G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
12/2011
12/27/2011	US8085660 System, method and computer readable medium for communicating with a zigbee device from a peripheral network
12/27/2011	US8085659 Method and switch for routing data packets in interconnection networks
12/27/2011	US8085657 Flow control in a cellular communication system
12/27/2011	US8085654 Method for reducing fault detection time in a telecommunication network
12/27/2011	US8085517 Apparatus and method for ground fault detection and location in electrical systems
12/27/2011	US8085146 Patient hoist with monitoring system
12/27/2011	US8085060 System and method for evaluating the electromagnetic compatibility of integrated circuits in an in-situ environment
12/27/2011	US8085059 RF chip test method
12/27/2011	US8085058 Apparatus for adjusting differential probe
12/27/2011	US8085057 Probe device having first and second probe pins
12/27/2011	US8085056 Circuit for testing internal voltage of semiconductor memory apparatus
12/27/2011	US8085054 Detecting arc discharges
12/27/2011	US8085053 Twisted-pair electrical cable testing
12/27/2011	US8085052 Charge eliminating apparatus and method, and program storage medium for removing static electricity from a target object such as a wafer
12/27/2011	US8085032 Multi-scanner device having a detachable outlet tester
12/27/2011	US8084979 Method for testing an electric motor
12/27/2011	US8084153 Operational guidance device of sodium-sulphur battery
12/25/2011	CA2744634A1 Electric device comprising an alternating current electric motor and a control inverter and a method for measuring the electromotive force of this device
12/22/2011	WO2011159841A1 Techniques for error diagnosis in vlsi systems
12/22/2011	WO2011159637A1 Electrical isolation detection with enhanced dynamic range
12/22/2011	WO2011159598A1 Method and apparatus for providing scan chain security
12/22/2011	WO2011159390A1 High voltage chuck for a probe station
12/22/2011	WO2011159321A1 Charge level measurement
12/22/2011	WO2011159112A2 Safety component by fuse at high voltage battery sensing line
12/22/2011	WO2011159060A2 Led-inspecting device and led-inspecting method using same
12/22/2011	WO2011158902A1 Lighting inspection device
12/22/2011	WO2011158897A1 Electrical device, and diagnostic method for electrical device
12/22/2011	WO2011158803A1 Semiconductor integrated circuit device inspection method and semiconductor integrated circuit device
12/22/2011	WO2011158797A1 Detection method for semiconductor integrated circuit device, and semiconductor integrated circuit device
12/22/2011	WO2011158500A1 Asynchronous memory element for scanning, semiconductor integrated circuit provided with same, design method thereof, and test pattern generation method
12/22/2011	WO2011158381A1 Deterioration degree determination device
12/22/2011	WO2011158361A1 Capacitive load device, and method for detecting abnormalities in capacitive load device
12/22/2011	WO2011157789A1 Diagnostic for a photovoltaic device
12/22/2011	WO2011157753A1 Method for locating a partial discharge transmission area and associated device
12/22/2011	WO2011157472A1 Circuit arrangement for determining a voltage fluctuation of conductor potentials in an unearthed electrical network
12/22/2011	WO2011157470A1 Circuit arrangement for determining a voltage fluctuation of conductor potentials in an unearthed electrical network
12/22/2011	WO2011157469A1 Circuit arrangement for determining a voltage fluctuation of conductor potentials in an unearthed electrical network
12/22/2011	WO2011157468A1 Method and apparatus for monitoring the insulation resistance in an unearthed electrical network
12/22/2011	WO2011157046A1 Method for simulating very fast transient overvoltage generation in gas insulated switchgear (gis) transformer substation and test loop thereof
12/22/2011	WO2011157043A1 Testing device for power grid adaptability of wind generator set
12/22/2011	WO2011156887A1 Semiconductor device with through-silicon vias
12/22/2011	WO2011133110A3 Method and apparatus for determining state of charge values for an electrical power cell
12/22/2011	WO2011130670A3 Consumption breakdown monitoring through power state sensing
12/22/2011	WO2011115836A3 Configurable electronic device reprogrammable to modify the device frequency response
12/22/2011	US20110314514 Method and apparatus for providing scan chain security
12/22/2011	US20110314348 Scan testing using scan frames with embedded commands
12/22/2011	US20110313711 Identifying Defective Semiconductor Components on a Wafer Using Component Triangulation
12/22/2011	US20110313710 Simultaneous Testing of Semiconductor Components on a Wafer
12/22/2011	US20110313708 Methods for manufacturing devices with flex circuits and radio-frequency cables
