Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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07/05/2011 | US7974209 Packet processing with re-insertion into network interface circuitry |
07/05/2011 | US7974192 Multicast switching in a distributed communication system |
07/05/2011 | US7974190 Dynamic queue memory allocation with flow control |
07/05/2011 | US7974189 Apparatus and method to set the signaling rate of a network disposed within an information storage and retrieval system |
07/05/2011 | US7974188 Repeater and communication method |
07/05/2011 | US7973551 Test fixture for printed circuit board |
07/05/2011 | US7973550 Semiconductor device test apparatus including interface unit and method of testing semiconductor device using the same |
07/05/2011 | US7973549 Method and apparatus for calibrating internal pulses in an integrated circuit |
07/05/2011 | US7973548 Semiconductor test equipment with concentric pogo towers |
07/05/2011 | US7973547 Method and apparatus for detecting a crack in a semiconductor wafer, and a wafer chuck |
07/05/2011 | US7973546 In-line electron beam test system |
07/05/2011 | US7973545 Time resolved radiation assisted device alteration |
07/05/2011 | US7973544 Thermal monitoring and management of integrated circuits |
07/05/2011 | US7973543 Measurement apparatus, test apparatus and measurement method |
07/05/2011 | US7973539 Methods for measuring dielectric properties of parts |
07/05/2011 | US7973538 Power over ethernet system having hazard detection circuitry to detect potentially hazardous cable conditions |
07/05/2011 | US7973537 Corrective device protection |
07/05/2011 | US7973536 Traveling wave based relay protection |
07/05/2011 | US7973535 Methods and apparatus to manage ground fault conditions with a single coil |
07/05/2011 | US7973533 In-circuit testing for integrity of solid-state switches |
07/05/2011 | US7973406 Bump-on-lead flip chip interconnection |
07/05/2011 | US7973391 Tapered dielectric and conductor structures and applications thereof |
07/05/2011 | US7972874 Semiconductor process evaluation methods including variable ion implanting conditions |
07/05/2011 | CA2588584C Control system for bathers with ground continuity and ground fault detection |
07/05/2011 | CA2548312C Characterizing circuit performance |
07/05/2011 | CA2419482C Method and device for determining backgate characteristics |
07/04/2011 | CA2726379A1 Universal front/back post terminal block and test link |
06/30/2011 | WO2011079049A1 Efficiency measuring circuit for dc-dc converter which calculates internal resistance of switching inductor based on duty cycle |
06/30/2011 | WO2011078995A1 Increasing transmission rate to a remote device |
06/30/2011 | WO2011078965A1 Methods and systems for high sigma yield estimation using reduced dimensionality |
06/30/2011 | WO2011078942A1 Inspection mode switching circuit |
06/30/2011 | WO2011078930A1 Methods and systems for high sigma yield estimation |
06/30/2011 | WO2011078428A1 Iq calibration method of test device for wireless communication system such as dvb-h system or like, device, and test device manufacturing method |
06/30/2011 | WO2011077540A1 Abnormality detection device for assembled battery |
06/30/2011 | WO2011077467A1 An apparatus and a process for producing connecting cables |
06/30/2011 | WO2011076259A1 Tapped transmission line structure, test board, automated test equipment and method for providing signals to a plurality of devices |
06/30/2011 | WO2011075984A1 Fault diagnosis system and method thereof |
06/30/2011 | WO2011075875A1 Control and protection system for operational test device of converter valves |
06/30/2011 | WO2011048155A3 Method for operating an electromechanical converter system and electromechanical converter system |
06/30/2011 | WO2010112976A3 Connection quality verification for integrated circuit test |
06/30/2011 | US20110161763 Test apparatus and synchronization method |
06/30/2011 | US20110161761 Probeless testing of pad buffers on wafer |
06/30/2011 | US20110161759 Scan architecture and design methodology yielding significant reduction in scan area and power overhead |
06/30/2011 | US20110161758 Adapting scan-bist architectures for low power operation |
06/30/2011 | US20110161757 Tap and linking module for scan access of multiple cores with ieee 1149.1 test access ports |
06/30/2011 | US20110161756 Integrated circuit and diagnosis circuit |
06/30/2011 | US20110161755 Methods of Parametric Testing in Digital Circuits |
06/30/2011 | US20110161748 Systems, methods, and apparatuses for hybrid memory |
06/30/2011 | US20110161025 State estimating device for secondary battery |
06/30/2011 | US20110158087 Systems and methods for reducing reflections and frequency dependent dispersions in redundant links |
