| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 01/04/2012 | CN102305907A Test method and system for multichip encapsulating structure |
| 01/04/2012 | CN102305906A Chip testing method and device |
| 01/04/2012 | CN102305905A Wide spectrum photoelectricity testing system |
| 01/04/2012 | CN102305904A Opto-coupler failure analysis method |
| 01/04/2012 | CN102305903A Partial discharge detection method for pulse current of electrified operation single phase integrated gas insulated switchgear (GIS) |
| 01/04/2012 | CN102305902A Method for detecting breakpoint of electric wire and cable by using digital multimeter |
| 01/04/2012 | CN102305901A Method for detecting cable fault point by impact oscillating wave principle |
| 01/04/2012 | CN102305900A Travelling wave fault ranging method and device based on differential output of Rogowski coil |
| 01/04/2012 | CN102305899A Method for recognizing internal fault and external fault of ultrahigh voltage alternating current transmission line |
| 01/04/2012 | CN102305898A Method for selecting fault phase of alternating current transmission line by using transient energy |
| 01/04/2012 | CN102305897A Relay protecting exit tester |
| 01/04/2012 | CN102305896A A method for providing alignment of a probe |
| 01/04/2012 | CN102305895A Testing device for data collection platform (DCP) integrated protection device and operating method of testing device |
| 01/04/2012 | CN102305807A Method for measuring Seebeck coefficient of micro/nano thermoelectric materials or devices |
| 01/04/2012 | CN102305673A Method for measuring and computing junction temperature of light emitting diode (LED) light source chip and special device |
| 01/04/2012 | CN102012275B Environment simulator for testing NOCT (Nominal Operating Cell Temperature) of component |
| 01/04/2012 | CN101882766B Electric power maintenance helicopter |
| 01/04/2012 | CN101813739B Adaptive three-phase symmetric fault phase selecting method for ultra high voltage transmission line |
| 01/04/2012 | CN101788645B Test circuit and method for increasing scanning coverage rate of chip circuit |
| 01/04/2012 | CN101788593B State monitoring and analysis system of power cable sheath grounding current and method thereof |
| 01/04/2012 | CN101718832B High-voltage line fault detection device and detection method |
| 01/04/2012 | CN101713800B Test method of digital substation relay protection device and special device thereof |
| 01/04/2012 | CN101710170B Automatic test device of electromagnetic switch performance |
| 01/04/2012 | CN101706551B Testing circuit for forecasting failure of back bias voltage unstability of integrated circuit |
| 01/04/2012 | CN101706547B Method for locating single-phase grounding fault by adopting transient state travelling wave and injection method |
| 01/04/2012 | CN101706538B Display test pattern multichannel clock generator |
| 01/04/2012 | CN101692119B Method for measuring internal resistance of storage battery based on differential equation |
| 01/04/2012 | CN101685644B Optical disc drive and optical storage medium |
| 01/04/2012 | CN101672895B Device for testing durability of starting motor of automobile |
| 01/04/2012 | CN101672894B Motor rotor turn-to-turn short circuit diagnosis method based on high-order harmonic shaft voltage signals |
| 01/04/2012 | CN101672882B Device and method for confirming winding direction of coil |
| 01/04/2012 | CN101603986B High-voltage electrical-insulation resistance measurement circuit for automobile |
| 01/04/2012 | CN101598760B Fractal analysis method for flicker source orientation |
| 01/04/2012 | CN101576599B Non-contact audio-frequency line-hunting method |
| 01/04/2012 | CN101561297B Vehicle instrument multifunction detection-test bed and detection method |
| 01/04/2012 | CN101542305B Test device and test module |
| 01/04/2012 | CN101408403B Height detecting device of elastic contact piece |
| 01/04/2012 | CN101351719B Device for monitoring cell voltage |
| 01/03/2012 | US8091136 Packet transfer device, packet transfer method, and program |
| 01/03/2012 | US8091002 Multiple-capture DFT system to reduce peak capture power during self-test or scan test |
| 01/03/2012 | US8091001 FPGA programming structure for ATPG test coverage |
| 01/03/2012 | US8090999 Memory media characterization for development of signal processors |
| 01/03/2012 | US8090551 Self-testing, monitoring and diagnostics in grouped circuitry modules |
| 01/03/2012 | US8090548 Method and device for predicting electrolytic capacitor defects, converter and uninterruptible power supply equipped with such a device |
| 01/03/2012 | US8089980 Method for protection switching of geographically separate switching systems |
| 01/03/2012 | US8089899 System and method for communicating using a multiserver platform |
| 01/03/2012 | US8089889 Adapter port configuration |
| 01/03/2012 | US8089883 Method for controlling transmissions between neighboring nodes in radio communications system and access node thereof |
| 01/03/2012 | US8089876 Packet transmission apparatus and packet transmission method |
