Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
06/2011
06/08/2011CN101545943B Method for fault line selection of cable-wire mixed line of electric distribution network by using wavelet energy relative entropy
06/08/2011CN101533072B Intelligent battery current detection circuit of dual integrator based on flow work timing
06/08/2011CN101478281B Starting method for brushless DC motor without position sensor based on current feedback
06/08/2011CN101477155B Electronic contact point positioning system and method
06/08/2011CN101464488B On-line monitoring system for high voltage cable
06/08/2011CN101464235B Test method and apparatus for polymer power cable insulation accelerated electric tree aging
06/08/2011CN101452047B Performance degradation in-situ measurement system and measurement method for solar cell under condition of vacuum particle irradiation
06/08/2011CN101420095B Switching board
06/08/2011CN101387675B Superconductive band AC loss test device and method
06/08/2011CN101387674B Expanding device of test passage
06/08/2011CN101382574B Method for measuring carrier mobility of organic semiconductor by using evanescent wave as excitation source
06/08/2011CN101373206B Test component
06/08/2011CN101363900B Method for testing FPGA device
06/08/2011CN101354431B Apparatus and method for recognizing battery types
06/08/2011CN101334452B Battery tester
06/08/2011CN101322040B Apparatus and method of testing for battery
06/08/2011CN101309015B Cell controller, battery module and power supply system
06/08/2011CN101276305B Automatic test system and method
06/08/2011CN101266275B Semiconductor integrated circuit and method for adjusting a capacitance value of a phase compensating capacitor
06/08/2011CN101256207B Method and apparatus for overvoltage detection circuit
06/08/2011CN101251577B Test equipment capable of carrying composite test
06/08/2011CN101228450B Direct detect sensor for flat panel displays
06/08/2011CN101176010B Apparatus and method for managing battery performance of a wireless device
06/08/2011CN101147078B Maximum and minimum power limit calculator for batteries and battery subpacks
06/08/2011CN101137911B Method and device for testing semiconductor wafers using a chuck device whose temperature can be regulated
06/08/2011CN101133339B Compact representation of vendor hardware module revisions in an open architecture test system
06/08/2011CN101133337B Insulation inspecting apparatus
06/08/2011CN101025436B High-voltage safety monitoring device for electric automobile
06/07/2011US7958472 Increasing scan compression by using X-chains
06/07/2011US7958422 Method and apparatus for generating self-verifying device scenario code
06/07/2011US7958421 Single-pass, concurrent-validation methods for generating test patterns for sequential circuits
06/07/2011US7958420 Clock delay circuits and multiplexer connected to boundary scan circuitry
06/07/2011US7958419 Entering a shift-DR state in one of star connected components
06/07/2011US7958418 Circuit arrangement, electronic mechanism, electrical turn out and procedures for the operation of one circuit arrangement
06/07/2011US7958416 Programmable logic device with differential communications support
06/07/2011US7958414 Enhancing security of internal memory
06/07/2011US7958408 On-chip receiver sensitivity test mechanism
06/07/2011US7958283 Observing an internal link via a second link
06/07/2011US7958272 Method and apparatus for outputting a user interface (UI) event of 3rd party device in home network
06/07/2011US7958241 Method and system for optimally allocating a network service
06/07/2011US7957726 System and method for porting a personalized indicium assigned to a mobile communications device
06/07/2011US7957579 Pattern inspection method and apparatus
06/07/2011US7957427 Method and apparatus for estimating traffic flows using dynamic latency constraints
06/07/2011US7957380 Support of unidirectional link in IS-IS without IP encapsulation and in presence of unidirectional return path
06/07/2011US7957320 Method for changing a group key in a group of network elements in a network system
06/07/2011US7957317 Method and apparatus for providing control signaling
06/07/2011US7957312 Communication unit, communication system, communication method and communication program
06/07/2011US7957308 Selectable training signals based on stored previous connection information for DMT-based system
06/07/2011US7957296 Apparatus for and method of detecting loss of signal in a radio frequency cable
