Patents
Patents for H01J 49 - Particle spectrometers or separator tubes (20,265)
08/1996
08/22/1996DE19605100A1 Mass spectrometer with controlled ancillary voltage source
08/21/1996EP0727095A1 Micromachined mass spectrometer
08/21/1996EP0564629B1 Power supply for multipolar mass filter
08/14/1996DE4441972A1 Detecting sample molecules in carrier gas with continuum and molecular jet zones
08/13/1996US5545895 Method of standardizing data obtained through mass spectrometry
08/13/1996US5545894 Compact hydrogen/helium isotope mass spectrometer
08/13/1996US5545304 Ion current detector for high pressure ion sources for monitoring separations
08/08/1996DE19517507C1 High frequency ion transfer guidance system for transfer of ions into vacuum of e.g. ion trap mass spectrometer
08/06/1996US5543624 Gasphase ion source for time-of-flight mass-spectrometers with high mass resolution and large mass range
08/06/1996US5543619 Vacuum inlet
07/1996
07/30/1996US5541410 Reduced diameter retractable cylindrical mirror analyzer
07/30/1996US5541409 High resolution retarding potential analyzer
07/30/1996US5541408 Micromachined mass spectrometer
07/30/1996US5541407 Dopes; sublimation, vaporization, atomizing
07/30/1996US5540890 Capped-closure for a container
07/24/1996EP0723282A1 Laser-assisted particle analysis
07/23/1996US5539204 Mass spectrometer vacuum housing and pumping system
07/23/1996US5538897 Use of mass spectrometry fragmentation patterns of peptides to identify amino acid sequences in databases
07/18/1996CA2167099A1 Particulate analysis of fluid samples
07/17/1996EP0721655A1 An ultra-sensitive molecular identifier
07/16/1996US5536939 Miniaturized mass filter
07/16/1996US5536471 Syringe with bubble flushing
07/11/1996DE19549144A1 Generating ion stream of hydroxonium ions for mass- spectrometric gas analysis
07/10/1996EP0720747A1 Automated continuous and random access analytical system and components thereof
07/09/1996US5534998 For producing an aerosol
07/09/1996US5534699 Device for separating and recombining charged particle beams
07/04/1996DE4446230A1 Ion filtering arrangement for ion beam layering processes and mass spectrometry
07/03/1996EP0720207A1 Magnetic field type mass spectrometer
07/02/1996US5532483 Mass spectrometer and ion source
06/1996
06/27/1996WO1996019822A1 Radio frequency ion source
06/27/1996WO1996019716A1 Spectrometer with discharge limiting means
06/25/1996US5530244 Solid state detector for sensing low energy charged particles
06/19/1996EP0717433A1 Means for reducing the contamination of mass spectrometer leak detector ion sources
06/18/1996US5528034 Method of ultra high sensitivity hydrogen detection with slow multiply-charged ions
06/18/1996US5528032 Thermal desorption gas spectrometer
06/18/1996US5528031 Collisionally induced decomposition of ions in nonlinear ion traps
06/11/1996US5525799 Portable gas chromatograph-mass spectrometer
06/11/1996US5525084 Method of formation of an electrode in a mass filter electrode assembly
06/05/1996EP0715337A1 Mass spectrometry of solution and apparatus therefor
06/04/1996US5523566 Diluting sample with organic solvent
05/1996
05/30/1996WO1996016430A1 Solid state micro-machined mass spectrograph universal gas detection sensor
05/30/1996DE4442348A1 Vorrichtung und Verfahren zur verbesserten Massenauflösung eines Flugzeit-Massenspektrometers mit Ionenreflektor Apparatus and method for improved mass resolution of a time of flight mass spectrometer with ion reflector
05/30/1996CA2181801A1 Solid state micro-machined mass spectrograph universal gas detection sensor
05/28/1996US5521382 MS/MS type mass analyzer
05/28/1996US5521381 Contamination analysis unit
05/28/1996US5521380 Frequency modulated selected ion species isolation in a quadrupole ion trap
05/28/1996US5521379 Method of selecting reaction paths in ion traps
05/28/1996US5520060 Process and apparatus for testing bottles for the presence of contamination
05/23/1996WO1996015547A1 Method and apparatus for plasma mass analysis with reduced space charge effects
05/23/1996CA2204523A1 Method and apparatus for plasma mass analysis with reduced space charge effects
05/22/1996EP0713244A1 Base plate for charged particle energy analyser
05/22/1996EP0617837A4 Mass spectrometry method using filtered noise signal.
