414 Semiconductor storage device
03/18/2003US6535413 Positioning and joining electronic structures of silicon, by annealing conductors causing silicon to diffuse and form joints such as terminals for transistors; process control; efficiency
03/18/2003US6535412 Semiconductor memory device capable of switching output data width
03/18/2003US6535368 Shared 5 volt tolerant ESD protection circuit for low voltage CMOS process
03/18/2003US6535338 Microlens array, method of manufacturing the same, and optical device and electronic apparatus using the same
03/18/2003US6535197 Printable electrode structures for displays
03/18/2003US6535101 Low loss high Q inductor
03/18/2003US6535098 Integrated helix coil inductor on silicon
03/18/2003US6535090 Compact high-frequency circuit device
03/18/2003US6535075 Tunable on-chip capacity
03/18/2003US6535056 Semiconductor integrated circuit device
03/18/2003US6535046 Integrated semiconductor circuit with an increased operating voltage
03/18/2003US6535043 Clock signal selection system, method of generating a clock signal and programmable clock manager including same
03/18/2003US6535034 High performance integrated circuit devices adaptable to use lower supply voltages with smaller device geometries
03/18/2003US6534998 Semiconductor device and control method thereof
03/18/2003US6534978 Electronic component
03/18/2003US6534948 Motor driving circuit, a method for driving a motor, and a semiconductor integrated circuit device
03/18/2003US6534867 Semiconductor device, semiconductor element and method for producing same
03/18/2003US6534864 Semiconductor memory device and method of fabricating the same
03/18/2003US6534857 Thermally balanced power transistor
03/18/2003US6534841 Electrical and electronic apparatus having three-dimensional dielectric multilayers, used in computers
03/18/2003US6534834 Polysilicon bounded snapback device
03/18/2003US6534833 Semiconductor device with protection circuitry and method
03/18/2003US6534831 Semiconductor integrated circuit device
03/18/2003US6534827 MOS transistor
03/18/2003US6534826 Semiconductor device and manufacturing method thereof
03/18/2003US6534824 Self-aligned punch through stop for 6F2 rotated hybrid DRAM cell
03/18/2003US6534821 Structure with protruding source in split-gate flash
03/18/2003US6534820 Integrated dynamic memory cell having a small area of extent, and a method for its production
03/18/2003US6534819 Dense backplane cell for configurable logic
03/18/2003US6534818 Stacked-gate flash memory device
03/18/2003US6534817 Contactless channel write/erase flash memory cell and its fabrication method
03/18/2003US6534816 Method and apparatus for injecting charge onto the floating gate of a nonvolatile memory cell
03/18/2003US6534815 Semiconductor device with stack electrode formed using HSG growth
03/18/2003US6534814 Method of manufacturing a semiconductor memory device having a trench capacitor with sufficient capacitance and small junction leak current
03/18/2003US6534813 Semiconductor device having a self-aligned contact structure and methods of forming the same
03/18/2003US6534812 Memory cell with stored charge on its gate and a resistance element having non-linear resistance elements
03/18/2003US6534811 DRAM cell with high integration density
03/18/2003US6534810 Semiconductor memory device having capacitor structure formed in proximity to corresponding transistor
03/18/2003US6534807 Local interconnect junction on insulator (JOI) structure
03/18/2003US6534805 Static random access memory
03/18/2003US6534804 Semiconductor device
03/18/2003US6534803 Electronic device, semiconductor device, and electrode forming method
03/18/2003US6534796 Integrated circuit optics assembly unit
03/18/2003US6534787 Asymmetrical MOS channel structure with drain extension
03/18/2003US6534786 Testing
03/18/2003US6534785 Reduced terminal testing system
03/18/2003US6534781 Phase-change memory bipolar array utilizing a single shallow trench isolation for creating an individual active area region for two memory array elements and one bipolar base contact
03/18/2003US6534780 Semiconductors
03/18/2003US6534759 Vertical photodetector with improved photocarrier separation and low capacitance
03/18/2003US6534758 Electromagnetic wave detector using quantum wells and subtractive detectors
03/18/2003US6534757 Image sensor noise reduction
03/18/2003US6534409 Silicon oxide co-deposition/etching process
03/18/2003US6534408 Utilization of disappearing silicon hard mask for fabrication of semiconductor structures
03/18/2003US6534406 Method for increasing inductance of on-chip inductors and related structure
03/18/2003US6534384 Method for manufacturing SOI wafer including heat treatment in an oxidizing atmosphere
03/18/2003US6534377 Capacitance elements and method of manufacturing the same
03/18/2003US6534375 Method of forming a capacitor in a semiconductor integrated circuit device using a metal silicon nitride layer to protect an underlying metal silicide layer from oxidation during subsequent processing steps
03/18/2003US6534374 Single damascene method for RF IC passive component integration in copper interconnect process
03/18/2003US6534371 C implants for improved SiGe bipolar yield
03/18/2003US6534368 Integrated circuit memory cell having a small active area and method of forming same
03/18/2003US6534366 Method of fabricating trench-gated power MOSFET
03/18/2003US6534365 Method of fabricating TDMOS device using self-align technique
03/18/2003US6534364 Tunnel diode layout for an EEPROM cell for protecting the tunnel diode region
1 ... 1625 1626 1627 1628 1629 1630 1631 1632 1633 1634 1635 1636 1637 1638 1639 1640 1641 1642 1643 1644 1645 ... 2293