Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
04/2011
04/06/2011CN101470141B Overcurrent detecting apparatus
04/06/2011CN101464964B Pattern recognition method capable of holding vectorial machine for equipment fault diagnosis
04/06/2011CN101447480B Integrated circuit wafer structure simplifying test program and testing method thereof
04/06/2011CN101446620B Battery-based semiconductor AC differential conductive scanning measurement system
04/06/2011CN101446603B Distributed multifunctional integral measurement method for electric power system
04/06/2011CN101424724B Method for rapidly and precision detecting magnetic circuit switch of electromagnetic relay and apparatus thereof
04/06/2011CN101419265B Signal generating circuit for detecting protective earthing connecting status
04/06/2011CN101388517B Test socket
04/06/2011CN101387681B Apparatus for detecting recessive breakdown of large-capacity capacitor
04/06/2011CN101387680B Multi-mould radio installation electromagnetical disturbance test system
04/06/2011CN101369396B Function verification method and system for liquid crystal display drive chip
04/06/2011CN101369004B Micro-phase shift fast transformation method used for excitation system frequency spectrum analysis
04/06/2011CN101354485B System and method for testing display apparatus
04/06/2011CN101349720B High pressure overhead power line power frequency electric field shielding analysis method
04/06/2011CN101331405B Test apparatus and pin electronics card
04/06/2011CN101329377B Electronic system and warning apparatus thereof
04/06/2011CN101325331B Method for implementing element for measuring distance between phases without relevance to load current and ground resistance
04/06/2011CN101325330B Method for implementing earthing distance measurement element
04/06/2011CN101322039B System, method, and article of manufacture for determining an estimated battery parameter vector
04/06/2011CN101308707B Sorting machine for memory IC detection
04/06/2011CN101295004B Method for judging single-phase grounding fault point position of generator stator winding
04/06/2011CN101276949B Method for detecting battery performance of hybrid power vehicle
04/06/2011CN101264821B Carrying device for electronic component detection classifier
04/06/2011CN101221226B Automatic testing method and apparatus of electric power
04/06/2011CN101221222B Battery collection instrument and device for preventing collected battery set from short circuit
04/06/2011CN101197569B Circuit built in chip for initializing its operation mode and method thereof
04/06/2011CN101142493B Apparatus and method for measuring the amount of the current in battery cells using a plurality of sensing resistors
04/06/2011CN101043094B Battery voltage measurement circuit and battery electric control unit
04/06/2011CN101023670B Apparatus for verifying a low noise block output voltage
04/05/2011US7921346 Verification of array built-in self-test (ABIST) design-for-test/design-for-diagnostics (DFT/DFD)
04/05/2011US7921345 Automated test system
04/05/2011US7921344 Multi-stage data processor with signal repeater
04/05/2011US7921343 Testing system, testing system control method, and test apparatus
04/05/2011US7921342 Integrated circuit comprising a test mode secured by the use of an identifier, and associated method
04/05/2011US7920989 Remote test facility with wireless interface to local test facilities
04/05/2011US7920695 Telephony distribution system
04/05/2011US7920480 System and method to determine broadband transport performance data
04/05/2011US7920479 Cost minimization of services provided by multiple service providers
04/05/2011US7920475 System and method for adaptive removal of delay jitter effect and low end-to-end delay
04/05/2011US7920474 System and method for context-based hierarchical adaptive round robin scheduling
04/05/2011US7920467 System and method for monitoring a plurality of network devices
04/05/2011US7920466 Protection of hierarchical tunnel head-end nodes
04/05/2011US7920464 Method of redundancy of ring network
04/05/2011US7920263 Apparatus and system for electro magnetic field measurements and automatic analyses of phase modulated optical signals from electrooptic devices
04/05/2011US7919976 Transistor diagnostic circuit
04/05/2011US7919975 Differential signaling system and flat panel display with the same
04/05/2011US7919974 Electronic device test apparatus and method of configuring electronic device test apparatus
04/05/2011US7919973 Method and apparatus for monitoring via's in a semiconductor fab
04/05/2011US7919972 Integrated substrate transfer module
04/05/2011US7919967 Verification of a fabrication process used to form read elements in magnetic heads
04/05/2011US7919946 Detection method for an electrical polyphase machine
04/05/2011US7918669 Integrated circuit socket with a two-piece connector with a rocker arm
