| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 02/15/2012 | CN102353909A Compatibility tester for portable ATX power supply system |
| 02/15/2012 | CN102353908A Voltage acquisition system for battery pack |
| 02/15/2012 | CN102353907A Detection system for power supply for emergency lighting |
| 02/15/2012 | CN102353906A Charge monitoring system for distributed storage battery pack |
| 02/15/2012 | CN102353905A Prediction method for battery life and apparatus for detecting battery life |
| 02/15/2012 | CN102353904A Battery voltage detection module and circuit thereof, and logic transmission circuit |
| 02/15/2012 | CN102353903A Battery performance test device |
| 02/15/2012 | CN102353902A Equivalent test device and method for motor |
| 02/15/2012 | CN102353901A Generator test system |
| 02/15/2012 | CN102353900A Load adjusting device for testing synchronous generator |
| 02/15/2012 | CN102353899A Electromagnetic compatibility test tool for automobile generator |
| 02/15/2012 | CN102353898A Method and device for acquiring switching value |
| 02/15/2012 | CN102353897A Extra-high voltage converter valve interrupting current test loop and test method thereof |
| 02/15/2012 | CN102353896A Switching device failure detection system and method for multilevel converters |
| 02/15/2012 | CN102353895A Low voltage breaker life automatic test apparatus |
| 02/15/2012 | CN102353894A Method for testing SOC (System On Chip) based on reference vector and bit mask |
| 02/15/2012 | CN102353893A Improved scan chain unit and online testing method based on improved scan chain unit and clock control logic |
| 02/15/2012 | CN102353892A LUT test structure of FPGA based on SRAM and method thereof |
| 02/15/2012 | CN102353891A Digital integrated circuit fundamental tester |
| 02/15/2012 | CN102353890A Method to reduce cross talk in a multi column e-beam test system |
| 02/15/2012 | CN102353889A Electrical testing tool |
| 02/15/2012 | CN102353888A Method for obtaining charge density of effective thin layer |
| 02/15/2012 | CN102353887A Method for measuring interface thermal resistance of micro-nanoscale circular boundary |
| 02/15/2012 | CN102353886A Temperature measuring method for self-heating effect of field effect transistor |
| 02/15/2012 | CN102353885A Method for extracting thermal resistance of silicon field-effect transistor on insulator |
| 02/15/2012 | CN102353884A LED light source apparatus for correction and test by simulation sun movement and astronomical refraction |
| 02/15/2012 | CN102353883A High temperature aging device for microwave transistor |
| 02/15/2012 | CN102353882A Method for testing trap density and position of gate dielectric layer of semiconductor device |
| 02/15/2012 | CN102353881A Online capacitor monitoring system based on partial discharge monitoring |
| 02/15/2012 | CN102353880A Visualized nondestructive detection method of internal defect of power switch equipment |
| 02/15/2012 | CN102353879A Cable partial discharge test terminal |
| 02/15/2012 | CN102353878A Vehicle low voltage lead insulating layer aging detection apparatus |
| 02/15/2012 | CN102353877A Partial discharge detection method for realizing phase resolved partial discharge (PRPD) pattern and time resolved partial discharge (TRPD) pattern |
| 02/15/2012 | CN102353876A Online detection device for local discharge of high-voltage cable for high-speed railway locomotive |
| 02/15/2012 | CN102353875A Fault distance measuring method for combined travelling wave of power transmission line |
| 02/15/2012 | CN102353874A Commutation failure detection method based on commutating current time area index |
| 02/15/2012 | CN102353873A Line selection method realized by using single criterion for low-current ground system during single-phase ground fault |
| 02/15/2012 | CN102353872A System and method for monitoring temperature of binding posts of electromobile |
| 02/15/2012 | CN102353871A System for remotely monitoring ground fault indicators |
| 02/15/2012 | CN102353870A Ship cable on-line fault determination automatic detection analysis system |
| 02/15/2012 | CN102353869A USB (Universal Serial Bus) storage circuit for online monitor of cable |
| 02/15/2012 | CN102353868A Detection method for remote fault signal of high voltage power transmission and transformation and detection apparatus thereof |
| 02/15/2012 | CN102353867A Interconnection test equipment and method |
| 02/15/2012 | CN102353866A Universal on-line detector for high-power electromagnetic equipment |
| 02/15/2012 | CN102353865A Automatic testing device and method universally used for multiple bus processor modules |
| 02/15/2012 | CN102353864A Insulation monitor and medical isolation power supply system |
| 02/15/2012 | CN102353863A Renewable energy source power generation synchronization test platform |
| 02/15/2012 | CN102353862A Batch aging tooling system for information decryption module of second-generation ID (Identification) card reader |
| 02/15/2012 | CN102353861A Testing device for outlet logics of main transformer, differential bus device, and automatic bus transfer device |