05/21/1996US5519215 Plasma mass spectrometry
05/15/1996EP0711453A1 Space change control method for improved ion isolation in ion trap mass spectrometer by dynamically adaptive sampling
05/14/1996US5517026 On-the-move surface sampling head for a mass spectrometer
05/14/1996US5517025 Frequency modulated selected ion species isolation in a quadrupole ion trap
05/08/1996EP0524311B1 Ion processing: storage, cooling and spectrometry
05/07/1996US5514868 To determine elemental composition of a sample
05/02/1996WO1996013052A1 Spatial-velocity correlation focusing in time-of-flight mass spectrometry
05/02/1996DE4438315A1 Gas ion removal device from electron beam in tomography appts.
05/01/1996EP0708976A1 Process for operating a time-of-flight secondary ion mass spectrometer
04/1996
04/24/1996EP0708475A1 Mass spectra deconvolution method
04/23/1996US5510613 Spatial-velocity correlation focusing in time-of-flight mass spectrometry
04/18/1996WO1996011493A1 Method for manufacturing a miniaturized mass spectrograph
04/18/1996WO1996011492A1 Miniaturized mass filter
04/18/1996WO1996011339A1 Micro-miniature piezoelectric diaphragm pump for the low pressure pumping of gases
04/18/1996CA2202062A1 Micro-miniature piezoelectric diaphragm pump for the low pressure pumping of gases
04/17/1996EP0571622B1 Sequential observation method for monitoring the evolution of a chemical reaction
04/16/1996US5508838 Slit system
04/16/1996US5508516 Mass spectrometry method using supplemental AC voltage signals
04/16/1996US5508515 Mass recombinator for accelerator mass spectrometry
04/16/1996US5507410 Meia cartridge feeder
04/10/1996EP0616550A4 Universal collisional activation ion trap mass spectrometry.
04/09/1996US5506414 For investigating a selected area of the surface region of a specimen
04/09/1996US5506413 Spatial-focus energy analyzer
04/09/1996US5506412 Means for reducing the contamination of mass spectrometer leak detection ion sources
04/09/1996US5506348 Composition containing ammonium salt of organic or inorganic acid, hydroxy substituted phenone, high molecular weight compound
04/09/1996US5505832 Device and method for mass spectrometric analysis of substance mixtures by coupling capillary electrophoretic separation (CE) with electrospray ionization (ESI)
04/03/1996EP0704879A1 Charged particle mirror
04/03/1996EP0436544B1 High resolution plasma mass spectrometer
04/02/1996US5504329 Method of ionizing atoms or molecules by electrospraying
04/02/1996US5504328 Endpoint detection utilizing ultraviolet mass spectrometry
04/02/1996US5504327 Electrospray ionization source and method for mass spectrometric analysis
04/02/1996US5504326 Spatial-velocity correlation focusing in time-of-flight mass spectrometry
03/1996
03/28/1996WO1996009642A1 Mass spectrometer for gas tension measurer
03/27/1996CN1119477A Cycloidal mass spectrometer and ionizer for use therein
03/20/1996EP0701471A1 A method of space charge control in an ion trap mass spectrometer
03/14/1996WO1996008034A1 Mass spectrometer system and method using simultaneous mode detector and signal region flags
03/13/1996EP0700521A1 Method and apparatus for desorption and ionization of analytes
03/12/1996US5498545 Mass spectrometer system and method for matrix-assisted laser desorption measurements
03/06/1996EP0700069A2 Frequency modulated selected ion species in a quadrapole ion trap
03/06/1996EP0700068A1 Apparatus and method for isotopic ratio plasma mass spectrometry
03/05/1996US5496998 Time-of-flight mass-spectrometer with gasphase ion source, with high sensitivity and large dynamic range
03/03/1996CA2157343A1 Apparatus and method for isotopic ratio plasma mass spectrometry
02/1996
02/28/1996EP0698912A1 High frequency mass spectrometer
02/28/1996EP0698281A1 Method of plasma mass analysis with reduced space charge effects
02/27/1996US5495108 Orthogonal ion sampling for electrospray LC/MS
02/27/1996US5495107 Analysis
02/20/1996US5493115 Methods for analyzing a sample for a compound of interest using mass analysis of ions produced by slow monochromatic electrons
02/20/1996US5492867 Forming an ionizer, dielectric layer inside an interconnecting cavities