12/22/2011	US20110313697 Method and apparatus for monitoring battery life
12/22/2011	US20110313696 Battery monitoring system
12/22/2011	US20110313692 Enhanced Intelligent Patch Panel Diagnostic Management
12/22/2011	US20110313613 Electric Storage Device
12/22/2011	US20110313581 Self-healing power grid and method thereof
12/22/2011	US20110309855 Method and apparatus for bypassing silicon bugs
12/22/2011	US20110309854 Probe Card for Simultaneously Testing Multiple Dies
12/22/2011	US20110309853 Sectional test probe assembly for electric meter
12/22/2011	US20110309852 Simultaneously Tagging of Semiconductor Components on a Wafer
12/22/2011	US20110309851 Tagging of Functional Blocks of a Semiconductor Component on a Wafer
12/22/2011	US20110309850 Testing device and testing method
12/22/2011	US20110309849 Inspection method for inspecting electric characteristics of devices formed on target object
12/22/2011	US20110309843 Discontinuous Type Layer-ID Detector For 3D-IC And Method of The Same
12/22/2011	US20110309842 Identifying Defective Semiconductor Components on a Wafer Using Thermal Imaging
12/22/2011	US20110309519 Semiconductor device with through-silicon vias
12/22/2011	US20110308602 Solar cell, solar cell manufacturing method and testing method
12/22/2011	US20110308070 Image apparatus production system, image apparatus inspection system, and image apparatus inspection method
12/22/2011	DE102011104320A1 Adaptive Batterieparameterextraktion und SOC-Abschätzung für eine Lithium-Ionen-Batterie Adaptive Parameter Extraction and battery SOC estimation for a lithium-ion battery
12/22/2011	DE102010017504A1 Method for determining charging condition of e.g. lithium iron phosphate battery utilized as starter battery in motor car, involves combining results of processes such that information about actual charging conditions of battery is derived
12/22/2011	DE102010017461A1 Solarzelle, Solarzellenherstellungsverfahren und Prüfverfahren Solar cell, solar cell manufacturing process and test methods
12/22/2011	CA2803049A1 Device having capacitive loads and abnormality detecting method thereof
12/22/2011	CA2802517A1 Electrical isolation detection with enhanced dynamic range
12/22/2011	CA2801313A1 Method for locating a partial discharge transmission area and associated device
12/21/2011	EP2398089A2 Chuck mechanism of charge/discharge testing device for flat-rechargeable batteries
12/21/2011	EP2397863A1 System for monitoring the status of a battery
12/21/2011	EP2397862A2 Simultaneous testing of semiconductor components on a wafer
12/21/2011	EP2396838A1 Method and device for classifying a battery
12/21/2011	EP2396665A1 Method for detecting a short-circuit, and power supply module implementing said method
12/21/2011	EP2396189A1 Device and method for managing the level of electric charge during the charging of an electrochemical storage source onboard a vehicle
12/21/2011	EP2132581B1 Method of automatically determining and adjusting a status and/or condition of a LED/OLED device and diagnostic device
12/21/2011	EP1743184B1 Method and arrangement for determining operating parameters of an electrochemical storage battery
12/21/2011	EP1490672B1 An electrical condition monitoring method for polymers
12/21/2011	CN202085382U Street lamp monitoring system capable of realizing networking test for service life of lamp tube
12/21/2011	CN202085378U 一种可测试灯管寿命的电子镇流器 One kind of lamp life can test electronic ballasts
12/21/2011	CN202084973U 机车充电机 Motorcycle Charger
12/21/2011	CN202084950U 一种检测微电网系统发生孤岛的装置 Islanding detection device a micro-grid system occurred
12/21/2011	CN202084612U Battery management system
12/21/2011	CN202084608U Lithium-ion battery chip-pressing, short circuit-detecting and rubber-coating equipment
12/21/2011	CN202084273U Liquid crystal module testing connector and signal transfer circuit board
12/21/2011	CN202084272U 数字液晶灯管测试仪 Digital LCD lamp tester
12/21/2011	CN202084271U 液晶电视和液晶显示器驱动板检测系统 LCD TV and LCD display driver board detection system
12/21/2011	CN202084171U Remote monitoring system for ground failure indicators
12/21/2011	CN202083973U 一种用于磁传感器的电流偏置电路 A magnetic sensor of a current bias circuit
12/21/2011	CN202083784U Ups在线监测装置 Ups line monitoring device
12/21/2011	CN202083783U 一种恒温系统供电电源无线监测器 One kind of wireless thermostat system monitors power supply
12/21/2011	CN202083782U 一种用于电机试验的排水装置 Drainage device for motor testing
12/21/2011	CN202083781U 一种断路器试验装置 A circuit breaker test device
12/21/2011	CN202083780U 一种按键测试装置 One kind of key test device
12/21/2011	CN202083779U 一种干簧管检测装置 A dry reed detection device
12/21/2011	CN202083778U 一种集成电路 An integrated circuit
12/21/2011	CN202083777U Ic卡膜式燃气表电路板性能检测仪 Ic card diaphragm gas meter board performance detector

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