| 02/15/2012 | CN102353860A Intelligent detection system for transformer station computer monitoring system |
| 02/15/2012 | CN102353859A Multi-path multifunctional power communication detection equipment and detection method for same |
| 02/15/2012 | CN102353858A Intelligent tester for semi-hardware-in-large-loop simulation test system of cabinet air conditioner |
| 02/15/2012 | CN102353857A Electric signal detection system |
| 02/15/2012 | CN102353856A Method for measuring electrostrictive coefficient by using multi-beam laser heterodyne quadratic harmonic method |
| 02/15/2012 | CN102353821A Clamp test mechanism for sorting thermistor |
| 02/15/2012 | CN102353817A Probe of conducting atomic force microscope and measuring methods employing probe |
| 02/15/2012 | CN102353492A Electromagnetic thrust of linear motor and thrust fluctuation test apparatus |
| 02/15/2012 | CN101900760B 一种电表及用于电表的电源 One kind of power meter and for meter |
| 02/15/2012 | CN101894828B 具有测试焊垫的硅晶圆及其测试方法 With a silicon wafer and method of test pads |
| 02/15/2012 | CN101871960B 一种变压器的试验方法 Test Method for Transformer |
| 02/15/2012 | CN101813735B 一种配电系统接地检测装置接地故障判别方法 An electrical distribution system grounding ground fault detection device identification method |
| 02/15/2012 | CN101806861B 一种密封电磁继电器电接触失效类别判定方法 A sealed electromagnetic relay method for determining the electrical contact failure category |
| 02/15/2012 | CN101782456B 一种远程检测显示器工作状态的方法及系统 A long-range detection monitor the working status of the method and system |
| 02/15/2012 | CN101769983B 太阳能电池ipce曲线测量装置及测量方法 Solar ipce curve measuring apparatus and methods of measurement |
| 02/15/2012 | CN101769981B 一种采用线性霍尔阵列的永磁平面电机寻相检测方法 One kind of permanent magnet linear Hall-array planar motor homing phase detection method |
| 02/15/2012 | CN101750563B 半导体器件中通孔或接触孔短路检测结构 The semiconductor device of the through hole or the contact hole structure of the short-circuit detection |
| 02/15/2012 | CN101726680B 一种用于电能质量监测系统的暂态事件报警方法 Transient event alarm method for power quality monitoring system |
| 02/15/2012 | CN101702008B 便携式电机故障在线诊断装置 Portable motor fault diagnosis device online |
| 02/15/2012 | CN101672892B 汽车cd机按钮耐久性试验装置 Car cd machine buttons Endurance Test |
| 02/15/2012 | CN101458302B 半导体测试仪 Semiconductor tester |
| 02/15/2012 | CN101430366B 电池荷电状态检测方法 Battery charge state detection method |
| 02/14/2012 | US8117513 Test method and test program of semiconductor logic circuit device |
| 02/14/2012 | US8117512 Failure detection and mitigation in logic circuits |
| 02/14/2012 | US8117511 Communication device and method of correcting the same |
| 02/14/2012 | US8117299 Method and apparatus for scheduling wireless LAN traffic |
| 02/14/2012 | US8116997 Battery-capacity supervisory control device and method thereof |
| 02/14/2012 | US8116799 Method and system for controlling power in a communication system |
| 02/14/2012 | US8116790 Reply message of a mobile terminal |
| 02/14/2012 | US8116337 Bandwidth requests transmitted according to priority in a centrally managed network |
| 02/14/2012 | US8116224 System and method for generating alarms based on bursting traffic |
| 02/14/2012 | US8116221 Method and apparatus for configuring and managing customer premises equipment |
| 02/14/2012 | US8116215 Method and apparatus for discriminating type of packet loss |
| 02/14/2012 | US8116210 System and program product to recover from node failure/recovery incidents in distributed systems in which notification does not occur |
| 02/14/2012 | US8116202 Methods for allocating transmission bandwidths of a network |
| 02/14/2012 | US8115604 Reader control system |
| 02/14/2012 | US8115507 Circuit and method for parallel testing and semiconductor device |
| 02/14/2012 | US8115506 Localization of driver failures within liquid crystal displays |
| 02/14/2012 | US8115505 Differential signaling system and flat panel display with the same |
| 02/14/2012 | US8115504 Microspring array having reduced pitch contact elements |
| 02/14/2012 | US8115503 Device for measuring metal/semiconductor contact resistivity |
| 02/14/2012 | US8115500 Accurate capacitance measurement for ultra large scale integrated circuits |
| 02/14/2012 | US8115496 Insulation coated conductor inspection method and inspection apparatus |
| 02/14/2012 | US8115495 Wired pipe signal transmission testing apparatus and method |
| 02/14/2012 | US8115494 Systems, methods, and apparatus for rub detection in a machine |
| 02/14/2012 | US8115493 Trainline integrity locomotive test device |
| 02/14/2012 | US8115492 Fuel gauging system and method thereof |
| 02/14/2012 | US8115473 Optical voltage transformer |
| 02/14/2012 | US8115470 Broadband isotropic antenna |
| 02/14/2012 | US8114688 Method and semiconductor structure for monitoring etch characteristics during fabrication of vias of interconnect structures |
| 02/14/2012 | US8114687 Adapter board and method for manufacturing same, probe card, method for inspecting semiconductor wafer, and method for manufacturing semiconductor device |