| 01/03/2012 | US8089871 Method and apparatus for traffic control of dynamic denial of service attacks within a communications network |
| 01/03/2012 | US8089870 QoE based admission control |
| 01/03/2012 | US8089863 RF site resilience using multiple visitor location registers simultaneously |
| 01/03/2012 | US8089712 Abnormality determining apparatus |
| 01/03/2012 | US8089297 Structure and method for determining a defect in integrated circuit manufacturing process |
| 01/03/2012 | US8089296 On-chip measurement of signals |
| 01/03/2012 | US8089295 Wafer level balanced capacitance design for magnetic heads |
| 01/03/2012 | US8089294 MEMS probe fabrication on a reusable substrate for probe card application |
| 01/03/2012 | US8089293 Test and measurement instrument and method of configuring using a sensed impedance |
| 01/03/2012 | US8089292 System and method of measuring probe float |
| 01/03/2012 | US8089285 Implementing tamper resistant integrated circuit chips |
| 01/03/2012 | US8089284 Impedance measuring method |
| 01/03/2012 | US8089283 Apparatus and method for high-speed determination of bioelectric electrode impedances |
| 01/03/2012 | US8089282 Test assembly for a circuit breaker |
| 01/03/2012 | US8089275 Sensor arrangement, integrated chip component with the sensor arrangement, and measurement method |
| 01/03/2012 | US8089274 Method for evaluating SOI wafer |
| 01/03/2012 | US8089267 System for operating differential probe |
| 01/03/2012 | US8088634 Methods of adding pads and one or more interconnect layers to the passivated topside of a wafer including connections to at least a portion of the integrated circuit pads thereon |
| 01/03/2012 | US8088633 Optical alignment methods for forming LEDs having a rough surface |
| 01/03/2012 | CA2617448C Arrangements to detect and respond to disturbances in electrical power systems |
| 01/03/2012 | CA2447200C Surge counter/detector apparatus, system and method |
| 01/03/2012 | CA2356002C Method and apparatus for device-dependent calibration of relays for high accuracy operation at zero-crossing of input power signal |
| 12/29/2011 | WO2011163331A2 Determining the state-of-charge of batteries via selective sampling of extrapolated open circuit voltage |
| 12/29/2011 | WO2011163254A2 Direct sequence spread spectrum predictive cable and component failure technology |
| 12/29/2011 | WO2011163035A2 Flat-hierarchy system for condition-based monitoring of distributed equipment |
| 12/29/2011 | WO2011162430A1 Insert for handler |
| 12/29/2011 | WO2011162240A1 Circuit for detecting disconnection of bridge circuit and system having means for detecting disconnection |
| 12/29/2011 | WO2011162014A1 Battery management system, battery management apparatus, method of reusing battery, and information communication terminal apparatus |
| 12/29/2011 | WO2011161867A1 Method for inspecting display panel, and apparatus for inspecting display panel |
| 12/29/2011 | WO2011161865A1 Lithium-ion secondary-battery charging method and charging system |
| 12/29/2011 | WO2011161855A1 Contact head, probe pin with the contact head, and electrical connection device using the probe pin |
| 12/29/2011 | WO2011161819A1 Power supply current measurement apparatus, test apparatus including power supply current measurement apparatus, and information processing apparatus including power supply current measurement apparatus |
| 12/29/2011 | WO2011161348A1 Method of detecting brush wear for an alternator-starter in a vehicle |
| 12/29/2011 | WO2011161210A1 Method of locating an internal arc in a gas insulated line and associated device |
| 12/29/2011 | WO2011161200A1 Device for the controlled generation of electric arcs |
| 12/29/2011 | WO2011160564A1 Novel testing system and method for mw-level wind driven generator set |
| 12/29/2011 | WO2011160258A1 Method and system for obtaining degradation of battery |
| 12/29/2011 | WO2011139441A3 Open circuit detector and method therefore |
| 12/29/2011 | WO2011121410A3 Fuel cell system |
| 12/29/2011 | WO2011110419A3 Test device and a test method |
| 12/29/2011 | WO2011100306A3 Determination of physical connectivity status of devices based on electrical measurement |
| 12/29/2011 | US20110320898 Integrated Circuit Arrangement For Test Inputs |
| 12/29/2011 | US20110320897 Core circuit test architecture |
| 12/29/2011 | US20110320896 Integrated Circuit Devices Having Selectively Enabled Scan Paths With Power Saving Circuitry |
| 12/29/2011 | US20110320895 Test circuit for testing execution of a handshake protocol and method for testing execution of handshake protocol |
| 12/29/2011 | US20110320894 Surrogate Circuit For Testing An Interface |
| 12/29/2011 | US20110320893 G-ODLAT On-die Logic Analyzer Trigger with Parallel Vector Finite State Machine |
| 12/29/2011 | US20110320169 Method and system for detection of collector flashover |
| 12/29/2011 | US20110320145 Method for parameters extraction of solar cells |
| 12/29/2011 | US20110318851 Manufacturing method and test method of semiconductor device |
| 12/29/2011 | US20110316751 Customizable antenna structures for adjusting antenna performance in electronic devices |