Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
03/2012
03/21/2012CN101750551B Electro-discharge automatic test method and device
03/21/2012CN101738566B Detection module
03/21/2012CN101526578B Method and device for detecting the high-voltage faults of vehicles
03/21/2012CN101493474B Modular program assembly for IC element detecting machine
03/21/2012CN101487870B Apparatus and systems for common mode voltage-based AC fault detection, verification and/or identification
03/21/2012CN101431039B Wafer detection system
03/21/2012CN101419373B Array detecting device
03/21/2012CN101408580B Method for evaluating oil paper insulation ageing state based on local discharge characteristic parameter
03/21/2012CN101373208B Fuel cell tester
03/21/2012CN101202268B Semiconductor device for measuring an overlay error, method for measuring an overlay error, lithographic apparatus and device manufacturing method
03/21/2012CN101165963B Battery management system (BMS) and driving method thereof
03/21/2012CN101065678B Monitoring physical operating parameters of an integrated circuit
03/21/2012CN101042426B Methods and apparatus for frequency rectification
03/20/2012US8141065 Method and apparatus for performing non service affecting software upgrades in place
03/20/2012US8140926 Die selectively connecting TAP leads to second die
03/20/2012US8140925 Method and apparatus to debug an integrated circuit chip via synchronous clock stop and scan
03/20/2012US8140924 Selectively accessing test access ports in a multiple test access port environment
03/20/2012US8140923 Test circuit and method for testing of infant mortality related defects
03/20/2012US8140922 Method for correlating an error message from a PCI express endpoint
03/20/2012US8140920 Method and system for providing bit error rate characterization
03/20/2012US8140910 Mismatched operation and control correction
03/20/2012US8140297 Three dimensional chip fabrication
03/20/2012US8140293 On die thermal sensor
03/20/2012US8140281 Voltage detecting device
03/20/2012US8140280 Battery condition diagnosis apparatus
03/20/2012US8140277 Enhanced characterization of electrical connection degradation
03/20/2012US8140276 System and method for streetlight monitoring diagnostics
03/20/2012US8139606 Methods and systems for providing switched broadband
03/20/2012US8139508 Self-forming network
03/20/2012US8139507 Network graph for alternate routes
03/20/2012US8139499 Method and arrangement for determining transmission delay differences
03/20/2012US8139498 Method and apparatus for determining reporting period of channel quality information in multi-carrier wireless system
03/20/2012US8139495 Determining quality of communication
03/20/2012US8139494 System for testing ethernet paths and links without impacting non-test traffic
03/20/2012US8139489 Robust jitter-free remote clock offset measuring method
03/20/2012US8139488 Cooperative flow locks distributed among multiple components
03/20/2012US8139479 Health probing detection and enhancement for traffic engineering label switched paths
03/20/2012US8139477 Network element bypass in computing computer architecture
03/20/2012US8139476 Optical ring networks using circulating optical probe in protection switching with automatic reversion
03/20/2012US8139475 Method and system for fault and performance recovery in communication networks, related network and computer program product therefor
03/20/2012US8138783 Testable integrated circuit and IC test method
03/20/2012US8138782 Photovoltaic cell solar simulator
03/20/2012US8138781 Test circuit adapted in a display panel of an electronic device
03/20/2012US8138780 LCD panel apparatus and testing method using the same
03/20/2012US8138779 Handler for electronic components, in particular IC's, comprising circulating units, the temperature of which can be controlled
03/20/2012US8138778 Apparatus for high density low cost automatic test applications
03/20/2012US8138777 TCP-type semiconductor device and method of testing thereof
03/20/2012US8138776 In-circuit test assembly
03/20/2012US8138775 CMOS-controlled printhead sense circuit in inkjet printer
03/20/2012US8138774 Method of determining the diameter of a hole in a workpiece
03/20/2012US8138771 Touch controller with read-out line
03/20/2012US8138766 Flashover analysis tool
