| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 12/07/2011 | CN101581747B 一种emc电波暗室摩托车测试气动机械手 One kind of emc test anechoic chamber motorcycle Pneumatic Manipulator |
| 12/07/2011 | CN101561451B 弹簧式测试夹座及具有弹簧式测试夹座的分类机 Spring-loaded clamp base and test test clip with a spring-loaded seat sorter |
| 12/07/2011 | CN101454676B 导电性触头支架 The conductive contact holder |
| 12/07/2011 | CN101446608B 自动转换开关控制器校验装置 Automatic transfer switch controller calibration device |
| 12/07/2011 | CN101432633B 用于变电站自动化系统的系统级测试 System-level testing for substation automation system |
| 12/07/2011 | CN101405611B 用于指示电力传动系统的轴承内部放电的方法和装置 Indicates the power transmission system of internal bearing discharge method and apparatus for |
| 12/07/2011 | CN101398463B 连接测试装置与方法及使用该装置的芯片 Connect the test device and method and the use of the device chip |
| 12/07/2011 | CN101384915B 对设备总线进行采样 Sampling device bus |
| 12/07/2011 | CN101042517B 风扇异常检测装置 Fan abnormality detection device |
| 12/07/2011 | CA2706503A1 A battery connection failure detection system |
| 12/06/2011 | US8074140 User equipment using hybrid automatic repeat request |
| 12/06/2011 | US8074133 Method and apparatus for testing delay faults |
| 12/06/2011 | US8074132 Protecting data on integrated circuit |
| 12/06/2011 | US8074131 Generic debug external connection (GDXC) for high integration integrated circuits |
| 12/06/2011 | US8074129 Memory apparatus and method and reduced pin count apparatus and method |
| 12/06/2011 | US8074127 Signal analyzing apparatus |
| 12/06/2011 | US8073648 Measuring threshold voltage distribution in memory using an aggregate characteristic |
| 12/06/2011 | US8072977 System and method for managing network resources and policies in a multicast environment |
| 12/06/2011 | US8072896 Adaptive coexistence between different wireless communication systems |
| 12/06/2011 | US8072894 Systems and methods for flow monitoring |
| 12/06/2011 | US8072893 Integrated circuit with data communication network and IC design method |
| 12/06/2011 | US8072892 Generating test sets |
| 12/06/2011 | US8072891 Method and apparatus for programmable generation of traffic streams |
| 12/06/2011 | US8072890 System and method for testing a dynamic communication across a network |
| 12/06/2011 | US8072888 Controlling congestion in a packet switched data network |
| 12/06/2011 | US8072887 Methods, systems, and computer program products for controlling enqueuing of packets in an aggregated queue including a plurality of virtual queues using backpressure messages from downstream queues |
| 12/06/2011 | US8072883 Internet small computer systems interface (iSCSI) distance acceleration device |
| 12/06/2011 | US8072878 Packet ring network system, packet transfer system, redundancy node, and packet transfer program |
| 12/06/2011 | US8072717 Protective device with separate end-of-life trip mechanism |
| 12/06/2011 | US8072601 Pattern monitor mark and monitoring method suitable for micropattern |
| 12/06/2011 | US8072233 Method and apparatus for monitoring via's in a semiconductor fab |
| 12/06/2011 | US8072232 Test apparatus that tests a device under test having a test function for sequentially outputting signals |
| 12/06/2011 | US8072231 Testing method of wafer with thin-film magnetic heads and manufacturing method of thin-film magnetic head |
| 12/06/2011 | US8072226 Nanostructure sensors |
| 12/06/2011 | US8072225 Differential power detection |
| 12/06/2011 | US8072223 Monitoring circuit for determining if an electric element has failed before the electric element is powered |
| 12/06/2011 | US8072207 Device and method for measuring the frequency of a signal coded modulated carrier signal |
| 12/06/2011 | US8072169 Method of controlling washing machine and motor |
| 12/06/2011 | US8072016 EPI substrate with low doped EPI layer and high doped Si substrate layer for media growth on EPI and low contact resistance to back-side substrate |
| 12/06/2011 | US8071892 Electromagnetic isolation chamber for accurately manipulating devices therein |
| 12/06/2011 | US8071496 Silicon nitride-melilite composite sintered body and device utilizing the same |
| 12/06/2011 | US8071398 Method and structure of monolithically integrated IC-MEMS oscillator using IC foundry-compatible processes |
| 12/06/2011 | US8071397 Semiconductor fabricating apparatus with function of determining etching processing state |
| 12/06/2011 | CA2453066C Electric circuit providing selectable short circuit for instrumentation applications |
| 12/05/2011 | DE202011102788U1 Kabelaufbau mit einer Anzeigefunktion Cable structure with a display function |
| 12/03/2011 | CA2735763A1 System and method for verifying a device under test |
| 12/03/2011 | CA2707552A1 Battery system and management method |
| 12/02/2011 | CA2741932A1 Metering apparatus |
| 12/01/2011 | WO2011150409A2 Solution for full speed, parallel dut testing |
| 12/01/2011 | WO2011150247A1 Power grid compensation system |
| 12/01/2011 | WO2011149928A1 System and method for low battery detection |
| 12/01/2011 | WO2011149533A1 System and method for wireless network offloading |