06/07/2011US7957292 Token-based congestion control method for the internet
06/07/2011US7957291 Apparatus and methods for controlling effective communication traffic rates
06/07/2011US7957289 Method to reduce IGP routing information
06/07/2011US7957286 Method for estimating optimized transmission bit rate in wireless local area network system
06/07/2011US7957278 Detection of signaling flows
06/07/2011US7957277 Wireless communication method and system for routing packets via intra-mesh and extra-mesh routes
06/07/2011US7957272 Method and apparatus for coincidence counting for estimating flow statistics
06/07/2011US7957269 Method and system for synchronization of packet
06/07/2011US7956946 Flat-panel display having test architecture
06/07/2011US7956637 System and method to determine electric motor efficiency using an equivalent circuit
06/07/2011US7956636 Generating test benches for pre-silicon validation of retimed complex IC designs against a reference design
06/07/2011US7956635 Stiffener assembly for use with testing devices
06/07/2011US7956634 Apparatus and method for performing an ion concentration analysis in liquid crystal panel
06/07/2011US7956633 Stacked guard structures
06/07/2011US7956632 Socket, module board, and inspection system using the module board
06/07/2011US7956631 Test socket for testing semiconductor package
06/07/2011US7956630 Real-time effective-wavelength error correction for HDVSI
06/07/2011US7956629 Probe tile for probing semiconductor wafer
06/07/2011US7956628 Chip-based prober for high frequency measurements and methods of measuring
06/07/2011US7956627 Probe card, semiconductor inspecting apparatus, and manufacturing method of semiconductor device
06/07/2011US7956626 Circuit arrangement with switchable functionality and electronic component
06/07/2011US7956625 Undoped silicon heat spreader window
06/07/2011US7956619 Testing an inductive load of a device using a modulated signal
06/07/2011US7956618 Additional pins on a USB connector
06/07/2011US7956617 Testing circuits for degradation without removal from host equipment
06/07/2011US7956616 System and method for measuring a cable resistance in a power over Ethernet application
06/07/2011US7955877 Method for simulating long-term performance of a non-volatile memory by exposing the non-volatile memory to heavy-ion radiation
06/07/2011US7955122 Conductive contact unit
06/07/2011US7954391 Method for testing the functionality of armatures
06/07/2011CA2496214C Testing of current transformers
06/03/2011WO2011066554A2 I-v measurement system for photovoltaic modules
06/03/2011WO2011066540A2 Battery emulator and methods of use
06/03/2011WO2011066524A1 Methods and systems for detecting metallic faults affecting communications links
06/03/2011WO2011065770A2 Built off self test circuit device or pattern-generating device having a look-up table embedded therein, and method for outputting test data for a device under test using same
06/03/2011WO2011064847A1 Board mounting device, test head, and electronic component testing device
06/03/2011WO2011064137A1 Load state determiner, load assembly, power supply circuit and method for determining a load state of an electrical power source
06/03/2011WO2011021831A3 Apparatus and method for detecting a corona
06/03/2011WO2011013938A3 Apparatus for the real-time measuring of surface resistance
06/02/2011US20110130999 Test system for connectors
06/02/2011US20110130986 System and Method For Maximizing a Battery Pack Total Energy Metric
06/02/2011US20110130985 System and Method for Recursively Estimating Battery Cell Total Capacity
06/02/2011US20110130984 Estimating remaining battery service life in an implantable medical device
06/02/2011US20110130983 Battery monitoring system
06/02/2011US20110130981 System and methods for aging compensation in amoled displays
06/02/2011US20110129325 Manufacturing method of a tray, a socket for inspection, and a semiconductor device
06/02/2011US20110128988 Temperature control of conduction-cooled devices during testing at high temperatures
06/02/2011US20110128033 Connection structure of electronic component and wired circuit board, wired circuit board assembly, and method for testing electronic component
06/02/2011US20110128032 Wafer for testing, test system, and semiconductor wafer
06/02/2011US20110128031 Test system and substrate unit for testing
06/02/2011US20110128030 Monitoring of the activity of an electronic circuit
06/02/2011US20110128029 Stiffener assembly for use with testing devices