Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
07/2011
07/05/2011US7974209 Packet processing with re-insertion into network interface circuitry
07/05/2011US7974192 Multicast switching in a distributed communication system
07/05/2011US7974190 Dynamic queue memory allocation with flow control
07/05/2011US7974189 Apparatus and method to set the signaling rate of a network disposed within an information storage and retrieval system
07/05/2011US7974188 Repeater and communication method
07/05/2011US7973551 Test fixture for printed circuit board
07/05/2011US7973550 Semiconductor device test apparatus including interface unit and method of testing semiconductor device using the same
07/05/2011US7973549 Method and apparatus for calibrating internal pulses in an integrated circuit
07/05/2011US7973548 Semiconductor test equipment with concentric pogo towers
07/05/2011US7973547 Method and apparatus for detecting a crack in a semiconductor wafer, and a wafer chuck
07/05/2011US7973546 In-line electron beam test system
07/05/2011US7973545 Time resolved radiation assisted device alteration
07/05/2011US7973544 Thermal monitoring and management of integrated circuits
07/05/2011US7973543 Measurement apparatus, test apparatus and measurement method
07/05/2011US7973539 Methods for measuring dielectric properties of parts
07/05/2011US7973538 Power over ethernet system having hazard detection circuitry to detect potentially hazardous cable conditions
07/05/2011US7973537 Corrective device protection
07/05/2011US7973536 Traveling wave based relay protection
07/05/2011US7973535 Methods and apparatus to manage ground fault conditions with a single coil
07/05/2011US7973533 In-circuit testing for integrity of solid-state switches
07/05/2011US7973406 Bump-on-lead flip chip interconnection
07/05/2011US7973391 Tapered dielectric and conductor structures and applications thereof
07/05/2011US7972874 Semiconductor process evaluation methods including variable ion implanting conditions
07/05/2011CA2588584C Control system for bathers with ground continuity and ground fault detection
07/05/2011CA2548312C Characterizing circuit performance
07/05/2011CA2419482C Method and device for determining backgate characteristics
07/04/2011CA2726379A1 Universal front/back post terminal block and test link
06/2011
06/30/2011WO2011079049A1 Efficiency measuring circuit for dc-dc converter which calculates internal resistance of switching inductor based on duty cycle
06/30/2011WO2011078995A1 Increasing transmission rate to a remote device
06/30/2011WO2011078965A1 Methods and systems for high sigma yield estimation using reduced dimensionality
06/30/2011WO2011078942A1 Inspection mode switching circuit
06/30/2011WO2011078930A1 Methods and systems for high sigma yield estimation
06/30/2011WO2011078428A1 Iq calibration method of test device for wireless communication system such as dvb-h system or like, device, and test device manufacturing method
06/30/2011WO2011077540A1 Abnormality detection device for assembled battery
06/30/2011WO2011077467A1 An apparatus and a process for producing connecting cables
06/30/2011WO2011076259A1 Tapped transmission line structure, test board, automated test equipment and method for providing signals to a plurality of devices
06/30/2011WO2011075984A1 Fault diagnosis system and method thereof
06/30/2011WO2011075875A1 Control and protection system for operational test device of converter valves
06/30/2011WO2011048155A3 Method for operating an electromechanical converter system and electromechanical converter system
06/30/2011WO2010112976A3 Connection quality verification for integrated circuit test
06/30/2011US20110161763 Test apparatus and synchronization method
06/30/2011US20110161761 Probeless testing of pad buffers on wafer
06/30/2011US20110161759 Scan architecture and design methodology yielding significant reduction in scan area and power overhead
06/30/2011US20110161758 Adapting scan-bist architectures for low power operation
06/30/2011US20110161757 Tap and linking module for scan access of multiple cores with ieee 1149.1 test access ports
06/30/2011US20110161756 Integrated circuit and diagnosis circuit
06/30/2011US20110161755 Methods of Parametric Testing in Digital Circuits
06/30/2011US20110161748 Systems, methods, and apparatuses for hybrid memory
06/30/2011US20110161025 State estimating device for secondary battery
06/30/2011US20110158087 Systems and methods for reducing reflections and frequency dependent dispersions in redundant links
06/30/2011US20110156747 Fusing apparatus for correcting process variation