03/20/2012US8138765 Device and method for actuator monitoring of a safety-related load circuit connected with two channels
03/20/2012US8138764 Test circuit for monitoring a bandgap circuit
03/20/2012CA2585921C State and parameter estimation for an electrochemical cell
03/20/2012CA2487806C System and method for retransmission of data
03/20/2012CA2352918C A method and apparatus for monitoring live electrical equipment at high or medium voltage
03/20/2012CA2261414C Battery pack and battery system
03/16/2012CA2752363A1 Fault location in a non-homogeneous electric power line
03/15/2012WO2012034045A1 Vehicle battery monitoring system
03/15/2012WO2012033876A1 Integrated circuit with programmable logic analyzer, enhanced analyzing and debugging capabilities and method
03/15/2012WO2012033871A1 An integrated circuit including a programmable logic analyzer with enhanced analyzing and debugging capabilities and a method therefor
03/15/2012WO2012033802A2 Electrically conductive pins for microcircuit tester
03/15/2012WO2012033258A1 Test contactor for semiconductor device and manufacturing method thereof
03/15/2012WO2012033248A1 Intelligent energy storage system and method
03/15/2012WO2012032843A1 Parameter estimation device
03/15/2012WO2012032776A1 Power control device, power control method, and power supply system
03/15/2012WO2012032651A1 Overvoltage detecting device for energy storage module
03/15/2012WO2012032428A1 Method and cell monitoring unit for monitoring a rechargeable battery
03/15/2012WO2012032247A1 Device and method for detecting discharges
03/15/2012WO2012032125A1 Method and device for automatically measuring physical characteristics of a cable, in particular the propagation velocity
03/15/2012WO2012031692A1 Device and method for locating an earth fault on a cable
03/15/2012WO2012031613A1 Apparatus, method, and computer software for detection of topology changes in electrical networks
03/15/2012WO2012031362A1 Methods, apparatus and system to support large-scale micro- systems including embedded and distributed power supply, thermal regulation, multi-distributed-sensors and electrical signal propagation
03/15/2012WO2011156675A3 Switch-state information aggregation
03/15/2012WO2011133602A3 Fuse tester and puller
03/15/2012WO2011045206A3 Method for determining and/or predicting the high-current carrying capacity of a battery
03/15/2012US20120065920 Evaluation method, evaluation apparatus, and simulation method of semiconductor device
03/15/2012US20120065919 Built-in self-test circuit-based radiation sensor, radiation sensing method and integrated circuit incorporating the same
03/15/2012US20120065845 Sensor detection controller and occupant detection apparatus having the same
03/15/2012US20120065824 Control apparatus for vehicle
03/15/2012US20120064643 Methods and System for On-Chip Decoder for Array Test
03/15/2012US20120064227 Cantilever Microprobes For Contacting Electronic Components and Methods for Making Such Probes
03/15/2012US20120064226 Cantilever Microprobes For Contacting Electronic Components and Methods for Making Such Probes
03/15/2012US20120063900 Method for examining an electric energy accumulator
03/15/2012US20120063173 Common Mode Noise Reduction Apparatus and Method
03/15/2012US20120062877 Referenced Inspection Device
03/15/2012US20120062273 Pdu testing apparatus
03/15/2012US20120062272 Methods and apparatus to detect voltage conditions of power supplies
03/15/2012US20120062271 Methods and System for Electrostatic Discharge Protection of Thin-Film Transistor Backplane Arrays
03/15/2012US20120062270 Compliant printed circuit wafer probe diagnostic tool
03/15/2012US20120062269 Inspection tool and methodology for three dimensional voltage contrast inspection
03/15/2012US20120062268 Method and device for measuring the reliability of an integrated circuit
03/15/2012US20120062267 Semiconductor memory device and method for inspecting the same
03/15/2012US20120062266 Scan or jtag controllable capture clock generation
03/15/2012US20120062265 Method of diagnosing the failure of a photovoltaic generator
03/15/2012US20120062264 Test device
03/15/2012US20120062263 Test method of liquid crystal display panel
03/15/2012US20120062262 Test Handlers For Semiconductor Packages and Test Methods Using the Same
03/15/2012US20120062261 Electrically Conductive Pins For Microcircuit Tester
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