Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
07/2011
07/19/2011US7983187 Load estimation in receiver diversity telecommunication systems
07/19/2011US7983183 Method and arrangement for measuring transmission quality in a packet mode communication network
07/19/2011US7983182 Methods and apparatus for exchanging network connectivity and capability information
07/19/2011US7983178 Fibre channel fabric simulator
07/19/2011US7983174 Method and apparatus for diagnosing a fault in a network path
07/19/2011US7983173 System and method for detecting link failures
07/19/2011US7983171 Method to manage path failure thresholds
07/19/2011US7983165 Methods and apparatus related to scheduling traffic in a wireless communications system using shared air link traffic resources
07/19/2011US7983164 Apparatus and method for merging internet traffic mirrored from multiple links
07/19/2011US7983161 Control management of voice-over-IP parameters
07/19/2011US7983158 Routing topology bandwidth management methods and system
07/19/2011US7983157 Bandwidth control system, method, and program storage medium storing program thereof
07/19/2011US7983152 Dual-homing layer 2 switch
07/19/2011US7983151 Communication systems
07/19/2011US7983149 Line accommodation device and control method thereof
07/19/2011US7983148 Disaster recovery via alternative terminals and partitioned networks
07/19/2011US7983147 Method of setting and changing receive channel set of cable modem
07/19/2011US7982487 System for multiple layer printed circuit board misregistration testing
07/19/2011US7982486 Method for measuring PN-junction temperature of light-emitting diode (LED)
07/19/2011US7982485 Semiconductor test device capable of modifying an amplitude of an output signal of a driver
07/19/2011US7982484 System for making contact between a transmit/receive module and a testing device
07/19/2011US7982483 Circuit and method for component communication
07/19/2011US7982482 Probe card, method of manufacturing the probe card and alignment method
07/19/2011US7982481 Module for a parallel tester for the testing of circuit boards
07/19/2011US7982479 Inspection methods for defects in electrophoretic display and related devices
07/19/2011US7982478 Liquid TIM dispense and removal method and assembly
07/19/2011US7982477 Universal test fixture for high-power packaged transistors and diodes
07/19/2011US7982476 Conduction-cooled accelerated test fixture
07/19/2011US7982475 Structure and method for reliability evaluation of FCPBGA substrates for high power semiconductor packaging applications
07/19/2011US7982473 Position detector
07/19/2011US7982468 Apparatus and method for testing electrical interconnects with switches
07/19/2011US7982467 Built-in test for high-speed electrical networks
07/19/2011US7982466 Inspection method for semiconductor memory
07/19/2011US7982458 Wire-rope flaw detector
07/19/2011US7982457 Method and eddy current system for non-contact determination of interface resistance
07/19/2011US7982450 Device and method allowing the detection and display of objects located behind an obscuring surface
07/19/2011US7982217 Semiconductor device and its test method
07/19/2011US7981702 Integrated circuit package in package system
07/19/2011US7981700 Semiconductor oxidation apparatus and method of producing semiconductor element
07/19/2011US7981698 Removal of integrated circuits from packages
07/19/2011CA2728375A1 Test apparatus and pallet for parallel rf testing of printed circuit boards
07/19/2011CA2728263A1 Inspection vehicle for inspecting an air gap between the rotor and the stator of a generator
07/19/2011CA2489178C Fault location using measurements of current and voltage from one end of a line
07/14/2011WO2011085317A2 System and method for monitoring and balancing voltage of individual battery cells within a battery pack
07/14/2011WO2011085123A1 Automated handling of electro-optical transducers used in lcd test equipment
07/14/2011WO2011083123A1 Method for selecting a resource from a plurality of processing resources such that the likely time lapses before resource failure evolve in a substantially identical manner
07/14/2011WO2011083108A1 Method for recognising starting ability
07/14/2011WO2011083062A1 Method for detecting the ability to start
07/14/2011WO2011042581A3 Device for digitally displaying the electric charge stored in electricity storage devices
07/14/2011WO2010133730A3 Method and device for measuring characteristic curves in photovoltaic systems
07/14/2011WO2007140336A3 Static dissipative layer system and method
07/14/2011US20110172946 Multifunctional distributed analysis tool and method for using same
07/14/2011US20110172945 Method for monitoring burn-in procedure of electronic device
07/14/2011US20110172940 Cell diagnostic system and method
07/14/2011US20110172939 System and Method to Determine an Internal Resistance and State of Charge, State of Health, or Energy Level of a Rechargeable Battery
07/14/2011US20110171838 Segmented contactor
07/14/2011US20110169526 Ic output signal path with switch, bus holder, and buffer
