Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
12/2012
12/05/2012CN102808615A Electronic circuit testing equipment for formation pressure tester while drilling
12/05/2012CN102804954A Capacitive precision seed meter performance-detecting sensor
12/05/2012CN102361101B Method for energy-saving charging and discharging of cells and system for testing energy-saving charging and discharging of cells
12/05/2012CN102214741B Method for correcting LED (light emitting diode) crystal grain production facility
12/05/2012CN102176442B Test structure and method for measuring HCI (hot carrier injection) reliability of MOS (metal oxide semiconductor) device
12/05/2012CN102175954B Circuit inter-phase fault single-end ranging method
12/05/2012CN102156231B Method for judging power amplifier entering noise bottom area in electromagnetic radiation sensitivity test
12/05/2012CN102129011B Single-ended interphase fault location method for distributed capacitance current and fault resistance resistant line
12/05/2012CN102116840B Method for testing local interconnection of field programmable gate array (FPGA) based on greedy strategy
12/05/2012CN102096044B Method for measuring temperature of permanent-magnet synchronous motor of hybrid electric vehicle
12/05/2012CN102073006B Calibration method of electrical properties of solar cells
12/05/2012CN102053228B Battery electric quantity monitoring method
12/05/2012CN102043122B Improved scan chain unit and non-concurrent testing method based on same
12/05/2012CN102033178B Intelligent bus duct simulating, monitoring and analyzing system
12/05/2012CN102012465B Wire order test method
12/05/2012CN101950516B Detection system of driving plates liquid crystal television and liquid crystal display
12/05/2012CN101893682B Method for testing resonant power amplifying circuit
12/05/2012CN101814730B Fault phase selection method of double transmission line protection on the same pole
12/05/2012CN101788602B Earth leakage tester, earth leakage circuit breaker equipped with the same, circuit breaker, and insulation monitor
12/05/2012CN101726673B Spot measurement device
12/05/2012CN101686035B Multiphase motor driving device
12/05/2012CN101669037B Monitoring reliability of a digital system
12/05/2012CN101661075B Power system failure diagnostic method based on neural network and fuzzy integral
12/05/2012CN101644723B Unit device for measuring performance of electrode material of double electric layer capacitor in water solution system and measuring method therefor
12/05/2012CN101609127B Relay fault detecting circuit
12/05/2012CN101513859B Method of externally charging a powertrain
12/05/2012CN101339231B Battery state monitoring circuit and battery apparatus
12/05/2012CN101271143B Method for testing hot carrier injection into MOS device
12/05/2012CN101149422B Battery life forecasting system and method, communication terminal device and battery life forecasting device
12/05/2012CN101055168B Optical detection system
12/04/2012US8327212 Error identifying method, data processing device, and semiconductor device
12/04/2012US8327207 Memory testing system
12/04/2012US8327206 Blanking primitives masking circuit
12/04/2012US8327205 IC testing methods and apparatus
12/04/2012US8327204 High-speed transceiver tester incorporating jitter injection
12/04/2012US8327203 State machine transitioning from sequence 1 to sequence 2 to idle 2
12/04/2012US8327202 System and method for scan testing
12/04/2012US8327201 Parallel testing of an integrated circuit that includes multiple dies
12/04/2012US8327199 Integrated circuit with configurable test pins
12/04/2012US8327198 On-die logic analyzer for semiconductor die
12/04/2012US8327196 Identifying an optimized test bit pattern for analyzing electrical communications channel topologies
12/04/2012US8327016 Device communications over unnumbered interfaces
12/04/2012US8326959 Virtual production testing of large integrated products
12/04/2012US8326565 Chip tester, method for providing timing information, test fixture set, apparatus for post-processing propagation delay information, method for post-processing delay information, chip test set up and method for testing devices under test
12/04/2012US8326564 Detected data processing apparatus and computer readable medium for detecting data
12/04/2012US8326552 Redundant and fault-tolerant power distribution system having an integrated communication network
12/04/2012US8326551 Method and system for incorporating electronic signature analysis in low voltage power supplies