03/2011
03/31/2011WO2011037257A1 Battery system
03/31/2011WO2011037022A1 Apparatus and method for detecting abnormality of high voltage circuit
03/31/2011WO2011036867A1 Disconnection detecting circuit and battery power supply device
03/31/2011WO2011036760A1 Secondary battery system
03/31/2011WO2011036718A1 Probe apparatus and testing apparatus
03/31/2011WO2011036705A1 Process for producing secondary battery
03/31/2011WO2011036325A1 System for measuring partial discharges in power lines
03/31/2011WO2011036056A1 Electric circuit configuration for switching an electrical load
03/31/2011WO2011005541A3 On-line time domain reflectometer system
03/31/2011WO2011005534A3 Charged capacitor warning system and method
03/31/2011WO2010144524A3 System and method for communicating notice to limit degradation within a battery pack
03/31/2011WO2010144401A3 System and method for controlling output of a battery pack
03/31/2011WO2010143881A3 Bank structure of fpga board for semiconductor verification
03/31/2011WO2010143876A3 Stacked fpga board for semiconductor verification
03/31/2011WO2010138951A3 Control system for a flow cell battery
03/31/2011WO2010128791A3 Voltage balancing device for battery cell
03/31/2011WO2010120832A3 Batteries, battery systems, battery submodules, battery operational methods, battery system operational methods, battery charging methods, and battery system charging methods
03/31/2011WO2010120478A3 Method and system for testing data signal amplifier having output signal power dependent upon multiple power control parameters
03/31/2011WO2010096149A3 Gravoltaic cell
03/31/2011US20110078526 Method and Circuit Configuration for Simulating Fault States in a Control Unit
03/31/2011US20110078525 Method and Apparatus of ATE IC Scan Test Using FPGA-Based System
03/31/2011US20110078524 Automatable scan partitioning for low power using external control
03/31/2011US20110078523 Output control scan flip-flop, scan test circuit using the same, and test design method
03/31/2011US20110078522 Semiconductor integrated circuit device
03/31/2011US20110077893 Delay Test Apparatus, Delay Test Method and Delay Test Program
03/31/2011US20110077880 Systems, methods and computer readable media for estimating capacity loss in rechargeable electrochemical cell
03/31/2011US20110077877 Semiconductor device failure analysis method and apparatus and program
03/31/2011US20110077866 Distance relay using real time lightning data
03/31/2011US20110074459 Structure and method for semiconductor testing
03/31/2011US20110074458 Transport Apparatus for Moving Carriers of Test Parts
03/31/2011US20110074457 System For Testing Electronic Components
03/31/2011US20110074456 Probe apparatus and test apparatus
03/31/2011US20110074455 Probe card and semiconductor wafer inspection method using the same
03/31/2011US20110074454 Test device and inspection apparatus using the same
03/31/2011US20110074453 Semiconductor chip having a crack test circuit and method of testing a crack of a semiconductor chip using the same
03/31/2011US20110074438 Stacked semiconductor device and method of connection test in the same
03/31/2011US20110074437 System and method for detecting a location of fault in a cable
03/31/2011US20110074436 Identification of false positives in high impedance fault detection
03/31/2011US20110074429 Defective emitter detection for electroluminescent display
03/31/2011US20110074390 Signal Acquisition System Having Reduced Probe Loading of a Device Under Test
03/31/2011US20110072858 Method for manufacturing a fiber optic current sensor with inherent temperature compensation of the faraday effect
03/31/2011DE202011001981U1 Ermittlung der Teilentladungseinsetz- bzw. Aussetzspannung bei der Stoßspannungsprüfung, mittels einer binären Entscheidungsstrategie Determination of Teilentladungseinsetz- or extinction at the surge test, using a binary decision strategy
03/31/2011DE202011001670U1 Hochfrequenz-Prüfstift Vorrichtung High frequency test pin device
03/31/2011DE202011001667U1 Hochfrequenz-Prüfstift Vorrichtung High frequency test pin device
03/31/2011DE102010036750A1 Überwachungssystem und Stromtransformatoren für den Teilentladungs-Nachweis Monitoring system and power transformers for the partial discharge detection
03/31/2011DE102010032500A1 Verfahren und System zum Testen von Elektromotoren Method and system for testing electric motors
03/31/2011DE102009048670A1 Control device e.g. power monitoring device, for controlling power and quality of electrical network, has switching device monitoring power supply and switching power supplies during interference in energy storage mode
03/31/2011DE102009044950A1 Elektrische Schaltungsanordnung zur Schaltung eines elektrischen Verbrauchers An electrical circuit arrangement for switching an electrical load