| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 06/01/2011 | CN102081148A Detection device for fire-fighting emergency illuminating lamp |
| 06/01/2011 | CN102081147A Testing pen capable of displaying direct current and alternating current |
| 06/01/2011 | CN102081146A High-voltage battery voltage detection device |
| 06/01/2011 | CN102081145A Functional verification platform of battery management system |
| 06/01/2011 | CN102081144A Device and system for monitoring and alarming faults of storage battery |
| 06/01/2011 | CN102081143A Estimation method and system of battery capacity |
| 06/01/2011 | CN102081142A Re-sowing test plan based on parallel folding counter |
| 06/01/2011 | CN102081141A Scheduling method of time-share SOC (System on a Chip) test |
| 06/01/2011 | CN102081140A Device for testing metallic film failure behaviors under the coupling of force, heat, power and magnetism multi-field |
| 06/01/2011 | CN102081139A Method for accurately calculating waiting time in semiconductor test |
| 06/01/2011 | CN102081138A Method for wafer-level burn-in test of semiconductor devices |
| 06/01/2011 | CN102081137A Intelligent AC withstand-voltage test system and full-automatic high-voltage test box special for same |
| 06/01/2011 | CN102081136A Method for on-site GIS (Gas-insulated metal-enclosed switchgear) partial discharge detection under impulse voltage |
| 06/01/2011 | CN102081135A Alternating-current voltage resistance test device |
| 06/01/2011 | CN102081134A Method for locating disturbance source of electrical power system |
| 06/01/2011 | CN102081133A Intelligent transformer and equipment for detecting high voltage line |
| 06/01/2011 | CN102081132A Two-end distance measuring method of transmission line fault under dynamic condition |
| 06/01/2011 | CN102081131A Grounding point finding method for low-current grounding system of urban power grid |
| 06/01/2011 | CN102081130A Electrified cable detection method, device and system |
| 06/01/2011 | CN102081129A Method for diagnosing short circuit fault of stator winding of switched reluctance motor |
| 06/01/2011 | CN102081128A Composite conductor short circuit tester |
| 06/01/2011 | CN102081127A Phase failure detection circuit |
| 06/01/2011 | CN102081126A Connector insertion test circuit |
| 06/01/2011 | CN102081125A Integrated test system for PTC (Positive Temperature Coefficient) resettable fuse |
| 06/01/2011 | CN102081124A System and method for identifying high-speed peripheral equipment interconnected signal |
| 06/01/2011 | CN102081123A Automatic capacitance and inductance testing device |
| 06/01/2011 | CN102081113A Tester for zinc oxide arrester |
| 06/01/2011 | CN102081109A Probe card and test apparatus including the same |
| 06/01/2011 | CN102081026A Portable sulfur hexafluoride (SF6) gas density calibrator |
| 06/01/2011 | CN102081008A Method and system for detecting imaging device |
| 06/01/2011 | CN102078695A Simulation run debugging device for model airplane steering engine |
| 06/01/2011 | CN101710010B Device for testing clamping force between moving contact and fixed contact of isolating switch |
| 06/01/2011 | CN101666849B Online monitoring device of partial discharge of high-voltage cable joint and online monitoring method thereof |
| 06/01/2011 | CN101614792B System and method for testing performance of large-area flat-plate SOFC single battery |
| 06/01/2011 | CN101581746B Sensor used for transformer partial discharge ultra wideband radio-frequency location |
| 06/01/2011 | CN101576603B Testing device |
| 06/01/2011 | CN101566669B Semiconductor integrated circuit device, and device and method for reliability test thereof |
| 06/01/2011 | CN101512827B Secondary battery control system and hybrid vehicle equipped with same |
| 06/01/2011 | CN101458300B Circuit discharging detecting system |
| 06/01/2011 | CN101458296B Multi-product silicon wafer test method |
| 06/01/2011 | CN101452009B Probe card for implementing silicon wafer grade test of HALL chip and test method |
| 06/01/2011 | CN101435843B Method for recognizing short circuit fault of power distribution network by dynamically regulating over current fixed value |
| 06/01/2011 | CN101408571B Inserted detection circuit |
| 06/01/2011 | CN101403780B Laboratory test device and method for dynamic electric voltage recovery device |
| 06/01/2011 | CN101324480B Apparatus for insulator wind-tunnel test |
| 06/01/2011 | CN101315402B Multi-test seat test station having in-turn arranged feeding section, test section and discharging section |
| 06/01/2011 | CN101287994B Method of preparing an integrated circuit die for imaging |
| 06/01/2011 | CN101281224B Method for testing digital oscilloscope waveform capturing rate |
| 06/01/2011 | CN101272049B Magnetic controlled shunt reactor exciting winding casing tube flashover detecting method and circuit |
| 06/01/2011 | CN101233419B Timing generator and semiconductor test instrument |