06/30/2011 | US20110156747 Fusing apparatus for correcting process variation |
06/30/2011 | US20110156745 Electronics tester with a signal distribution board and a wafer chuck having different coefficients of thermal expansion |
06/30/2011 | US20110156744 Linear voltage generating device for testing performance of power supplies |
06/30/2011 | US20110156743 System for testing power supply performance |
06/30/2011 | US20110156742 Chip Testing Circuit |
06/30/2011 | US20110156741 Test of electronic devices with boards without sockets based on magnetic locking |
06/30/2011 | US20110156740 Probe card |
06/30/2011 | US20110156739 Test kit for testing a chip subassembly and a testing method by using the same |
06/30/2011 | US20110156738 Semiconductor integrated circuit |
06/30/2011 | US20110156737 Contactor |
06/30/2011 | US20110156736 Semiconductor apparatus and probe test method thereof |
06/30/2011 | US20110156735 Wafer test cassette system |
06/30/2011 | US20110156734 Test systems and methods for testing electronic devices |
06/30/2011 | US20110156733 Test head moving apparatus and electronic component testing apparatus |
06/30/2011 | US20110156732 Process for controlling the correct positioning of test probes on terminations of electronic devices integrated on a semiconductor and corresponding electronic device |
06/30/2011 | US20110156731 Semiconductor integrated circuit |
06/30/2011 | US20110156730 Chip-based prober for high frequency measurements and methods of measuring |
06/30/2011 | US20110156729 Test apparatus and test method |
06/30/2011 | US20110156718 Electrical connection defect detection device |
06/30/2011 | US20110156717 Electrical connection defect detection system and method |
06/30/2011 | US20110156716 System and method for localizing and passivating defects in a photovoltaic element |
06/30/2011 | US20110156712 Device and method for testing magnetic switches at wafer-level stage of manufacture |
06/30/2011 | US20110156600 Smart monitoring of light emitting diode strings |
06/30/2011 | DE102010048353A1 Verfahren zur Zuteilung elektrischer Hochspannungsenergie an Fahrzeugsysteme beim Fahren A method for allocating high voltage electric power to vehicle systems while driving |
06/30/2011 | DE102010044157A1 Prüfkarte und Testvorrichtung Probe card and test device |
06/30/2011 | DE102009059300A1 Transporting and regenerating container for regenerating and transporting silicon solar cell from last manufacturing stage to classifying stage, has region arranged relative to electrode so that cells are electrically coupled with electrode |
06/30/2011 | DE102009055331A1 Vorrichtung und Verfahren zur Erkennung einer Verpolung auf einer Niedervoltseite eines Gleichspannungswandlers in einem Zweispannungsbordnetz Apparatus and method for detecting a reverse polarity on a low-voltage side of a DC-DC converter in a two-voltage electrical system |
06/30/2011 | CA2797635A1 Inspection mode switching circuit |
06/29/2011 | EP2339804A1 Interface circuit, analog flip-flop, and data processor |
06/29/2011 | EP2339361A2 Battery diagnosis device and method |
06/29/2011 | EP2339360A1 Testing circuit and method |
06/29/2011 | EP2339359A2 Line monitoring device |
06/29/2011 | EP2339318A1 Method for diagnosing a malfunction of a mechatronic system |
06/29/2011 | EP2338746A1 Method for displaying differences in the journey data of a motor vehicle and system for performing the method |
06/29/2011 | EP2338066A1 Device and method for inspecting a frequency-modulated pulse generator |
06/29/2011 | EP2338065A1 Method and device for diagnosing connection errors between a driver circuit and an electric machine |
06/29/2011 | EP2135105B1 Battery voltage monitoring system |
06/29/2011 | EP1984749B1 Method and apparatus for evaluating the level of superficial pollution of a medium/high voltage outdoor insulator |
06/29/2011 | EP1454152B1 Method and system for providing failure protection in a ring network that utilizes label switching |
06/29/2011 | CN201887732U Triggering and online monitoring system for thyristor valve block |
06/29/2011 | CN201887568U Self-power taking digital wireless fault indicator |
06/29/2011 | CN201887465U Intelligent surge protector with line monitoring function |
06/29/2011 | CN201887425U Electricity leakage detection display protection circuit |
06/29/2011 | CN201886623U Fault telemetry and control device for high voltage lines of rural power network |
06/29/2011 | CN201886586U Electrical fire monitor protector |
06/29/2011 | CN201886138U Charging detection combination |
06/29/2011 | CN201886137U Detecting and alarming circuit of charging voltage |
06/29/2011 | CN201886136U Storage battery itinerant detector |
06/29/2011 | CN201886135U Accumulator inspection system with independent power supply |
06/29/2011 | CN201886134U Storage battery load capability detector |