06/30/2011US20110156745 Electronics tester with a signal distribution board and a wafer chuck having different coefficients of thermal expansion
06/30/2011US20110156744 Linear voltage generating device for testing performance of power supplies
06/30/2011US20110156743 System for testing power supply performance
06/30/2011US20110156742 Chip Testing Circuit
06/30/2011US20110156741 Test of electronic devices with boards without sockets based on magnetic locking
06/30/2011US20110156740 Probe card
06/30/2011US20110156739 Test kit for testing a chip subassembly and a testing method by using the same
06/30/2011US20110156738 Semiconductor integrated circuit
06/30/2011US20110156737 Contactor
06/30/2011US20110156736 Semiconductor apparatus and probe test method thereof
06/30/2011US20110156735 Wafer test cassette system
06/30/2011US20110156734 Test systems and methods for testing electronic devices
06/30/2011US20110156733 Test head moving apparatus and electronic component testing apparatus
06/30/2011US20110156732 Process for controlling the correct positioning of test probes on terminations of electronic devices integrated on a semiconductor and corresponding electronic device
06/30/2011US20110156731 Semiconductor integrated circuit
06/30/2011US20110156730 Chip-based prober for high frequency measurements and methods of measuring
06/30/2011US20110156729 Test apparatus and test method
06/30/2011US20110156718 Electrical connection defect detection device
06/30/2011US20110156717 Electrical connection defect detection system and method
06/30/2011US20110156716 System and method for localizing and passivating defects in a photovoltaic element
06/30/2011US20110156712 Device and method for testing magnetic switches at wafer-level stage of manufacture
06/30/2011US20110156600 Smart monitoring of light emitting diode strings
06/30/2011DE102010048353A1 Verfahren zur Zuteilung elektrischer Hochspannungsenergie an Fahrzeugsysteme beim Fahren A method for allocating high voltage electric power to vehicle systems while driving
06/30/2011DE102010044157A1 Prüfkarte und Testvorrichtung Probe card and test device
06/30/2011DE102009059300A1 Transporting and regenerating container for regenerating and transporting silicon solar cell from last manufacturing stage to classifying stage, has region arranged relative to electrode so that cells are electrically coupled with electrode
06/30/2011DE102009055331A1 Vorrichtung und Verfahren zur Erkennung einer Verpolung auf einer Niedervoltseite eines Gleichspannungswandlers in einem Zweispannungsbordnetz Apparatus and method for detecting a reverse polarity on a low-voltage side of a DC-DC converter in a two-voltage electrical system
06/30/2011CA2797635A1 Inspection mode switching circuit
06/29/2011EP2339804A1 Interface circuit, analog flip-flop, and data processor
06/29/2011EP2339361A2 Battery diagnosis device and method
06/29/2011EP2339360A1 Testing circuit and method
06/29/2011EP2339359A2 Line monitoring device
06/29/2011EP2339318A1 Method for diagnosing a malfunction of a mechatronic system
06/29/2011EP2338746A1 Method for displaying differences in the journey data of a motor vehicle and system for performing the method
06/29/2011EP2338066A1 Device and method for inspecting a frequency-modulated pulse generator
06/29/2011EP2338065A1 Method and device for diagnosing connection errors between a driver circuit and an electric machine
06/29/2011EP2135105B1 Battery voltage monitoring system
06/29/2011EP1984749B1 Method and apparatus for evaluating the level of superficial pollution of a medium/high voltage outdoor insulator
06/29/2011EP1454152B1 Method and system for providing failure protection in a ring network that utilizes label switching
06/29/2011CN201887732U Triggering and online monitoring system for thyristor valve block
06/29/2011CN201887568U Self-power taking digital wireless fault indicator
06/29/2011CN201887465U Intelligent surge protector with line monitoring function
06/29/2011CN201887425U Electricity leakage detection display protection circuit
06/29/2011CN201886623U Fault telemetry and control device for high voltage lines of rural power network
06/29/2011CN201886586U Electrical fire monitor protector
06/29/2011CN201886138U Charging detection combination
06/29/2011CN201886137U Detecting and alarming circuit of charging voltage
06/29/2011CN201886136U Storage battery itinerant detector
06/29/2011CN201886135U Accumulator inspection system with independent power supply
06/29/2011CN201886134U Storage battery load capability detector