12/04/2012US8325866 Selection circuit enabling clock/mode or mode/clock signals
12/04/2012US8325723 Method and apparatus for dynamic traffic management with packet classification
12/04/2012US8325623 System and method for reducing latency during data transmissions over a network
12/04/2012US8325615 System and method for collapsed subscriber management and call control
12/04/2012US8325613 Characterizing broadband communication networks
12/04/2012US8325611 Scaling OAM for point-to-point trunking
12/04/2012US8325610 System and method for medium access control in a power-save network
12/04/2012US8325605 Managing media resources utilizing session initiation protocol
12/04/2012US8325596 Method and system for recognizing radio link failures associated with HSUPA and HSPDA channels
12/04/2012US8324923 Vertical probe array arranged to provide space transformation
12/04/2012US8324922 Selective core functional and bypass circuitry
12/04/2012US8324921 Testing of a photovoltaic panel
12/04/2012US8324920 Display device including test circuit, and electronic apparatus having the display device
12/04/2012US8324919 Scrub inducing compliant electrical contact
12/04/2012US8324918 Probe needle material, probe needle and probe card each using the same, and inspection process
12/04/2012US8324917 Logic applying serial test bits to scan paths in parallel
12/04/2012US8324916 Electro-optical device
12/04/2012US8324915 Increasing thermal isolation of a probe card assembly
12/04/2012US8324908 Electrical connection defect detection device
12/04/2012US8324907 Electrical connection quality detection
12/04/2012US8324906 Methods for detecting a hidden peak in wire fault location applications—improving the distance range resolution
12/04/2012US8324902 Stun device testing apparatus and methods
12/04/2012US8323992 Method of manufacturing semiconductor integrated circuit device
12/04/2012US8323991 Method for detecting stress migration properties
12/04/2012US8323990 Reliability test structure for multilevel interconnect
12/04/2012US8322236 Measuring apparatus and method for detecting moisture at a measurement voltage input of the measuring apparatus
11/2012
11/29/2012WO2012162486A2 On-line monitoring system of insulation losses for underground power cables
11/29/2012WO2012162091A2 Method and apparatus pertaining to automatic electrical-fault detection
11/29/2012WO2012161760A1 Fault detection for laminated core
11/29/2012WO2012161338A1 Solar simulator, solar cell characteristic measurement method, and program
11/29/2012WO2012160754A1 Power storage apparatus, mobile device, and electric-powered vehicle
11/29/2012WO2012160301A1 Method of estimating the state of charge of an electric battery
11/29/2012WO2012160118A1 Isolation monitoring using a test signal of variable frequency
11/29/2012WO2012159812A1 Method and apparatus for operating a power output stage
11/29/2012WO2012159677A1 Clamp
11/29/2012WO2012159652A1 Method and system for detecting an arc fault in a power circuit
11/29/2012WO2012135707A3 Conveyor-mountable carrier for electronic device testing
11/29/2012US20120304033 Clock domain check method, clock domain check program, and recording medium
11/29/2012US20120304032 Test system
11/29/2012US20120304031 Hybrid test compression architecture using multiple codecs for low pin count and high compression devices
11/29/2012US20120304030 Semiconductor-based test device that implements random logic functions
11/29/2012US20120304029 Tap and linking module for scan access of multiple cores with ieee 1149.1 test access ports
11/29/2012US20120304028 Scan response reuse method and apparatus
11/29/2012US20120303302 Systems and Methods for Monitoring Deterioration of a Rechargeable Battery
11/29/2012US20120303301 Device for estimating internal resistance of battery and battery pack including the same
11/29/2012US20120303297 Systems and Methods for Determining Electrical Faults
11/29/2012US20120303208 Battery recharge estimator using battery impedance response
11/29/2012US20120299740 Method and Apparatus Pertaining to Automatic Electrical-Fault Detection
11/29/2012US20120299615 Circuit board assembly and assistant test circuit board
11/29/2012US20120299614 Test socket with a rapidly detachable electrical connection module
11/29/2012US20120299613 Jig for semiconductor test
11/29/2012US20120299610 Method and apparatus for testing a semiconductor wafer
11/29/2012US20120299609 Positioning and socketing for semiconductor dice
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