| 12/01/2011 | WO2011149532A1 Device- assisted services for protecting network capacity |
| 12/01/2011 | WO2011148926A1 Power supply device |
| 12/01/2011 | WO2011148802A1 Control circuit |
| 12/01/2011 | WO2011148749A1 Electrical leakage detection apparatus with unexpected motion blocking function |
| 12/01/2011 | WO2011148592A1 Excess current detecting circuit and battery pack |
| 12/01/2011 | WO2011148540A1 Probe structure, probe device, method for producing probe structure, and testing device |
| 12/01/2011 | WO2011148215A1 Method and apparatus for estimating remaining operating time |
| 12/01/2011 | WO2011148214A1 Method of evaluating remaining power of a battery for portable devices |
| 12/01/2011 | WO2011147222A1 Control method and system of intelligent detection, restoration for lead-acid battery group |
| 12/01/2011 | WO2011126627A3 Monitoring state of charge of a battery system |
| 12/01/2011 | WO2011119376A3 Battery analysis interface and measurement system |
| 12/01/2011 | WO2011006554A8 Air dryer |
| 12/01/2011 | US20110296266 Self-Adjusting Critical Path Timing of Multi-Core VLSI Chip |
| 12/01/2011 | US20110296265 System for testing integrated circuit with asynchronous clock domains |
| 12/01/2011 | US20110296264 Scan Insertion Optimization Using Physical Information |
| 12/01/2011 | US20110296263 Semiconductor test system and method |
| 12/01/2011 | US20110296262 Scan driver and display device using the same |
| 12/01/2011 | US20110295558 Method and system for detecting faults in a brushless exciter for a generator |
| 12/01/2011 | US20110295543 Performance improvement for a multi-chip system via kerf area interconnect |
| 12/01/2011 | US20110295530 Fault diagnosis device for amplitude modulation device |
| 12/01/2011 | US20110292696 Variable frequency drive and methods for filter capacitor fault detection |
| 12/01/2011 | US20110291695 Monitoring device for an electric power system |
| 12/01/2011 | US20110291694 Television apparatus, semiconductor package, and electronic device |
| 12/01/2011 | US20110291693 Testing fuse configurations in semiconductor devices |
| 12/01/2011 | US20110291692 Method and apparatus for inspecting semiconductor using absorbed current image |
| 12/01/2011 | US20110291691 Chip and chip test system |
| 12/01/2011 | US20110291690 Apparatus and Method for Testing Non-Contact Pads of a Semiconductor Device to be Tested |
| 12/01/2011 | US20110291689 Sas interface output signal detecting apparatus |
| 12/01/2011 | US20110291688 Identifying A Signal On A Printed Circuit Board Under Test |
| 12/01/2011 | US20110291687 Probe card for testing semiconductor device and probe card built-in probe system |
| 12/01/2011 | US20110291685 Probe |
| 12/01/2011 | US20110291683 Apparatus and method for electrostatic discharge (esd) reduction |
| 12/01/2011 | US20110291681 Semiconductor apparatus |
| 12/01/2011 | US20110291680 Chuck for supporting and retaining a test substrate and a calibration substrate |
| 12/01/2011 | US20110291679 Testing integrated circuits |
| 12/01/2011 | US20110291666 Device and method for determining partial discharges at an electrical component |
| 12/01/2011 | US20110291665 Timer circuit |
| 12/01/2011 | US20110291664 Device for testing surface mounted connectors |
| 12/01/2011 | US20110291663 Printing apparatus and liquid detection sensor inspection method |
| 12/01/2011 | US20110291662 Method and apparatus to monitor electric isolation of a high-voltage direct current electrical circuit |
| 12/01/2011 | US20110291661 Electrical fault location determination |
| 12/01/2011 | US20110291098 Organic el display device, mother substrate of organic el display device, and method of testing organic el display device |
| 12/01/2011 | DE202011107542U1 Lichtleiteranordnung und Prüfanordnung zum Prüfen von Leuchtdioden An optical fiber assembly and test setup for testing LEDs |
| 12/01/2011 | DE102011100305A1 Method for determining e.g. residual service life, characterizing wear and tear of e.g. electromechanical relay, involves increasing and displaying counter, which effects shift operations in determined current region |
| 12/01/2011 | DE102010033991A1 Messspitze mit integriertem Messwandler Probe with integrated transducer |
| 12/01/2011 | DE102010022413A1 Method for determining failure location of line for determining line interruption in e.g. aircraft, involves determining position of error on line from ratio of voltage reference effective value and voltage effective value of line |
| 12/01/2011 | DE102010022338A1 Interface characterization method for electrical/electronic circuit in motor vehicle, involves generating simulation model for predetermined terminal by cross-linking and model generation of layout with predetermined model properties |
| 12/01/2011 | DE102010021599A1 Device for monitoring fault in closed alternate current circuit of protection device, has generation unit for comparing integrated current measurement signal with predetermined threshold level and for generating trigger signal |