Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
02/2012
02/08/2012CN102346235A Automatic test system and method for hardware device function
02/08/2012CN102346234A Functional test method of I2S (Inter-IC Sound Bus) interface
02/08/2012CN102346233A System and method for analyzing scattering parameter passivity
02/08/2012CN102346232A Method for detecting GaN-based HEMT reliability through Schottky test figure
02/08/2012CN102346231A Sunlight simulator provided with detection device and solar battery detection device
02/08/2012CN102346230A Method and device for online detection of transformer sleeve
02/08/2012CN102346229A System for monitoring arc discharge of power towers
02/08/2012CN102346228A Breakdown-resistant tester for high-voltage and microcurrent household electrical appliances
02/08/2012CN102346227A Endoscope technology-based discharge-trace inspection system
02/08/2012CN102346226A Operation control structure for continuity test device
02/08/2012CN102346225A Rapid detection method of connection condition
02/08/2012CN102346224A Insulation monitor and monitoring method thereof
02/08/2012CN102346223A Power evaluation system of frequency converter in energy two-way transmission rectification mode and test method of power evaluation system
02/08/2012CN102346222A Device, system and method for testing output electrical signals of optical interfaces
02/08/2012CN102346221A Electromagnetic compatibility test monitoring system
02/08/2012CN102346212A Method for determining electrical power signal levels in a transmission system
02/08/2012CN102346211A Alternating-current (ac) real current detection apparatus and detection method thereof
02/08/2012CN102346209A Apparatus and method for improved edge triggering in a test and measurement instrument
02/08/2012CN102346205A No pin test mode
02/08/2012CN102346203A FM (frequency modulation) series resonance and oscillating wave high-voltage generator
02/08/2012CN102346199A Ball grid array test socket
02/08/2012CN102345449A Fixing test pup joint for flow test of generator
02/08/2012CN102345349A Solar tile system
02/08/2012CN102343632A Line breakage detection method for multi-line cutting of silicon wafers
02/08/2012CN101839958B 配电网单相接地故障带电定位装置 Single-phase-to-ground fault locating device charged
02/08/2012CN101806850B 一种气候环境模拟试验方法 One kind of climate simulation test methods
02/08/2012CN101806842B 电网质量现场记录仪 Power Quality Logger site
02/08/2012CN101788642B 测量金属通孔电阻的集成电路测试器件及其制造方法 Measuring the resistance of the metal via an integrated circuit test device and manufacturing method
02/08/2012CN101718827B 震后电网设施剩余寿命分布寿命模型诊断方法 Residual life after the earthquake distribution grid facilities Life Model Diagnosis
02/08/2012CN101718823B 测试大电流互感器抗电磁干扰力的多绕组非均绕等安匝法 Testing large current transformers anti-electromagnetic interference ability and other multi-winding non-ampere-turns are wound Act
02/08/2012CN101713791B 直流低电压标准源非线性输出的修正方法 Correction standard low voltage DC source non-linear output
02/08/2012CN101685655B 光盘驱动器、光学存储介质 CD-ROM drives, optical storage media
02/08/2012CN101666858B 开关磁阻电机双主开关功率变换器主开关故障诊断方法 Switched reluctance motor dual master switching power converter main switch fault diagnosis method
02/08/2012CN101592714B 测试装置及其去胶模块以及太阳能电池的制造方法 To the test device and method of manufacturing a plastic solar cell module, and
02/08/2012CN101592710B 直流开关线圈动作电压测试方法 Operation voltage DC switch coil test method
02/08/2012CN101317098B 部分放电电荷量测定方法以及装置 Partial discharge charge amount measuring method and apparatus
02/08/2012CN101283284B 存储器扫描测试 Memory scan test
02/08/2012CN101169459B 用于确定两个磁场的相位的设备及其应用 Means for determining the phase of the two magnetic field application device and
02/08/2012CN101149761B 硅基螺旋电感器件等效电路双π非对称模型参数的提取方法 Silicon spiral inductors double π device equivalent circuit model parameter extraction method of asymmetric
02/08/2012CN101063704B 处理测试器与多个被测器件间的信号的装置、系统和方法 Processing testing a device under test with the plurality of signals between the devices, systems and methods
02/07/2012US8112686 Deterministic logic built-in self-test stimuli generation
02/07/2012US8112685 Serial compressed data I/O in a parallel test compression architecture
02/07/2012US8112684 Input linking circuitry connected to test mode select and enables
02/07/2012US8112683 System and application debugging
02/07/2012US8112681 Method and apparatus for handling fuse data for repairing faulty elements within an IC
02/07/2012US8112563 Arrangement comprising a first semiconductor chip and a second semiconductor chip connected thereto
02/07/2012US8112400 Method for collecting data from semiconductor equipment