07/14/2011US20110169521 Testing system for power supply unit
07/14/2011US20110169520 Apparatus for measuring minority carrier lifetime and method for using the same
07/14/2011US20110169519 Conductive film structure, fabrication method thereof, and conductive film type probe device for ic
07/14/2011US20110169518 Probe card, semiconductor inspecting apparatus, and manufacturing method of semiconductor device
07/14/2011US20110169517 Mems probe card and method of manufacturing same
07/14/2011US20110169516 Probe element having a substantially zero stiffness and applications thereof
07/14/2011US20110169515 Method for providing alignment of a probe
07/14/2011US20110169514 Equipment burn-in method and system
07/14/2011US20110169500 Test apparatus, additional circuit and test board
07/14/2011US20110169499 High speed measurement of random variation/yield in integrated circuit device testing
07/14/2011US20110169498 Arc fault location detection for aircraft wiring
07/14/2011US20110169497 Shunt calibration for electronic pressure switches
07/14/2011US20110169496 Fault detection of electric consumers in motor vehicles
07/14/2011US20110169494 Method for the Operation of Illuminants
07/14/2011US20110169493 Identification of a Defective Filament in a Fluorescent Lamp
07/14/2011US20110169447 Electric vehicle supply equipment
07/14/2011US20110167618 Electrical device manufacturing method
07/14/2011DE19861283B4 Prüfstation mit innerer und äußerer Abschirmung Test station with inner and outer shield
07/14/2011DE102010004390A1 Test contactor for connecting integrated switching circuit component with circuit board in microprocessor, has fluid conduit aperture through which fluid flows, where component is thermally contactable area by area by fluid
07/14/2011DE102010004389A1 Test contactor for connecting integrated switching circuit component with printed circuit board, has direction element provided with direction element fastening device for fastening direction element at circuit board
07/14/2011DE102010004388A1 Test contactor for connecting e.g. integrated circuit component in printed circuit board, has locking device rotatably mounted relative to pressing element and formed as bayonet lock, where element in operating position is locked by device
07/14/2011DE102010004387A1 Test contactor for connecting integrated switching circuit component with printed circuit board, has pressing element transferred from closing position into operating position and locked in operating position by locking device
07/14/2011DE102010004260A1 Method for displaying power loss in solar-technical plant for photoelectric power generation, involves determining efficiency in irradiation conditions to recognize and display power loss in solar technical plant
07/14/2011DE102010004216A1 Energieversorgungseinrichtung Power supply device
07/14/2011DE102010002370A1 Fehlerdetektion in einer integrierten Schaltung Error detection in an integrated circuit
07/14/2011DE102010000015A1 Electronic circuit for electrical energy storage system for e.g. hybrid vehicle, performs single-pole galvanic disconnection of partial cell by coupling capacitor unit into energy store-side region and measuring device-side region
07/14/2011DE102009060662A1 Device for testing power source of switch device, has switching-off units electrically connected with digital output terminal, where short circuit of power source of consumer is determined by four-pole networks
07/14/2011DE102009038663A1 Method for determining e.g. loading ability, of starter battery of motor vehicle, involves obtaining values by diagnostic device, and deriving loading ability and/or aging state of battery of motor vehicle from values
07/14/2011DE102008050642B4 Elektronische Einheit und Testverfahren Electronic unit and test methods
07/13/2011EP2343786A2 Circuit fault detecting device and method
07/13/2011EP2343768A2 Battery system and method for detecting current restriction state in a battery system
07/13/2011EP2343565A2 Circuits and methods for measuring cell voltages in battery packs
07/13/2011EP2343564A1 Built-in chip self-test apparatus and method
07/13/2011EP2343563A2 Apparatus for removing the partial discharge noise of an electrical power facility and apparatus for detecting a partial discharge generated section
07/13/2011EP2343562A2 Wire system assessment
07/13/2011EP2343561A1 Method and system for remotely controlling a certified measuring chain
07/13/2011EP2343560A2 High frequency circuit analyser
07/13/2011EP2343559A1 A method to detect clock tampering
07/13/2011EP2343558A2 Battery system and method for detecting internal short circuit in battery system
07/13/2011EP2342574A1 Fault location in electrical power supply grids using the distance protection principle
07/13/2011EP2342573A2 Arc fault location detection for aircraft wiring
07/13/2011EP1990723B1 Information processing apparatus control method and information processing apparatus
07/13/2011EP1494217B1 Optical information device, optical storage medium, optical storage medium inspection device, and optical storage inspection method