Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
04/2011
04/20/2011CN102023100A Equipment failure early-warning system and method
04/20/2011CN102022403A Clamping mechanism for probe card and test device
04/20/2011CN101696911B Simulating device of ignition electric property of igniter and method thereof
04/20/2011CN101653310B Eyelash curler and heating control method thereof
04/20/2011CN101651329B Judgment method of line breakage of special TV for inter-turn protection of generator
04/20/2011CN101650401B Method for detecting state of ground wire in substation
04/20/2011CN101639513B Method for improving accuracy of cable fault location
04/20/2011CN101603995B Station user identification apparatus
04/20/2011CN101598769B Method for estimating remaining capacity of battery based on sampling points Kalman filtering
04/20/2011CN101587158B Multifunctional leakage current indicator of insulator
04/20/2011CN101556955B Structure for measuring body pinch resistance of high density trench MOSFET array
04/20/2011CN101551437B Device for testing solar cell parameter
04/20/2011CN101493497B Stress migration test method capable of enhancing test efficiency
04/20/2011CN101476987B Fault diagnosis method for turbine emergency protection device
04/20/2011CN101464496B Overload reliability test assembly for plastic case breakers and implementing method thereof
04/20/2011CN101464492B FPGA and test method for collocating PROM total dose
04/20/2011CN101446617B Test apparatus of DC gas insulated metal enclosed transmission line (GIL)
04/20/2011CN101446598B Variable-cross-section current lead wire
04/20/2011CN101413975B Three-phase power input phase lack detection circuit
04/20/2011CN101409752B System for remotely on-line monitoring short circuit and earth fault in real time
04/20/2011CN101382579B Detection device for quality of rubber stress cone of high-pressure cross-linking cable
04/20/2011CN101379407B An integrated circuit package, and a method for producing an integrated circuit package
04/20/2011CN101351718B Discharge state indicator
04/20/2011CN101322037B Nanoscale fault isolation and measurement method and system
04/20/2011CN101312298B Battery charger and control method therefor
04/20/2011CN101310191B Integrated circuit arrangement and design method
04/20/2011CN101243453B Controlling embedded memory access
04/20/2011CN101206248B Method and apparatus for monitoring an electrical energy storage device
04/20/2011CN101185005B Method and apparatus of detecting voltage for battery pack
04/20/2011CN101132112B Semiconductor laser device for communication, its manufacturing method and light transmitting module
04/20/2011CN101118269B Wire connection analyser for electric power protective circuit
04/20/2011CN101099088B Signal transmission system, circuit board, signal output method and signal receiving method
04/20/2011CN101086522B Method and apparatus for determining the effect of temperature upon life expectancy of an electric energy storage device
04/19/2011US7930725 Early warning fault identification and isolation system for a two-way cable network
04/19/2011US7930671 Test method for unit re-modification
04/19/2011US7930610 System and method for power reduction through power aware latch weighting of complex sub-circuits
04/19/2011US7930609 Apparatus and method for verifying target circuit
04/19/2011US7930608 Circuit for controlling voltage fluctuation in integrated circuit
04/19/2011US7930607 Circuit for boosting encoding capabilities of test stimulus decompressors
04/19/2011US7930606 Selectively debugging processor cores through instruction codes
04/19/2011US7930605 Electronic circuit comprising a test mode secured by insertion of decoy data in the test chain, associated method
04/19/2011US7930604 Apparatus and method for testing and debugging an integrated circuit
04/19/2011US7930603 Feature-oriented test program development and execution
04/19/2011US7930579 Voltage test circuit for computer power supply
04/19/2011US7930141 Communicating faulted circuit indicator apparatus and method of use thereof
04/19/2011US7930130 Method and system for reducing device test time
04/19/2011US7930129 Uniform power density across processor cores at burn-in
04/19/2011US7930128 Robust damage detection
04/19/2011US7930123 Method, apparatus, and computer readable medium for evaluating a sampling inspection