02/07/2012US8112263 Method for logic checking to check operation of circuit to be connected to bus
02/07/2012US8111900 Computer-implemented methods for detecting and/or sorting defects in a design pattern of a reticle
02/07/2012US8111643 Communication control method of wireless LAN system and relay apparatus
02/07/2012US8111626 Method and apparatus for providing statistical event correlation in a network
02/07/2012US8111625 Method for detecting a message interface fault in a communication device
02/07/2012US8111624 Link adaptation telecommunication system
02/07/2012US8111619 Apparatus and method for routing data in wireless networks
02/07/2012US8111616 Constructing a repair path in the event of failure of an inter-routing domain system link
02/07/2012US8111613 In-layer ethernet p-cycle protection scheme
02/07/2012US8111082 Test apparatus
02/07/2012US8111081 Method for evaluating silicon wafer
02/07/2012US8111072 Steam cooker and related superheater
02/07/2012US8111061 Multi-output determination circuit
02/07/2012US8110416 AC impedance spectroscopy testing of electrical parametric structures
02/02/2012WO2012016151A2 Improving at-speed test access port operations
02/02/2012WO2012016101A1 Thin film solar cell processing and testing method and equipment
02/02/2012WO2012015869A2 Positioner system and method of positioning
02/02/2012WO2012015433A1 Aging-based usage metering of components
02/02/2012WO2012015102A1 Device and method for finding cable fault points
02/02/2012WO2012014935A1 Inspection method and device
02/02/2012WO2012014899A1 Tray unit and semiconductor device inspecting apparatus
02/02/2012WO2012014736A1 Specimen testing device and method for creating absorbed current image
02/02/2012WO2012014673A1 Inspection jig and contact
02/02/2012WO2012014350A1 Battery module
02/02/2012WO2012014303A1 Semiconductor integrated circuit device, control method therefor and information processing apparatus
02/02/2012WO2012013453A1 Method and arrangement for estimating the efficiency of at least one battery unit of a rechargeable battery
02/02/2012WO2012013199A1 Apparatus and method for monitoring an electric power transmission system through partial discharges analysis
02/02/2012WO2012012897A1 Localisation of a defect on a section of a dead electrical line
02/02/2012WO2011119671A3 System and method for assessing adc operation and voltage of a battery pack
02/02/2012WO2010123991A3 Electrically conductive kelvin contacts for microcircuit tester
02/02/2012US20120030533 Implementing switching factor reduction in lbist
02/02/2012US20120030532 Structures and control processes for efficient generation of different test clocking sequences, controls and other test signals in scan designs with multiple partitions, and devices, systems and processes of making
02/02/2012US20120029860 Test circuit for network interface
02/02/2012US20120029852 Battery monitor system attached to a vehicle wiring harness
02/02/2012US20120029851 Remaining capacity detecting device and battery control ic
02/02/2012US20120028381 Solar battery panel inspection apparatus, method of inspecting solar battery panel, and method of manufacturing solar battery panel
02/02/2012US20120028375 Inspection method of light-emitting device and processing method after inspection of light-emitting device
02/02/2012US20120026894 Communication device, communication system, and communication fault detection method
02/02/2012US20120026500 Medium-pressing device and malfunction detection method
02/02/2012US20120026415 Active matrix substrate, method for producing active matrix substrate, liquid crystal panel, method for producing liquid crystal panel, liquid crystal display device, liquid crystal display unit, and television receiver
02/02/2012US20120025864 Circuit testing device and method for implementing same
02/02/2012US20120025863 Solder joint inspection
02/02/2012US20120025862 Test Structure for ILD Void Testing and Conduct Resistance Measurement in a Semiconductor Device
02/02/2012US20120025861 Test socket and test device having the same
02/02/2012US20120025860 Burn-in socket and testing fixture using the same
02/02/2012US20120025858 Probe card holding apparatus
02/02/2012US20120025857 Manipulator of robot
02/02/2012US20120025856 Temperature control device and temperature control method
02/02/2012US20120025855 Display device having repair and detect structure
02/02/2012US20120025853 Solid state sensor for metal ion detection and trapping in solution
02/02/2012US20120025844 Connection diagnostic apparatus for ground fault detector
02/02/2012US20120025843 Lens connector-testing device
02/02/2012US20120025842 Method for monitoring a power coupler for a plug-in electric vehicle