| 06/01/2011 | CN101052886B Replaceable probe apparatus for probing semiconductor wafer |
| 05/31/2011 | US7954090 Systems and methods for detecting behavioral features of software application deployments for automated deployment management |
| 05/31/2011 | US7954031 Method and apparatus for generating expect data from a captured bit pattern, and memory device using same |
| 05/31/2011 | US7954030 Automatable scan partitioning for low power using external control |
| 05/31/2011 | US7954029 System, apparatus, and method for memory built-in self testing using microcode sequencers |
| 05/31/2011 | US7954028 Structure for redundancy programming of a memory device |
| 05/31/2011 | US7954027 Reduced signaling interface method and apparatus |
| 05/31/2011 | US7954026 TAM controller connected with TAM and functional core wrapper circuit |
| 05/31/2011 | US7954025 Scan architecture for full custom blocks |
| 05/31/2011 | US7954024 Selecting scan test/TAP with FF receiving lock in and update-IR |
| 05/31/2011 | US7954023 Semiconductor integrated circuit including power domains |
| 05/31/2011 | US7954022 Apparatus and method for controlling dynamic modification of a scan path |
| 05/31/2011 | US7954020 Method and apparatus for testing a circuit |
| 05/31/2011 | US7954017 Multiple embedded memories and testing components for the same |
| 05/31/2011 | US7953569 On die thermal sensor of semiconductor memory device and method thereof |
| 05/31/2011 | US7953568 Flow meter and method for detecting a cable fault in a cabling of the flow meter |
| 05/31/2011 | US7953511 System and method for reducing processing errors during wafer fabrication employing a 2D wafer scribe and monitoring system |
| 05/31/2011 | US7953120 Efficient synchronization of a sliding buffer window to prevent packet re-injection in an internet protocol (IP) network |
| 05/31/2011 | US7953113 Method and apparatus for adaptive bandwidth control with user settings |
| 05/31/2011 | US7953025 Load estimation using scheduled uplink power |
| 05/31/2011 | US7953014 FPGA-based network device testing equipment for high load testing |
| 05/31/2011 | US7953012 Monitoring arrangements, having communication establishment information changed from initial communication establishment information |
| 05/31/2011 | US7952998 InfiniBand credit-less flow control for long distance links |
| 05/31/2011 | US7952992 Procedure and mechanisms for control and bearer redundancy of TDM-based service provider connections |
| 05/31/2011 | US7952379 Substrate testing device and method thereof |
| 05/31/2011 | US7952378 Tunable stress technique for reliability degradation measurement |
| 05/31/2011 | US7952377 Vertical probe array arranged to provide space transformation |
| 05/31/2011 | US7952376 Method and apparatus for equalizer testing |
| 05/31/2011 | US7952375 AC coupled parameteric test probe |
| 05/31/2011 | US7952374 Transient emission scanning microscopy |
| 05/31/2011 | US7952373 Construction structures and manufacturing processes for integrated circuit wafer probe card assemblies |
| 05/31/2011 | US7952372 Contacting component, method of producing the same, and test tool having the contacting component |
| 05/31/2011 | US7952371 Integrated circuit device having ground open detection circuit |
| 05/31/2011 | US7952370 On-chip detection of power supply vulnerabilities |
| 05/31/2011 | US7952369 Device and method for sensing a position of a probe |
| 05/31/2011 | US7952368 Apparatus and method for measuring diode chip |
| 05/31/2011 | US7952363 System and method for sorting detection of signal egress from a wired communication system |
| 05/31/2011 | US7952361 Test apparatus |
| 05/31/2011 | US7952360 Method and system for passively detecting and locating wire harness defects |
| 05/31/2011 | US7952359 Test apparatus having bidirectional differential interface |
| 05/31/2011 | US7952326 Method and system for battery protection employing over-discharge control |
| 05/31/2011 | US7952186 Semiconductor package land grid array substrate and plurality of first and second electrodes |
| 05/31/2011 | US7952169 Isolation circuit |
| 05/31/2011 | US7952074 Method and apparatus for inspecting integrated circuit pattern |
| 05/31/2011 | US7951616 Process for wafer temperature verification in etch tools |
| 05/31/2011 | US7951615 System and method for implementing multi-resolution advanced process control |
| 05/26/2011 | WO2011061796A1 Receiving apparatus, testing apparatus, receiving method and testing method |
| 05/26/2011 | WO2011060820A1 Method and device for error-compensated current measurement of an electrical accumulator |
| 05/26/2011 | WO2006086359A3 Method and system for recognizing radio link failures associated with hsupa and hsdpa channels |
| 05/26/2011 | US20110126065 Microprocessor comprising signature means for detecting an attack by error injection |