04/19/2011US7930042 Redundant fieldbus system
04/19/2011US7929444 Communication nodes and methods using small routers to communicate over a backhaul facility
04/19/2011US7929440 Systems and methods for capacity planning using classified traffic
04/19/2011US7929434 Method for determining limits for controlling traffic in communication networks with access control
04/19/2011US7929428 Switch for dynamically rerouting traffic due to detection of faulty link
04/19/2011US7929424 Switchover for broadband subscriber sessions
04/19/2011US7929422 Method of moving a transport connection among network hosts
04/19/2011US7929420 Method and apparatus for learning VRRP backup routers
04/19/2011US7929418 Data packet communication protocol offload method and system
04/19/2011US7928882 Monitoring physical operating parameters of an integrated circuit
04/19/2011US7928856 Method of sampling a modulated signal driven channel
04/19/2011US7928755 Methods and apparatus that selectively use or bypass a remote pin electronics block to test at least one device under test
04/19/2011US7928754 Wafer level burn-in and electrical test system and method
04/19/2011US7928753 Device and method for evaluating electrostatic discharge protection capabilities
04/19/2011US7928752 Display device, display device testing system and method for testing a display device using the same
04/19/2011US7928751 MEMS interconnection pins fabrication on a reusable substrate for probe card application
04/19/2011US7928750 Contactless interfacing of test signals with a device under test
04/19/2011US7928749 Vertical probe comprising slots and probe card for integrated circuit devices using the same
04/19/2011US7928748 Method of locating failure site on semiconductor device under test
04/19/2011US7928747 Operating an integrated circuit at a minimum supply voltage
04/19/2011US7928746 Exclusive-option chips and methods with all-options-active test mode
04/19/2011US7928745 Endurance testing system and method
04/19/2011US7928742 Digital measurement transmitter with current signal
04/19/2011US7928738 Detecting system for detecting connection of connectors and connector assemblies having same
04/19/2011US7928737 Electrical overstress and transient latch-up pulse generation system, circuit, and method
04/19/2011US7928734 Universal voltage monitoring and switching device
04/19/2011US7928717 Multi-scanner device having a detachable outlet tester
04/19/2011US7928688 Vehicle, power supply device of vehicle, and current detection device
04/19/2011CA2550072C Apparatus and method for estimating state of charge of battery using neural network
04/14/2011WO2011044402A1 System and method for providing faster and more efficient data communication
04/14/2011WO2011044156A1 Protection of proprietary embedded instruments
04/14/2011WO2011043832A1 Programmable protocol generator
04/14/2011WO2011043570A2 Method and apparatus for measuring the residual capacity of a lithium primary battery
04/14/2011WO2011043556A2 Fault-locating method for a trolley line, and system for same
04/14/2011WO2011042603A1 Method and system for testing transponders
04/14/2011WO2011041835A1 Portable earth leakage tester
04/14/2011WO2011041819A2 Method and device for recognizing faults in a photovoltaic system
04/14/2011WO2011008943A3 Storage device temperature sensing
04/14/2011WO2011008937A3 Conductive heating
04/14/2011WO2010142811A3 System and method for representing a multi-tone signal
04/14/2011WO2010039371A3 Battery management for a breathing assistance system
04/14/2011US20110087942 Programmable Protocol Generator
04/14/2011US20110087941 Ieee 1149.1 and p1500 test interfaces combined circuits and processes
04/14/2011US20110087940 Jtag bus communication method and apparatus
04/14/2011US20110087939 Dual mode test access port method and apparatus
04/14/2011US20110087937 Core circuit test architecture
04/14/2011US20110087936 Selectable jtag or trace access with data store and output
04/14/2011US20110087453 Reliability test with monitoring of the results
04/14/2011US20110086255 Temporary insulator for battery packs and associated systems and methods
04/14/2011US20110085564 Gateway for Transporting Out-Of-Band Messaging Signals
04/14/2011US20110085430 Optical disc drive, optical storage medium, optical storage medium inspection apparatus, and optical storage medium inspection method